JP2008157971A5 - - Google Patents

Download PDF

Info

Publication number
JP2008157971A5
JP2008157971A5 JP2008075855A JP2008075855A JP2008157971A5 JP 2008157971 A5 JP2008157971 A5 JP 2008157971A5 JP 2008075855 A JP2008075855 A JP 2008075855A JP 2008075855 A JP2008075855 A JP 2008075855A JP 2008157971 A5 JP2008157971 A5 JP 2008157971A5
Authority
JP
Japan
Prior art keywords
clock signal
signal
system clock
generates
generator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
JP2008075855A
Other languages
English (en)
Japanese (ja)
Other versions
JP2008157971A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2008075855A priority Critical patent/JP2008157971A/ja
Priority claimed from JP2008075855A external-priority patent/JP2008157971A/ja
Publication of JP2008157971A publication Critical patent/JP2008157971A/ja
Publication of JP2008157971A5 publication Critical patent/JP2008157971A5/ja
Ceased legal-status Critical Current

Links

JP2008075855A 2005-03-03 2008-03-24 サンプリングタイミング信号発生器 Ceased JP2008157971A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2008075855A JP2008157971A (ja) 2005-03-03 2008-03-24 サンプリングタイミング信号発生器

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2005059282 2005-03-03
JP2008075855A JP2008157971A (ja) 2005-03-03 2008-03-24 サンプリングタイミング信号発生器

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP2006056374A Division JP4150402B2 (ja) 2005-03-03 2006-03-02 信号波形測定装置及び信号波形測定システム

Publications (2)

Publication Number Publication Date
JP2008157971A JP2008157971A (ja) 2008-07-10
JP2008157971A5 true JP2008157971A5 (enExample) 2009-07-02

Family

ID=36943640

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008075855A Ceased JP2008157971A (ja) 2005-03-03 2008-03-24 サンプリングタイミング信号発生器

Country Status (2)

Country Link
US (2) US7332916B2 (enExample)
JP (1) JP2008157971A (enExample)

Families Citing this family (44)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7338506B2 (en) * 2001-09-05 2008-03-04 Caro Nicholas C Scleral clip and procedures for using same
US7469199B2 (en) * 2006-04-06 2008-12-23 International Business Machines Corporation Apparatus and method for selectively monitoring multiple voltages in an IC or other electronic chip
JP2007303874A (ja) * 2006-05-09 2007-11-22 Fujitsu Ltd 電源センス回路，電源供給システム，及び集積回路
JP5038710B2 (ja) * 2006-12-28 2012-10-03 株式会社日立製作所 レベル変換回路
US7714635B2 (en) * 2007-02-06 2010-05-11 International Business Machines Corporation Digital adaptive voltage supply
US7936153B2 (en) * 2007-02-06 2011-05-03 International Business Machines Corporation On-chip adaptive voltage compensation
US7971035B2 (en) * 2007-02-06 2011-06-28 International Business Machines Corporation Using temperature data for instruction thread direction
US7865750B2 (en) 2007-02-06 2011-01-04 International Business Machines Corporation Fan speed control from adaptive voltage supply
US7779235B2 (en) 2007-02-06 2010-08-17 International Business Machines Corporation Using performance data for instruction thread direction
US8615767B2 (en) 2007-02-06 2013-12-24 International Business Machines Corporation Using IR drop data for instruction thread direction
US7560945B2 (en) 2007-02-06 2009-07-14 International Business Machines Corporation Integrated circuit failure prediction
US8022685B2 (en) * 2007-02-06 2011-09-20 International Business Machines Corporation Temperature dependent voltage source compensation
US7895454B2 (en) 2007-02-06 2011-02-22 International Business Machines Corporation Instruction dependent dynamic voltage compensation
US7573307B2 (en) * 2007-08-01 2009-08-11 Texas Instruments Incorporated Systems and methods for reduced area delay locked loop
US8005880B2 (en) * 2007-08-24 2011-08-23 International Business Machines Corporation Half width counting leading zero circuit
US8185572B2 (en) * 2007-08-24 2012-05-22 International Business Machines Corporation Data correction circuit
US7797131B2 (en) * 2007-08-24 2010-09-14 International Business Machines Corporation On-chip frequency response measurement
US7495479B1 (en) * 2007-09-13 2009-02-24 Faraday Technology Corp. Sample and hold circuit and related data signal detecting method utilizing sample and hold circuit
JP4773549B2 (ja) 2009-07-01 2011-09-14 株式会社半導体理工学研究センター タイミング信号発生回路
US8365024B2 (en) * 2010-02-26 2013-01-29 Honeywell International Inc. High integrity data bus fault detection using multiple signal components
US8054208B2 (en) 2010-03-30 2011-11-08 Honeywell International Inc. Re-configurable multipurpose analog interface
US8782299B2 (en) 2010-04-27 2014-07-15 Honeywell International Inc. Re-configurable multi-purpose digital interface
US8390324B2 (en) 2010-09-20 2013-03-05 Honeywell International Inc. Universal functionality module
JP5743063B2 (ja) * 2011-02-09 2015-07-01 ラピスセミコンダクタ株式会社 半導体集積回路、半導体チップ、及び半導体集積回路の設計手法
US8614571B2 (en) 2011-11-18 2013-12-24 Taiwan Semiconductor Manufacturing Co., Ltd. Apparatus and method for on-chip sampling of dynamic IR voltage drop
US8953364B2 (en) 2012-09-18 2015-02-10 Micron Technology, Inc. Voltage rail noise sensing circuit and method
US9316734B2 (en) * 2012-10-19 2016-04-19 The Curators Of The University Of Missouri Free-hand scanning and imaging
CN102928774B (zh) * 2012-11-15 2014-12-10 福建一丁芯光通信科技有限公司 用于混合信号集成电路的可测性电路
WO2014108742A1 (en) 2013-01-09 2014-07-17 Freescale Semiconductor, Inc. Method and apparatus for sampling a signal
US8981982B2 (en) * 2013-04-05 2015-03-17 Maxlinear, Inc. Multi-zone data converters
US8928506B2 (en) * 2013-04-09 2015-01-06 Maxlinear, Inc. Successive approximation analog-to-digital converter (ADC) with dynamic search algorithm
US9083376B2 (en) 2013-04-25 2015-07-14 Maxlinear, Inc. Successive approximation register analog-to-digital converter
US9599645B2 (en) * 2013-05-28 2017-03-21 Oracle International Corporation High speed clock cycle rate digital voltage monitor with triggered tracing for integrated circuits
KR101478920B1 (ko) * 2013-08-22 2015-01-02 인제대학교 산학협력단 탐침을 구비한 다기능 측정 및 파형발생 장치
US10135394B2 (en) * 2014-11-24 2018-11-20 Imec Vzw Low voltage supply amplifier and amplification method
US10161967B2 (en) * 2016-01-09 2018-12-25 Taiwan Semiconductor Manufacturing Co., Ltd. On-chip oscilloscope
US10305541B2 (en) * 2016-09-09 2019-05-28 Marvell World Trade Ltd. Reduction of far-end crosstalk in high-speed single-ended receivers
US10312892B2 (en) 2017-01-31 2019-06-04 International Business Machines Corporation On-chip waveform measurement
CN107255748A (zh) * 2017-06-16 2017-10-17 江苏理工学院 一种数字信号测量与发生仪
CN108061850A (zh) * 2017-12-19 2018-05-22 许昌学院 一种片上信号监测系统
CN111752794B (zh) * 2020-06-04 2022-08-12 Oppo广东移动通信有限公司 供电信息的采集方法、系统以及芯片
US10979059B1 (en) * 2020-10-26 2021-04-13 Ciena Corporation Successive approximation register analog to digital converter based phase-locked loop with programmable range
CN113467565B (zh) * 2021-07-08 2025-05-30 海宁奕斯伟计算技术有限公司 驱动系统、驱动方法、计算机系统和可读介质
CN118068063B (zh) * 2024-04-22 2024-06-21 普源精电科技股份有限公司 示波器

