JP2007277723A - 反応炉に均一な気体運搬を行う方法および装置 - Google Patents
反応炉に均一な気体運搬を行う方法および装置 Download PDFInfo
- Publication number
- JP2007277723A JP2007277723A JP2007099449A JP2007099449A JP2007277723A JP 2007277723 A JP2007277723 A JP 2007277723A JP 2007099449 A JP2007099449 A JP 2007099449A JP 2007099449 A JP2007099449 A JP 2007099449A JP 2007277723 A JP2007277723 A JP 2007277723A
- Authority
- JP
- Japan
- Prior art keywords
- gas
- orifice
- gas source
- reactor
- source orifice
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45565—Shower nozzles
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45544—Atomic layer deposition [ALD] characterized by the apparatus
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45574—Nozzles for more than one gas
Landscapes
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
- Feeding, Discharge, Calcimining, Fusing, And Gas-Generation Devices (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/278,700 US20070234956A1 (en) | 2006-04-05 | 2006-04-05 | Method and apparatus for providing uniform gas delivery to a reactor |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2007277723A true JP2007277723A (ja) | 2007-10-25 |
| JP2007277723A5 JP2007277723A5 (enExample) | 2010-05-20 |
Family
ID=38254883
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007099449A Pending JP2007277723A (ja) | 2006-04-05 | 2007-04-05 | 反応炉に均一な気体運搬を行う方法および装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (3) | US20070234956A1 (enExample) |
| EP (1) | EP1842938A3 (enExample) |
| JP (1) | JP2007277723A (enExample) |
| KR (1) | KR101373828B1 (enExample) |
| CN (1) | CN101050524A (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2018135603A (ja) * | 2018-03-22 | 2018-08-30 | プラサド ナーハー ガジル | セラミック薄膜の低温堆積方法 |
Families Citing this family (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20100037820A1 (en) * | 2008-08-13 | 2010-02-18 | Synos Technology, Inc. | Vapor Deposition Reactor |
| EP3471130A1 (en) * | 2008-12-04 | 2019-04-17 | Veeco Instruments Inc. | Chemical vapor deposition flow inlet elements and methods |
| US8257799B2 (en) | 2009-02-23 | 2012-09-04 | Synos Technology, Inc. | Method for forming thin film using radicals generated by plasma |
| US8758512B2 (en) | 2009-06-08 | 2014-06-24 | Veeco Ald Inc. | Vapor deposition reactor and method for forming thin film |
| FI124113B (fi) * | 2010-08-30 | 2014-03-31 | Beneq Oy | Laitteisto ja menetelmä substraatin pinnan muokkaamiseksi |
| EP2481833A1 (en) * | 2011-01-31 | 2012-08-01 | Nederlandse Organisatie voor toegepast -natuurwetenschappelijk onderzoek TNO | Apparatus for atomic layer deposition |
| US8840958B2 (en) | 2011-02-14 | 2014-09-23 | Veeco Ald Inc. | Combined injection module for sequentially injecting source precursor and reactant precursor |
| US8877300B2 (en) | 2011-02-16 | 2014-11-04 | Veeco Ald Inc. | Atomic layer deposition using radicals of gas mixture |
| US9163310B2 (en) | 2011-02-18 | 2015-10-20 | Veeco Ald Inc. | Enhanced deposition of layer on substrate using radicals |
| US11326255B2 (en) | 2013-02-07 | 2022-05-10 | Uchicago Argonne, Llc | ALD reactor for coating porous substrates |
| US9334566B2 (en) * | 2013-11-25 | 2016-05-10 | Lam Research Corporation | Multi-tray ballast vapor draw systems |
| US10082461B2 (en) * | 2014-07-29 | 2018-09-25 | Nanometrics Incorporated | Optical metrology with purged reference chip |
| US10451542B2 (en) | 2017-12-05 | 2019-10-22 | Nanometrics Incorporated | Local purge within metrology and inspection systems |
