WO2007099579A9 - Ｒａｍマクロ、そのタイミング生成回路 - Google Patents

Ｒａｍマクロ、そのタイミング生成回路 Download PDF

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Publication number
WO2007099579A9
WO2007099579A9 PCT/JP2006/303656 JP2006303656W WO2007099579A9 WO 2007099579 A9 WO2007099579 A9 WO 2007099579A9 JP 2006303656 W JP2006303656 W JP 2006303656W WO 2007099579 A9 WO2007099579 A9 WO 2007099579A9
Authority
WO
WIPO (PCT)
Prior art keywords
clock
test
generating circuit
timing generating
circuit
Prior art date
Application number
PCT/JP2006/303656
Other languages
English (en)
French (fr)
Other versions
WO2007099579A1 (ja
WO2007099579A8 (ja
Inventor
Kenji Ijitsu
Original Assignee
Fujitsu Ltd
Kenji Ijitsu
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd, Kenji Ijitsu filed Critical Fujitsu Ltd
Priority to JP2008502566A priority Critical patent/JP4957719B2/ja
Priority to DE602006015236T priority patent/DE602006015236D1/de
Priority to PCT/JP2006/303656 priority patent/WO2007099579A1/ja
Priority to EP06714793A priority patent/EP1990805B1/en
Publication of WO2007099579A1 publication Critical patent/WO2007099579A1/ja
Priority to US12/198,373 priority patent/US8000157B2/en
Publication of WO2007099579A8 publication Critical patent/WO2007099579A8/ja
Publication of WO2007099579A9 publication Critical patent/WO2007099579A9/ja

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/14—Implementation of control logic, e.g. test mode decoders
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/12015—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details comprising clock generation or timing circuitry
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger

Landscapes

  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Dram (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Static Random-Access Memory (AREA)

Abstract

　タイミング生成回路１３は、外部からの入力クロックＣＬＫを基に、制御クロック（１）、テストクロック（２）を生成して、テスト回路１４に出力する。制御クロック（１）は、クロックＣＬＫを基準として、所定量、位相を遅らせた信号となるが、この所定量は外部からのテスト信号によって設定・変更できる。テストクロック（２）はほぼクロックCLKの反転信号となる。テスト回路１４は、上記クロック（１）、（２）のどちらかを基に、各種制御信号(4)を生成して制御回路１２に分配する。テスト回路１４において上記クロック（１）、（２）のどちらかを選択するのかは、外部からのテスト信号によって設定できる。  
PCT/JP2006/303656 2006-02-28 2006-02-28 Ｒａｍマクロ、そのタイミング生成回路 WO2007099579A1 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2008502566A JP4957719B2 (ja) 2006-02-28 2006-02-28 Ｒａｍマクロ、そのタイミング生成回路
DE602006015236T DE602006015236D1 (de) 2006-02-28 2006-02-28 Ram-makro und timing-erzeugungsschaltung dafür
PCT/JP2006/303656 WO2007099579A1 (ja) 2006-02-28 2006-02-28 Ｒａｍマクロ、そのタイミング生成回路
EP06714793A EP1990805B1 (en) 2006-02-28 2006-02-28 Ram macro and timing generating circuit for same
US12/198,373 US8000157B2 (en) 2006-02-28 2008-08-26 RAM macro and timing generating circuit thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2006/303656 WO2007099579A1 (ja) 2006-02-28 2006-02-28 Ｒａｍマクロ、そのタイミング生成回路

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/198,373 Continuation US8000157B2 (en) 2006-02-28 2008-08-26 RAM macro and timing generating circuit thereof

Publications (3)

Publication Number Publication Date
WO2007099579A1 WO2007099579A1 (ja) 2007-09-07
WO2007099579A8 WO2007099579A8 (ja) 2008-09-18
WO2007099579A9 true WO2007099579A9 (ja) 2009-05-14

Family

ID=38458702

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2006/303656 WO2007099579A1 (ja) 2006-02-28 2006-02-28 Ｒａｍマクロ、そのタイミング生成回路

Country Status (5)

