JP2007266610A5 - - Google Patents

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Publication number
JP2007266610A5
JP2007266610A5 JP2007085108A JP2007085108A JP2007266610A5 JP 2007266610 A5 JP2007266610 A5 JP 2007266610A5 JP 2007085108 A JP2007085108 A JP 2007085108A JP 2007085108 A JP2007085108 A JP 2007085108A JP 2007266610 A5 JP2007266610 A5 JP 2007266610A5
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JP
Japan
Prior art keywords
diffuser
gas distribution
processing
processing system
coupled
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2007085108A
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English (en)
Japanese (ja)
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JP2007266610A (ja
JP5305316B2 (ja
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Publication date
Priority claimed from US11/390,196 external-priority patent/US8034176B2/en
Application filed filed Critical
Publication of JP2007266610A publication Critical patent/JP2007266610A/ja
Publication of JP2007266610A5 publication Critical patent/JP2007266610A5/ja
Application granted granted Critical
Publication of JP5305316B2 publication Critical patent/JP5305316B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2007085108A 2006-03-28 2007-03-28 エッチング後の処理システムのためのガス分配システム Expired - Fee Related JP5305316B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/390,196 2006-03-28
US11/390,196 US8034176B2 (en) 2006-03-28 2006-03-28 Gas distribution system for a post-etch treatment system

Publications (3)

Publication Number Publication Date
JP2007266610A JP2007266610A (ja) 2007-10-11
JP2007266610A5 true JP2007266610A5 (enExample) 2010-04-22
JP5305316B2 JP5305316B2 (ja) 2013-10-02

Family

ID=38573892

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007085108A Expired - Fee Related JP5305316B2 (ja) 2006-03-28 2007-03-28 エッチング後の処理システムのためのガス分配システム

Country Status (2)

Country Link
US (1) US8034176B2 (enExample)
JP (1) JP5305316B2 (enExample)

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US8129281B1 (en) 2005-05-12 2012-03-06 Novellus Systems, Inc. Plasma based photoresist removal system for cleaning post ash residue
US8057633B2 (en) * 2006-03-28 2011-11-15 Tokyo Electron Limited Post-etch treatment system for removing residue on a substrate
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US8435895B2 (en) 2007-04-04 2013-05-07 Novellus Systems, Inc. Methods for stripping photoresist and/or cleaning metal regions
KR101791685B1 (ko) * 2008-10-14 2017-11-20 노벨러스 시스템즈, 인코포레이티드 수소 이용 화학 반응으로 고용량 주입 스트립(ｈｄｉｓ) 방법 및 장치
US8591661B2 (en) * 2009-12-11 2013-11-26 Novellus Systems, Inc. Low damage photoresist strip method for low-K dielectrics
US20100183825A1 (en) * 2008-12-31 2010-07-22 Cambridge Nanotech Inc. Plasma atomic layer deposition system and method
JP2012531053A (ja) * 2009-08-25 2012-12-06 シルバーブルック リサーチ ピーティワイ リミテッド フォトレジストおよびエッチング残留物をビアから除去する方法
US20110136346A1 (en) * 2009-12-04 2011-06-09 Axcelis Technologies, Inc. Substantially Non-Oxidizing Plasma Treatment Devices and Processes
JP5770740B2 (ja) 2009-12-11 2015-08-26 ノベラス・システムズ・インコーポレーテッドＮｏｖｅｌｌｕｓ Ｓｙｓｔｅｍｓ Ｉｎｃｏｒｐｏｒａｔｅｄ 高ドーズインプラントストリップの前に行われる、シリコンを保護するためのパッシベーションプロセスの改善方法およびそのための装置
US20110143548A1 (en) 2009-12-11 2011-06-16 David Cheung Ultra low silicon loss high dose implant strip
JP2013008949A (ja) * 2011-05-26 2013-01-10 Hitachi Kokusai Electric Inc 基板載置台、基板処理装置及び半導体装置の製造方法
US20120312234A1 (en) * 2011-06-11 2012-12-13 Tokyo Electron Limited Process gas diffuser assembly for vapor deposition system
US9613825B2 (en) 2011-08-26 2017-04-04 Novellus Systems, Inc. Photoresist strip processes for improved device integrity
US9245761B2 (en) 2013-04-05 2016-01-26 Lam Research Corporation Internal plasma grid for semiconductor fabrication
KR101480340B1 (ko) * 2013-08-12 2015-01-09 주식회사 테라텍 이종 플라즈마 다중 연결을 이용한 애슁 공정 장치 및 이를 이용한 애슁 방법
TWI654333B (zh) * 2013-12-18 2019-03-21 美商蘭姆研究公司 具有均勻性折流板之半導體基板處理設備
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US9514954B2 (en) 2014-06-10 2016-12-06 Lam Research Corporation Peroxide-vapor treatment for enhancing photoresist-strip performance and modifying organic films
US11384432B2 (en) 2015-04-22 2022-07-12 Applied Materials, Inc. Atomic layer deposition chamber with funnel-shaped gas dispersion channel and gas distribution plate
EP3178540A1 (en) * 2015-12-09 2017-06-14 Point Engineering Co., Ltd. Fluid permeable anodic oxide film and fluid permeable body using anodic oxide film
US10586696B2 (en) 2017-05-12 2020-03-10 Applied Materials, Inc. Halogen abatement for high aspect ratio channel device damage layer removal for EPI growth
TWI794238B (zh) * 2017-07-13 2023-03-01 荷蘭商Ａｓｍ智慧財產控股公司 於單一加工腔室中自半導體膜移除氧化物及碳之裝置及方法
US12272527B2 (en) 2018-05-09 2025-04-08 Asm Ip Holding B.V. Apparatus for use with hydrogen radicals and method of using same
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CN113448172A (zh) * 2020-03-27 2021-09-28 长鑫存储技术有限公司 一种光刻胶涂覆装置及方法
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