| FI128427B (en) * | 2018-04-12 | 2020-05-15 | Beneq Oy | Nozzle head and device |
| FI129731B (en) * | 2018-04-16 | 2022-08-15 | Beneq Oy | Nozzle head, apparatus and method |
| CN108950546B (zh) * | 2018-10-08 | 2023-06-02 | 福建工程学院 | 一种预置激光熔覆保护气充盈装置 |
| DE102019119019A1 (de) | 2019-07-12 | 2021-01-14 | Aixtron Se | Gaseinlassorgan für einen CVD-Reaktor |
| US11111578B1 (en) | 2020-02-13 | 2021-09-07 | Uchicago Argonne, Llc | Atomic layer deposition of fluoride thin films |
| US12065738B2 (en) | 2021-10-22 | 2024-08-20 | Uchicago Argonne, Llc | Method of making thin films of sodium fluorides and their derivatives by ALD |
| US20230212747A1 (en) * | 2021-12-31 | 2023-07-06 | Applied Materials, Inc. | Apparatus and Methods for Self-Assembled Monolayer (SAM) Deposition in Semiconductor Equipment |
| US11901169B2 (en) | 2022-02-14 | 2024-02-13 | Uchicago Argonne, Llc | Barrier coatings |
| CN118007093B (zh) * | 2024-02-19 | 2024-07-26 | 江苏协鑫特种材料科技有限公司 | 一种用于碳化硅涂层生产的沉积炉进气结构 |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6179773A (ja) * | 1984-09-27 | 1986-04-23 | Fujitsu Ltd | Cvd装置 |
| JPS6345374A (ja) * | 1986-08-12 | 1988-02-26 | Canon Inc | 機能性堆積膜形成装置 |
| US4829021A (en) * | 1986-12-12 | 1989-05-09 | Daido Sanso K.K. | Process for vacuum chemical epitaxy |
| JPH02114530A (ja) * | 1988-10-25 | 1990-04-26 | Mitsubishi Electric Corp | 薄膜形成装置 |
| JP2001254181A (ja) * | 2000-01-06 | 2001-09-18 | Tokyo Electron Ltd | 成膜装置および成膜方法 |
| JP2002053963A (ja) * | 2000-07-22 | 2002-02-19 | Ips Ltd | クリーニング装置を備えたald薄膜蒸着装置及びそのクリーニング方法 |
| JP2002511905A (ja) * | 1997-06-30 | 2002-04-16 | ラム リサーチ コーポレイション | プラズマ処理装置のガス噴射システム |
| JP2003188104A (ja) * | 2001-12-14 | 2003-07-04 | Fuji Xerox Co Ltd | 窒化物半導体の製造装置、窒化物半導体の製造方法、及びリモートプラズマ装置 |
| JP2005175242A (ja) * | 2003-12-12 | 2005-06-30 | Mitsubishi Heavy Ind Ltd | 薄膜作製装置及び薄膜作製方法 |
| JP2005268651A (ja) * | 2004-03-19 | 2005-09-29 | Advanced Lcd Technologies Development Center Co Ltd | 絶縁膜の形成方法及び絶縁膜形成装置 |
Family Cites Families (34)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3721637A1 (de) * | 1987-06-30 | 1989-01-12 | Aixtron Gmbh | Gaseinlass fuer eine mehrzahl verschiedener reaktionsgase in reaktionsgefaesse |
| US5387289A (en) * | 1992-09-22 | 1995-02-07 | Genus, Inc. | Film uniformity by selective pressure gradient control |
| DE4326697C2 (de) | 1993-08-09 | 2002-12-05 | Aixtron Gmbh | Vorrichtung zum Einlassen wenigstens eines Gases und deren Verwendung |
| GB9411911D0 (en) * | 1994-06-14 | 1994-08-03 | Swan Thomas & Co Ltd | Improvements in or relating to chemical vapour deposition |
| DE19540771A1 (de) * | 1995-11-02 | 1997-05-07 | Hertz Inst Heinrich | Gaseinlaßvorrichtung für eine Beschichtungsanlage |
| EP0989256B1 (de) * | 1998-09-23 | 2003-11-19 | 3S Systemtechnik Ag | Arbeitsverfahren und Reinigungsgerät zum Reinigen eines Schwimmbeckens |
| KR100331544B1 (ko) * | 1999-01-18 | 2002-04-06 | 윤종용 | 반응챔버에 가스를 유입하는 방법 및 이에 사용되는 샤워헤드 |
| US6309465B1 (en) * | 1999-02-18 | 2001-10-30 | Aixtron Ag. | CVD reactor |
| US6540838B2 (en) * | 2000-11-29 | 2003-04-01 | Genus, Inc. | Apparatus and concept for minimizing parasitic chemical vapor deposition during atomic layer deposition |
| US6206972B1 (en) * | 1999-07-08 | 2001-03-27 | Genus, Inc. | Method and apparatus for providing uniform gas delivery to substrates in CVD and PECVD processes |
| JP4487338B2 (ja) * | 1999-08-31 | 2010-06-23 | 東京エレクトロン株式会社 | 成膜処理装置及び成膜処理方法 |
