JP2006066906A5 - - Google Patents

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Publication number
JP2006066906A5
JP2006066906A5 JP2005220262A JP2005220262A JP2006066906A5 JP 2006066906 A5 JP2006066906 A5 JP 2006066906A5 JP 2005220262 A JP2005220262 A JP 2005220262A JP 2005220262 A JP2005220262 A JP 2005220262A JP 2006066906 A5 JP2006066906 A5 JP 2006066906A5
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JP
Japan
Prior art keywords
film
peeling
thin film
semiconductor device
manufacturing
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JP2005220262A
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English (en)
Japanese (ja)
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JP2006066906A (ja
JP5041686B2 (ja
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Priority to JP2005220262A priority Critical patent/JP5041686B2/ja
Priority claimed from JP2005220262A external-priority patent/JP5041686B2/ja
Publication of JP2006066906A publication Critical patent/JP2006066906A/ja
Publication of JP2006066906A5 publication Critical patent/JP2006066906A5/ja
Application granted granted Critical
Publication of JP5041686B2 publication Critical patent/JP5041686B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2005220262A 2004-07-30 2005-07-29 薄膜集積回路の剥離方法および半導体装置の作製方法 Expired - Fee Related JP5041686B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2005220262A JP5041686B2 (ja) 2004-07-30 2005-07-29 薄膜集積回路の剥離方法および半導体装置の作製方法

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2004224803 2004-07-30
JP2004224803 2004-07-30
JP2004224762 2004-07-30
JP2004224762 2004-07-30
JP2005220262A JP5041686B2 (ja) 2004-07-30 2005-07-29 薄膜集積回路の剥離方法および半導体装置の作製方法

Publications (3)

Publication Number Publication Date
JP2006066906A JP2006066906A (ja) 2006-03-09
JP2006066906A5 true JP2006066906A5 (enExample) 2008-08-07
JP5041686B2 JP5041686B2 (ja) 2012-10-03

Family

ID=36113046

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005220262A Expired - Fee Related JP5041686B2 (ja) 2004-07-30 2005-07-29 薄膜集積回路の剥離方法および半導体装置の作製方法

Country Status (1)

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JP (1) JP5041686B2 (enExample)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101385039B (zh) * 2006-03-15 2012-03-21 株式会社半导体能源研究所 半导体器件
JP5469799B2 (ja) 2006-03-15 2014-04-16 株式会社半導体エネルギー研究所 無線通信によりデータの交信を行う半導体装置
TWI433306B (zh) * 2006-09-29 2014-04-01 Semiconductor Energy Lab 半導體裝置的製造方法
US8137417B2 (en) 2006-09-29 2012-03-20 Semiconductor Energy Laboratory Co., Ltd. Peeling apparatus and manufacturing apparatus of semiconductor device
US7968382B2 (en) 2007-02-02 2011-06-28 Semiconductor Energy Laboratory Co., Ltd. Method of manufacturing semiconductor device
WO2008120286A1 (ja) 2007-02-27 2008-10-09 Fujitsu Microelectronics Limited 半導体記憶装置、半導体記憶装置の製造方法、およびパッケージ樹脂形成方法
US7973316B2 (en) * 2007-03-26 2011-07-05 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing semiconductor device
KR101026040B1 (ko) * 2008-11-13 2011-03-30 삼성전기주식회사 박막소자 제조방법
WO2010101543A1 (en) * 2009-03-04 2010-09-10 Sri International Encapsulation methods and dielectric layers for organic electrical devices
JP2011181591A (ja) * 2010-02-26 2011-09-15 Sumitomo Chemical Co Ltd 薄膜半導体装置、薄膜半導体製造装置及び薄膜半導体製造方法
WO2012166686A2 (en) * 2011-05-27 2012-12-06 Mc10, Inc. Electronic, optical and/or mechanical apparatus and systems and methods for fabricating same
KR101174834B1 (ko) * 2012-04-05 2012-08-17 주식회사 다보씨앤엠 공정필름을 이용한 필름형 디스플레이 기판의 제조방법 및 이에 사용되는 필름형 디스플레이 기판 제조용 공정필름
CN111128707B (zh) * 2014-08-26 2023-06-16 株式会社尼康 元件制造方法及转印基板
US9496165B1 (en) 2015-07-09 2016-11-15 International Business Machines Corporation Method of forming a flexible semiconductor layer and devices on a flexible carrier
CN108109950A (zh) * 2016-11-25 2018-06-01 中芯国际集成电路制造(上海)有限公司 一种半导体器件及其制造方法和电子装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4748859B2 (ja) * 2000-01-17 2011-08-17 株式会社半導体エネルギー研究所 発光装置の作製方法
JP2002353235A (ja) * 2001-05-23 2002-12-06 Matsushita Electric Ind Co Ltd アクティブマトリクス基板とそれを用いた表示装置およびその製造方法
WO2003010825A1 (fr) * 2001-07-24 2003-02-06 Seiko Epson Corporation Procede de transfert, procede de fabrication d'un element en couche mince, procede de fabrication d'un circuit integre, substrat de circuit et son procede de fabrication, dispositif electro-optique et son procede de fabrication et carte a circuit integre et materiel electronique
TWI330269B (en) * 2002-12-27 2010-09-11 Semiconductor Energy Lab Separating method
JP4373085B2 (ja) * 2002-12-27 2009-11-25 株式会社半導体エネルギー研究所 半導体装置の作製方法、剥離方法及び転写方法

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