JP2005309415A5 - - Google Patents

Download PDF

Info

Publication number
JP2005309415A5
JP2005309415A5 JP2005086550A JP2005086550A JP2005309415A5 JP 2005309415 A5 JP2005309415 A5 JP 2005309415A5 JP 2005086550 A JP2005086550 A JP 2005086550A JP 2005086550 A JP2005086550 A JP 2005086550A JP 2005309415 A5 JP2005309415 A5 JP 2005309415A5
Authority
JP
Japan
Prior art keywords
light
light beam
specimen
optical microscope
light source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2005086550A
Other languages
English (en)
Japanese (ja)
Other versions
JP4819383B2 (ja
JP2005309415A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2005086550A priority Critical patent/JP4819383B2/ja
Priority claimed from JP2005086550A external-priority patent/JP4819383B2/ja
Publication of JP2005309415A publication Critical patent/JP2005309415A/ja
Publication of JP2005309415A5 publication Critical patent/JP2005309415A5/ja
Application granted granted Critical
Publication of JP4819383B2 publication Critical patent/JP4819383B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP2005086550A 2004-03-26 2005-03-24 光学顕微鏡と光学的観察方法 Expired - Fee Related JP4819383B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2005086550A JP4819383B2 (ja) 2004-03-26 2005-03-24 光学顕微鏡と光学的観察方法

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2004093340 2004-03-26
JP2004093340 2004-03-26
JP2005086550A JP4819383B2 (ja) 2004-03-26 2005-03-24 光学顕微鏡と光学的観察方法

Publications (3)

Publication Number Publication Date
JP2005309415A JP2005309415A (ja) 2005-11-04
JP2005309415A5 true JP2005309415A5 (enExample) 2008-04-24
JP4819383B2 JP4819383B2 (ja) 2011-11-24

Family

ID=35438212

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005086550A Expired - Fee Related JP4819383B2 (ja) 2004-03-26 2005-03-24 光学顕微鏡と光学的観察方法

Country Status (1)

Country Link
JP (1) JP4819383B2 (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3992064B2 (ja) 2006-01-20 2007-10-17 住友電気工業株式会社 光学分析装置
JP5047669B2 (ja) * 2007-04-04 2012-10-10 オリンパス株式会社 走査型共焦点顕微鏡装置
EP2058643B1 (en) 2007-11-07 2018-12-26 Mitutoyo Corporation Noncontact measurement probe
JP5638793B2 (ja) 2009-12-03 2014-12-10 オリンパス株式会社 顕微鏡装置
US9575090B2 (en) * 2013-12-07 2017-02-21 Bruker Nano, Inc. Force measurement with real-time baseline determination
CN110095464B (zh) * 2019-04-12 2022-01-28 武汉科技大学 一种复杂组成的烧结矿矿相精细化定量分析方法
CN111826422B (zh) * 2019-04-22 2024-03-26 康岭有限公司 检测荧光偏振的光学系统以及偏振度测量单元
KR102252427B1 (ko) * 2019-12-26 2021-05-14 조선대학교산학협력단 3d 형상 측정을 위한 편광 패턴 조사 현미경

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61260211A (ja) * 1985-05-15 1986-11-18 Hitachi Ltd 自動異物検出方法及びその装置
JPH0391709A (ja) * 1989-09-05 1991-04-17 Nikon Corp 走査型微分干渉顕微鏡
JPH0720382A (ja) * 1993-06-30 1995-01-24 Nikon Corp レ−ザ走査型顕微鏡
JP4673955B2 (ja) * 2000-03-24 2011-04-20 オリンパス株式会社 光学装置
DE20122782U1 (de) * 2000-06-17 2007-11-15 Leica Microsystems Cms Gmbh Beleuchtungseinrichtung
JP2002350117A (ja) * 2001-05-29 2002-12-04 Olympus Optical Co Ltd 形状計測装置及び形状計測方法
JP3581840B2 (ja) * 2001-07-13 2004-10-27 有限会社トッケン 顕微鏡観察用培養装置

Similar Documents

Publication Publication Date Title
JP6798990B2 (ja) 線走査、標本走査、多モード共焦点顕微鏡
JP2011511966A5 (enExample)
EP2409139A2 (en) Non-coherent light microscopy
US20130100461A1 (en) Methods and apparatuses for position and force detection
JP6358577B2 (ja) 走査型光学顕微鏡
US7915575B2 (en) Laser scanning microscope having an IR partial transmission filter for realizing oblique illumination
JP2009053398A (ja) 顕微鏡および三次元情報取得方法
JP2017215546A (ja) 共焦点顕微鏡
CN103604787B (zh) 一种激光扫描位相显微成像方法及系统
JP2005309415A5 (enExample)
JP2008033263A (ja) 蛍光検査用の走査型レーザ顕微鏡
WO2015151461A1 (ja) 超解像観察装置及び超解像観察方法
KR20130115891A (ko) 광량 변조와 스캐닝 시스템 기반의 구조 조명 현미경
JP2019045431A (ja) 光画像計測装置
JP2007139870A5 (enExample)
JP5107003B2 (ja) エバネッセント波発生装置及びそれを用いた観察装置
JP5699421B2 (ja) 顕微鏡装置
JP2013003204A (ja) レーザ顕微鏡装置
JP5106369B2 (ja) 光学装置
JP2007233241A5 (enExample)
JP4172212B2 (ja) 顕微鏡標本の照明方法とこれを用いた照明装置を有する顕微鏡
JP5122930B2 (ja) エバネッセント波発生装置及びそれを用いた観察装置
JP2003185927A5 (enExample)
JP4819383B2 (ja) 光学顕微鏡と光学的観察方法
JP2011017875A5 (enExample)