| KR20010062209A (ko) * | 1999-12-10 | 2001-07-07 | 히가시 데쓰로 | 고내식성 막이 내부에 형성된 챔버를 구비하는 처리 장치 |
| US6576062B2 (en) * | 2000-01-06 | 2003-06-10 | Tokyo Electron Limited | Film forming apparatus and film forming method |
| ATE249532T1 (de) * | 2000-02-04 | 2003-09-15 | Aixtron Ag | Vorrichtung und verfahren zum abscheiden einer oder mehrerer schichten auf ein substrat |
| KR100363088B1 (ko) * | 2000-04-20 | 2002-12-02 | 삼성전자 주식회사 | 원자층 증착방법을 이용한 장벽 금속막의 제조방법 |
| KR100458982B1 (ko) * | 2000-08-09 | 2004-12-03 | 주성엔지니어링(주) | 회전형 가스분사기를 가지는 반도체소자 제조장치 및 이를이용한 박막증착방법 |
| DE10064944A1 (de) * | 2000-09-22 | 2002-04-11 | Aixtron Ag | Verfahren zum Abscheiden von insbesondere kristallinen Schichten, Gaseinlassorgan sowie Vorrichtung zur Durchführung des Verfahrens |
| EP1322801B1 (de) * | 2000-09-22 | 2010-01-06 | Aixtron Ag | Cvd-verfahren und gaseinlassorgan zur durchführung des verfahrens |
| US7780785B2 (en) * | 2001-10-26 | 2010-08-24 | Applied Materials, Inc. | Gas delivery apparatus for atomic layer deposition |
| US6821891B2 (en) * | 2001-11-16 | 2004-11-23 | Applied Materials, Inc. | Atomic layer deposition of copper using a reducing gas and non-fluorinated copper precursors |
| US6773507B2 (en) * | 2001-12-06 | 2004-08-10 | Applied Materials, Inc. | Apparatus and method for fast-cycle atomic layer deposition |
| US6911391B2 (en) * | 2002-01-26 | 2005-06-28 | Applied Materials, Inc. | Integration of titanium and titanium nitride layers |
| US20050081788A1 (en) * | 2002-03-15 | 2005-04-21 | Holger Jurgensen | Device for depositing thin layers on a substrate |
| US6846516B2 (en) * | 2002-04-08 | 2005-01-25 | Applied Materials, Inc. | Multiple precursor cyclical deposition system |
| US7264846B2 (en) * | 2002-06-04 | 2007-09-04 | Applied Materials, Inc. | Ruthenium layer formation for copper film deposition |
| KR100515052B1 (ko) * | 2002-07-18 | 2005-09-14 | 삼성전자주식회사 | 반도체 기판상에 소정의 물질을 증착하는 반도체 제조 장비 |
| US6884296B2 (en) * | 2002-08-23 | 2005-04-26 | Micron Technology, Inc. | Reactors having gas distributors and methods for depositing materials onto micro-device workpieces |
| US20040065256A1 (en) * | 2002-10-03 | 2004-04-08 | Kim Gi Youl | Systems and methods for improved gas delivery |
| US7018940B2 (en) * | 2002-12-30 | 2006-03-28 | Genus, Inc. | Method and apparatus for providing uniform gas delivery to substrates in CVD and PECVD processes |
| US20050106864A1 (en) * | 2003-02-15 | 2005-05-19 | Holger Jurgensen | Process and device for depositing semiconductor layers |
| DE102004009130A1 (de) | 2004-02-25 | 2005-09-15 | Aixtron Ag | Einlasssystem für einen MOCVD-Reaktor |
| US7431772B2 (en) * | 2004-03-09 | 2008-10-07 | Applied Materials, Inc. | Gas distributor having directed gas flow and cleaning method |
| KR100574569B1 (ko) * | 2004-04-30 | 2006-05-03 | 주성엔지니어링(주) | 박막 증착방법 및 분리된 퍼지가스 분사구를 구비하는박막 증착장치 |
| US20060021703A1 (en) * | 2004-07-29 | 2006-02-02 | Applied Materials, Inc. | Dual gas faceplate for a showerhead in a semiconductor wafer processing system |
-
2006
- 2006-04-05 US US11/278,700 patent/US20070234956A1/en not_active Abandoned
-
2007
- 2007-03-30 EP EP07251447A patent/EP1842938A3/en not_active Withdrawn
- 2007-03-30 KR KR1020070031718A patent/KR101373828B1/ko active Active
- 2007-04-05 JP JP2007099449A patent/JP2007277723A/ja active Pending
- 2007-04-05 CN CNA2007100898274A patent/CN101050524A/zh active Pending
-
2009
- 2009-09-03 US US12/553,917 patent/US7981472B2/en not_active Expired - Fee Related
