JP2004212984A5 - - Google Patents
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- Publication number
- JP2004212984A5 JP2004212984A5 JP2003421714A JP2003421714A JP2004212984A5 JP 2004212984 A5 JP2004212984 A5 JP 2004212984A5 JP 2003421714 A JP2003421714 A JP 2003421714A JP 2003421714 A JP2003421714 A JP 2003421714A JP 2004212984 A5 JP2004212984 A5 JP 2004212984A5
- Authority
- JP
- Japan
- Prior art keywords
- input
- input nand
- wirings
- series
- nand circuits
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000007689 inspection Methods 0.000 claims 12
- 238000000034 method Methods 0.000 claims 6
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003421714A JP4494001B2 (ja) | 2002-12-18 | 2003-12-18 | 表示装置の検査方法 |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2002366803 | 2002-12-18 | ||
| JP2003421714A JP4494001B2 (ja) | 2002-12-18 | 2003-12-18 | 表示装置の検査方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2004212984A JP2004212984A (ja) | 2004-07-29 |
| JP2004212984A5 true JP2004212984A5 (https=) | 2007-02-08 |
| JP4494001B2 JP4494001B2 (ja) | 2010-06-30 |
Family
ID=32828774
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2003421714A Expired - Fee Related JP4494001B2 (ja) | 2002-12-18 | 2003-12-18 | 表示装置の検査方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP4494001B2 (https=) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4864306B2 (ja) * | 2004-09-27 | 2012-02-01 | 富士通セミコンダクター株式会社 | 半導体装置およびその試験方法 |
| JP2006171386A (ja) * | 2004-12-16 | 2006-06-29 | Seiko Epson Corp | 電気光学装置および電子機器 |
| JP4600147B2 (ja) * | 2005-05-20 | 2010-12-15 | エプソンイメージングデバイス株式会社 | 検査回路、電気光学装置および電子機器 |
| JP2008083529A (ja) * | 2006-09-28 | 2008-04-10 | Seiko Epson Corp | アクティブマトリクス基板、アクティブマトリクス基板の検査方法および電気光学装置 |
| KR100822208B1 (ko) * | 2006-11-10 | 2008-04-17 | 삼성에스디아이 주식회사 | 점등 테스트 기능을 구비한 평판 표시장치 |
| KR102352610B1 (ko) * | 2015-05-29 | 2022-01-19 | 엘지디스플레이 주식회사 | 드라이버집적회로 및 표시장치 |
| JP2017181574A (ja) * | 2016-03-28 | 2017-10-05 | 株式会社ジャパンディスプレイ | 表示装置 |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH085709A (ja) * | 1994-06-22 | 1996-01-12 | Kawasaki Steel Corp | 半導体集積回路 |
| JP3317384B2 (ja) * | 1996-02-14 | 2002-08-26 | 川崎マイクロエレクトロニクス株式会社 | 集積回路テスト方法 |
| JP3263365B2 (ja) * | 1998-07-27 | 2002-03-04 | 松下電器産業株式会社 | 液晶表示パネルおよびその検査方法 |
| JP4276373B2 (ja) * | 2000-12-07 | 2009-06-10 | セイコーエプソン株式会社 | 電気光学装置の検査用回路、電気光学装置および電子機器 |
-
2003
- 2003-12-18 JP JP2003421714A patent/JP4494001B2/ja not_active Expired - Fee Related
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