JP2005277323A5 - - Google Patents
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- Publication number
- JP2005277323A5 JP2005277323A5 JP2004092093A JP2004092093A JP2005277323A5 JP 2005277323 A5 JP2005277323 A5 JP 2005277323A5 JP 2004092093 A JP2004092093 A JP 2004092093A JP 2004092093 A JP2004092093 A JP 2004092093A JP 2005277323 A5 JP2005277323 A5 JP 2005277323A5
- Authority
- JP
- Japan
- Prior art keywords
- layer
- recess
- insulating layer
- forming
- conductive
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 claims 20
- 239000010409 thin film Substances 0.000 claims 12
- 238000004519 manufacturing process Methods 0.000 claims 7
- 238000000034 method Methods 0.000 claims 7
- 239000004020 conductor Substances 0.000 claims 4
- 238000007599 discharging Methods 0.000 claims 4
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004092093A JP4628004B2 (ja) | 2004-03-26 | 2004-03-26 | 薄膜トランジスタの作製方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004092093A JP4628004B2 (ja) | 2004-03-26 | 2004-03-26 | 薄膜トランジスタの作製方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2005277323A JP2005277323A (ja) | 2005-10-06 |
| JP2005277323A5 true JP2005277323A5 (enExample) | 2007-05-17 |
| JP4628004B2 JP4628004B2 (ja) | 2011-02-09 |
Family
ID=35176615
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004092093A Expired - Fee Related JP4628004B2 (ja) | 2004-03-26 | 2004-03-26 | 薄膜トランジスタの作製方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP4628004B2 (enExample) |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI517378B (zh) | 2005-10-17 | 2016-01-11 | 半導體能源研究所股份有限公司 | 半導體裝置及其製造方法 |
| JP2007220360A (ja) * | 2006-02-14 | 2007-08-30 | Tokyo Electron Ltd | 発光素子、発光素子の製造方法および基板処理装置 |
| JP5371144B2 (ja) * | 2007-06-29 | 2013-12-18 | 株式会社半導体エネルギー研究所 | 半導体装置及び半導体装置の作製方法、並びに電子機器 |
| TWI500159B (zh) | 2008-07-31 | 2015-09-11 | Semiconductor Energy Lab | 半導體裝置和其製造方法 |
| US8106400B2 (en) * | 2008-10-24 | 2012-01-31 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
| KR101432764B1 (ko) * | 2008-11-13 | 2014-08-21 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체장치의 제조방법 |
| KR102556313B1 (ko) * | 2008-11-21 | 2023-07-18 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 |
| KR101752640B1 (ko) | 2009-03-27 | 2017-06-30 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체장치 |
| KR102221207B1 (ko) | 2009-09-04 | 2021-03-03 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 발광 장치 및 발광 장치를 제작하기 위한 방법 |
| KR102142835B1 (ko) * | 2009-10-09 | 2020-08-10 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
| WO2011046048A1 (en) | 2009-10-16 | 2011-04-21 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
| CN102576734B (zh) * | 2009-10-21 | 2015-04-22 | 株式会社半导体能源研究所 | 显示装置和包括显示装置的电子设备 |
| KR102481935B1 (ko) | 2009-11-06 | 2022-12-28 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 반도체 장치의 제작 방법 |
| JP5683125B2 (ja) * | 2010-03-24 | 2015-03-11 | 莉立 范 | 電極の敷設方法とその構造 |
| CN103762167A (zh) * | 2011-12-31 | 2014-04-30 | 广东中显科技有限公司 | 一种搭桥晶粒多晶硅薄膜晶体管及其制造方法 |
| JP6536634B2 (ja) * | 2017-07-28 | 2019-07-03 | セイコーエプソン株式会社 | 電気光学装置および電子機器 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100206877B1 (ko) * | 1995-12-28 | 1999-07-01 | 구본준 | 박막트랜지스터 제조방법 |
| JP2003249658A (ja) * | 2002-02-26 | 2003-09-05 | Seiko Epson Corp | 有機半導体装置 |
-
2004
- 2004-03-26 JP JP2004092093A patent/JP4628004B2/ja not_active Expired - Fee Related
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