JP2008160399A - パワーオンシステムリセット回路 - Google Patents
パワーオンシステムリセット回路 Download PDFInfo
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- JP2008160399A JP2008160399A JP2006346016A JP2006346016A JP2008160399A JP 2008160399 A JP2008160399 A JP 2008160399A JP 2006346016 A JP2006346016 A JP 2006346016A JP 2006346016 A JP2006346016 A JP 2006346016A JP 2008160399 A JP2008160399 A JP 2008160399A
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- Prior art keywords
- power
- signal
- system reset
- memory system
- sequence
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Classifications
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
- G11C16/20—Initialising; Data preset; Chip identification
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/30—Power supply circuits
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/32—Timing circuits
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
- G11C5/143—Detection of memory cassette insertion or removal; Continuity checks of supply or ground lines; Detection of supply variations, interruptions or levels ; Switching between alternative supplies
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/20—Memory cell initialisation circuits, e.g. when powering up or down, memory clear, latent image memory
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management
- G11C7/222—Clock generating, synchronizing or distributing circuits within memory device
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- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Electronic Switches (AREA)
- Read Only Memory (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Abstract
【解決手段】電源投入時から電源電圧が所定の電圧に達するまでの間、メモリシステム内で発生している動作シーケンスを終了させる処理を繰り返し行うシーケンス終了手段10、20、30、41及び42と、動作シーケンスが終了したとき、メモリシステム50のシステムリセットを行うシステムリセット手段43とを備え、システムリセット手段43は、電源電圧が所定の電圧に達したときにシステムリセットを解除する。
【選択図】 図1
Description
20 論理計数部
30 電圧検知部
40 制御部
41 トリガーパルス発生回路(トリガーパルス発生部)
42 メモリシステム制御手段(メモリシステム制御部)
43 システムリセット発生回路(システムリセット手段)
50 不揮発性メモリシステム
OSC クロック信号
COUNTER カウンター信号
PONRST 電圧検知信号
PONRST2 内部信号
TRG トリガー信号
HVCEN ステータス信号
system reset システムリセット信号
Claims (2)
- 半導体メモリシステムにおける電源投入時のパワーオンシステムリセット回路であって、
電源投入時から電源電圧が所定の電圧に達するまでの間、前記メモリシステム内で発生している動作シーケンスを終了させる処理を繰り返し行うシーケンス終了手段と、
前記動作シーケンスが終了したとき、前記メモリシステムのシステムリセットを行うシステムリセット手段と、を備え、
前記システムリセット手段は、前記電源電圧が所定の電圧に達したときにシステムリセットを解除することを特徴とするパワーオンシステムリセット回路。 - 前記シーケンス終了手段は、
基準クロックを発生する基準クロック発生部と、
前記基準クロックを計数して、カウンター信号を発生する論理計数部と、
前記電源投入後の電源電圧を検知して、電圧検知信号を発生する電圧検知部と、
前記論理計数部のカウンター信号と前記電圧検知信号とに基づいてトリガーパルス信号を周期的に発生するトリガーパルス発生回路と、
前記トリガーパルス信号に応じて前記メモリシステムの動作シーケンスを終了するメモリシステム制御部と、
を有することを特徴とする請求項1に記載のパワーオンシステムリセット回路。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006346016A JP5020623B2 (ja) | 2006-12-22 | 2006-12-22 | パワーオンシステムリセット回路 |
KR1020070133486A KR20080059049A (ko) | 2006-12-22 | 2007-12-18 | 반도체 메모리 장치의 파워 온 시스템 리셋 회로 및 그것의파워 온 리셋 방법 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006346016A JP5020623B2 (ja) | 2006-12-22 | 2006-12-22 | パワーオンシステムリセット回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2008160399A true JP2008160399A (ja) | 2008-07-10 |
JP5020623B2 JP5020623B2 (ja) | 2012-09-05 |
Family
ID=39660826
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2006346016A Active JP5020623B2 (ja) | 2006-12-22 | 2006-12-22 | パワーオンシステムリセット回路 |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP5020623B2 (ja) |
KR (1) | KR20080059049A (ja) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101145113B1 (ko) * | 2010-07-19 | 2012-05-14 | 국방과학연구소 | 컨트롤러를 위한 리셋회로 및 이를 이용한 리셋 방법 |
US10658052B2 (en) | 2018-05-14 | 2020-05-19 | Winbond Electronics Corp. | Semiconductor device |
KR20200097632A (ko) | 2019-02-07 | 2020-08-19 | 윈본드 일렉트로닉스 코포레이션 | 기준전압 발생회로, 파워 온 검출회로 및 반도체 장치 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2019056192A1 (zh) * | 2017-09-19 | 2019-03-28 | 深圳市汇顶科技股份有限公司 | 上电复位时间的测量方法及系统 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62145411A (ja) * | 1985-12-20 | 1987-06-29 | Fujitsu Ltd | システムリセツト制御方式 |
JP2001142792A (ja) * | 1999-11-17 | 2001-05-25 | Ricoh Co Ltd | リセット信号発生回路 |
JP2003050647A (ja) * | 2001-08-08 | 2003-02-21 | Mitsubishi Electric Corp | メモリ装置及びその保護方法 |
JP2003131951A (ja) * | 2001-10-19 | 2003-05-09 | Sanyo Electric Co Ltd | 不揮発性メモリの制御回路 |
JP2006191655A (ja) * | 1995-08-21 | 2006-07-20 | Matsushita Electric Ind Co Ltd | パワーオン・オフリセット回路及び半導体装置 |
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2006
- 2006-12-22 JP JP2006346016A patent/JP5020623B2/ja active Active
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2007
- 2007-12-18 KR KR1020070133486A patent/KR20080059049A/ko active IP Right Grant
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62145411A (ja) * | 1985-12-20 | 1987-06-29 | Fujitsu Ltd | システムリセツト制御方式 |
JP2006191655A (ja) * | 1995-08-21 | 2006-07-20 | Matsushita Electric Ind Co Ltd | パワーオン・オフリセット回路及び半導体装置 |
JP2001142792A (ja) * | 1999-11-17 | 2001-05-25 | Ricoh Co Ltd | リセット信号発生回路 |
JP2003050647A (ja) * | 2001-08-08 | 2003-02-21 | Mitsubishi Electric Corp | メモリ装置及びその保護方法 |
JP2003131951A (ja) * | 2001-10-19 | 2003-05-09 | Sanyo Electric Co Ltd | 不揮発性メモリの制御回路 |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101145113B1 (ko) * | 2010-07-19 | 2012-05-14 | 국방과학연구소 | 컨트롤러를 위한 리셋회로 및 이를 이용한 리셋 방법 |
US10658052B2 (en) | 2018-05-14 | 2020-05-19 | Winbond Electronics Corp. | Semiconductor device |
KR20200097632A (ko) | 2019-02-07 | 2020-08-19 | 윈본드 일렉트로닉스 코포레이션 | 기준전압 발생회로, 파워 온 검출회로 및 반도체 장치 |
US10990119B2 (en) | 2019-02-07 | 2021-04-27 | Winbond Electronics Corp. | Reference voltage generation circuit, power-on detection circuit, and semiconductor device for preventing internal circuit from operating incorrectly at low voltage |
Also Published As
Publication number | Publication date |
---|---|
KR20080059049A (ko) | 2008-06-26 |
JP5020623B2 (ja) | 2012-09-05 |
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