JP2004212984A5 - - Google Patents

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Publication number
JP2004212984A5
JP2004212984A5 JP2003421714A JP2003421714A JP2004212984A5 JP 2004212984 A5 JP2004212984 A5 JP 2004212984A5 JP 2003421714 A JP2003421714 A JP 2003421714A JP 2003421714 A JP2003421714 A JP 2003421714A JP 2004212984 A5 JP2004212984 A5 JP 2004212984A5
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Japan
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input
input nand
wirings
series
nand circuits
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JP2003421714A
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English (en)
Japanese (ja)
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JP4494001B2 (ja
JP2004212984A (ja
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Priority to JP2003421714A priority Critical patent/JP4494001B2/ja
Priority claimed from JP2003421714A external-priority patent/JP4494001B2/ja
Publication of JP2004212984A publication Critical patent/JP2004212984A/ja
Publication of JP2004212984A5 publication Critical patent/JP2004212984A5/ja
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Publication of JP4494001B2 publication Critical patent/JP4494001B2/ja
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Expired - Fee Related legal-status Critical Current

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JP2003421714A 2002-12-18 2003-12-18 表示装置の検査方法 Expired - Fee Related JP4494001B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2003421714A JP4494001B2 (ja) 2002-12-18 2003-12-18 表示装置の検査方法

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2002366803 2002-12-18
JP2003421714A JP4494001B2 (ja) 2002-12-18 2003-12-18 表示装置の検査方法

Publications (3)

Publication Number Publication Date
JP2004212984A JP2004212984A (ja) 2004-07-29
JP2004212984A5 true JP2004212984A5 (https=) 2007-02-08
JP4494001B2 JP4494001B2 (ja) 2010-06-30

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ID=32828774

Family Applications (1)

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JP2003421714A Expired - Fee Related JP4494001B2 (ja) 2002-12-18 2003-12-18 表示装置の検査方法

Country Status (1)

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JP (1) JP4494001B2 (https=)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4864306B2 (ja) * 2004-09-27 2012-02-01 富士通セミコンダクター株式会社 半導体装置およびその試験方法
JP2006171386A (ja) * 2004-12-16 2006-06-29 Seiko Epson Corp 電気光学装置および電子機器
JP4600147B2 (ja) * 2005-05-20 2010-12-15 エプソンイメージングデバイス株式会社 検査回路、電気光学装置および電子機器
JP2008083529A (ja) * 2006-09-28 2008-04-10 Seiko Epson Corp アクティブマトリクス基板、アクティブマトリクス基板の検査方法および電気光学装置
KR100822208B1 (ko) * 2006-11-10 2008-04-17 삼성에스디아이 주식회사 점등 테스트 기능을 구비한 평판 표시장치
KR102352610B1 (ko) * 2015-05-29 2022-01-19 엘지디스플레이 주식회사 드라이버집적회로 및 표시장치
JP2017181574A (ja) * 2016-03-28 2017-10-05 株式会社ジャパンディスプレイ 表示装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH085709A (ja) * 1994-06-22 1996-01-12 Kawasaki Steel Corp 半導体集積回路
JP3317384B2 (ja) * 1996-02-14 2002-08-26 川崎マイクロエレクトロニクス株式会社 集積回路テスト方法
JP3263365B2 (ja) * 1998-07-27 2002-03-04 松下電器産業株式会社 液晶表示パネルおよびその検査方法
JP4276373B2 (ja) * 2000-12-07 2009-06-10 セイコーエプソン株式会社 電気光学装置の検査用回路、電気光学装置および電子機器

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