JP2005308511A - 位相雑音を測定する方法および位相雑音測定装置 - Google Patents

位相雑音を測定する方法および位相雑音測定装置 Download PDF

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Publication number
JP2005308511A
JP2005308511A JP2004124968A JP2004124968A JP2005308511A JP 2005308511 A JP2005308511 A JP 2005308511A JP 2004124968 A JP2004124968 A JP 2004124968A JP 2004124968 A JP2004124968 A JP 2004124968A JP 2005308511 A JP2005308511 A JP 2005308511A
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Japan
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signal
phase
phase noise
frequency
cross
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JP2004124968A
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Japanese (ja)
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JP2005308511A5 (enExample
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Masaki Bessho
正樹 別所
Hiroaki Ukawa
浩明 烏川
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Agilent Technologies Inc
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Agilent Technologies Inc
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Priority to JP2004124968A priority Critical patent/JP2005308511A/ja
Priority to US11/102,263 priority patent/US20050238094A1/en
Priority to DE102005017217A priority patent/DE102005017217A1/de
Publication of JP2005308511A publication Critical patent/JP2005308511A/ja
Priority to US11/784,048 priority patent/US20070225927A1/en
Publication of JP2005308511A5 publication Critical patent/JP2005308511A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B3/00—Line transmission systems
    • H04B3/02—Details
    • H04B3/46—Monitoring; Testing
    • H04B3/462—Testing group delay or phase shift, e.g. timing jitter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R25/00—Arrangements for measuring phase angle between a voltage and a current or between voltages or currents

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Measuring Phase Differences (AREA)
JP2004124968A 2004-04-21 2004-04-21 位相雑音を測定する方法および位相雑音測定装置 Pending JP2005308511A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2004124968A JP2005308511A (ja) 2004-04-21 2004-04-21 位相雑音を測定する方法および位相雑音測定装置
US11/102,263 US20050238094A1 (en) 2004-04-21 2005-04-08 Method and an apparatus for measuring phase noise
DE102005017217A DE102005017217A1 (de) 2004-04-21 2005-04-14 Verfahren und Apparatur zur Messung von Phasenrauschen
US11/784,048 US20070225927A1 (en) 2004-04-21 2007-04-05 Method and an apparatus for measuring noise

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004124968A JP2005308511A (ja) 2004-04-21 2004-04-21 位相雑音を測定する方法および位相雑音測定装置

Publications (2)

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JP2005308511A true JP2005308511A (ja) 2005-11-04
JP2005308511A5 JP2005308511A5 (enExample) 2007-06-14

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JP2004124968A Pending JP2005308511A (ja) 2004-04-21 2004-04-21 位相雑音を測定する方法および位相雑音測定装置

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US (2) US20050238094A1 (enExample)
JP (1) JP2005308511A (enExample)
DE (1) DE102005017217A1 (enExample)

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JP2010141448A (ja) * 2008-12-10 2010-06-24 Nec Corp 信号検出装置及びそれに用いる信号検出方法並びにそのプログラム
KR20140063594A (ko) * 2011-07-15 2014-05-27 테라다인 인코퍼레이티드 피시험 장치의 신호 특성을 검출하기 위한 ａｔｅ
CN105021904A (zh) * 2015-08-10 2015-11-04 郑州轻工业学院 一种基于dds移相技术的快速相位噪声测量系统及测量方法
JP2015230296A (ja) * 2014-06-06 2015-12-21 富士通株式会社 データ受信機、入出力装置、ジッタ測定装置およびジッタ測定方法
CN105467229A (zh) * 2014-12-30 2016-04-06 北京无线电计量测试研究所 一种基于光学自混频和互相关的相位噪声测量装置
US10756829B1 (en) 2019-12-03 2020-08-25 Teradyne, Inc. Determining error vector magnitude using cross-correlation
US10949005B2 (en) 2019-06-03 2021-03-16 Globalfoundries U.S. Inc. Absolute phase measurement testing device and technique
US11742970B1 (en) 2022-07-21 2023-08-29 Litepoint Corporation Correcting error vector magnitude measurements
US11817913B1 (en) 2022-05-11 2023-11-14 Litepoint Corporation Correcting error vector magnitude measurements