Country Link
US (1) US8000157B2 (ja)
EP (1) EP1990805B1 (ja)
JP (1) JP4957719B2 (ja)
DE (1) DE602006015236D1 (ja)
WO (1) WO2007099579A1 (ja)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5060794B2 (ja) * 2007-02-06 2012-10-31 株式会社リコー 半導体記憶装置
ATE541310T1 (de) 2007-10-09 2012-01-15 Fujitsu Ltd Integriertes halbleiterschaltungsbauelement
US7668037B2 (en) * 2007-11-06 2010-02-23 International Business Machines Corporation Storage array including a local clock buffer with programmable timing
US8332552B2 (en) * 2008-11-13 2012-12-11 International Business Machines Corporation Supporting multiple high bandwidth I/O controllers on a single chip
US8051228B2 (en) * 2008-11-13 2011-11-01 International Business Machines Corporation Physical interface macros (PHYS) supporting heterogeneous electrical properties
JP5539916B2 (ja) * 2011-03-04 2014-07-02 ルネサスエレクトロニクス株式会社 半導体装置
KR102392903B1 (ko) * 2017-10-23 2022-05-03 에스케이하이닉스 주식회사 반도체 메모리 장치 및 그의 동작 방법
US10983725B2 (en) * 2018-03-01 2021-04-20 Synopsys, Inc. Memory array architectures for memory queues
TWI744157B (zh) * 2020-12-31 2021-10-21 瑞昱半導體股份有限公司 內嵌式記憶體系統與記憶體測試方法

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Publication number Priority date Publication date Assignee Title
US4608669A (en) * 1984-05-18 1986-08-26 International Business Machines Corporation Self contained array timing
US4916670A (en) * 1988-02-02 1990-04-10 Fujitsu Limited Semiconductor memory device having function of generating write signal internally
JP2509275B2 (ja) * 1988-02-02 1996-06-19 富士通株式会社 半導体メモリ装置
JPH0752600B2 (ja) * 1988-09-27 1995-06-05 日本電気株式会社 半導体メモリ素子
JPH03230395A (ja) * 1990-02-02 1991-10-14 Hitachi Ltd スタティック型ｒａｍ
JPH04134695A (ja) * 1990-09-25 1992-05-08 Nec Corp 半導体メモリ
JPH0729375A (ja) * 1993-07-14 1995-01-31 Seiko Epson Corp 半導体記憶装置
JP3591887B2 (ja) * 1994-09-12 2004-11-24 富士通株式会社 半導体記憶装置
US5764592A (en) * 1996-12-21 1998-06-09 Sgs-Thomson Microelectronics, Inc. External write pulse control method and structure
JPH10283777A (ja) * 1997-04-04 1998-10-23 Mitsubishi Electric Corp Ｓｄｒａｍコアと論理回路を単一チップ上に混載した半導体集積回路装置およびｓｄｒａｍコアのテスト方法
JPH11144497A (ja) * 1997-11-13 1999-05-28 Mitsubishi Electric Corp 同期型半導体記憶装置
JP4301680B2 (ja) * 2000-02-29 2009-07-22 株式会社ルネサステクノロジ 半導体集積回路装置
JP2001307499A (ja) * 2000-04-24 2001-11-02 Nec Corp 半導体記憶装置
JP2002042466A (ja) * 2000-07-21 2002-02-08 Mitsubishi Electric Corp 半導体装置および半導体記憶装置
US6643807B1 (en) * 2000-08-01 2003-11-04 International Business Machines Corporation Array-built-in-self-test (ABIST) for efficient, fast, bitmapping of large embedded arrays in manufacturing test
US6829728B2 (en) * 2000-11-13 2004-12-07 Wu-Tung Cheng Full-speed BIST controller for testing embedded synchronous memories
JP2002298580A (ja) * 2001-03-28 2002-10-11 Mitsubishi Electric Corp 半導体記憶装置
JP2004022014A (ja) * 2002-06-13 2004-01-22 Nec Micro Systems Ltd 半導体装置およびそのテスト方法
JP2004158144A (ja) * 2002-11-07 2004-06-03 Renesas Technology Corp 半導体集積回路
JP2005141817A (ja) * 2003-11-05 2005-06-02 Toshiba Corp 半導体集積回路
KR100583152B1 (ko) * 2004-02-19 2006-05-23 주식회사 하이닉스반도체 데이터 억세스타임 측정모드를 갖는 반도체 메모리 소자

Also Published As

Publication number Publication date
EP1990805A4 (en) 2009-06-10
US8000157B2 (en) 2011-08-16
EP1990805B1 (en) 2010-06-30
JPWO2007099579A1 (ja) 2009-07-16
EP1990805A1 (en) 2008-11-12
WO2007099579A1 (ja) 2007-09-07
DE602006015236D1 (de) 2010-08-12
US20090059713A1 (en) 2009-03-05
JP4957719B2 (ja) 2012-06-20
WO2007099579A8 (ja) 2008-09-18

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