JP2008157971A5 - - Google Patents
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- JP2008157971A5 JP2008157971A5 JP2008075855A JP2008075855A JP2008157971A5 JP 2008157971 A5 JP2008157971 A5 JP 2008157971A5 JP 2008075855 A JP2008075855 A JP 2008075855A JP 2008075855 A JP2008075855 A JP 2008075855A JP 2008157971 A5 JP2008157971 A5 JP 2008157971A5
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- JP
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- Prior art keywords
- clock signal
- signal
- system clock
- generates
- generator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
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- 230000003111 delayed effect Effects 0.000 claims 3
- 238000005070 sampling Methods 0.000 claims 3
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 claims 2
- 239000003990 capacitor Substances 0.000 claims 1
Claims (1)
- 所定のシステムクロック信号及び所定のマスタクロック信号に基づいて、イネーブルタイミング制御信号を発生するサンプリングタイミング信号発生器であって、
上記サンプリングタイミング信号発生器は、
上記システムクロック信号に基づいて、上記システムクロック信号に同期して所定の基準バイアス電圧を発生して出力するレプリカＤＬＬ（Delayed Locked Loop）回路と、
上記基準バイアス電圧に対応する基準電流をｎ分の１（ここで、ｎは１以上の数である。）に分流してなる分流電流を発生し、上記発生された分流電流により出力負荷容量を充電する充電時間をｎ倍することにより当該ｎ倍の充電時間である遅延時間を生成し、上記マスタクロック信号を当該遅延時間だけ遅延させ、上記遅延させたマスタクロック信号をイネーブルタイミング制御信号として発生する遅延信号発生回路とを備え、
上記レプリカＤＬＬ回路は、上記遅延時間が上記システムクロック信号の周期に等しくなるように上記基準バイアス電圧を発生することにより、上記遅延信号発生回路は、上記イネーブルタイミング制御信号を発生することを特徴とするサンプリングタイミング信号発生器。
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008075855A JP2008157971A (ja) | 2005-03-03 | 2008-03-24 | サンプリングタイミング信号発生器 |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2005059282 | 2005-03-03 | ||
| JP2008075855A JP2008157971A (ja) | 2005-03-03 | 2008-03-24 | サンプリングタイミング信号発生器 |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2006056374A Division JP4150402B2 (ja) | 2005-03-03 | 2006-03-02 | 信号波形測定装置及び信号波形測定システム |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2008157971A JP2008157971A (ja) | 2008-07-10 |
| JP2008157971A5 true JP2008157971A5 (ja) | 2009-07-02 |
Family
ID=36943640
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008075855A Ceased JP2008157971A (ja) | 2005-03-03 | 2008-03-24 | サンプリングタイミング信号発生器 |
Country Status (2)
| Country | Link |
|---|---|
| US (2) | US7332916B2 (ja) |
| JP (1) | JP2008157971A (ja) |
Families Citing this family (43)
| Publication number | Priority date | Publication date | Assignee | Title |
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| JP2007303874A (ja) * | 2006-05-09 | 2007-11-22 | Fujitsu Ltd | 電源センス回路，電源供給システム，及び集積回路 |
| JP5038710B2 (ja) * | 2006-12-28 | 2012-10-03 | 株式会社日立製作所 | レベル変換回路 |
| US7865750B2 (en) * | 2007-02-06 | 2011-01-04 | International Business Machines Corporation | Fan speed control from adaptive voltage supply |
| US8022685B2 (en) * | 2007-02-06 | 2011-09-20 | International Business Machines Corporation | Temperature dependent voltage source compensation |
| US7971035B2 (en) * | 2007-02-06 | 2011-06-28 | International Business Machines Corporation | Using temperature data for instruction thread direction |
| US7714635B2 (en) * | 2007-02-06 | 2010-05-11 | International Business Machines Corporation | Digital adaptive voltage supply |
