JP2006294103A - 半導体記憶装置 - Google Patents

半導体記憶装置 Download PDF

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Publication number
JP2006294103A
JP2006294103A JP2005111351A JP2005111351A JP2006294103A JP 2006294103 A JP2006294103 A JP 2006294103A JP 2005111351 A JP2005111351 A JP 2005111351A JP 2005111351 A JP2005111351 A JP 2005111351A JP 2006294103 A JP2006294103 A JP 2006294103A
Authority
JP
Japan
Prior art keywords
charge
power supply
memory device
semiconductor memory
flag
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2005111351A
Other languages
English (en)
Japanese (ja)
Other versions
JP2006294103A5 (enExample
Inventor
Toshio Kuraki
敏夫 椋木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP2005111351A priority Critical patent/JP2006294103A/ja
Priority to US11/398,770 priority patent/US7602638B2/en
Priority to CNA2006100741818A priority patent/CN1845255A/zh
Publication of JP2006294103A publication Critical patent/JP2006294103A/ja
Publication of JP2006294103A5 publication Critical patent/JP2006294103A5/ja
Priority to US12/555,600 priority patent/US20090323427A1/en
Withdrawn legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0466—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells with charge storage in an insulating layer, e.g. metal-nitride-oxide-silicon [MNOS], silicon-oxide-nitride-oxide-silicon [SONOS]
    • G11C16/0475—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells with charge storage in an insulating layer, e.g. metal-nitride-oxide-silicon [MNOS], silicon-oxide-nitride-oxide-silicon [SONOS] comprising two or more independent storage sites which store independent data
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/74—Masking faults in memories by using spares or by reconfiguring using duplex memories, i.e. using dual copies

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Non-Volatile Memory (AREA)
  • Read Only Memory (AREA)
  • Semiconductor Memories (AREA)
JP2005111351A 2005-04-07 2005-04-07 半導体記憶装置 Withdrawn JP2006294103A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2005111351A JP2006294103A (ja) 2005-04-07 2005-04-07 半導体記憶装置
US11/398,770 US7602638B2 (en) 2005-04-07 2006-04-06 Semiconductor memory device
CNA2006100741818A CN1845255A (zh) 2005-04-07 2006-04-07 半导体存储器件
US12/555,600 US20090323427A1 (en) 2005-04-07 2009-09-08 Semiconductor memory device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005111351A JP2006294103A (ja) 2005-04-07 2005-04-07 半導体記憶装置

Publications (2)

Publication Number Publication Date
JP2006294103A true JP2006294103A (ja) 2006-10-26
JP2006294103A5 JP2006294103A5 (enExample) 2008-04-03

Family

ID=37064181

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005111351A Withdrawn JP2006294103A (ja) 2005-04-07 2005-04-07 半導体記憶装置

Country Status (3)

Country Link
US (2) US7602638B2 (enExample)
JP (1) JP2006294103A (enExample)
CN (1) CN1845255A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012022749A (ja) * 2010-07-15 2012-02-02 Lapis Semiconductor Co Ltd 不揮発性半導体メモリ装置及び再利用方法

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE1015965A6 (fr) * 2004-03-31 2005-12-06 Const Electr Schreder Procede et dispositif de phototherapie.
CN101916214B (zh) * 2010-07-28 2013-03-20 钰创科技股份有限公司 存储器装置与存储器控制方法
US8339886B2 (en) * 2011-02-14 2012-12-25 Taiwan Semiconductor Manufacturing Company, Ltd. Amplifier sensing
TWI473094B (zh) * 2012-03-21 2015-02-11 Macronix Int Co Ltd 具有定址及相鄰位元之記憶胞的汲極偏壓調整方法與裝置
WO2015171684A1 (en) * 2014-05-07 2015-11-12 Fong John Yit 4 bit nonvolatile flash or variable resistance memory
DE102021205318A1 (de) 2021-05-26 2022-12-01 Robert Bosch Gesellschaft mit beschränkter Haftung Speichervorrichtung und Verfahren zur Durchführung aufeinanderfolgender Speicherzugriffe
DE102021205327A1 (de) 2021-05-26 2022-12-01 Robert Bosch Gesellschaft mit beschränkter Haftung Speichervorrichtung und Verfahren zum Verschieben von Speicherwerten
WO2023024056A1 (en) 2021-08-27 2023-03-02 Yangtze Memory Technologies Co., Ltd. Memory device and program operation thereof

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4224686A (en) 1978-10-02 1980-09-23 Ncr Corporation Electrically alterable memory cell
JP2796590B2 (ja) 1991-08-07 1998-09-10 三菱電機株式会社 メモリ装置及びそれを使用したデータ処理装置
FR2703501B1 (fr) * 1993-04-01 1995-05-19 Gemplus Card Int Circuit intégré pour carte à mémoire et procédé de décomptage d'unités dans une carte à mémoire.
US5815433A (en) 1994-12-27 1998-09-29 Nkk Corporation Mask ROM device with gate insulation film based in pad oxide film and/or nitride film
US6147904A (en) * 1999-02-04 2000-11-14 Tower Semiconductor Ltd. Redundancy method and structure for 2-bit non-volatile memory cells
US6687325B1 (en) * 1999-06-23 2004-02-03 Intel Corporation Counter with non-uniform digit base
US6493261B1 (en) * 2001-01-31 2002-12-10 Advanced Micro Devices, Inc. Single bit array edges
JP2003224215A (ja) * 2001-11-22 2003-08-08 Innotech Corp トランジスタとそれを用いた半導体メモリ、およびトランジスタの駆動方法
JP3821066B2 (ja) * 2002-07-04 2006-09-13 日本電気株式会社 磁気ランダムアクセスメモリ
JP2004079602A (ja) * 2002-08-12 2004-03-11 Fujitsu Ltd トラップ層を有する不揮発性メモリ
US6657891B1 (en) * 2002-11-29 2003-12-02 Kabushiki Kaisha Toshiba Semiconductor memory device for storing multivalued data

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012022749A (ja) * 2010-07-15 2012-02-02 Lapis Semiconductor Co Ltd 不揮発性半導体メモリ装置及び再利用方法
US8854877B2 (en) 2010-07-15 2014-10-07 Lapis Semiconductor Co., Ltd. Nonvolatile semiconductor memory device and method of reusing same

Also Published As

Publication number Publication date
US7602638B2 (en) 2009-10-13
CN1845255A (zh) 2006-10-11
US20060258100A1 (en) 2006-11-16
US20090323427A1 (en) 2009-12-31

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