JP2021113987A5 - - Google Patents

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Publication number
JP2021113987A5
JP2021113987A5 JP2021065272A JP2021065272A JP2021113987A5 JP 2021113987 A5 JP2021113987 A5 JP 2021113987A5 JP 2021065272 A JP2021065272 A JP 2021065272A JP 2021065272 A JP2021065272 A JP 2021065272A JP 2021113987 A5 JP2021113987 A5 JP 2021113987A5
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JP
Japan
Prior art keywords
scanning element
light
telescope
optical scanning
optical
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JP2021065272A
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English (en)
Japanese (ja)
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JP7626439B2 (ja
JP2021113987A (ja
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Priority claimed from JP2018502075A external-priority patent/JP6914241B2/ja
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JP2021065272A 2015-07-17 2021-04-07 ３次元イメージングのためのシステムおよび方法 Active JP7626439B2 (ja)

Applications Claiming Priority (7)

Application Number Priority Date Filing Date Title
US201562194155P 2015-07-17 2015-07-17
US62/194,155 2015-07-17
US201562195729P 2015-07-22 2015-07-22
US62/195,729 2015-07-22
US201562202126P 2015-08-06 2015-08-06
US62/202,126 2015-08-06
JP2018502075A JP6914241B2 (ja) 2015-07-17 2016-07-15 ３次元イメージングのためのシステムおよび方法

Related Parent Applications (1)

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JP2018502075A Division JP6914241B2 (ja) 2015-07-17 2016-07-15 ３次元イメージングのためのシステムおよび方法

Publications (3)

Publication Number Publication Date
JP2021113987A JP2021113987A (ja) 2021-08-05
JP2021113987A5 true JP2021113987A5 (enExample) 2021-09-16
JP7626439B2 JP7626439B2 (ja) 2025-02-04

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JP2018502075A Active JP6914241B2 (ja) 2015-07-17 2016-07-15 ３次元イメージングのためのシステムおよび方法
JP2021065272A Active JP7626439B2 (ja) 2015-07-17 2021-04-07 ３次元イメージングのためのシステムおよび方法

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JP2018502075A Active JP6914241B2 (ja) 2015-07-17 2016-07-15 ３次元イメージングのためのシステムおよび方法

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EP (1) EP3326018B1 (enExample)
JP (2) JP6914241B2 (enExample)
WO (1) WO2017015077A1 (enExample)

Families Citing this family (17)

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US11686928B2 (en) 2016-09-16 2023-06-27 Leica Microsystems Cms Gmbh Light microscope
WO2018052905A1 (en) 2016-09-16 2018-03-22 The Trustees Of Columbia University In The City Of New York Three-dimensional imaging using swept, confocally aligned planar excitation and a customized image splitter
DE102019102330C5 (de) 2019-01-30 2023-02-23 Leica Microsystems Cms Gmbh Optisches System für ein Mikroskop, Mikroskop mit einem optischen System und Verfahren zur Abbildung eines Objekts unter Verwendung eines Mikroskops
WO2020188018A1 (en) * 2019-03-19 2020-09-24 Charité-Universitätsmedizin Berlin Microscopy system for oblique plane microscopy
CN113874790B (zh) * 2019-03-29 2024-05-28 迈康尼股份公司 长扫掠长度duv微光刻光束扫描声光偏转器和光学器件设计
DE102020204615A1 (de) * 2020-04-09 2021-10-14 Leica Microsystems Cms Gmbh Schiefeebenemikroskop mit verbesserter Sammeleffizienz
CN111679422B (zh) * 2020-06-09 2023-11-03 腾讯科技（深圳）有限公司 显微镜、图像处理系统及图像处理方法
CN113884019B (zh) * 2020-07-03 2024-04-05 睿镞科技(北京)有限责任公司 三维成像系统及方法
KR102327806B1 (ko) * 2020-07-07 2021-11-18 주식회사 나노시스템 탈착이 가능한 필터 및 조명 모듈을 구비한 형광 이미징 장치
EP4342166A4 (en) * 2021-05-16 2025-04-16 The Trustees of Columbia University in the City of New York Swept, confocally- aligned, planar excitation (scape) microscopy using a graded-index (grin) lens
US11788891B2 (en) * 2021-06-11 2023-10-17 The United States Of America, As Represented By The Secretary Of Agriculture Method and system for active line scan imaging
WO2023283742A1 (en) * 2021-07-14 2023-01-19 Westboro Photonics Inc. Imager and spot sampler with translatable stage
KR102547513B1 (ko) * 2022-01-25 2023-06-26 (주)오로스 테크놀로지 광학 검사 장치
CN115202022B (zh) * 2022-08-22 2023-03-24 浙江荷湖科技有限公司 一种各向同性分辨率的扫描光场成像系统和方法
WO2024232351A1 (ja) * 2023-05-09 2024-11-14 国立大学法人大阪大学 共焦点イメージング装置、及び共焦点イメージング方法
DE102023119977A1 (de) * 2023-07-27 2025-01-30 Abberior Instruments Gmbh Verfahren, Computerprogramm und Vorrichtung zum Schätzen einer Lage eines Emitters in einer Probe
WO2025216206A1 (ja) * 2024-04-08 2025-10-16 国立大学法人大阪大学 超解像顕微鏡および超解像顕微鏡の制御方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2633718B2 (ja) * 1990-10-03 1997-07-23 株式会社東芝 形状認識装置
JPH05332733A (ja) * 1992-05-27 1993-12-14 Hitachi Ltd 検出光学系並びに立体形状検出方法
US20030021016A1 (en) * 2001-07-27 2003-01-30 Grier David G. Parallel scanned laser confocal microscope
DE102004032952A1 (de) * 2004-07-07 2006-01-26 Leica Microsystems Cms Gmbh Rastermikroskop und Verfahren zur Untersuchung von biologischen Proben mit einem Rastermikroskop
US8619237B2 (en) * 2009-12-04 2013-12-31 The Trustees Of Columbia University In The City Of New York Laser-scanning intersecting plane tomography such as for high speed volumetric optical imaging
DE102011000835C5 (de) * 2011-02-21 2019-08-22 Leica Microsystems Cms Gmbh Abtastmikroskop und Verfahren zur lichtmikroskopischen Abbildung eines Objektes
JP5838466B2 (ja) * 2011-03-11 2016-01-06 ナノフォトン株式会社 光学顕微鏡、及び分光測定方法
DE102012023024B4 (de) * 2012-11-07 2023-05-04 Carl Zeiss Microscopy Gmbh Lichtmikroskop und Mikroskopieverfahren
DE102013218795A1 (de) * 2013-09-19 2015-03-19 Carl Zeiss Microscopy Gmbh Laserscanningmikroskop und Verfahren zur Korrektur von Abbildungsfehlern insbesondere in der hochauflösenden Scanning-Mikroskopie
EP3095001B1 (en) * 2014-01-17 2023-04-26 The Trustees of Columbia University in the City of New York Systems and methods for three-dimensional imaging
EP3465318B1 (en) * 2016-05-30 2022-03-23 The Trustees of Columbia University in the City of New York Three-dimensional imaging using swept, confocally aligned planar excitation

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