JP2005537481A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2005537481A5 JP2005537481A5 JP2004532588A JP2004532588A JP2005537481A5 JP 2005537481 A5 JP2005537481 A5 JP 2005537481A5 JP 2004532588 A JP2004532588 A JP 2004532588A JP 2004532588 A JP2004532588 A JP 2004532588A JP 2005537481 A5 JP2005537481 A5 JP 2005537481A5
- Authority
- JP
- Japan
- Prior art keywords
- housing
- front surface
- probes
- extending
- retainer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims 7
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/230,849 US6902416B2 (en) | 2002-08-29 | 2002-08-29 | High density probe device |
| PCT/US2003/020631 WO2004021019A1 (en) | 2002-08-29 | 2003-07-01 | High density probe device |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010094355A Division JP2010156717A (ja) | 2002-08-29 | 2010-04-15 | 高密度プローブデバイス |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2005537481A JP2005537481A (ja) | 2005-12-08 |
| JP2005537481A5 true JP2005537481A5 (https=) | 2006-08-03 |
Family
ID=31976604
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004532588A Pending JP2005537481A (ja) | 2002-08-29 | 2003-07-01 | 高密度プローブデバイス |
| JP2010094355A Withdrawn JP2010156717A (ja) | 2002-08-29 | 2010-04-15 | 高密度プローブデバイス |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010094355A Withdrawn JP2010156717A (ja) | 2002-08-29 | 2010-04-15 | 高密度プローブデバイス |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US6902416B2 (https=) |
| EP (1) | EP1546740B1 (https=) |
| JP (2) | JP2005537481A (https=) |
| AT (1) | ATE485524T1 (https=) |
| AU (1) | AU2003247852A1 (https=) |
| DE (1) | DE60334634D1 (https=) |
| WO (1) | WO2004021019A1 (https=) |
Families Citing this family (62)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6232789B1 (en) | 1997-05-28 | 2001-05-15 | Cascade Microtech, Inc. | Probe holder for low current measurements |
| US5914613A (en) | 1996-08-08 | 1999-06-22 | Cascade Microtech, Inc. | Membrane probing system with local contact scrub |
| US6256882B1 (en) | 1998-07-14 | 2001-07-10 | Cascade Microtech, Inc. | Membrane probing system |
| US6578264B1 (en) | 1999-06-04 | 2003-06-17 | Cascade Microtech, Inc. | Method for constructing a membrane probe using a depression |
| US6838890B2 (en) | 2000-02-25 | 2005-01-04 | Cascade Microtech, Inc. | Membrane probing system |
| DE10143173A1 (de) | 2000-12-04 | 2002-06-06 | Cascade Microtech Inc | Wafersonde |
| WO2003052435A1 (en) | 2001-08-21 | 2003-06-26 | Cascade Microtech, Inc. | Membrane probing system |
| JP2005527823A (ja) | 2002-05-23 | 2005-09-15 | カスケード マイクロテック インコーポレイテッド | デバイスのテスト用プローブ |
| US7154257B2 (en) * | 2002-09-30 | 2006-12-26 | Intel Corporation | Universal automated circuit board tester |
| US6999888B2 (en) * | 2002-09-30 | 2006-02-14 | Intel Corporation | Automated circuit board test actuator system |
| US6724205B1 (en) | 2002-11-13 | 2004-04-20 | Cascade Microtech, Inc. | Probe for combined signals |
| MXPA05012044A (es) | 2003-05-09 | 2006-02-03 | Lg Electronics Inc | Disco optico de una sola escritura, metodo y aparato par recuperacion de informacion de administracion de disco del disco optico de una sola escritura. |