| US7936153B2 (en) * | 2007-02-06 | 2011-05-03 | International Business Machines Corporation | On-chip adaptive voltage compensation |
| US7560945B2 (en) | 2007-02-06 | 2009-07-14 | International Business Machines Corporation | Integrated circuit failure prediction |
| US7895454B2 (en) | 2007-02-06 | 2011-02-22 | International Business Machines Corporation | Instruction dependent dynamic voltage compensation |
| US7779235B2 (en) | 2007-02-06 | 2010-08-17 | International Business Machines Corporation | Using performance data for instruction thread direction |
| US8615767B2 (en) | 2007-02-06 | 2013-12-24 | International Business Machines Corporation | Using IR drop data for instruction thread direction |
| US7573307B2 (en) * | 2007-08-01 | 2009-08-11 | Texas Instruments Incorporated | Systems and methods for reduced area delay locked loop |
| US8185572B2 (en) * | 2007-08-24 | 2012-05-22 | International Business Machines Corporation | Data correction circuit |
| US7797131B2 (en) * | 2007-08-24 | 2010-09-14 | International Business Machines Corporation | On-chip frequency response measurement |
| US8005880B2 (en) * | 2007-08-24 | 2011-08-23 | International Business Machines Corporation | Half width counting leading zero circuit |
| US7495479B1 (en) * | 2007-09-13 | 2009-02-24 | Faraday Technology Corp. | Sample and hold circuit and related data signal detecting method utilizing sample and hold circuit |
| JP4773549B2 (ja) | 2009-07-01 | 2011-09-14 | 株式会社半導体理工学研究センター | タイミング信号発生回路 |
| US8365024B2 (en) * | 2010-02-26 | 2013-01-29 | Honeywell International Inc. | High integrity data bus fault detection using multiple signal components |
| US8054208B2 (en) | 2010-03-30 | 2011-11-08 | Honeywell International Inc. | Re-configurable multipurpose analog interface |
| US8782299B2 (en) | 2010-04-27 | 2014-07-15 | Honeywell International Inc. | Re-configurable multi-purpose digital interface |
| US8390324B2 (en) | 2010-09-20 | 2013-03-05 | Honeywell International Inc. | Universal functionality module |
| JP5743063B2 (ja) * | 2011-02-09 | 2015-07-01 | ラピスセミコンダクタ株式会社 | 半導体集積回路、半導体チップ、及び半導体集積回路の設計手法 |
| US8614571B2 (en) | 2011-11-18 | 2013-12-24 | Taiwan Semiconductor Manufacturing Co., Ltd. | Apparatus and method for on-chip sampling of dynamic IR voltage drop |
| US8953364B2 (en) | 2012-09-18 | 2015-02-10 | Micron Technology, Inc. | Voltage rail noise sensing circuit and method |
| US9316734B2 (en) * | 2012-10-19 | 2016-04-19 | The Curators Of The University Of Missouri | Free-hand scanning and imaging |
| CN102928774B (zh) * | 2012-11-15 | 2014-12-10 | 福建一丁芯光通信科技有限公司 | 用于混合信号集成电路的可测性电路 |
| US9906355B2 (en) | 2013-01-09 | 2018-02-27 | Nxp Usa, Inc. | On-die signal measurement circuit and method |
| US8981982B2 (en) * | 2013-04-05 | 2015-03-17 | Maxlinear, Inc. | Multi-zone data converters |
| US8928506B2 (en) | 2013-04-09 | 2015-01-06 | Maxlinear, Inc. | Successive approximation analog-to-digital converter (ADC) with dynamic search algorithm |
| US9083376B2 (en) | 2013-04-25 | 2015-07-14 | Maxlinear, Inc. | Successive approximation register analog-to-digital converter |
