JP2008537628A5 - - Google Patents
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- JP2008537628A5 JP2008537628A5 JP2007555173A JP2007555173A JP2008537628A5 JP 2008537628 A5 JP2008537628 A5 JP 2008537628A5 JP 2007555173 A JP2007555173 A JP 2007555173A JP 2007555173 A JP2007555173 A JP 2007555173A JP 2008537628 A5 JP2008537628 A5 JP 2008537628A5
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- JP
- Japan
- Prior art keywords
- gas
- zone
- distribution member
- zones
- flow rate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/057,433 | 2005-02-15 | ||
| US11/057,433 US7480974B2 (en) | 2005-02-15 | 2005-02-15 | Methods of making gas distribution members for plasma processing apparatuses |
| PCT/US2006/004284 WO2006088697A2 (en) | 2005-02-15 | 2006-02-08 | Methods of making gas distribution members for plasma processing apparatuses |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2008537628A JP2008537628A (ja) | 2008-09-18 |
| JP2008537628A5 true JP2008537628A5 (enExample) | 2009-03-26 |
| JP4814259B2 JP4814259B2 (ja) | 2011-11-16 |
Family
ID=36814467
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007555173A Expired - Fee Related JP4814259B2 (ja) | 2005-02-15 | 2006-02-08 | プラズマ処理装置用ガス分配部材の製造方法および該部材のガス透過率の調整方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US7480974B2 (enExample) |
| JP (1) | JP4814259B2 (enExample) |
| KR (1) | KR101323025B1 (enExample) |
| CN (1) | CN101495268B (enExample) |
| TW (1) | TWI378152B (enExample) |
| WO (1) | WO2006088697A2 (enExample) |
Families Citing this family (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7480974B2 (en) * | 2005-02-15 | 2009-01-27 | Lam Research Corporation | Methods of making gas distribution members for plasma processing apparatuses |
| US8702866B2 (en) | 2006-12-18 | 2014-04-22 | Lam Research Corporation | Showerhead electrode assembly with gas flow modification for extended electrode life |
| JP4849247B2 (ja) * | 2006-12-22 | 2012-01-11 | 三菱マテリアル株式会社 | 比抵抗値の面内バラツキの小さい複合シリコン電極およびその製造方法 |
| US8216419B2 (en) * | 2008-03-28 | 2012-07-10 | Bridgelux, Inc. | Drilled CVD shower head |
| RU2499081C2 (ru) * | 2008-03-26 | 2013-11-20 | ДжиТиЭйТи Корпорейшн | Системы и способы распределения газа в реакторе для химического осаждения из паровой фазы |
| CN101980959A (zh) * | 2008-03-26 | 2011-02-23 | Gt太阳能公司 | 涂覆金的多晶硅反应器系统和方法 |
| US20100071210A1 (en) * | 2008-09-24 | 2010-03-25 | Applied Materials, Inc. | Methods for fabricating faceplate of semiconductor apparatus |
| KR101460555B1 (ko) * | 2008-12-29 | 2014-11-14 | 주식회사 케이씨텍 | 샤워헤드 및 이를 구비하는 원자층 증착장치 |
| JP5336968B2 (ja) * | 2009-07-30 | 2013-11-06 | 東京エレクトロン株式会社 | プラズマ処理装置用電極及びプラズマ処理装置 |
| US9245717B2 (en) * | 2011-05-31 | 2016-01-26 | Lam Research Corporation | Gas distribution system for ceramic showerhead of plasma etch reactor |
| US8883029B2 (en) | 2013-02-13 | 2014-11-11 | Lam Research Corporation | Method of making a gas distribution member for a plasma processing chamber |
| US9275840B2 (en) | 2014-01-25 | 2016-03-01 | Yuri Glukhoy | Method for providing uniform distribution of plasma density in a plasma treatment apparatus |
| US9484190B2 (en) | 2014-01-25 | 2016-11-01 | Yuri Glukhoy | Showerhead-cooler system of a semiconductor-processing chamber for semiconductor wafers of large area |