| US7057404B2 (en) | 2003-05-23 | 2006-06-06 | Sharp Laboratories Of America, Inc. | Shielded probe for testing a device under test |
| JP4053962B2 (ja) * | 2003-10-15 | 2008-02-27 | 株式会社東芝 | 半導体装置 |
| DE202004021093U1 (de) | 2003-12-24 | 2006-09-28 | Cascade Microtech, Inc., Beaverton | Aktiver Halbleiterscheibenmessfühler |
| US7232340B2 (en) * | 2004-02-20 | 2007-06-19 | Adc Incorporated | Methods and systems for minimizing alien crosstalk between connectors |
| US7368927B2 (en) | 2004-07-07 | 2008-05-06 | Cascade Microtech, Inc. | Probe head having a membrane suspended probe |
| KR20070058522A (ko) | 2004-09-13 | 2007-06-08 | 캐스케이드 마이크로테크 인코포레이티드 | 양측 프루빙 구조 |
| US7535247B2 (en) | 2005-01-31 | 2009-05-19 | Cascade Microtech, Inc. | Interface for testing semiconductors |
| US7656172B2 (en) | 2005-01-31 | 2010-02-02 | Cascade Microtech, Inc. | System for testing semiconductors |
| US7449899B2 (en) | 2005-06-08 | 2008-11-11 | Cascade Microtech, Inc. | Probe for high frequency signals |
| JP5080459B2 (ja) | 2005-06-13 | 2012-11-21 | カスケード マイクロテック インコーポレイテッド | 広帯域能動/受動差動信号プローブ |
| US7524214B2 (en) * | 2005-12-27 | 2009-04-28 | The Boeing Company | Electrical quick lock interconnect |
| US7294024B2 (en) | 2006-01-06 | 2007-11-13 | Adc Telecommunications, Inc. | Methods and systems for minimizing alien crosstalk between connectors |
| US7331795B2 (en) * | 2006-01-13 | 2008-02-19 | Raytheon Company | Spring probe-compliant pin connector |
| DE202007018733U1 (de) | 2006-06-09 | 2009-03-26 | Cascade Microtech, Inc., Beaverton | Messfühler für differentielle Signale mit integrierter Symmetrieschaltung |
| US7723999B2 (en) | 2006-06-12 | 2010-05-25 | Cascade Microtech, Inc. | Calibration structures for differential signal probing |
| US7443186B2 (en) | 2006-06-12 | 2008-10-28 | Cascade Microtech, Inc. | On-wafer test structures for differential signals |
| US7403028B2 (en) | 2006-06-12 | 2008-07-22 | Cascade Microtech, Inc. | Test structure and probe for differential signals |
| US7764072B2 (en) | 2006-06-12 | 2010-07-27 | Cascade Microtech, Inc. | Differential signal probing system |
| US7651355B2 (en) * | 2006-06-30 | 2010-01-26 | 3M Innovative Properties Company | Floating panel mount connection system |
| US7498826B2 (en) * | 2006-08-25 | 2009-03-03 | Interconnect Devices, Inc. | Probe array wafer |
| KR100901409B1 (ko) * | 2007-07-06 | 2009-06-05 | 현대자동차주식회사 | 동축 케이블 커넥터 |
| US7876114B2 (en) | 2007-08-08 | 2011-01-25 | Cascade Microtech, Inc. | Differential waveguide probe |
| JP5125407B2 (ja) * | 2007-10-26 | 2013-01-23 | 住友電装株式会社 | コネクタ |
| US20090134898A1 (en) * | 2007-11-26 | 2009-05-28 | Carlsen Richard D | Coaxial Spring Probe Grounding Method |
| MY151561A (en) * | 2007-12-06 | 2014-06-13 | Test Tooling Solutions M Sdn Bhd | Eco contactor |
| US7795890B2 (en) * | 2008-06-09 | 2010-09-14 | Integrated Test Arizona | Reduced ground spring probe array and method for controlling signal spring probe impedance |
| US7740508B2 (en) * | 2008-09-08 | 2010-06-22 | 3M Innovative Properties Company | Probe block assembly |