-
2011
- 2011-06-24 US US13/168,792 patent/US20110253046A1/en not_active Abandoned
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6179773A (ja) * | 1984-09-27 | 1986-04-23 | Fujitsu Ltd | Cvd装置 |
| JPS6345374A (ja) * | 1986-08-12 | 1988-02-26 | Canon Inc | 機能性堆積膜形成装置 |
| US4829021A (en) * | 1986-12-12 | 1989-05-09 | Daido Sanso K.K. | Process for vacuum chemical epitaxy |
| JPH02114530A (ja) * | 1988-10-25 | 1990-04-26 | Mitsubishi Electric Corp | 薄膜形成装置 |
| JP2002511905A (ja) * | 1997-06-30 | 2002-04-16 | ラム リサーチ コーポレイション | プラズマ処理装置のガス噴射システム |
| JP2001254181A (ja) * | 2000-01-06 | 2001-09-18 | Tokyo Electron Ltd | 成膜装置および成膜方法 |
| JP2002053963A (ja) * | 2000-07-22 | 2002-02-19 | Ips Ltd | クリーニング装置を備えたald薄膜蒸着装置及びそのクリーニング方法 |
| JP2003188104A (ja) * | 2001-12-14 | 2003-07-04 | Fuji Xerox Co Ltd | 窒化物半導体の製造装置、窒化物半導体の製造方法、及びリモートプラズマ装置 |
| JP2005175242A (ja) * | 2003-12-12 | 2005-06-30 | Mitsubishi Heavy Ind Ltd | 薄膜作製装置及び薄膜作製方法 |
| JP2005268651A (ja) * | 2004-03-19 | 2005-09-29 | Advanced Lcd Technologies Development Center Co Ltd | 絶縁膜の形成方法及び絶縁膜形成装置 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2018135603A (ja) * | 2018-03-22 | 2018-08-30 | プラサド ナーハー ガジル | セラミック薄膜の低温堆積方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20090324829A1 (en) | 2009-12-31 |
| CN101050524A (zh) | 2007-10-10 |
| KR20070100120A (ko) | 2007-10-10 |
| US20070234956A1 (en) | 2007-10-11 |
| US20110253046A1 (en) | 2011-10-20 |
| US7981472B2 (en) | 2011-07-19 |
| EP1842938A2 (en) | 2007-10-10 |
| KR101373828B1 (ko) | 2014-03-11 |
| EP1842938A3 (en) | 2008-06-18 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2007277723A (ja) | 反応炉に均一な気体運搬を行う方法および装置 | |
| CN100537843C (zh) | 微特征工件处理装置和用于在微特征工件上批量沉积材料的方法 | |
| KR101893693B1 (ko) | 가스 혼합 장치 및 기판 처리 장치 | |
| EP2356672B1 (en) | Chemical vapor deposition flow inlet elements | |
| TWI490366B (zh) | Cvd腔室之流體控制特徵結構 | |
| US6616766B2 (en) | Method and apparatus for providing uniform gas delivery to substrates in CVD and PECVD processes | |
| US20050145337A1 (en) | Apparatus for forming thin layers of materials on micro-device workpieces | |
| US20060011298A1 (en) | Showerhead with branched gas receiving channel and apparatus including the same for use in manufacturing semiconductor substrates | |
| CN105839077B (zh) | 用于沉积iii-v主族半导体层的方法和装置 | |
| US20050116064A1 (en) | Reactors having gas distributors and methods for depositing materials onto micro-device workpieces | |
| US20080029028A1 (en) | Systems and methods for depositing material onto microfeature workpieces in reaction chambers | |
| US6818249B2 (en) | Reactors, systems with reaction chambers, and methods for depositing materials onto micro-device workpieces | |
| KR100341521B1 (ko) | 가스 분배 시스템 | |
| CN113122824A (zh) | 淋喷头组件和部件 | |
| JP2010232376A (ja) | 気相成長装置の原料ガス供給ノズル | |
| KR20170040815A (ko) | 균일한 반응가스 플로우를 형성하는 원자층 박막 증착장치 | |
| US20180044792A1 (en) | Gas injector for semiconductor processes and film deposition apparatus | |
| JP2024007511A (ja) | クロスフローを有する複数の基板を処理するための半導体処理装置 | |
| TW202532688A (zh) | 多輸入後混合噴淋頭 | |
| WO2025080512A1 (en) | Multi plenum showerhead without faceplate | |
| KR101010513B1 (ko) | 반도체 제조용 인젝터 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20100402 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20100402 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20120911 |
|
| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20130423 |