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JP5154741B2 (ja) * 2005-05-26 2013-02-27 テクトロニクス・インターナショナル・セールス・ゲーエムベーハー 雑音特性表示方法
DE102006019759B4 (de) * 2006-04-28 2010-10-07 Imst Gmbh Verfahren zur Zweitor-Messung des Phasenrauschens
DE102007012122A1 (de) 2007-03-13 2008-09-18 Rohde & Schwarz Gmbh & Co. Kg Verfahren und Vorrichtung zum Messen des Phasenrauschens
US20080279268A1 (en) * 2007-05-10 2008-11-13 Agilent Technologies, Inc. Method for measuring noise, apparatus for measuring noise, and program for measuring noise
DE102007047138A1 (de) 2007-07-12 2009-01-15 Rohde & Schwarz Gmbh & Co. Kg Verfahren und Vorrichtung zur Optimierung der Messzeit für Rauschanalysatoren oder Spektrumanalysatoren mit Kreuzkorrelationsverfahren
EP2015083B1 (de) 2007-07-12 2019-04-24 Rohde & Schwarz GmbH & Co. KG Verfahren und Vorrichtung zur Optimierung der Messzeit für Rauschanalysatoren oder Spektrumanalysatoren mit Kreuzkorrelationsverfahren
EP2220794B1 (en) * 2007-11-13 2019-06-12 Oewaves, Inc. Photonic based cross-correlation homodyne detection with low phase noise
DE102011011978B4 (de) 2011-01-13 2017-04-20 Rohde & Schwarz Gmbh & Co. Kg Verfahren und Vorrichtung zur gleichzeitigen Ermittlung des Amplituden- und Phasenrauschens eines Messobjekts
DE102011004572A1 (de) 2011-02-23 2012-08-23 Rohde & Schwarz Gmbh & Co. Kg Verfahren und Vorrichtung zur Messung des Phasenrausch-Spektrums eines gepulsten Sinussignals
CN102944765B (zh) * 2012-11-30 2015-02-11 中国船舶重工集团公司第七二二研究所 一种低频段磁传感器本底噪声测量方法
CN103197160B (zh) * 2013-03-14 2015-09-16 东南大学 一种电子装置残余相位噪声的检测方法及其装置
DE102013213657A1 (de) * 2013-07-12 2015-01-15 Rohde & Schwarz Gmbh & Co. Kg Verfahren und Vorrichtung zur Messung des Amplituden- und/oder Phasenrauschens eines Signals
US20160273957A1 (en) * 2015-03-19 2016-09-22 National Instruments Corporation Machine Condition Monitoring Using Phase Adjusted Frequency Referenced Vector Averaging
SE539238C2 (en) * 2015-07-07 2017-05-23 Rönnow Daniel Method and devices for measuring phase noise and constructing a phase noise representation for a set of electromagnetic signals
CN105467228B (zh) * 2015-11-11 2019-02-26 中国电子科技集团公司第四十一研究所 一种基于滑动互相关和余晖技术的相位噪声测量数据处理和显示装置及方法
CN105512431A (zh) * 2016-01-04 2016-04-20 西安电子科技大学 一种基于相位噪声数学模型的相位噪声测量方法
CN105699790A (zh) * 2016-01-27 2016-06-22 国家电网公司 一种高压输电线路可听放电噪声监测装置
EP3486666B8 (en) * 2017-11-16 2021-09-08 Rohde & Schwarz GmbH & Co. KG Measuring device and measuring method for noise-corrected transmitter performance measurement
US11255893B2 (en) * 2018-08-22 2022-02-22 Keysight Technologies, Inc. Measuring error in signal under test (SUT) using multiple channel measurement device
CN110716092B (zh) * 2019-10-22 2021-09-07 上海交通大学 基于激光鉴频和互相关处理的相位噪声测量装置和测量方法
US11604213B1 (en) 2020-10-29 2023-03-14 Keysight Technologies, Inc. System and method for reducing error in time domain waveform of a signal under test (SUT)
US11821920B1 (en) 2021-02-18 2023-11-21 Keysight Technologies, Inc. System and method for reducing error in time domain waveform of a signal under test (SUT)
US11815540B2 (en) * 2021-07-01 2023-11-14 Keysight Technologies, Inc. System and method for noise measurement
EP4145152B1 (en) * 2022-07-18 2024-08-28 Rohde & Schwarz GmbH & Co. KG Detector module, signal processing module, and measurement instrument
EP4145151B1 (en) * 2022-07-18 2024-05-08 Rohde & Schwarz GmbH & Co. KG Signal processing module and measurement instrument
US12235299B2 (en) 2022-09-20 2025-02-25 Rohde & Schwarz Gmbh & Co. Kg Measurement system and method of determining a corrected averaged power signal
GB2632167A (en) * 2023-07-27 2025-01-29 Landis & Gyr Technology Inc Electricity meter and associated method
CN118244019B (zh) * 2024-03-05 2024-11-29 西安科技大学 一种相位噪声分析仪及相位噪声分析方法

