JP2006339533A - 半導体装置 - Google Patents
半導体装置 Download PDFInfo
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- JP2006339533A JP2006339533A JP2005164741A JP2005164741A JP2006339533A JP 2006339533 A JP2006339533 A JP 2006339533A JP 2005164741 A JP2005164741 A JP 2005164741A JP 2005164741 A JP2005164741 A JP 2005164741A JP 2006339533 A JP2006339533 A JP 2006339533A
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 91
- 239000000758 substrate Substances 0.000 claims abstract description 28
- 239000012535 impurity Substances 0.000 claims description 21
- 238000005192 partition Methods 0.000 claims description 4
- 230000003287 optical effect Effects 0.000 abstract description 21
- 230000035945 sensitivity Effects 0.000 abstract description 5
- 238000002955 isolation Methods 0.000 description 10
- 230000007246 mechanism Effects 0.000 description 5
- 238000000034 method Methods 0.000 description 5
- 238000010521 absorption reaction Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 238000009792 diffusion process Methods 0.000 description 4
- 238000005468 ion implantation Methods 0.000 description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- 238000005530 etching Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 230000004044 response Effects 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 150000002500 ions Chemical class 0.000 description 2
- 238000001020 plasma etching Methods 0.000 description 2
- 230000004043 responsiveness Effects 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 201000009310 astigmatism Diseases 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 238000002513 implantation Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000005036 potential barrier Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/02016—Circuit arrangements of general character for the devices
- H01L31/02019—Circuit arrangements of general character for the devices for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/02024—Position sensitive and lateral effect photodetectors; Quadrant photodiodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0352—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions
- H01L31/035272—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions characterised by at least one potential jump barrier or surface barrier
- H01L31/03529—Shape of the potential jump barrier or surface barrier
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
- H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
- H01L31/102—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier
- H01L31/105—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier being of the PIN type
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Light Receiving Elements (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Semiconductor Lasers (AREA)
Abstract
【解決手段】 半導体基板の主面に、PINフォトダイオード(PIN−PD)のi層となる高比抵抗のエピタキシャル層82を形成する。エピタキシャル層82の表面にトレンチ68,70を形成し、PIN−PDのカソード領域64となるn+領域をトレンチ68の表面に形成し、アノード領域66となるp+領域をトレンチ70の表面に形成する。カソード領域64とアノード領域66とを逆バイアスすると、カソード領域64及びアノード領域66の間のi層である受光半導体領域72が空乏化される。この空乏層は半導体基板表面まで広がる。よって、吸収長が短い青色光に対して、半導体基板表面にて信号電荷を生成させ、これをカソード領域64に集めて受光信号として取り出すことができる。
【選択図】 図2
Description
本発明の好適な態様は、前記受光半導体領域が、エピタキシャル成長層である半導体装置である。
Claims (5)
- 半導体基板の主面に設けられ、信号光を受光する低不純物濃度の受光半導体領域と、
相互間に前記受光半導体領域を配して、前記主面に形成されたアノード領域及びカソード領域と、を有し、
前記アノード領域は、第1電圧を印加され、前記受光半導体領域よりも高不純物濃度の第1導電型半導体領域であり、
前記カソード領域は、第2電圧を印加され、前記受光半導体領域よりも高不純物濃度の第2導電型半導体領域であり、
前記アノード領域と前記カソード領域とは、前記第1電圧及び前記第2電圧により逆バイアス状態とされて、前記受光半導体領域に空乏層を形成する半導体装置。 - 複数区画に分割された受光部を半導体基板の主面に形成された半導体装置であって、
前記主面に設けられた低不純物濃度の受光半導体領域と、
前記各区画毎に前記主面に形成され前記受光半導体領域よりも高不純物濃度の第1導電型半導体領域である複数のカソード領域と、
前記区画相互間の境界に沿って前記主面に形成され前記受光半導体領域よりも高不純物濃度の第2導電型半導体領域であるアノード領域と、
前記カソード領域の表面に形成され、第1電圧を印加される第1電極領域と、
前記アノード領域の表面に形成され、第2電圧を印加される第2電極領域と、
を有し、
前記第1電極領域と前記第2電極領域とは、前記第1電圧及び前記第2電圧により逆バイアス状態とされて、それらの間の前記受光半導体領域に空乏層を形成すること、
を特徴とする半導体装置。 - 請求項2に記載の半導体装置において、
前記カソード領域は、対応する前記区画の境界のうち他の前記区画に隣接しない部分に沿って形成されること、を特徴とする半導体装置。 - 請求項1から請求項3のいずれか1つに記載の半導体装置において、
前記アノード領域又は前記カソード領域は、前記主面に形成された溝部の表面に形成されること、を特徴とする半導体装置。 - 請求項4に記載の半導体装置において、
前記受光半導体領域は、エピタキシャル成長層であること、を特徴とする半導体装置。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005164741A JP2006339533A (ja) | 2005-06-03 | 2005-06-03 | 半導体装置 |
CNB200610084804XA CN100483751C (zh) | 2005-06-03 | 2006-05-19 | 半导体装置 |
