JP2008181493A5 - - Google Patents
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- Publication number
- JP2008181493A5 JP2008181493A5 JP2007320422A JP2007320422A JP2008181493A5 JP 2008181493 A5 JP2008181493 A5 JP 2008181493A5 JP 2007320422 A JP2007320422 A JP 2007320422A JP 2007320422 A JP2007320422 A JP 2007320422A JP 2008181493 A5 JP2008181493 A5 JP 2008181493A5
- Authority
- JP
- Japan
- Prior art keywords
- insulating film
- signal processing
- forming
- substrate
- processing circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000010408 film Substances 0.000 claims 29
- 239000000758 substrate Substances 0.000 claims 14
- 239000003990 capacitor Substances 0.000 claims 8
- 239000004065 semiconductor Substances 0.000 claims 7
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims 6
- 239000003792 electrolyte Substances 0.000 claims 3
- XMWRBQBLMFGWIX-UHFFFAOYSA-N C60 fullerene Chemical compound C12=C3C(C4=C56)=C7C8=C5C5=C9C%10=C6C6=C4C1=C1C4=C6C6=C%10C%10=C9C9=C%11C5=C8C5=C8C7=C3C3=C7C2=C1C1=C2C4=C6C4=C%10C6=C9C9=C%11C5=C5C8=C3C3=C7C1=C1C2=C4C6=C2C9=C5C3=C12 XMWRBQBLMFGWIX-UHFFFAOYSA-N 0.000 claims 2
- 229910021393 carbon nanotube Inorganic materials 0.000 claims 2
- 239000002041 carbon nanotube Substances 0.000 claims 2
- 229910003472 fullerene Inorganic materials 0.000 claims 2
- 230000015572 biosynthetic process Effects 0.000 claims 1
- 239000003431 cross linking reagent Substances 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 claims 1
- 238000000034 method Methods 0.000 claims 1
- 239000000565 sealant Substances 0.000 claims 1
- 239000010409 thin film Substances 0.000 claims 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007320422A JP5210613B2 (ja) | 2006-12-27 | 2007-12-12 | 半導体装置 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006353336 | 2006-12-27 | ||
| JP2006353336 | 2006-12-27 | ||
| JP2007320422A JP5210613B2 (ja) | 2006-12-27 | 2007-12-12 | 半導体装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2008181493A JP2008181493A (ja) | 2008-08-07 |
| JP2008181493A5 true JP2008181493A5 (enExample) | 2011-01-27 |
| JP5210613B2 JP5210613B2 (ja) | 2013-06-12 |
Family
ID=39582459
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007320422A Expired - Fee Related JP5210613B2 (ja) | 2006-12-27 | 2007-12-12 | 半導体装置 |
Country Status (2)
| Country | Link |
|---|---|
| US (3) | US8517275B2 (enExample) |
| JP (1) | JP5210613B2 (enExample) |
Families Citing this family (31)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8044813B1 (en) | 2006-11-16 | 2011-10-25 | Semiconductor Energy Laboratory Co., Ltd. | Radio field intensity measurement device, and radio field intensity detector and game console using the same |
| US7750852B2 (en) | 2007-04-13 | 2010-07-06 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| US8716850B2 (en) * | 2007-05-18 | 2014-05-06 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
| EP2310987A4 (en) | 2008-07-03 | 2011-09-14 | Mario W Cardullo | NANO RFID METHOD AND DEVICE |
| US8298949B2 (en) * | 2009-01-07 | 2012-10-30 | Lam Research Corporation | Profile and CD uniformity control by plasma oxidation treatment |
| TWI504059B (zh) * | 2010-03-12 | 2015-10-11 | Hon Hai Prec Ind Co Ltd | 射頻識別標籤天線及其製造方法 |
| US8940610B2 (en) * | 2010-04-16 | 2015-01-27 | Semiconductor Energy Laboratory Co., Ltd. | Electrode for energy storage device and method for manufacturing the same |
| US20110304305A1 (en) * | 2010-06-15 | 2011-12-15 | Nokia Corporation | apparatus and method for a capacitive element in a structure |