| US9570289B2 (en) * | 2015-03-06 | 2017-02-14 | Lam Research Corporation | Method and apparatus to minimize seam effect during TEOS oxide film deposition |
| JP6421294B1 (ja) * | 2017-05-25 | 2018-11-14 | 株式会社三井E&Sマシナリー | シャワーヘッド加工工具およびシャワーヘッド加工工具の製造方法 |
| JP7716425B2 (ja) * | 2020-04-29 | 2025-07-31 | ラム リサーチ コーポレーション | 基板処理システムにおけるシャワーヘッドのグルーピングフィーチャ |
| JP7563846B2 (ja) * | 2020-12-21 | 2024-10-08 | 東京エレクトロン株式会社 | 流量測定方法及び基板処理装置 |
Family Cites Families (41)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5539609A (en) * | 1992-12-02 | 1996-07-23 | Applied Materials, Inc. | Electrostatic chuck usable in high density plasma |
| JPH0718441U (ja) * | 1993-09-10 | 1995-03-31 | 日新電機株式会社 | 薄膜気相成長装置 |
| US5928427A (en) * | 1994-12-16 | 1999-07-27 | Hwang; Chul-Ju | Apparatus for low pressure chemical vapor deposition |
| US5534751A (en) * | 1995-07-10 | 1996-07-09 | Lam Research Corporation | Plasma etching apparatus utilizing plasma confinement |
| US5644467A (en) * | 1995-09-28 | 1997-07-01 | Applied Materials, Inc. | Method and structure for improving gas breakdown resistance and reducing the potential of arcing in a electrostatic chuck |
| US6108189A (en) * | 1996-04-26 | 2000-08-22 | Applied Materials, Inc. | Electrostatic chuck having improved gas conduits |
| US6013155A (en) * | 1996-06-28 | 2000-01-11 | Lam Research Corporation | Gas injection system for plasma processing |
| US6090304A (en) * | 1997-08-28 | 2000-07-18 | Lam Research Corporation | Methods for selective plasma etch |
| US6537418B1 (en) * | 1997-09-19 | 2003-03-25 | Siemens Aktiengesellschaft | Spatially uniform gas supply and pump configuration for large wafer diameters |
| US6098568A (en) * | 1997-12-01 | 2000-08-08 | Applied Materials, Inc. | Mixed frequency CVD apparatus |
| KR19990065416A (ko) * | 1998-01-13 | 1999-08-05 | 윤종용 | 샤워 헤드를 포함하는 반도체장치 제조용 챔버 장비 |
| US6464843B1 (en) * | 1998-03-31 | 2002-10-15 | Lam Research Corporation | Contamination controlling method and apparatus for a plasma processing chamber |
| US6106663A (en) * | 1998-06-19 | 2000-08-22 | Lam Research Corporation | Semiconductor process chamber electrode |
| US5998932A (en) * | 1998-06-26 | 1999-12-07 | Lam Research Corporation | Focus ring arrangement for substantially eliminating unconfined plasma in a plasma processing chamber |
| US6073577A (en) * | 1998-06-30 | 2000-06-13 | Lam Research Corporation | Electrode for plasma processes and method for manufacture and use thereof |
| JP4162773B2 (ja) * | 1998-08-31 | 2008-10-08 | 東京エレクトロン株式会社 | プラズマ処理装置および検出窓 |
| KR20000010029U (ko) * | 1998-11-14 | 2000-06-15 | 김영환 | 반도체 증착장비용 샤워헤드 |
| US6123775A (en) * | 1999-06-30 | 2000-09-26 | Lam Research Corporation | Reaction chamber component having improved temperature uniformity |
| US6408786B1 (en) * | 1999-09-23 | 2002-06-25 | Lam Research Corporation | Semiconductor processing equipment having tiled ceramic liner |
| US6451157B1 (en) * | 1999-09-23 | 2002-09-17 | Lam Research Corporation | Gas distribution apparatus for semiconductor processing |
| JP2001185494A (ja) * | 1999-12-27 | 2001-07-06 | Toshiba Corp | マグネトロンプラズマ処理装置及びプラズマ処理方法 |
| KR100338955B1 (ko) * | 1999-12-31 | 2002-05-31 | 박종섭 | 반도체의 건식각 공정용 가스 공급 장치 |