US11/443,005 US7619293B2 (en) | 2005-06-03 | 2006-05-31 | Pin photodiode with improved blue light sensitivity |
TW095119337A TWI303107B (en) | 2005-06-03 | 2006-06-01 | Semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005164741A JP2006339533A (ja) | 2005-06-03 | 2005-06-03 | 半導体装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2006339533A true JP2006339533A (ja) | 2006-12-14 |
Family
ID=37484364
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005164741A Pending JP2006339533A (ja) | 2005-06-03 | 2005-06-03 | 半導体装置 |
Country Status (4)
Country | Link |
---|---|
US (1) | US7619293B2 (ja) |
JP (1) | JP2006339533A (ja) |
CN (1) | CN100483751C (ja) |
TW (1) | TWI303107B (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108321218A (zh) * | 2018-03-20 | 2018-07-24 | 湘潭大学 | 一种三维平行板电极半导体探测器 |
JP2021513747A (ja) * | 2018-04-18 | 2021-05-27 | レイセオン カンパニー | 可視撮像アレイにおけるクロストーク緩和のためのセグメント化チャネルストップグリッド |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2008133016A1 (ja) * | 2007-04-13 | 2008-11-06 | Sharp Kabushiki Kaisha | 光センサ及び表示装置 |
US8760631B2 (en) * | 2010-01-27 | 2014-06-24 | Intersil Americas Inc. | Distance sensing by IQ domain differentiation of time of flight (TOF) measurements |
KR102611170B1 (ko) * | 2018-12-28 | 2023-12-08 | 에스케이하이닉스 주식회사 | 수직 핀형 캐패시터 및 이를 포함하는 이미지 센싱 장치 |
CN114512557A (zh) * | 2022-01-18 | 2022-05-17 | 中国电子科技集团公司第十三研究所 | 横向光电探测器 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4282541A (en) * | 1979-12-26 | 1981-08-04 | Bell Telephone Laboratories, Incorporated | Planar P-I-N photodetectors |
JP2000299453A (ja) * | 1999-02-09 | 2000-10-24 | Sony Corp | 固体撮像装置及びその製造方法 |
US6177289B1 (en) * | 1998-12-04 | 2001-01-23 | International Business Machines Corporation | Lateral trench optical detectors |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5210434A (en) * | 1983-07-02 | 1993-05-11 | Canon Kabushiki Kaisha | Photoelectric converter with scanning circuit |
JP3170463B2 (ja) * | 1996-09-30 | 2001-05-28 | シャープ株式会社 | 回路内蔵受光素子 |
JP3457551B2 (ja) * | 1998-11-09 | 2003-10-20 | 株式会社東芝 | 固体撮像装置 |
EP2287917B1 (en) * | 1999-02-25 | 2016-05-25 | Canon Kabushiki Kaisha | Light-receiving element and photoelectric conversion device |
JP4131059B2 (ja) | 1999-08-23 | 2008-08-13 | ソニー株式会社 | 受光素子を有する半導体装置、光学ピックアップ装置、および受光素子を有する半導体装置の製造方法 |
EP1146567A1 (de) * | 2000-04-14 | 2001-10-17 | Infineon Technologies AG | Diode und Verfahren zu deren Herstellung |
AU2002356330A1 (en) * | 2001-12-27 | 2003-07-30 | Bookham Technology Plc | An in-line waveguide photo detector |
DE10252878A1 (de) * | 2002-11-12 | 2004-06-03 | X-Fab Semiconductor Foundries Ag | In BiCMOS-Technologie monolithisch integrierte verbesserte vertikale pin-Fotodiode |
US6936895B2 (en) * | 2003-10-09 | 2005-08-30 | Chartered Semiconductor Manufacturing Ltd. | ESD protection device |
US7264982B2 (en) * | 2004-11-01 | 2007-09-04 | International Business Machines Corporation | Trench photodetector |
JP4086860B2 (ja) * | 2005-05-23 | 2008-05-14 | 三洋電機株式会社 | 半導体装置 |
-
2005
- 2005-06-03 JP JP2005164741A patent/JP2006339533A/ja active Pending
-
2006
- 2006-05-19 CN CNB200610084804XA patent/CN100483751C/zh not_active Expired - Fee Related
- 2006-05-31 US US11/443,005 patent/US7619293B2/en not_active Expired - Fee Related
- 2006-06-01 TW TW095119337A patent/TWI303107B/zh not_active IP Right Cessation
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4282541A (en) * | 1979-12-26 | 1981-08-04 | Bell Telephone Laboratories, Incorporated | Planar P-I-N photodetectors |
US6177289B1 (en) * | 1998-12-04 | 2001-01-23 | International Business Machines Corporation | Lateral trench optical detectors |
JP2000299453A (ja) * | 1999-02-09 | 2000-10-24 | Sony Corp | 固体撮像装置及びその製造方法 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108321218A (zh) * | 2018-03-20 | 2018-07-24 | 湘潭大学 | 一种三维平行板电极半导体探测器 |
JP2021513747A (ja) * | 2018-04-18 | 2021-05-27 | レイセオン カンパニー | 可視撮像アレイにおけるクロストーク緩和のためのセグメント化チャネルストップグリッド |
Also Published As
Publication number | Publication date |
---|---|
TW200707778A (en) | 2007-02-16 |
US7619293B2 (en) | 2009-11-17 |
TWI303107B (en) | 2008-11-11 |
CN1874008A (zh) | 2006-12-06 |
US20060273358A1 (en) | 2006-12-07 |
CN100483751C (zh) | 2009-04-29 |
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