JP2014002318A - 光音響顕微鏡 - Google Patents
光音響顕微鏡 Download PDFInfo
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/1702—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids
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- G—PHYSICS
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- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
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- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
- G01B9/02007—Two or more frequencies or sources used for interferometric measurement
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/0209—Low-coherence interferometers
- G01B9/02091—Tomographic interferometers, e.g. based on optical coherence
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- G—PHYSICS
- G01—MEASURING; TESTING
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- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/04—Analysing solids
- G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
- G01N29/0654—Imaging
- G01N29/0672—Imaging by acoustic tomography
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/04—Analysing solids
- G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
- G01N29/0654—Imaging
- G01N29/0681—Imaging by acoustic microscopy, e.g. scanning acoustic microscopy
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/24—Probes
- G01N29/2418—Probes using optoacoustic interaction with the material, e.g. laser radiation, photoacoustics
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/1702—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids
- G01N2021/1706—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids in solids
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/061—Sources
- G01N2201/06113—Coherent sources; lasers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/069—Supply of sources
- G01N2201/0696—Pulsed
- G01N2201/0697—Pulsed lasers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/08—Optical fibres; light guides
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/10—Scanning
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/12—Circuits of general importance; Signal processing
- G01N2201/125—Digital circuitry
Abstract
【解決手段】観察対象物の吸収波長域の励起光を標本Sの内部に集光させる対物レンズ10と、励起光とは異なる波長の検出光の点光源像を対物レンズ10の瞳9の中心部に結像させて、対物レンズ10により標本Sに検出光を照射させる検出光用光学系27と、対物レンズ10に入射する励起光及び検出光を偏向して標本Sを走査する光走査部5a,5bと、標本Sによる検出光の反射光を検出する光検出部(22〜24,28)とを備える。
【選択図】図1
Description
観察対象物の吸収波長域の励起光を標本内部に集光させる対物レンズと、
前記励起光とは異なる波長の検出光の点光源像を前記対物レンズの瞳中心部に結像させて、前記対物レンズにより前記標本に前記検出光を照射させる検出光用光学系と、
前記対物レンズに入射する前記励起光及び前記検出光を偏向して前記標本を走査する光走査部と、
前記標本による前記検出光の反射光を検出する光検出部と、
を備えることを特徴とするものである。
図1は、本発明の第1実施の形態に係る光音響顕微鏡の要部の構成を模式的に示す図である。本実施の形態に係る光音響顕微鏡は、励起光として、レーザパルス光源1から射出されるパルス光を用いる。励起光は、例えば、標本Sが生体で、生体内の血管をイメージングする場合は、ヘモグロビンの吸収波長域の光が用いられる。なお、観察対象は血管に限定されるものではなく、励起光は観察対象に応じた吸収波長域の光が用いられる。また、標本S内に複数の吸収体が存在する場合は、観察対象の特徴的な吸収スペクトルのピークの波長の光を用いるのが望ましい。レーザパルス光源1からの励起光は、コリメータレンズ2により平行光として射出される。
図2は、本発明の第2実施の形態に係る光音響顕微鏡の要部の構成を模式的に示す図である。本実施の形態に係る光音響顕微鏡は、第1実施の形態に係る光音響顕微鏡と光検出部の構成が異なるものである。すなわち、第1実施の形態では、標本Sにより変調された反射検出光をOCTにより検出したが、本実施の形態では、標本Sにより変調された反射検出光を光ヘテロダイン法により検出する。その他の構成は、第1実施の形態と同様であるので、図1と同様の作用をなす構成要素には同一参照符号を付して説明を省略する。
2 コリメータレンズ
3 ビームスプリッタ
4,7 リレー光学系
5a,5b ガルバノミラー
6,9 瞳(開口絞り)
8 反射ミラー
10 対物レンズ
11 液滴
21 SLD
22 サーキュレータ
23 2×2ファイバカプラ
24 参照光用光学系
25 反射ミラー
26 コリメータレンズ
28 光検出器
31 画像処理部
32 プロセッサ
33 表示部
51 LD
52,56,61 ファイバ
53 コリメータレンズ
54 偏光ビームスプリッタ
55 集光レンズ
57 光ヘテロダイン検出部
58 1/4波長板
59,60 集光レンズ
S 標本
Claims (3)
- 観察対象物の吸収波長域の励起光を標本内部に集光させる対物レンズと、
前記励起光とは異なる波長の検出光の点光源像を前記対物レンズの瞳中心部に結像させて、前記対物レンズにより前記標本に前記検出光を照射させる検出光用光学系と、
前記対物レンズに入射する前記励起光及び前記検出光を偏向して前記標本を走査する光走査部と、
前記標本による前記検出光の反射光を検出する光検出部と、
を備えることを特徴とする光音響顕微鏡。 - 前記光検出部は、前記反射光を光干渉断層法により検出する、ことを特徴とする請求項1に記載の光音響顕微鏡。
- 前記光検出部は、前記反射光を光ヘテロダイン法により検出する、ことを特徴とする請求項1に記載の光音響顕微鏡。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012138981A JP5885600B2 (ja) | 2012-06-20 | 2012-06-20 | 光音響顕微鏡 |
PCT/JP2013/003862 WO2013190843A1 (ja) | 2012-06-20 | 2013-06-20 | 光音響顕微鏡 |
US14/559,312 US9335253B2 (en) | 2012-06-20 | 2014-12-03 | Photoacoustic microscope for detecting reflected detection light resulting from modulation by specimen |
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JP2012138981A JP5885600B2 (ja) | 2012-06-20 | 2012-06-20 | 光音響顕微鏡 |
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JP2014002318A true JP2014002318A (ja) | 2014-01-09 |
