JP2008520835A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2008520835A5 JP2008520835A5 JP2007543038A JP2007543038A JP2008520835A5 JP 2008520835 A5 JP2008520835 A5 JP 2008520835A5 JP 2007543038 A JP2007543038 A JP 2007543038A JP 2007543038 A JP2007543038 A JP 2007543038A JP 2008520835 A5 JP2008520835 A5 JP 2008520835A5
- Authority
- JP
- Japan
- Prior art keywords
- precursor
- gas
- substrate
- carbon monoxide
- process chamber
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/996,145 | 2004-11-23 | ||
| US10/996,145 US7270848B2 (en) | 2004-11-23 | 2004-11-23 | Method for increasing deposition rates of metal layers from metal-carbonyl precursors |
| PCT/US2005/035582 WO2006057709A2 (en) | 2004-11-23 | 2005-10-03 | Method for deposition of metal layers from metal carbonyl precursors |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2008520835A JP2008520835A (ja) | 2008-06-19 |
| JP2008520835A5 true JP2008520835A5 (enExample) | 2008-11-20 |
| JP4980235B2 JP4980235B2 (ja) | 2012-07-18 |
Family
ID=36102580
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007543038A Expired - Lifetime JP4980235B2 (ja) | 2004-11-23 | 2005-10-03 | 金属カルボニル前駆体からの金属層の成膜速度を上げる方法 |
Country Status (8)
| Country | Link |
|---|---|
| US (2) | US7270848B2 (enExample) |
| EP (1) | EP1828430B1 (enExample) |
| JP (1) | JP4980235B2 (enExample) |
| KR (1) | KR101178984B1 (enExample) |
| CN (1) | CN100572591C (enExample) |
| AT (1) | ATE519870T1 (enExample) |
| TW (1) | TWI300098B (enExample) |
| WO (1) | WO2006057709A2 (enExample) |
Families Citing this family (55)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7427426B2 (en) * | 2002-11-06 | 2008-09-23 | Tokyo Electron Limited | CVD method for forming metal film by using metal carbonyl gas |
| US7270848B2 (en) * | 2004-11-23 | 2007-09-18 | Tokyo Electron Limited | Method for increasing deposition rates of metal layers from metal-carbonyl precursors |
| US7638002B2 (en) * | 2004-11-29 | 2009-12-29 | Tokyo Electron Limited | Multi-tray film precursor evaporation system and thin film deposition system incorporating same |
| US7708835B2 (en) * | 2004-11-29 | 2010-05-04 | Tokyo Electron Limited | Film precursor tray for use in a film precursor evaporation system and method of using |
| US7351285B2 (en) * | 2005-03-29 | 2008-04-01 | Tokyo Electron Limited | Method and system for forming a variable thickness seed layer |
| US7288479B2 (en) * | 2005-03-31 | 2007-10-30 | Tokyo Electron Limited | Method for forming a barrier/seed layer for copper metallization |
| US7651570B2 (en) * | 2005-03-31 | 2010-01-26 | Tokyo Electron Limited | Solid precursor vaporization system for use in chemical vapor deposition |
| US7396766B2 (en) * | 2005-03-31 | 2008-07-08 | Tokyo Electron Limited | Low-temperature chemical vapor deposition of low-resistivity ruthenium layers |
| US8268078B2 (en) * | 2006-03-16 | 2012-09-18 | Tokyo Electron Limited | Method and apparatus for reducing particle contamination in a deposition system |
| US20070218200A1 (en) * | 2006-03-16 | 2007-09-20 | Kenji Suzuki | Method and apparatus for reducing particle formation in a vapor distribution system |
