JP2007033392A5 - - Google Patents
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- JP2007033392A5 JP2007033392A5 JP2005220980A JP2005220980A JP2007033392A5 JP 2007033392 A5 JP2007033392 A5 JP 2007033392A5 JP 2005220980 A JP2005220980 A JP 2005220980A JP 2005220980 A JP2005220980 A JP 2005220980A JP 2007033392 A5 JP2007033392 A5 JP 2007033392A5
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- JP
- Japan
- Prior art keywords
- signal
- radiation
- pulse
- detection element
- radiation detection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 230000005855 radiation Effects 0.000 claims 17
- 238000001514 detection method Methods 0.000 claims 8
- 238000001228 spectrum Methods 0.000 claims 7
- 238000004458 analytical method Methods 0.000 claims 3
- 230000035945 sensitivity Effects 0.000 claims 3
- 238000010894 electron beam technology Methods 0.000 claims 2
- 150000002500 ions Chemical class 0.000 claims 2
- 238000007493 shaping process Methods 0.000 claims 2
- 230000001678 irradiating effect Effects 0.000 claims 1
- 238000012216 screening Methods 0.000 claims 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2005220980A JP2007033392A (ja) | 2005-07-29 | 2005-07-29 | 放射線分析装置と放射線分析方法、及びそれを用いたｘ線計測装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2005220980A JP2007033392A (ja) | 2005-07-29 | 2005-07-29 | 放射線分析装置と放射線分析方法、及びそれを用いたｘ線計測装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2007033392A JP2007033392A (ja) | 2007-02-08 |
| JP2007033392A5 true JP2007033392A5 (enExample) | 2008-05-22 |
Family
ID=37792824
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2005220980A Withdrawn JP2007033392A (ja) | 2005-07-29 | 2005-07-29 | 放射線分析装置と放射線分析方法、及びそれを用いたｘ線計測装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2007033392A (enExample) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5146745B2 (ja) * | 2008-05-09 | 2013-02-20 | エスアイアイ・ナノテクノロジー株式会社 | Ｘ線分析装置 |
| JP5146746B2 (ja) * | 2008-05-14 | 2013-02-20 | エスアイアイ・ナノテクノロジー株式会社 | Ｘ線分析装置 |
| JP5216673B2 (ja) * | 2009-04-09 | 2013-06-19 | 浜松ホトニクス株式会社 | 距離計用受光装置および距離計 |
| JP2015094624A (ja) * | 2013-11-11 | 2015-05-18 | 国立大学法人京都大学 | 放射線検出システム、データ処理装置、放射線検出方法および波高値分布データ処理プログラム |
| KR101672874B1 (ko) | 2014-04-17 | 2016-11-29 | 아주대학교산학협력단 | 휴대용 방사선 검출장치 및 그 방법 |
| JP6516320B2 (ja) | 2015-01-20 | 2019-05-22 | 株式会社日立ハイテクサイエンス | 放射線分析装置 |
| JP6510245B2 (ja) * | 2015-01-20 | 2019-05-08 | 株式会社日立ハイテクサイエンス | 放射線分析装置 |
| JP7026443B2 (ja) * | 2017-03-03 | 2022-02-28 | 三菱電機株式会社 | 放射性ダストモニタ |
| JP2018162984A (ja) * | 2017-03-24 | 2018-10-18 | 株式会社日立ハイテクサイエンス | 放射線分析装置 |
| CN109507714B (zh) * | 2018-12-27 | 2020-06-05 | 江苏赛诺格兰医疗科技有限公司 | 一种探测器增益状态快速判断方法 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004361275A (ja) * | 2003-06-05 | 2004-12-24 | Sii Nanotechnology Inc | 放射線計測装置およびそれを用いた分析装置 |
-
2005
- 2005-07-29 JP JP2005220980A patent/JP2007033392A/ja not_active Withdrawn
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