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JPH07270464A (ja) * 1993-12-23 1995-10-20 Hughes Aircraft Co 位相雑音測定システムおよび方法
JPH08184624A (ja) * 1994-12-28 1996-07-16 Sony Corp 伝達関数測定装置
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JP2001358616A (ja) * 2000-06-14 2001-12-26 Anritsu Corp 位相雑音伝達特性解析装置
JP2003232842A (ja) * 2002-02-12 2003-08-22 Mitsubishi Electric Corp 方位探知装置
JP2004032649A (ja) * 2002-06-28 2004-01-29 Kenwood Corp 無線受信装置

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Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010141448A (ja) * 2008-12-10 2010-06-24 Nec Corp 信号検出装置及びそれに用いる信号検出方法並びにそのプログラム
KR20140063594A (ko) * 2011-07-15 2014-05-27 테라다인 인코퍼레이티드 피시험 장치의 신호 특성을 검출하기 위한 ａｔｅ
JP2014521090A (ja) * 2011-07-15 2014-08-25 テラダイン・インコーポレーテッド Ｄｕｔの信号特性を検出するためのａｔｅ
US9442148B2 (en) 2011-07-15 2016-09-13 Teradyne, Inc. ATE to detect signal characteristics of a DUT
KR101904522B1 (ko) * 2011-07-15 2018-10-04 테라다인 인코퍼레이티드 피시험 장치의 신호 특성을 검출하기 위한 ａｔｅ
JP2015230296A (ja) * 2014-06-06 2015-12-21 富士通株式会社 データ受信機、入出力装置、ジッタ測定装置およびジッタ測定方法
CN105467229A (zh) * 2014-12-30 2016-04-06 北京无线电计量测试研究所 一种基于光学自混频和互相关的相位噪声测量装置
CN105021904A (zh) * 2015-08-10 2015-11-04 郑州轻工业学院 一种基于dds移相技术的快速相位噪声测量系统及测量方法
US10949005B2 (en) 2019-06-03 2021-03-16 Globalfoundries U.S. Inc. Absolute phase measurement testing device and technique
US10756829B1 (en) 2019-12-03 2020-08-25 Teradyne, Inc. Determining error vector magnitude using cross-correlation
US11817913B1 (en) 2022-05-11 2023-11-14 Litepoint Corporation Correcting error vector magnitude measurements
US11742970B1 (en) 2022-07-21 2023-08-29 Litepoint Corporation Correcting error vector magnitude measurements

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Publication number Publication date
US20050238094A1 (en) 2005-10-27
DE102005017217A1 (de) 2005-11-24
US20070225927A1 (en) 2007-09-27

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