| US20070231489A1 (en) * | 2006-03-29 | 2007-10-04 | Tokyo Electron Limited | Method for introducing a precursor gas to a vapor deposition system |
| US7892358B2 (en) * | 2006-03-29 | 2011-02-22 | Tokyo Electron Limited | System for introducing a precursor gas to a vapor deposition system |
| US8034406B2 (en) * | 2006-09-26 | 2011-10-11 | Tokyo Electron Limited | Integrated substrate processing in a vacuum processing tool |
| WO2008042691A2 (en) * | 2006-09-29 | 2008-04-10 | Tokyo Electron Limited | Processing system containing a hot filament hydrogen radical source for integrated substrate processing |
| US7846256B2 (en) * | 2007-02-23 | 2010-12-07 | Tokyo Electron Limited | Ampule tray for and method of precursor surface area |
| JP5236197B2 (ja) * | 2007-03-28 | 2013-07-17 | 東京エレクトロン株式会社 | 成膜方法および成膜装置 |
| JP2008244298A (ja) * | 2007-03-28 | 2008-10-09 | Tokyo Electron Ltd | 金属膜の成膜方法、多層配線構造の形成方法、半導体装置の製造方法、成膜装置 |
| US20080242088A1 (en) * | 2007-03-29 | 2008-10-02 | Tokyo Electron Limited | Method of forming low resistivity copper film structures |
| US7829454B2 (en) * | 2007-09-11 | 2010-11-09 | Tokyo Electron Limited | Method for integrating selective ruthenium deposition into manufacturing of a semiconductior device |
| US7704879B2 (en) * | 2007-09-27 | 2010-04-27 | Tokyo Electron Limited | Method of forming low-resistivity recessed features in copper metallization |
| US7884012B2 (en) * | 2007-09-28 | 2011-02-08 | Tokyo Electron Limited | Void-free copper filling of recessed features for semiconductor devices |
| US7772110B2 (en) * | 2007-09-28 | 2010-08-10 | Tokyo Electron Limited | Electrical contacts for integrated circuits and methods of forming using gas cluster ion beam processing |
| US7776740B2 (en) * | 2008-01-22 | 2010-08-17 | Tokyo Electron Limited | Method for integrating selective low-temperature ruthenium deposition into copper metallization of a semiconductor device |
| US8247030B2 (en) * | 2008-03-07 | 2012-08-21 | Tokyo Electron Limited | Void-free copper filling of recessed features using a smooth non-agglomerated copper seed layer |
| JP4731580B2 (ja) * | 2008-03-27 | 2011-07-27 | 東京エレクトロン株式会社 | 成膜方法および成膜装置 |
| FR2930371B1 (fr) * | 2008-04-16 | 2010-10-29 | St Microelectronics Sa | Structure de memoire comportant un element resistif programmable et son procede de fabrication. |
| US7799681B2 (en) * | 2008-07-15 | 2010-09-21 | Tokyo Electron Limited | Method for forming a ruthenium metal cap layer |
| CN102112649A (zh) * | 2008-08-05 | 2011-06-29 | 东京毅力科创株式会社 | 载置台构造 |
| US20100081274A1 (en) * | 2008-09-29 | 2010-04-01 | Tokyo Electron Limited | Method for forming ruthenium metal cap layers |
| US7977235B2 (en) * | 2009-02-02 | 2011-07-12 | Tokyo Electron Limited | Method for manufacturing a semiconductor device with metal-containing cap layers |
| US8716132B2 (en) * | 2009-02-13 | 2014-05-06 | Tokyo Electron Limited | Radiation-assisted selective deposition of metal-containing cap layers |
| US8242019B2 (en) * | 2009-03-31 | 2012-08-14 | Tokyo Electron Limited | Selective deposition of metal-containing cap layers for semiconductor devices |
| JP2011063850A (ja) * | 2009-09-17 | 2011-03-31 | Tokyo Electron Ltd | 成膜装置、成膜方法および記憶媒体 |