| EP2599366A4 (en) * | 2010-07-28 | 2014-12-24 | Nokia Corp | TELECOMMUNICATIONS APPARATUS AND ASSOCIATED METHODS |
| US8358110B2 (en) * | 2010-07-29 | 2013-01-22 | Nokia Corporation | Integration of supercapacitors within a flexible printed circuit and associated methods |
| US8969132B2 (en) * | 2010-09-20 | 2015-03-03 | Nuvotronics, Llc | Device package and methods for the fabrication thereof |
| US20130176661A1 (en) | 2010-09-28 | 2013-07-11 | Markku Rouvala | Apparatus and Associated Methods |
| JP2013175636A (ja) * | 2012-02-27 | 2013-09-05 | Dainippon Screen Mfg Co Ltd | 電気二重層キャパシタの製造装置及び製造方法並びにそれにより製造された電気二重層キャパシタを備える電子シート |
| WO2014027220A1 (en) * | 2012-08-15 | 2014-02-20 | Nokia Corporation | Apparatus and methods for electrical energy harvesting and/or wireless communication |
| US9337152B2 (en) | 2013-03-15 | 2016-05-10 | Nuvotronics, Inc | Formulation for packaging an electronic device and assemblies made therefrom |
| US10170315B2 (en) | 2013-07-17 | 2019-01-01 | Globalfoundries Inc. | Semiconductor device having local buried oxide |
| DE102013109212B4 (de) * | 2013-08-26 | 2019-07-25 | Infineon Technologies Ag | RFID-Vorrichtung, RFID-Lesegerät, Portionsheißgetränkmaschine und System |
| US9583277B2 (en) * | 2013-09-30 | 2017-02-28 | The Paper Battery Company, Inc. | Ultra-capacitor structures and electronic systems with ultra-capacitor structures |
| US9252272B2 (en) | 2013-11-18 | 2016-02-02 | Globalfoundries Inc. | FinFET semiconductor device having local buried oxide |
| CN104051847B (zh) * | 2014-06-27 | 2016-07-06 | 南通富士通微电子股份有限公司 | 射频识别天线 |
| CN104051839B (zh) * | 2014-06-27 | 2016-06-01 | 南通富士通微电子股份有限公司 | 射频识别天线的形成方法 |
| US10204898B2 (en) | 2014-08-08 | 2019-02-12 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and electronic device |
| US9595955B2 (en) | 2014-08-08 | 2017-03-14 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device including power storage elements and switches |
| FR3026530B1 (fr) * | 2014-09-30 | 2017-12-22 | Oberthur Technologies | Document electronique a extremites d'antenne inclinees, support d'antenne pour un tel document electronique et procede de fabrication d'un tel document |
| US9378450B1 (en) * | 2014-12-05 | 2016-06-28 | Vivalnk, Inc | Stretchable electronic patch having a circuit layer undulating in the thickness direction |
| US9380698B1 (en) * | 2014-12-05 | 2016-06-28 | VivaLnk, Inc. | Stretchable electronic patch having a foldable circuit layer |
| WO2017205565A1 (en) * | 2016-05-25 | 2017-11-30 | William Marsh Rice University | Methods and systems related to remote measuring and sensing |
| US11488215B2 (en) | 2017-07-14 | 2022-11-01 | Visa International Service Association | Method, system, and computer program product for user communication with merchants associated with transactions |
| JP6306258B1 (ja) * | 2017-09-20 | 2018-04-04 | 誠敏 中野 | Icタグシステム |
| JP6362759B1 (ja) * | 2017-12-19 | 2018-07-25 | 誠敏 中野 | Icタグ |
| CN116132956B (zh) * | 2022-12-15 | 2023-09-05 | 香港理工大学深圳研究院 | 一种基于相机磁场干扰的近场通信方法及系统 |
Family Cites Families (31)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0230907A3 (en) * | 1986-01-17 | 1989-05-31 | Asahi Glass Company Ltd. | Electric double layer capacitor having high capacity |
| JP2758030B2 (ja) * | 1988-07-04 | 1998-05-25 | ソニー株式会社 | 薄型電子機器とその製造方法 |
| US5643804A (en) * | 1993-05-21 | 1997-07-01 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing a hybrid integrated circuit component having a laminated body |
