JP2007033392A - 放射線分析装置と放射線分析方法、及びそれを用いたｘ線計測装置 - Google Patents

放射線分析装置と放射線分析方法、及びそれを用いたｘ線計測装置 Download PDF

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JP2007033392A
JP2007033392A JP2005220980A JP2005220980A JP2007033392A JP 2007033392 A JP2007033392 A JP 2007033392A JP 2005220980 A JP2005220980 A JP 2005220980A JP 2005220980 A JP2005220980 A JP 2005220980A JP 2007033392 A JP2007033392 A JP 2007033392A
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radiation
pulse
signal
energy
spectrum
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JP2007033392A5 (enExample
Inventor
Toshimitsu Morooka
利光 師岡
Masanori Ikeda
正徳 池田
Tatsuji Ishikawa
達次 石川
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Hitachi High Tech Science Corp
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SII NanoTechnology Inc
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  • Measurement Of Radiation (AREA)
JP2005220980A 2005-07-29 2005-07-29 放射線分析装置と放射線分析方法、及びそれを用いたｘ線計測装置 Withdrawn JP2007033392A (ja)

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JP2007033392A5 JP2007033392A5 (enExample) 2008-05-22

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Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009271016A (ja) * 2008-05-09 2009-11-19 Sii Nanotechnology Inc Ｘ線分析装置
JP2009276191A (ja) * 2008-05-14 2009-11-26 Sii Nanotechnology Inc Ｘ線分析装置
JP2010243444A (ja) * 2009-04-09 2010-10-28 Hamamatsu Photonics Kk 距離計用受光装置および距離計
JP2015094624A (ja) * 2013-11-11 2015-05-18 国立大学法人京都大学 放射線検出システム、データ処理装置、放射線検出方法および波高値分布データ処理プログラム
EP3048457A1 (en) * 2015-01-20 2016-07-27 Hitachi High-Tech Science Corporation Radiation analyzing apparatus
KR101672874B1 (ko) 2014-04-17 2016-11-29 아주대학교산학협력단 휴대용 방사선 검출장치 및 그 방법
US9678218B2 (en) 2015-01-20 2017-06-13 Hitachi High-Tech Science Corporation Radiation analyzing apparatus
JP2018146319A (ja) * 2017-03-03 2018-09-20 三菱電機株式会社 放射性ダストモニタ
JP2018162984A (ja) * 2017-03-24 2018-10-18 株式会社日立ハイテクサイエンス 放射線分析装置
CN109507714A (zh) * 2018-12-27 2019-03-22 江苏赛诺格兰医疗科技有限公司 一种探测器增益状态快速判断方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004361275A (ja) * 2003-06-05 2004-12-24 Sii Nanotechnology Inc 放射線計測装置およびそれを用いた分析装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004361275A (ja) * 2003-06-05 2004-12-24 Sii Nanotechnology Inc 放射線計測装置およびそれを用いた分析装置

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009271016A (ja) * 2008-05-09 2009-11-19 Sii Nanotechnology Inc Ｘ線分析装置
JP2009276191A (ja) * 2008-05-14 2009-11-26 Sii Nanotechnology Inc Ｘ線分析装置
JP2010243444A (ja) * 2009-04-09 2010-10-28 Hamamatsu Photonics Kk 距離計用受光装置および距離計
JP2015094624A (ja) * 2013-11-11 2015-05-18 国立大学法人京都大学 放射線検出システム、データ処理装置、放射線検出方法および波高値分布データ処理プログラム
KR101672874B1 (ko) 2014-04-17 2016-11-29 아주대학교산학협력단 휴대용 방사선 검출장치 및 그 방법
US9678227B2 (en) 2015-01-20 2017-06-13 Hitachi High-Tech Science Corporation Radiation analyzing apparatus
EP3048457A1 (en) * 2015-01-20 2016-07-27 Hitachi High-Tech Science Corporation Radiation analyzing apparatus
US9678218B2 (en) 2015-01-20 2017-06-13 Hitachi High-Tech Science Corporation Radiation analyzing apparatus
JP2018146319A (ja) * 2017-03-03 2018-09-20 三菱電機株式会社 放射性ダストモニタ
JP7026443B2 (ja) 2017-03-03 2022-02-28 三菱電機株式会社 放射性ダストモニタ
JP2018162984A (ja) * 2017-03-24 2018-10-18 株式会社日立ハイテクサイエンス 放射線分析装置
CN109507714A (zh) * 2018-12-27 2019-03-22 江苏赛诺格兰医疗科技有限公司 一种探测器增益状态快速判断方法
CN109507714B (zh) * 2018-12-27 2020-06-05 江苏赛诺格兰医疗科技有限公司 一种探测器增益状态快速判断方法

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