| US9599645B2 (en) * | 2013-05-28 | 2017-03-21 | Oracle International Corporation | High speed clock cycle rate digital voltage monitor with triggered tracing for integrated circuits |
| KR101478920B1 (ko) * | 2013-08-22 | 2015-01-02 | 인제대학교 산학협력단 | 탐침을 구비한 다기능 측정 및 파형발생 장치 |
| US10135394B2 (en) * | 2014-11-24 | 2018-11-20 | Imec Vzw | Low voltage supply amplifier and amplification method |
| US10161967B2 (en) | 2016-01-09 | 2018-12-25 | Taiwan Semiconductor Manufacturing Co., Ltd. | On-chip oscilloscope |
| US10305541B2 (en) * | 2016-09-09 | 2019-05-28 | Marvell World Trade Ltd. | Reduction of far-end crosstalk in high-speed single-ended receivers |
| US10312892B2 (en) | 2017-01-31 | 2019-06-04 | International Business Machines Corporation | On-chip waveform measurement |
| CN107255748A (zh) * | 2017-06-16 | 2017-10-17 | 江苏理工学院 | 一种数字信号测量与发生仪 |
| CN108061850A (zh) * | 2017-12-19 | 2018-05-22 | 许昌学院 | 一种片上信号监测系统 |
| CN111752794B (zh) * | 2020-06-04 | 2022-08-12 | Oppo广东移动通信有限公司 | 供电信息的采集方法、系统以及芯片 |
| US10979059B1 (en) * | 2020-10-26 | 2021-04-13 | Ciena Corporation | Successive approximation register analog to digital converter based phase-locked loop with programmable range |
| CN113467565A (zh) * | 2021-07-08 | 2021-10-01 | 海宁奕斯伟集成电路设计有限公司 | 驱动系统、驱动方法、计算机系统和可读介质 |
Family Cites Families (13)
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|---|---|---|---|---|
| US6570944B2 (en) * | 2001-06-25 | 2003-05-27 | Rambus Inc. | Apparatus for data recovery in a synchronous chip-to-chip system |
| US4799165A (en) * | 1986-03-03 | 1989-01-17 | Tektronix, Inc. | Level detecting waveform sampling system |
| US5442352A (en) * | 1994-01-14 | 1995-08-15 | Motorola, Inc. | Linear attenuator for current-mode digital-to-analog converter (DAC) or the like |
| JPH10123215A (ja) | 1996-10-21 | 1998-05-15 | Toshiba Microelectron Corp | 半導体集積回路 |
| JP4183859B2 (ja) | 1999-09-02 | 2008-11-19 | 株式会社アドバンテスト | 半導体基板試験装置 |
| JP4571283B2 (ja) * | 2000-08-10 | 2010-10-27 | アンリツ株式会社 | 波形測定装置 |
| US6604206B2 (en) * | 2001-05-30 | 2003-08-05 | Cicada Semiconductor Corporation | Reduced GMII with internal timing compensation |
| JP3990123B2 (ja) | 2001-07-17 | 2007-10-10 | 日本電気株式会社 | サンプラーおよび計測方法 |
| JP3994713B2 (ja) * | 2001-10-03 | 2007-10-24 | 日本電気株式会社 | 波形測定用半導体集積回路 |
| US7309998B2 (en) * | 2002-12-02 | 2007-12-18 | Burns Lawrence M | Process monitor for monitoring an integrated circuit chip |
| US20040113667A1 (en) * | 2002-12-13 | 2004-06-17 | Huawen Jin | Delay locked loop with improved strobe skew control |
| JP4561188B2 (ja) * | 2004-06-03 | 2010-10-13 | セイコーエプソン株式会社 | 半導体装置、サンプリングパルス生成回路及び受信回路 |
| US20060020412A1 (en) * | 2004-07-23 | 2006-01-26 | Bruensteiner Matthew M | Analog waveform information from binary sampled measurements |
-
2006
- 2006-03-03 US US11/366,835 patent/US7332916B2/en not_active Expired - Fee Related
-
2007
- 2007-07-13 US US11/826,271 patent/US7609100B2/en not_active Expired - Fee Related
-
2008
- 2008-03-24 JP JP2008075855A patent/JP2008157971A/ja not_active Ceased
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