| US6444040B1 (en) * | 2000-05-05 | 2002-09-03 | Applied Materials Inc. | Gas distribution plate |
| US6506254B1 (en) * | 2000-06-30 | 2003-01-14 | Lam Research Corporation | Semiconductor processing equipment having improved particle performance |
| JP2002064084A (ja) * | 2000-08-17 | 2002-02-28 | Sumitomo Metal Ind Ltd | プラズマ処理用ガス導入装置およびプラズマ処理方法 |
| JP4484185B2 (ja) * | 2000-08-29 | 2010-06-16 | コバレントマテリアル株式会社 | シリコン半導体基板の化学的気相薄膜成長方法 |
| US6391787B1 (en) * | 2000-10-13 | 2002-05-21 | Lam Research Corporation | Stepped upper electrode for plasma processing uniformity |
| US6797639B2 (en) * | 2000-11-01 | 2004-09-28 | Applied Materials Inc. | Dielectric etch chamber with expanded process window |
| JP2002155366A (ja) * | 2000-11-15 | 2002-05-31 | Tokyo Electron Ltd | 枚葉式熱処理方法および枚葉式熱処理装置 |
| US20020127853A1 (en) * | 2000-12-29 | 2002-09-12 | Hubacek Jerome S. | Electrode for plasma processes and method for manufacture and use thereof |
| US6805952B2 (en) * | 2000-12-29 | 2004-10-19 | Lam Research Corporation | Low contamination plasma chamber components and methods for making the same |
| US6620520B2 (en) * | 2000-12-29 | 2003-09-16 | Lam Research Corporation | Zirconia toughened ceramic components and coatings in semiconductor processing equipment and method of manufacture thereof |
| US6852167B2 (en) * | 2001-03-01 | 2005-02-08 | Micron Technology, Inc. | Methods, systems, and apparatus for uniform chemical-vapor depositions |
| US6830622B2 (en) * | 2001-03-30 | 2004-12-14 | Lam Research Corporation | Cerium oxide containing ceramic components and coatings in semiconductor processing equipment and methods of manufacture thereof |
| US6527911B1 (en) * | 2001-06-29 | 2003-03-04 | Lam Research Corporation | Configurable plasma volume etch chamber |
| US6780787B2 (en) * | 2002-03-21 | 2004-08-24 | Lam Research Corporation | Low contamination components for semiconductor processing apparatus and methods for making components |
| US7543547B1 (en) * | 2002-07-31 | 2009-06-09 | Lam Research Corporation | Electrode assembly for plasma processing apparatus |
| JP2005019606A (ja) * | 2003-06-25 | 2005-01-20 | Anelva Corp | プラズマ処理装置におけるガスシャワーヘッドまたはターゲットプレートを電極に固定する装置 |
| CN100545303C (zh) * | 2003-08-20 | 2009-09-30 | 维高仪器股份有限公司 | 用于竖流型转盘式反应器的烷基挤出流 |
| US7645341B2 (en) * | 2003-12-23 | 2010-01-12 | Lam Research Corporation | Showerhead electrode assembly for plasma processing apparatuses |
| US7480974B2 (en) * | 2005-02-15 | 2009-01-27 | Lam Research Corporation | Methods of making gas distribution members for plasma processing apparatuses |
-
2005
- 2005-02-15 US US11/057,433 patent/US7480974B2/en not_active Expired - Fee Related
-
2006
- 2006-02-08 CN CN2006800080809A patent/CN101495268B/zh active Active
- 2006-02-08 KR KR1020077021227A patent/KR101323025B1/ko not_active Expired - Fee Related
- 2006-02-08 WO PCT/US2006/004284 patent/WO2006088697A2/en not_active Ceased
- 2006-02-08 JP JP2007555173A patent/JP4814259B2/ja not_active Expired - Fee Related
- 2006-02-15 TW TW095105083A patent/TWI378152B/zh not_active IP Right Cessation
-
2009
- 2009-01-07 US US12/349,803 patent/US20090120583A1/en not_active Abandoned
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