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6570944B2 (en) * 2001-06-25 2003-05-27 Rambus Inc. Apparatus for data recovery in a synchronous chip-to-chip system
US4799165A (en) * 1986-03-03 1989-01-17 Tektronix, Inc. Level detecting waveform sampling system
US5442352A (en) * 1994-01-14 1995-08-15 Motorola, Inc. Linear attenuator for current-mode digital-to-analog converter (DAC) or the like
JPH10123215A (ja) 1996-10-21 1998-05-15 Toshiba Microelectron Corp 半導体集積回路
JP4183859B2 (ja) 1999-09-02 2008-11-19 株式会社アドバンテスト 半導体基板試験装置
JP4571283B2 (ja) * 2000-08-10 2010-10-27 アンリツ株式会社 波形測定装置
US6604206B2 (en) * 2001-05-30 2003-08-05 Cicada Semiconductor Corporation Reduced GMII with internal timing compensation
JP3990123B2 (ja) * 2001-07-17 2007-10-10 日本電気株式会社 サンプラーおよび計測方法
JP3994713B2 (ja) * 2001-10-03 2007-10-24 日本電気株式会社 波形測定用半導体集積回路
US7309998B2 (en) * 2002-12-02 2007-12-18 Burns Lawrence M Process monitor for monitoring an integrated circuit chip
US20040113667A1 (en) * 2002-12-13 2004-06-17 Huawen Jin Delay locked loop with improved strobe skew control
JP4561188B2 (ja) * 2004-06-03 2010-10-13 セイコーエプソン株式会社 半導体装置、サンプリングパルス生成回路及び受信回路
US20060020412A1 (en) * 2004-07-23 2006-01-26 Bruensteiner Matthew M Analog waveform information from binary sampled measurements

Similar Documents

Publication Publication Date Title
JP2008157971A5 (enExample)
TW200636754A (en) Clock generator and clock duty cycle correction method
WO2010033436A3 (en) Techniques for generating fractional clock signals
JP2012147426A5 (ja) デジタル位相周波数検出器
JP5955764B2 (ja) 半導体装置のデータ出力タイミング制御回路
TW200713829A (en) Delay cell of voltage controlled delay line using digital and analog control scheme
JP2009542072A5 (enExample)
GB0906418D0 (en) Digital phase-locked loop architecture
WO2012121892A3 (en) Delay circuitry
WO2013032753A3 (en) Systems and methods for switched-inductor integrated voltage regulators
TW200746644A (en) Clock generator with variable delay clock and method thereof
TW200515710A (en) Delay locked loop and its control method
WO2009126374A3 (en) Agile high resolution arbitrary waveform generator with jitterless frequency stepping
TW201130229A (en) Delay locked loop and method of driving delay locked loop
JP2011055048A5 (enExample)
WO2009057289A1 (ja) スペクトラム拡散クロック発生装置
WO2011103602A3 (en) Clock synthesis systems, circuits and methods
JP2010252288A5 (enExample)
JP2014520436A5 (enExample)
JP2015527013A5 (enExample)
TW200737726A (en) Delay locked loop circuit and semiconductor integrated circuit device
TW200713322A (en) Delay locked loop circuit
GB201213601D0 (en) Phase- locked loop
WO2007006048A3 (en) Spread spectrum clock generator having an adjustable delay line
TW200736642A (en) Test equipment, test method and recording media