| US8076241B2 (en) * | 2009-09-30 | 2011-12-13 | Tokyo Electron Limited | Methods for multi-step copper plating on a continuous ruthenium film in recessed features |
| US8178439B2 (en) * | 2010-03-30 | 2012-05-15 | Tokyo Electron Limited | Surface cleaning and selective deposition of metal-containing cap layers for semiconductor devices |
| CN102173447B (zh) * | 2010-12-20 | 2012-11-14 | 钢铁研究总院 | 一种由氧化钨或钼直接合成钨或钼羰基金属络合物的方法 |
| CN102140625B (zh) * | 2011-01-05 | 2013-07-17 | 景德镇陶瓷学院 | 一种采用羰基钨为前驱体制备用于聚变堆中面向等离子体钨涂层的方法 |
| JP5659041B2 (ja) * | 2011-02-24 | 2015-01-28 | 東京エレクトロン株式会社 | 成膜方法および記憶媒体 |
| JP5656683B2 (ja) * | 2011-02-24 | 2015-01-21 | 東京エレクトロン株式会社 | 成膜方法および記憶媒体 |
| JP5659040B2 (ja) * | 2011-02-24 | 2015-01-28 | 東京エレクトロン株式会社 | 成膜方法および記憶媒体 |
| JP6412493B2 (ja) * | 2012-04-13 | 2018-10-24 | オーティーアイ ルミオニクス インコーポレーテッドOti Lumionics Inc. | 基板の官能基化 |
| CN102717066A (zh) * | 2012-06-05 | 2012-10-10 | 金川集团股份有限公司 | 一种制备铁包覆粉的方法 |
| CN102717065A (zh) * | 2012-06-05 | 2012-10-10 | 金川集团股份有限公司 | 一种制备镍包铝粉的方法 |
| JP2014053477A (ja) * | 2012-09-07 | 2014-03-20 | Philtech Inc | 固体金属ガス供給装置 |
| US20160020011A2 (en) * | 2012-09-28 | 2016-01-21 | Seagate Technology Llc | Methods of forming magnetic materials and articles formed thereby |
| WO2014052642A1 (en) | 2012-09-28 | 2014-04-03 | Advanced Technology Materials, Inc. | Fluorine free tungsten ald/cvd process |
| US8809827B1 (en) | 2013-03-13 | 2014-08-19 | International Business Machines Corporation | Thermally assisted MRAM with multilayer strap and top contact for low thermal conductivity |
| JP5732512B2 (ja) * | 2013-10-29 | 2015-06-10 | 田中貴金属工業株式会社 | ドデカカルボニルトリルテニウムの製造方法及び製造装置 |
| US9515251B2 (en) * | 2014-04-09 | 2016-12-06 | International Business Machines Corporation | Structure for thermally assisted MRAM |
| CN107836034B (zh) * | 2015-06-05 | 2022-07-19 | 东京毅力科创株式会社 | 用于互连的钌金属特征部填充 |
| US9915314B2 (en) | 2015-11-06 | 2018-03-13 | Goodrich Corporation | Shock strut fluid adjustment assisting system |
| KR102686799B1 (ko) * | 2018-11-08 | 2024-07-22 | 엔테그리스, 아이엔씨. | 루테늄 전구체 및 환원 가스를 사용하는 화학 증착 공정 |
| WO2021041442A1 (en) | 2019-08-26 | 2021-03-04 | Entegris, Inc. | Group vi metal deposition process |
| TW202341352A (zh) * | 2022-03-31 | 2023-10-16 | 美商應用材料股份有限公司 | 用於選擇性沉積之金屬表面阻隔分子 |
| US20250154643A1 (en) * | 2023-11-14 | 2025-05-15 | Tokyo Electron Limited | Area selective deposition of metals for electronic devices |
Family Cites Families (34)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4851895A (en) * | 1985-05-06 | 1989-07-25 | American Telephone And Telegraph Company, At&T Bell Laboratories | Metallization for integrated devices |
| US4929468A (en) | 1988-03-18 | 1990-05-29 | The United States Of America As Represented By The United States Department Of Energy | Formation of amorphous metal alloys by chemical vapor deposition |
| US4938999A (en) | 1988-07-11 | 1990-07-03 | Jenkin William C | Process for coating a metal substrate by chemical vapor deposition using a metal carbonyl |
| US5171610A (en) * | 1990-08-28 | 1992-12-15 | The Regents Of The University Of Calif. | Low temperature photochemical vapor deposition of alloy and mixed metal oxide films |
| US5314727A (en) * | 1992-07-28 | 1994-05-24 | Minnesota Mining & Mfg. Co./Regents Of The University Of Minnesota | Chemical vapor deposition of iron, ruthenium, and osmium |
