JP2005301065A5 - - Google Patents

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Publication number
JP2005301065A5
JP2005301065A5 JP2004119328A JP2004119328A JP2005301065A5 JP 2005301065 A5 JP2005301065 A5 JP 2005301065A5 JP 2004119328 A JP2004119328 A JP 2004119328A JP 2004119328 A JP2004119328 A JP 2004119328A JP 2005301065 A5 JP2005301065 A5 JP 2005301065A5
Authority
JP
Japan
Prior art keywords
light
units
light irradiation
detection unit
detection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2004119328A
Other languages
English (en)
Japanese (ja)
Other versions
JP2005301065A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2004119328A priority Critical patent/JP2005301065A/ja
Priority claimed from JP2004119328A external-priority patent/JP2005301065A/ja
Priority to EP05006144A priority patent/EP1580586B1/en
Priority to DE602005007403T priority patent/DE602005007403D1/de
Priority to US11/085,047 priority patent/US7015444B2/en
Publication of JP2005301065A publication Critical patent/JP2005301065A/ja
Publication of JP2005301065A5 publication Critical patent/JP2005301065A5/ja
Pending legal-status Critical Current

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JP2004119328A 2004-03-25 2004-04-14 観察装置 Pending JP2005301065A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2004119328A JP2005301065A (ja) 2004-04-14 2004-04-14 観察装置
EP05006144A EP1580586B1 (en) 2004-03-25 2005-03-21 Scanning confocal microscope
DE602005007403T DE602005007403D1 (de) 2004-03-25 2005-03-21 Scannendes konfokales Mikroskop
US11/085,047 US7015444B2 (en) 2004-03-25 2005-03-22 Optical-scanning examination apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004119328A JP2005301065A (ja) 2004-04-14 2004-04-14 観察装置

Publications (2)

Publication Number Publication Date
JP2005301065A JP2005301065A (ja) 2005-10-27
JP2005301065A5 true JP2005301065A5 (enExample) 2007-05-31

Family

ID=35332650

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004119328A Pending JP2005301065A (ja) 2004-03-25 2004-04-14 観察装置

Country Status (1)

Country Link
JP (1) JP2005301065A (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4757023B2 (ja) * 2005-12-28 2011-08-24 富士通株式会社 インジェクション装置およびインジェクション方法
DE102006010767B4 (de) * 2006-03-08 2008-04-17 Carl Zeiss Surgical Gmbh Mikroskopiesystem
FR2901029B1 (fr) * 2006-05-12 2012-12-21 Mauna Kea Technologies Dispositif et procede d'endoscopie pour une observation simultanee de plusieurs zones d'interet.
JP2008076530A (ja) * 2006-09-19 2008-04-03 Yokogawa Electric Corp 顕微鏡
JP5394501B2 (ja) 2009-10-02 2014-01-22 シャープ株式会社 血管状態モニタリング方法
JP5386634B2 (ja) * 2010-03-19 2014-01-15 シャープ株式会社 測定結果処理装置、測定システム、測定結果処理方法、制御プログラムおよび記録媒体
JP5581785B2 (ja) * 2010-04-07 2014-09-03 ソニー株式会社 顕微鏡、位置制御方法及び位置制御プログラム
KR101212459B1 (ko) * 2010-12-30 2012-12-14 주식회사 휴비츠 디지털 현미경 시스템
JP2014239871A (ja) * 2013-05-07 2014-12-25 安東　秀夫 生体活動検出方法、生体活動測定装置、生体活動検出信号の転送方法および生体活動情報を利用したサービスの提供方法
WO2016007954A1 (en) * 2014-07-11 2016-01-14 The University Of North Carolina At Chapel Hill Steering devices for two-photon excitation imaging systems
CN116490811B (zh) * 2020-08-25 2025-09-26 奥罗克斯有限公司 显微镜
CN113866139A (zh) * 2021-09-06 2021-12-31 北京谊安和景生物科技有限公司 一种高通量核酸检测光学系统

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5626247A (en) * 1979-08-09 1981-03-13 Fuji Electric Co Ltd Optical testing device
JPS56145337A (en) * 1980-04-15 1981-11-12 Furukawa Electric Co Ltd:The Detecting method for surface flaw of long body
JPS6461653A (en) * 1987-09-01 1989-03-08 Aoki Tetsuo Method and device for detecting crack of translucent body
FR2682490B1 (fr) * 1991-10-11 1993-12-17 Oreal Appareil pour observer in vivo la structure microscopique de la peau ou d'un tissu similaire.
JP3205212B2 (ja) * 1995-04-13 2001-09-04 株式会社日立ビルシステム 劣化度診断装置
US5822486A (en) * 1995-11-02 1998-10-13 General Scanning, Inc. Scanned remote imaging method and system and method of determining optimum design characteristics of a filter for use therein
JPH10325924A (ja) * 1997-05-26 1998-12-08 Nikon Corp 顕微鏡用照明装置及び顕微鏡システム
JP3560120B2 (ja) * 1997-10-29 2004-09-02 横河電機株式会社 共焦点顕微鏡
JP4468507B2 (ja) * 1999-03-24 2010-05-26 オリンパス株式会社 走査型レーザ顕微鏡
JP4270884B2 (ja) * 2002-01-10 2009-06-03 オリンパス株式会社 顕微鏡システム

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