JP2008151715A5 - - Google Patents

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Publication number
JP2008151715A5
JP2008151715A5 JP2006341934A JP2006341934A JP2008151715A5 JP 2008151715 A5 JP2008151715 A5 JP 2008151715A5 JP 2006341934 A JP2006341934 A JP 2006341934A JP 2006341934 A JP2006341934 A JP 2006341934A JP 2008151715 A5 JP2008151715 A5 JP 2008151715A5
Authority
JP
Japan
Prior art keywords
control circuit
inspection
electronic
circuits
electronic device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2006341934A
Other languages
English (en)
Japanese (ja)
Other versions
JP2008151715A (ja
JP4974665B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2006341934A priority Critical patent/JP4974665B2/ja
Priority claimed from JP2006341934A external-priority patent/JP4974665B2/ja
Priority to US11/956,411 priority patent/US8228070B2/en
Publication of JP2008151715A publication Critical patent/JP2008151715A/ja
Publication of JP2008151715A5 publication Critical patent/JP2008151715A5/ja
Application granted granted Critical
Publication of JP4974665B2 publication Critical patent/JP4974665B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2006341934A 2006-12-19 2006-12-19 電子装置 Expired - Fee Related JP4974665B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2006341934A JP4974665B2 (ja) 2006-12-19 2006-12-19 電子装置
US11/956,411 US8228070B2 (en) 2006-12-19 2007-12-14 Electronic apparatus and control method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006341934A JP4974665B2 (ja) 2006-12-19 2006-12-19 電子装置

Publications (3)

Publication Number Publication Date
JP2008151715A JP2008151715A (ja) 2008-07-03
JP2008151715A5 true JP2008151715A5 (https=) 2010-02-04
JP4974665B2 JP4974665B2 (ja) 2012-07-11

Family

ID=39526347

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006341934A Expired - Fee Related JP4974665B2 (ja) 2006-12-19 2006-12-19 電子装置

Country Status (2)

Country Link
US (1) US8228070B2 (https=)
JP (1) JP4974665B2 (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4816775B2 (ja) 2009-07-31 2011-11-16 ブラザー工業株式会社 画像形成装置およびその検査方法
JP5606503B2 (ja) * 2012-08-31 2014-10-15 京セラドキュメントソリューションズ株式会社 梱包済画像形成装置及び被梱包装置診断システム
JP2015031890A (ja) * 2013-08-06 2015-02-16 株式会社リコー 異常監視システム及び画像形成装置

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6304987B1 (en) * 1995-06-07 2001-10-16 Texas Instruments Incorporated Integrated test circuit
JPH04368875A (ja) 1991-06-15 1992-12-21 Ricoh Co Ltd 異常検出装置
US5617021A (en) * 1992-07-23 1997-04-01 Xilinx, Inc. High speed post-programming net verification method
JP3288848B2 (ja) * 1994-03-28 2002-06-04 旭光学工業株式会社 ユニット検出装置
JPH0895442A (ja) 1994-09-29 1996-04-12 Canon Inc 画像形成装置
JPH10132901A (ja) 1996-10-30 1998-05-22 Ricoh Co Ltd 画像形成装置
US5900875A (en) * 1997-01-29 1999-05-04 3Com Corporation Method and apparatus for interacting with a portable computer system
US6104198A (en) * 1997-05-20 2000-08-15 Zen Licensing Group Llp Testing the integrity of an electrical connection to a device using an onboard controllable signal source
JPH11118864A (ja) * 1997-10-17 1999-04-30 Canon Inc 回路網接続状態の自己診断方式
US6124715A (en) * 1998-04-13 2000-09-26 Lucent Technologies, Inc. Testing of live circuit boards
TW484016B (en) * 1999-07-28 2002-04-21 Hitachi Ltd Semiconductor integrated circuit and recording medium
KR20020008158A (ko) * 2000-02-23 2002-01-29 롤페스 요하네스 게라투스 알베르투스 테스트 인터페이스를 가지는 집적 회로 및 집적 회로테스트 방법
JP4304868B2 (ja) * 2001-02-05 2009-07-29 コニカミノルタホールディングス株式会社 メモリ装置を有する画像形成装置及び判断処理方法
JP2002286782A (ja) 2001-03-23 2002-10-03 Canon Inc 故障検知装置及びそれを備えた画像形成装置
JP2003014819A (ja) * 2001-07-03 2003-01-15 Matsushita Electric Ind Co Ltd 半導体配線基板，半導体デバイス，半導体デバイスのテスト方法及びその実装方法
US7071705B2 (en) * 2004-01-08 2006-07-04 Panduit Corp. Apparatus and method for communications testing
JP4157066B2 (ja) * 2004-03-29 2008-09-24 株式会社東芝 半導体集積回路
US7424348B2 (en) * 2004-06-28 2008-09-09 Micrel, Incorporated System and method for monitoring serially-connected devices
US8135959B2 (en) * 2006-04-07 2012-03-13 Honeywell International Inc. External key to provide protection to devices
US7620864B2 (en) * 2006-10-26 2009-11-17 International Business Machines Corporation Method and apparatus for controlling access to and/or exit from a portion of scan chain

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