| JP2001195307A (ja) * | 2000-01-06 | 2001-07-19 | Nippon Telegr & Teleph Corp <Ntt> | 半導体装置 |
| US6577015B1 (en) * | 2000-03-07 | 2003-06-10 | Micron Technology, Inc. | Partial slot cover for encapsulation process |
| US6284406B1 (en) * | 2000-06-09 | 2001-09-04 | Ntk Powerdex, Inc. | IC card with thin battery |
| JP3608531B2 (ja) | 2000-08-31 | 2005-01-12 | セイコーエプソン株式会社 | 電気光学装置及び投射型表示装置 |
| US6636284B2 (en) * | 2000-08-11 | 2003-10-21 | Seiko Epson Corporation | System and method for providing an electro-optical device having light shield layers |
| JP3900810B2 (ja) * | 2000-08-31 | 2007-04-04 | 株式会社パワーシステム | 電気二重層キャパシタ |
| JP4719852B2 (ja) | 2002-10-18 | 2011-07-06 | シンボル テクノロジーズ, インコーポレイテッド | パッシブrfidタグの不必要な再交渉を最小化するためのシステムおよび方法 |
| JP2004177989A (ja) * | 2002-11-22 | 2004-06-24 | Sony Corp | 非接触icカード |
| JP2004221531A (ja) * | 2002-12-26 | 2004-08-05 | Toin Gakuen | 光充電可能な積層型電気二重層キャパシタ |
| US7294209B2 (en) * | 2003-01-02 | 2007-11-13 | Cymbet Corporation | Apparatus and method for depositing material onto a substrate using a roll-to-roll mask |
| JP2004297753A (ja) * | 2003-02-07 | 2004-10-21 | Nec Tokin Corp | 電源回路、及び該電源回路を備えた通信機器 |
| US7123314B2 (en) * | 2003-07-11 | 2006-10-17 | Nec Corporation | Thin-film transistor with set trap level densities, and method of manufactures |
| JP2005051223A (ja) | 2003-07-11 | 2005-02-24 | Nec Corp | 薄膜トランジスタ、tft基板、液晶表示装置、及び、薄膜トランジスタの製造方法 |
| US7768405B2 (en) * | 2003-12-12 | 2010-08-03 | Semiconductor Energy Laboratory Co., Ltd | Semiconductor device and manufacturing method thereof |
| JP2005316724A (ja) | 2004-04-28 | 2005-11-10 | Matsushita Electric Works Ltd | アクティブ型rfidタグ |
| JP4611093B2 (ja) * | 2004-05-12 | 2011-01-12 | セイコーインスツル株式会社 | 電波発電回路 |
| JP2006024087A (ja) | 2004-07-09 | 2006-01-26 | Nec Corp | 無線デバイス、その製造方法、その検査方法及び検査装置並びに無線装置及びその製造方法 |
| JP5072208B2 (ja) * | 2004-09-24 | 2012-11-14 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| TWI372413B (en) * | 2004-09-24 | 2012-09-11 | Semiconductor Energy Lab | Semiconductor device and method for manufacturing the same, and electric appliance |
| JP2006127363A (ja) * | 2004-11-01 | 2006-05-18 | Advance Design Corp | 非接触ic媒体 |
| US8783577B2 (en) * | 2005-03-15 | 2014-07-22 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and electronic device having the same |
| US7659892B2 (en) * | 2005-03-17 | 2010-02-09 | Semiconductor Energy Laboratory Co., Ltd. | Display device and portable terminal |
| EP1908032A4 (en) * | 2005-07-19 | 2011-02-02 | Prec Dynamics Corp | SEMI-ACTIVE RADIO FREQUENCY IDENTIFICATION LABEL AND ASSOCIATED METHODS |
| KR101299932B1 (ko) * | 2006-03-10 | 2013-08-27 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
| KR101362954B1 (ko) * | 2006-03-10 | 2014-02-12 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 동작방법 |
| EP2002383B1 (en) * | 2006-03-15 | 2012-04-25 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| CN101385218A (zh) * | 2006-03-15 | 2009-03-11 | 株式会社半导体能源研究所 | 电力供应系统和用于机动车的电力供应系统 |
| CN101385039B (zh) * | 2006-03-15 | 2012-03-21 | 株式会社半导体能源研究所 | 半导体器件 |
-
2007
- 2007-12-12 JP JP2007320422A patent/JP5210613B2/ja not_active Expired - Fee Related
- 2007-12-20 US US12/003,147 patent/US8517275B2/en not_active Expired - Fee Related
-
2013
- 2013-08-20 US US13/970,814 patent/US9965713B2/en active Active
-
2018
- 2018-04-30 US US15/966,578 patent/US10380472B2/en not_active Expired - Fee Related
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