| US7888957B2 (en) | 2008-10-06 | 2011-02-15 | Cascade Microtech, Inc. | Probing apparatus with impedance optimized interface |
| US7736183B2 (en) * | 2008-10-13 | 2010-06-15 | Tyco Electronics Corporation | Connector assembly with variable stack heights having power and signal contacts |
| US7896698B2 (en) * | 2008-10-13 | 2011-03-01 | Tyco Electronics Corporation | Connector assembly having multiple contact arrangements |
| US7867032B2 (en) * | 2008-10-13 | 2011-01-11 | Tyco Electronics Corporation | Connector assembly having signal and coaxial contacts |
| US7637777B1 (en) | 2008-10-13 | 2009-12-29 | Tyco Electronics Corporation | Connector assembly having a noise-reducing contact pattern |
| US7740489B2 (en) * | 2008-10-13 | 2010-06-22 | Tyco Electronics Corporation | Connector assembly having a compressive coupling member |
| WO2010059247A2 (en) | 2008-11-21 | 2010-05-27 | Cascade Microtech, Inc. | Replaceable coupon for a probing apparatus |
| DE202009003966U1 (de) * | 2009-03-20 | 2009-06-04 | Rosenberger Hochfrequenztechnik Gmbh & Co. Kg | Messspitzen |
| IT1395368B1 (it) * | 2009-08-28 | 2012-09-14 | St Microelectronics Srl | Schermatura elettromagnetica per il collaudo di circuiti integrati |
| US7918683B1 (en) | 2010-03-24 | 2011-04-05 | Tyco Electronics Corporation | Connector assemblies and daughter card assemblies configured to engage each other along a side interface |
| JP5538107B2 (ja) * | 2010-07-09 | 2014-07-02 | 日置電機株式会社 | 回路基板検査用プローブユニットおよび回路基板検査装置 |
| US8052470B1 (en) * | 2011-01-12 | 2011-11-08 | Cheng Uei Precision Industry Co., Ltd. | Probe connector |
| US8083548B1 (en) * | 2011-01-13 | 2011-12-27 | Cheng Uei Precision Industry Co., Ltd. | Probe connector |
| DE102012205352B4 (de) * | 2012-02-24 | 2022-12-08 | Rohde & Schwarz GmbH & Co. Kommanditgesellschaft | Adapter für einen Tastkopf zur Messung eines differenziellen Signals |
| CN102981094B (zh) * | 2012-11-23 | 2016-04-13 | 深圳莱宝高科技股份有限公司 | 一种面板测试装置 |
| CN104360112B (zh) * | 2014-10-30 | 2018-04-06 | 通富微电子股份有限公司 | 半导体测试治具及其形成方法 |
| US9979112B2 (en) * | 2016-03-29 | 2018-05-22 | Aces Electronics Co., Ltd. | Press-type connector |
| US11187723B2 (en) * | 2016-10-31 | 2021-11-30 | Rohde & Schwarz Gmbh & Co. Kg | Differential test probe |
| US11422156B2 (en) * | 2017-07-28 | 2022-08-23 | Nhk Spring Co., Ltd. | Contact probe and probe unit |
| US11031713B2 (en) | 2017-09-11 | 2021-06-08 | Smiths Interconnect Americas, Inc. | Spring probe connector for interfacing a printed circuit board with a backplane |
| US10476196B2 (en) * | 2018-02-28 | 2019-11-12 | Ohio Associated Enterprises, Llc | Electrical connector with contacts holding spring-loaded pins |
| KR102377330B1 (ko) * | 2020-07-22 | 2022-03-22 | 신동익 | 인쇄회로기판 검사기용 핀블록 장치 |
| US12601762B2 (en) * | 2024-04-17 | 2026-04-14 | F Time Technology Industrial Co., Ltd. | Test terminal |
Family Cites Families (38)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3852700A (en) * | 1969-04-18 | 1974-12-03 | Breston M | Grounding base for connector |
| US3731254A (en) * | 1971-08-02 | 1973-05-01 | Thomas & Betts Corp | Jumper for interconnecting dual-in-line sockets |
