JP2008515210A5 - - Google Patents

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Publication number
JP2008515210A5
JP2008515210A5 JP2007533864A JP2007533864A JP2008515210A5 JP 2008515210 A5 JP2008515210 A5 JP 2008515210A5 JP 2007533864 A JP2007533864 A JP 2007533864A JP 2007533864 A JP2007533864 A JP 2007533864A JP 2008515210 A5 JP2008515210 A5 JP 2008515210A5
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JP
Japan
Prior art keywords
layer sequence
contact position
back side
active layer
annealing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2007533864A
Other languages
English (en)
Japanese (ja)
Other versions
JP2008515210A (ja
Filing date
Publication date
Priority claimed from DE102004061865A external-priority patent/DE102004061865A1/de
Application filed filed Critical
Publication of JP2008515210A publication Critical patent/JP2008515210A/ja
Publication of JP2008515210A5 publication Critical patent/JP2008515210A5/ja
Pending legal-status Critical Current

Links

JP2007533864A 2004-09-29 2005-09-23 薄膜半導体チップの製造方法 Pending JP2008515210A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102004047392 2004-09-29
DE102004061865A DE102004061865A1 (de) 2004-09-29 2004-12-22 Verfahren zur Herstellung eines Dünnfilmhalbleiterchips
PCT/DE2005/001684 WO2006034686A2 (de) 2004-09-29 2005-09-23 Verfahren zur herstellung eines dünnfilmhalbleiterchips

Publications (2)

Publication Number Publication Date
JP2008515210A JP2008515210A (ja) 2008-05-08
JP2008515210A5 true JP2008515210A5 (https=) 2011-12-22

Family

ID=35457637

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007533864A Pending JP2008515210A (ja) 2004-09-29 2005-09-23 薄膜半導体チップの製造方法

Country Status (6)

Country Link
US (2) US20080268560A1 (https=)
EP (1) EP1794816B1 (https=)
JP (1) JP2008515210A (https=)
KR (1) KR101249432B1 (https=)
DE (1) DE102004061865A1 (https=)
WO (1) WO2006034686A2 (https=)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102007003282B4 (de) * 2007-01-23 2023-12-21 OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung Leuchtdiodenchip
DE102007032283A1 (de) 2007-07-11 2009-01-15 Stein, Wilhelm, Dr. Dünnschichtsolarzellen-Modul und Verfahren zu dessen Herstellung
WO2009010762A1 (en) * 2007-07-19 2009-01-22 Photonstar Led Limited Vertical led with conductive vias
DE102008024517A1 (de) * 2007-12-27 2009-07-02 Osram Opto Semiconductors Gmbh Strahlungsemittierender Körper und Verfahren zur Herstellung eines strahlungsemittierenden Körpers
DE102008035900A1 (de) * 2008-04-30 2009-11-05 Osram Opto Semiconductors Gmbh Leuchtdiodenchip
DE102009054784A1 (de) * 2009-12-16 2011-06-22 Osram Gesellschaft mit beschränkter Haftung, 81543 Halbleiterchip und Verfahren zum Herstellen eines Halbleiterchips
DE102010015520A1 (de) * 2010-04-16 2011-10-20 Pac Tech-Packaging Technologies Gmbh Verfahren und Vorrichtung zur Ausbildung von Lotdepots
DE102010049186B4 (de) * 2010-10-21 2022-03-24 OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung Optoelektronisches Bauelement und Verfahren zu dessen Herstellung
DE102016120685A1 (de) * 2016-10-28 2018-05-03 Osram Opto Semiconductors Gmbh Verfahren zur Herstellung eines Halbleiterlasers und Halbleiterlaser

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4142160A (en) * 1972-03-13 1979-02-27 Hitachi, Ltd. Hetero-structure injection laser
US4044222A (en) * 1976-01-16 1977-08-23 Western Electric Company, Inc. Method of forming tapered apertures in thin films with an energy beam
US4307131A (en) * 1976-01-30 1981-12-22 Thomson-Csf Method of manufacturing metal-semiconductor contacts exhibiting high injected current density
DE59814431D1 (de) * 1997-09-29 2010-03-25 Osram Opto Semiconductors Gmbh Halbleiterlichtquelle und Verfahren zu ihrer Herstellung
TWI256976B (en) * 2000-08-04 2006-06-21 Hannstar Display Corp Method of patterning an ITO layer
US20020017652A1 (en) * 2000-08-08 2002-02-14 Stefan Illek Semiconductor chip for optoelectronics
DE10046170A1 (de) * 2000-09-19 2002-04-04 Fraunhofer Ges Forschung Verfahren zur Herstellung eines Halbleiter-Metallkontaktes durch eine dielektrische Schicht
US6611002B2 (en) 2001-02-23 2003-08-26 Nitronex Corporation Gallium nitride material devices and methods including backside vias
JP2002313914A (ja) * 2001-04-18 2002-10-25 Sony Corp 配線形成方法及びこれを用いた素子の配列方法、画像表示装置の製造方法
DE10141352A1 (de) * 2001-08-23 2003-06-05 Osram Opto Semiconductors Gmbh Verfahren zur Oberflächenbehandlung eines Halbleiters
US6784462B2 (en) 2001-12-13 2004-08-31 Rensselaer Polytechnic Institute Light-emitting diode with planar omni-directional reflector
JP2003282478A (ja) * 2002-01-17 2003-10-03 Sony Corp 合金化方法及び配線形成方法、表示素子の形成方法、画像表示装置の製造方法
TW577178B (en) * 2002-03-04 2004-02-21 United Epitaxy Co Ltd High efficient reflective metal layer of light emitting diode
DE10307280B4 (de) 2002-11-29 2005-09-01 Osram Opto Semiconductors Gmbh Verfahren zum Herstellen eines lichtemittierenden Halbleiterbauelements
US6929966B2 (en) * 2002-11-29 2005-08-16 Osram Opto Semiconductors Gmbh Method for producing a light-emitting semiconductor component
JP2004235649A (ja) * 2003-01-31 2004-08-19 Osram Opto Semiconductors Gmbh 電気コンタクト領域を備えたモジュールの製造方法および半導体層列および活性ゾーンを有するモジュール
US7122841B2 (en) * 2003-06-04 2006-10-17 Kopin Corporation Bonding pad for gallium nitride-based light-emitting devices
US6913985B2 (en) * 2003-06-20 2005-07-05 Oki Data Corporation Method of manufacturing a semiconductor device
FR2857983B1 (fr) * 2003-07-24 2005-09-02 Soitec Silicon On Insulator Procede de fabrication d'une couche epitaxiee
US7291529B2 (en) * 2003-11-12 2007-11-06 Cree, Inc. Methods of processing semiconductor wafer backsides having light emitting devices (LEDs) thereon
DE102004004786B4 (de) * 2004-01-30 2017-06-22 Empacher Verwaltungs Gmbh & Co. Kg Rennzweier

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