JP5885600B2 JP5885600B2 (ja) | 2016-03-15 |
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JP2012138981A Expired - Fee Related JP5885600B2 (ja) | 2012-06-20 | 2012-06-20 | 光音響顕微鏡 |
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US (1) | US9335253B2 (ja) |
JP (1) | JP5885600B2 (ja) |
WO (1) | WO2013190843A1 (ja) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015161527A (ja) * | 2014-02-26 | 2015-09-07 | オリンパス株式会社 | 光音響顕微鏡装置 |
KR101567803B1 (ko) | 2015-01-08 | 2015-11-11 | 연세대학교 산학협력단 | 렌즈표면 분석장치 |
KR102114135B1 (ko) * | 2019-02-28 | 2020-05-22 | 서강대학교산학협력단 | 현미경 장치 및 현미경 장치의 동작방법 |
JP7434182B2 (ja) | 2018-01-26 | 2024-02-20 | イルミソニックス インコーポレイテッド | コヒーレンスゲーテッド光音響リモートセンシング(cg-pars) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2014103106A1 (ja) * | 2012-12-25 | 2014-07-03 | オリンパス株式会社 | 光音響顕微鏡 |
DE102013203454A1 (de) * | 2013-02-28 | 2014-09-11 | Carl Zeiss Ag | Aufnahmevorrichtung und Aufnahmeverfahren |
DE102014005880A1 (de) * | 2014-04-17 | 2015-11-05 | Carl Zeiss Ag | Lichtrastermikroskop mit vereinfachter Optik, insbesondere mit veränderlicher Pupillenlage |
US11644442B2 (en) * | 2016-04-01 | 2023-05-09 | The Board Of Regents Of The University Of Oklahoma | System and method for nanoscale photoacoustic tomography |
EP3538941A4 (en) | 2016-11-10 | 2020-06-17 | The Trustees of Columbia University in the City of New York | METHODS FOR FAST IMAGING OF HIGH RESOLUTION LARGE SAMPLES |
CN108535196A (zh) * | 2018-04-08 | 2018-09-14 | 深圳大学 | 一种探测型光声显微系统及成像方法 |
US11187679B1 (en) * | 2020-05-20 | 2021-11-30 | The Boeing Company | Beam steering for laser ultrasonic inspection systems |
Citations (2)
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JPH07159381A (ja) * | 1993-12-13 | 1995-06-23 | Hitachi Ltd | 光音響信号検出方法及びその装置 |
JP2011519281A (ja) * | 2007-10-25 | 2011-07-07 | ワシントン・ユニバーシティ | 光学的方位分解能を備えた共焦点光音響顕微鏡検査 |
Family Cites Families (3)
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JP4786027B2 (ja) * | 2000-12-08 | 2011-10-05 | オリンパス株式会社 | 光学系及び光学装置 |
US7126693B2 (en) * | 2004-03-29 | 2006-10-24 | Carl Zeiss Meditec, Inc. | Simple high efficiency optical coherence domain reflectometer design |
WO2012018991A2 (en) * | 2010-08-05 | 2012-02-09 | Bioptigen, Inc. | Compact multimodality optical coherence tomography imaging systems and related methods and computer program products |
-
2012
- 2012-06-20 JP JP2012138981A patent/JP5885600B2/ja not_active Expired - Fee Related
-
2013
- 2013-06-20 WO PCT/JP2013/003862 patent/WO2013190843A1/ja active Application Filing
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2014
- 2014-12-03 US US14/559,312 patent/US9335253B2/en active Active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07159381A (ja) * | 1993-12-13 | 1995-06-23 | Hitachi Ltd | 光音響信号検出方法及びその装置 |
JP2011519281A (ja) * | 2007-10-25 | 2011-07-07 | ワシントン・ユニバーシティ | 光学的方位分解能を備えた共焦点光音響顕微鏡検査 |
Non-Patent Citations (2)
Title |
---|
JPN6013046166; Guy ROUSSEAU, et al.: 'Non-contact photoacoustic tomography and ultrasonography for tissue imaging' BIOMEDICAL OPTICS EXPRESS Vol. 3, No. 1, 20120101, p. 16 - 25 * |
JPN6013046167; Yi WANG, et al.: 'Noncontact photoacoustic imaging achieved by using a low-coherence interferometer as the acoustic de' OPTICS LETTERS Vol. 36, No. 20, 20111015, p. 3975 - 3977 * |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015161527A (ja) * | 2014-02-26 | 2015-09-07 | オリンパス株式会社 | 光音響顕微鏡装置 |
US10209226B2 (en) | 2014-02-26 | 2019-02-19 | Olympus Corporation | Photoacoustic microscope apparatus |
KR101567803B1 (ko) | 2015-01-08 | 2015-11-11 | 연세대학교 산학협력단 | 렌즈표면 분석장치 |
JP7434182B2 (ja) | 2018-01-26 | 2024-02-20 | イルミソニックス インコーポレイテッド | コヒーレンスゲーテッド光音響リモートセンシング(cg-pars) |
KR102114135B1 (ko) * | 2019-02-28 | 2020-05-22 | 서강대학교산학협력단 | 현미경 장치 및 현미경 장치의 동작방법 |
US11762179B2 (en) | 2019-02-28 | 2023-09-19 | Sogang University Research & Business Development Foundation | Microscope device with increased three-dimensional image depth and method for operating the same |
Also Published As
Publication number | Publication date |
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WO2013190843A1 (ja) | 2013-12-27 |
US9335253B2 (en) | 2016-05-10 |
US20150085296A1 (en) | 2015-03-26 |
JP5885600B2 (ja) | 2016-03-15 |
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