| US3806801A (en) | 1972-12-26 | 1974-04-23 | Ibm | Probe contactor having buckling beam probes |
| JPS6074062U (ja) * | 1983-10-27 | 1985-05-24 | セイコーエプソン株式会社 | プロ−ブ用レセプタクルの固定構造 |
| US4593243A (en) | 1984-08-29 | 1986-06-03 | Magnavox Government And Industrial Electronics Company | Coplanar and stripline probe card apparatus |
| JPS6177286A (ja) * | 1984-09-21 | 1986-04-19 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | 同軸ケーブル用インターフェース装置 |
| US4734046A (en) * | 1984-09-21 | 1988-03-29 | International Business Machines Corporation | Coaxial converter with resilient terminal |
| US4712062A (en) | 1984-12-20 | 1987-12-08 | Hughes Aircraft Company | Ground shield apparatus for giga-hertz test jig |
| US4724180A (en) | 1985-08-05 | 1988-02-09 | Teradyne, Inc. | Electrically shielded connectors |
| US4783624A (en) * | 1986-04-14 | 1988-11-08 | Interconnect Devices, Inc. | Contact probe devices and method |
| US4964814A (en) * | 1986-10-03 | 1990-10-23 | Minnesota Mining And Manufacturing Co. | Shielded and grounded connector system for coaxial cables |
| US4827211A (en) | 1987-01-30 | 1989-05-02 | Cascade Microtech, Inc. | Wafer probe |
| US4931726A (en) | 1987-06-22 | 1990-06-05 | Hitachi, Ltd. | Apparatus for testing semiconductor device |
| JPH0178029U (https=) * | 1987-11-13 | 1989-05-25 | ||
| JPH06100635B2 (ja) * | 1989-03-08 | 1994-12-12 | 理化電子株式会社 | 配線板の検査装置のテストヘッド |
| US4965514A (en) | 1989-06-05 | 1990-10-23 | Tektronix, Inc. | Apparatus for probing a microwave circuit |
| US5144228A (en) | 1991-04-23 | 1992-09-01 | International Business Machines Corporation | Probe interface assembly |
| US5194020A (en) * | 1991-06-17 | 1993-03-16 | W. L. Gore & Associates, Inc. | High-density coaxial interconnect system |
| US5190472A (en) * | 1992-03-24 | 1993-03-02 | W. L. Gore & Associates, Inc. | Miniaturized high-density coaxial connector system with staggered grouper modules |
| US5223787A (en) * | 1992-05-29 | 1993-06-29 | Tektronix, Inc. | High-speed, low-profile test probe |
| US5477159A (en) | 1992-10-30 | 1995-12-19 | Hewlett-Packard Company | Integrated circuit probe fixture with detachable high frequency probe carrier |
| US5308250A (en) | 1992-10-30 | 1994-05-03 | Hewlett-Packard Company | Pressure contact for connecting a coaxial shield to a microstrip ground plane |
| US5367254A (en) * | 1993-02-01 | 1994-11-22 | International Business Machines Corporation | Test probe assembly using buckling wire probes within tubes having opposed overlapping slots |
| KR0138618B1 (ko) | 1993-08-04 | 1998-06-15 | 이노우에 아끼라 | 프로브카드, 프로브카드용 동축 프로브빔 및 그 제조방법 |
| JPH07218541A (ja) | 1994-01-31 | 1995-08-18 | Matsushita Electric Works Ltd | 回路基板検査装置 |
| US5416429A (en) | 1994-05-23 | 1995-05-16 | Wentworth Laboratories, Inc. | Probe assembly for testing integrated circuits |
| US5486770A (en) | 1994-06-27 | 1996-01-23 | Motorola, Inc. | High frequency wafer probe apparatus and method |
| JPH08106944A (ja) * | 1994-10-03 | 1996-04-23 | Tokai Rika Co Ltd | 電気コネクタ及び同電気コネクタのハウジング |
| US5625299A (en) | 1995-02-03 | 1997-04-29 | Uhling; Thomas F. | Multiple lead analog voltage probe with high signal integrity over a wide band width |