| US5359787A (en) | 1993-04-16 | 1994-11-01 | Air Products And Chemicals, Inc. | High purity bulk chemical delivery system |
| CA2206217C (en) * | 1997-05-27 | 2003-01-07 | Miroslav Milinkovic | Nickel carbonyl vapour deposition process |
| US6074945A (en) * | 1998-08-27 | 2000-06-13 | Micron Technology, Inc. | Methods for preparing ruthenium metal films |
| US6063705A (en) * | 1998-08-27 | 2000-05-16 | Micron Technology, Inc. | Precursor chemistries for chemical vapor deposition of ruthenium and ruthenium oxide |
| EP1131475A1 (en) | 1998-11-03 | 2001-09-12 | Chemical Vapour Deposition Systems Inc. | Nickel carbonyl vapour deposition apparatus and process |
| US6319832B1 (en) | 1999-02-19 | 2001-11-20 | Micron Technology, Inc. | Methods of making semiconductor devices |
| US6303809B1 (en) | 1999-12-10 | 2001-10-16 | Yun Chi | Organometallic ruthenium and osmium source reagents for chemical vapor deposition |
| US6440495B1 (en) | 2000-08-03 | 2002-08-27 | Applied Materials, Inc. | Chemical vapor deposition of ruthenium films for metal electrode applications |
| US6444263B1 (en) | 2000-09-15 | 2002-09-03 | Cvc Products, Inc. | Method of chemical-vapor deposition of a material |
| KR100727372B1 (ko) | 2001-09-12 | 2007-06-12 | 토소가부시키가이샤 | 루테늄착체, 그 제조방법 및 박막의 제조방법 |
| US6420583B1 (en) * | 2001-09-27 | 2002-07-16 | Praxair Technology, Inc | Methods of synthesizing ruthenium and osmium compounds |
| US6713373B1 (en) | 2002-02-05 | 2004-03-30 | Novellus Systems, Inc. | Method for obtaining adhesion for device manufacture |
| US7264846B2 (en) | 2002-06-04 | 2007-09-04 | Applied Materials, Inc. | Ruthenium layer formation for copper film deposition |
| JP3992588B2 (ja) | 2002-10-23 | 2007-10-17 | 東京エレクトロン株式会社 | 成膜方法 |
| JP4126219B2 (ja) * | 2002-11-06 | 2008-07-30 | 東京エレクトロン株式会社 | 成膜方法 |
| JP4031704B2 (ja) * | 2002-12-18 | 2008-01-09 | 東京エレクトロン株式会社 | 成膜方法 |
| US7078341B2 (en) | 2003-09-30 | 2006-07-18 | Tokyo Electron Limited | Method of depositing metal layers from metal-carbonyl precursors |
| US6989321B2 (en) * | 2003-09-30 | 2006-01-24 | Tokyo Electron Limited | Low-pressure deposition of metal layers from metal-carbonyl precursors |
| US7107998B2 (en) * | 2003-10-16 | 2006-09-19 | Novellus Systems, Inc. | Method for preventing and cleaning ruthenium-containing deposits in a CVD apparatus |
| US20050110142A1 (en) | 2003-11-26 | 2005-05-26 | Lane Michael W. | Diffusion barriers formed by low temperature deposition |
| US7285308B2 (en) * | 2004-02-23 | 2007-10-23 | Advanced Technology Materials, Inc. | Chemical vapor deposition of high conductivity, adherent thin films of ruthenium |
| US7476618B2 (en) * | 2004-10-26 | 2009-01-13 | Asm Japan K.K. | Selective formation of metal layers in an integrated circuit |
| US7279421B2 (en) * | 2004-11-23 | 2007-10-09 | Tokyo Electron Limited | Method and deposition system for increasing deposition rates of metal layers from metal-carbonyl precursors |
| US7270848B2 (en) * | 2004-11-23 | 2007-09-18 | Tokyo Electron Limited | Method for increasing deposition rates of metal layers from metal-carbonyl precursors |
