JP2007538376A5 - - Google Patents
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- Publication number
- JP2007538376A5 JP2007538376A5 JP2007527397A JP2007527397A JP2007538376A5 JP 2007538376 A5 JP2007538376 A5 JP 2007538376A5 JP 2007527397 A JP2007527397 A JP 2007527397A JP 2007527397 A JP2007527397 A JP 2007527397A JP 2007538376 A5 JP2007538376 A5 JP 2007538376A5
- Authority
- JP
- Japan
- Prior art keywords
- liner
- anode
- ion source
- electron
- source assembly
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 150000002500 ions Chemical class 0.000 claims 34
- 238000003780 insertion Methods 0.000 claims 12
- 230000037431 insertion Effects 0.000 claims 12
- 238000000034 method Methods 0.000 claims 8
- 239000004020 conductor Substances 0.000 claims 4
- 238000009825 accumulation Methods 0.000 claims 1
- 230000015556 catabolic process Effects 0.000 claims 1
- 239000003153 chemical reaction reagent Substances 0.000 claims 1
- 238000006731 degradation reaction Methods 0.000 claims 1
- 238000010894 electron beam technology Methods 0.000 claims 1
- 238000000605 extraction Methods 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 claims 1
- 230000035945 sensitivity Effects 0.000 claims 1
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/849,765 US7041984B2 (en) | 2004-05-20 | 2004-05-20 | Replaceable anode liner for ion source |
| PCT/US2005/017340 WO2005114701A2 (en) | 2004-05-20 | 2005-05-18 | Replaceable anode liner for ion source |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2007538376A JP2007538376A (ja) | 2007-12-27 |
| JP2007538376A5 true JP2007538376A5 (enExample) | 2008-07-10 |
Family
ID=35150670
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007527397A Pending JP2007538376A (ja) | 2004-05-20 | 2005-05-18 | イオン源のための置き換え可能な陽極ライナー |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US7041984B2 (enExample) |
| JP (1) | JP2007538376A (enExample) |
| DE (1) | DE112005001120T5 (enExample) |
| GB (1) | GB2434027B (enExample) |
| WO (1) | WO2005114701A2 (enExample) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007157529A (ja) * | 2005-12-06 | 2007-06-21 | Ulvac Japan Ltd | 四極子形質量分析計用イオン源 |
| US20090014644A1 (en) * | 2007-07-13 | 2009-01-15 | Inficon, Inc. | In-situ ion source cleaning for partial pressure analyzers used in process monitoring |
| US7709790B2 (en) * | 2008-04-01 | 2010-05-04 | Thermo Finnigan Llc | Removable ion source that does not require venting of the vacuum chamber |
| US8117987B2 (en) * | 2009-09-18 | 2012-02-21 | Applied Materials, Inc. | Hot wire chemical vapor deposition (CVD) inline coating tool |
| AU2010303358B2 (en) | 2009-10-08 | 2016-04-21 | Perkinelmer U.S. Llc | Coupling devices and methods of using them |
| JP2014086137A (ja) * | 2012-10-19 | 2014-05-12 | Ran Technical Service Kk | コールドカソード型イオン源 |
| KR101366781B1 (ko) * | 2012-11-12 | 2014-02-21 | 한국표준과학연구원 | 이온원 및 이를 구비하는 질량분석장치 |
| TWI654695B (zh) | 2012-12-06 | 2019-03-21 | 英福康公司 | 真空工具及測量該真空工具的客真空室中的氛圍的方法 |
| TWI539154B (zh) | 2012-12-19 | 2016-06-21 | 英福康公司 | 雙重偵測殘餘氣體分析器 |
| GB201810823D0 (en) | 2018-06-01 | 2018-08-15 | Micromass Ltd | An inner source assembly and associated components |
| US20250360603A1 (en) * | 2024-05-21 | 2025-11-27 | Thermo Finnigan Llc | Module installation tools and associated methods |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2610165C2 (de) * | 1976-03-11 | 1983-11-10 | Gesellschaft für Schwerionenforschung mbH, 6100 Darmstadt | Duoplasmatron-Ionenquelle zur Erzeugung mehrfach geladener Ionen |
| NL7902620A (nl) * | 1978-04-05 | 1979-10-09 | Atomic Energy Authority Uk | Ionenbron. |
| JPH0855602A (ja) * | 1994-08-16 | 1996-02-27 | Jeol Ltd | 質量分析装置用イオン源チャンバ |
| US5506412A (en) * | 1994-12-16 | 1996-04-09 | Buttrill, Jr.; Sidney E. | Means for reducing the contamination of mass spectrometer leak detection ion sources |
| JPH09219169A (ja) * | 1996-02-09 | 1997-08-19 | Nissin Electric Co Ltd | イオン源 |
| US5889281A (en) * | 1997-03-21 | 1999-03-30 | Leybold Inficon, Inc. | Method for linearization of ion currents in a quadrupole mass analyzer |
| GB9722649D0 (en) * | 1997-10-24 | 1997-12-24 | Univ Nanyang | Cathode ARC source for metallic and dielectric coatings |
| US6064156A (en) * | 1998-09-14 | 2000-05-16 | The United States Of America As Represented By The Administrator Of Nasa | Process for ignition of gaseous electrical discharge between electrodes of a hollow cathode assembly |
| KR20010014842A (ko) * | 1999-04-30 | 2001-02-26 | 조셉 제이. 스위니 | 반도체 장치를 제조하기 위한 장치 및 방법 |
| US6765216B2 (en) * | 2002-03-04 | 2004-07-20 | Atomic Hydrogen Technologies Ltd. | Method and apparatus for producing atomic flows of molecular gases |
-
2004
- 2004-05-20 US US10/849,765 patent/US7041984B2/en not_active Expired - Lifetime
-
2005
- 2005-05-18 DE DE112005001120T patent/DE112005001120T5/de not_active Withdrawn
- 2005-05-18 WO PCT/US2005/017340 patent/WO2005114701A2/en not_active Ceased
- 2005-05-18 JP JP2007527397A patent/JP2007538376A/ja active Pending
- 2005-05-18 GB GB0622336A patent/GB2434027B/en not_active Expired - Fee Related
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