| US5917330A (en) | 1996-01-17 | 1999-06-29 | Miley; David M. | Probe ring having electrical components affixed thereto and related apparatus and processes |
| US5936415A (en) | 1996-12-20 | 1999-08-10 | Xilinx, Inc. | Method and apparatus for a pin-configurable integrated circuit tester board |
| US6433562B1 (en) * | 1998-08-28 | 2002-08-13 | International Business Machines Corporation | Method and apparatus of interconnecting with a system board |
| US6160412A (en) | 1998-11-05 | 2000-12-12 | Wentworth Laboratories, Inc. | Impedance-matched interconnection device for connecting a vertical-pin integrated circuit probing device to integrated circuit test equipment |
| US6196866B1 (en) | 1999-04-30 | 2001-03-06 | International Business Machines Corporation | Vertical probe housing |
| JP2001074814A (ja) * | 1999-09-07 | 2001-03-23 | Sony Corp | 回路基板検査装置 |
| US6498506B1 (en) * | 2000-07-26 | 2002-12-24 | Gore Enterprise Holdings, Inc. | Spring probe assemblies |
| US6551126B1 (en) * | 2001-03-13 | 2003-04-22 | 3M Innovative Properties Company | High bandwidth probe assembly |
| US6447328B1 (en) | 2001-03-13 | 2002-09-10 | 3M Innovative Properties Company | Method and apparatus for retaining a spring probe |
-
2002
- 2002-08-29 US US10/230,849 patent/US6902416B2/en not_active Expired - Fee Related
-
2003
- 2003-07-01 AT AT03791564T patent/ATE485524T1/de not_active IP Right Cessation
- 2003-07-01 DE DE60334634T patent/DE60334634D1/de not_active Expired - Lifetime
- 2003-07-01 AU AU2003247852A patent/AU2003247852A1/en not_active Abandoned
- 2003-07-01 WO PCT/US2003/020631 patent/WO2004021019A1/en not_active Ceased
- 2003-07-01 EP EP03791564A patent/EP1546740B1/en not_active Expired - Lifetime
- 2003-07-01 JP JP2004532588A patent/JP2005537481A/ja active Pending
-
2010
- 2010-04-15 JP JP2010094355A patent/JP2010156717A/ja not_active Withdrawn
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2005537481A5 (https=) | ||
| AU2003247852A1 (en) | High density probe device | |
| JPH10133779A5 (https=) | ||
| JP2005072005A5 (https=) | ||
| JP2011138685A5 (https=) | ||
| FR2875007B1 (fr) | Puce biologique comportant un reseau d'electrodes sur un substrat | |
| CA2309232A1 (en) | Micro-electromechanical device, liquid discharge head, and method of manufacture therefor | |
| JP2001035907A5 (https=) | ||
| JP2007513472A5 (https=) | ||
| ES2175817T3 (es) | Conmutador electrico de efecto tactil con varios canales y un unico elemento disparador. | |
| WO2006067918A3 (en) | Battery case | |
| JPH0325177U (https=) | ||
| EP1526578A3 (en) | Solid-state imaging device | |
| CN213753192U (zh) | 一种可替换模块化魔方插座结构 | |
| CN108199218A (zh) | 用于发光积木的供电底座 | |
| CN201112462Y (zh) | 电池连接器 | |
| DK1403981T3 (da) | Konnektor, hvori der i en lang periode kan opretholdes kontaktkraft | |
| CN211236494U (zh) | 一种定向声独立box音腔的蓝牙智能眼镜 | |
| CN216056599U (zh) | 一种高速永磁电机的低电能损耗碳刷 | |
| JP2001133436A5 (https=) | ||
| CN214673091U (zh) | 一种导电连接结构、导电连接组件及展示系统 | |
| US6816359B1 (en) | Power supply casing | |
| CN201355712Y (zh) | 电连接器 | |
| JP2007173505A5 (https=) | ||
| ITBS20040099A1 (it) | Dispositivo di supporto per lampade |