| US7638002B2 (en) * | 2004-11-29 | 2009-12-29 | Tokyo Electron Limited | Multi-tray film precursor evaporation system and thin film deposition system incorporating same |
| US20060113675A1 (en) * | 2004-12-01 | 2006-06-01 | Chung-Liang Chang | Barrier material and process for Cu interconnect |
| US7396766B2 (en) | 2005-03-31 | 2008-07-08 | Tokyo Electron Limited | Low-temperature chemical vapor deposition of low-resistivity ruthenium layers |
| US20070059502A1 (en) * | 2005-05-05 | 2007-03-15 | Applied Materials, Inc. | Integrated process for sputter deposition of a conductive barrier layer, especially an alloy of ruthenium and tantalum, underlying copper or copper alloy seed layer |
| US7402519B2 (en) * | 2005-06-03 | 2008-07-22 | Intel Corporation | Interconnects having sealing structures to enable selective metal capping layers |
-
2004
- 2004-11-23 US US10/996,145 patent/US7270848B2/en not_active Expired - Lifetime
-
2005
- 2005-10-03 WO PCT/US2005/035582 patent/WO2006057709A2/en not_active Ceased
- 2005-10-03 EP EP05807544A patent/EP1828430B1/en not_active Expired - Lifetime
- 2005-10-03 AT AT05807544T patent/ATE519870T1/de not_active IP Right Cessation
- 2005-10-03 JP JP2007543038A patent/JP4980235B2/ja not_active Expired - Lifetime
- 2005-10-03 CN CNB200580040103XA patent/CN100572591C/zh not_active Expired - Fee Related
- 2005-10-03 KR KR1020077009822A patent/KR101178984B1/ko not_active Expired - Lifetime
- 2005-11-23 TW TW094141096A patent/TWI300098B/zh not_active IP Right Cessation
-
2007
- 2007-09-18 US US11/856,946 patent/US7678421B2/en not_active Expired - Lifetime
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2008520835A5 (enExample) | ||
| JP2008538129A5 (enExample) | ||
| Mackus et al. | Influence of oxygen exposure on the nucleation of platinum atomic layer deposition: consequences for film growth, nanopatterning, and nanoparticle synthesis | |
| WO2006057709A3 (en) | Method for deposition of metal layers from metal carbonyl precursors | |
| TW511159B (en) | Method for forming thin film and apparatus for forming thin film | |
| JP2012501543A5 (enExample) | ||
| TWI470107B (zh) | 用於沉積含過渡金屬之膜的環戊二烯基過渡金屬前驅物 | |
| JP2007247062A5 (ja) | 気相原料分散システム、成膜システム、および堆積方法 | |
| JP2006520686A5 (enExample) | ||
| JP2006520687A5 (enExample) | ||
| JP2019530224A (ja) | Cvdリアクタおよびcvdリアクタの洗浄方法 | |
| WO2006036865A3 (en) | Deposition of ruthenium metal layers in a thermal chemical vapor deposition process | |
| JP2018515694A5 (enExample) | ||
| JP2005029821A (ja) | 成膜方法 | |
| Kim et al. | Atomic layer deposition of nickel using a heteroleptic Ni precursor with NH3 and selective deposition on defects of graphene | |
| JP6041464B2 (ja) | 金属薄膜の製膜方法、および金属薄膜の製膜装置 | |
| JP5409652B2 (ja) | 窒化タンタル膜の形成方法 | |
| JP4661130B2 (ja) | 化学気相成長方法 | |
| JP4889227B2 (ja) | 基板処理方法および成膜方法 | |
| JP5826698B2 (ja) | Ni膜の形成方法 | |
| CN101426952A (zh) | 成膜装置及阻挡膜的制造方法 | |
| Zhong et al. | Preliminary growth of metallic co films by thermal atomic layer deposition using RCpCo (CO) 2 and alkylamine precursors | |
| JP4601975B2 (ja) | 成膜方法 | |
| JP2010215982A (ja) | ルテニウム錯体有機溶媒溶液を用いたルテニウム含有膜製造方法、及びルテニウム含有膜 | |
| Mackus et al. | Catalytic surface reactions during nucleation and growth of atomic layer deposition of noble metals: a case study for platinum |