JP4819383B2 - 光学顕微鏡と光学的観察方法 - Google Patents
光学顕微鏡と光学的観察方法 Download PDFInfo
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- JP4819383B2 JP4819383B2 JP2005086550A JP2005086550A JP4819383B2 JP 4819383 B2 JP4819383 B2 JP 4819383B2 JP 2005086550 A JP2005086550 A JP 2005086550A JP 2005086550 A JP2005086550 A JP 2005086550A JP 4819383 B2 JP4819383 B2 JP 4819383B2
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- light
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Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2005086550A JP4819383B2 (ja) | 2004-03-26 | 2005-03-24 | 光学顕微鏡と光学的観察方法 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004093340 | 2004-03-26 | ||
| JP2004093340 | 2004-03-26 | ||
| JP2005086550A JP4819383B2 (ja) | 2004-03-26 | 2005-03-24 | 光学顕微鏡と光学的観察方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2005309415A JP2005309415A (ja) | 2005-11-04 |
| JP2005309415A5 JP2005309415A5 (enExample) | 2008-04-24 |
| JP4819383B2 true JP4819383B2 (ja) | 2011-11-24 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2005086550A Expired - Fee Related JP4819383B2 (ja) | 2004-03-26 | 2005-03-24 | 光学顕微鏡と光学的観察方法 |
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| Country | Link |
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| JP (1) | JP4819383B2 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110095464A (zh) * | 2019-04-12 | 2019-08-06 | 武汉科技大学 | 一种复杂组成的烧结矿矿相精细化定量分析方法 |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3992064B2 (ja) | 2006-01-20 | 2007-10-17 | 住友電気工業株式会社 | 光学分析装置 |
| JP5047669B2 (ja) * | 2007-04-04 | 2012-10-10 | オリンパス株式会社 | 走査型共焦点顕微鏡装置 |
| EP2058643B1 (en) | 2007-11-07 | 2018-12-26 | Mitutoyo Corporation | Noncontact measurement probe |
| JP5638793B2 (ja) | 2009-12-03 | 2014-12-10 | オリンパス株式会社 | 顕微鏡装置 |
| US9575090B2 (en) * | 2013-12-07 | 2017-02-21 | Bruker Nano, Inc. | Force measurement with real-time baseline determination |
| CN111826422B (zh) * | 2019-04-22 | 2024-03-26 | 康岭有限公司 | 检测荧光偏振的光学系统以及偏振度测量单元 |
| KR102252427B1 (ko) * | 2019-12-26 | 2021-05-14 | 조선대학교산학협력단 | 3d 형상 측정을 위한 편광 패턴 조사 현미경 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61260211A (ja) * | 1985-05-15 | 1986-11-18 | Hitachi Ltd | 自動異物検出方法及びその装置 |
| JPH0391709A (ja) * | 1989-09-05 | 1991-04-17 | Nikon Corp | 走査型微分干渉顕微鏡 |
| JPH0720382A (ja) * | 1993-06-30 | 1995-01-24 | Nikon Corp | レ−ザ走査型顕微鏡 |
| JP4673955B2 (ja) * | 2000-03-24 | 2011-04-20 | オリンパス株式会社 | 光学装置 |
| DE20122782U1 (de) * | 2000-06-17 | 2007-11-15 | Leica Microsystems Cms Gmbh | Beleuchtungseinrichtung |
| JP2002350117A (ja) * | 2001-05-29 | 2002-12-04 | Olympus Optical Co Ltd | 形状計測装置及び形状計測方法 |
| JP3581840B2 (ja) * | 2001-07-13 | 2004-10-27 | 有限会社トッケン | 顕微鏡観察用培養装置 |
-
2005
- 2005-03-24 JP JP2005086550A patent/JP4819383B2/ja not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110095464A (zh) * | 2019-04-12 | 2019-08-06 | 武汉科技大学 | 一种复杂组成的烧结矿矿相精细化定量分析方法 |
| CN110095464B (zh) * | 2019-04-12 | 2022-01-28 | 武汉科技大学 | 一种复杂组成的烧结矿矿相精细化定量分析方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2005309415A (ja) | 2005-11-04 |
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