JP6914241B2 - ３次元イメージングのためのシステムおよび方法 - Google Patents

３次元イメージングのためのシステムおよび方法 Download PDF

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JP6914241B2
JP6914241B2 JP2018502075A JP2018502075A JP6914241B2 JP 6914241 B2 JP6914241 B2 JP 6914241B2 JP 2018502075 A JP2018502075 A JP 2018502075A JP 2018502075 A JP2018502075 A JP 2018502075A JP 6914241 B2 JP6914241 B2 JP 6914241B2
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light
image
illumination
optical
module
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JP2018527607A (ja
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マージョリー クレア ヒルマン エリザベス
マージョリー クレア ヒルマン エリザベス
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ザ トラスティース オブ コロンビア ユニバーシティ イン ザ シティ オブ ニューヨーク
ザ トラスティース オブ コロンビア ユニバーシティ イン ザ シティ オブ ニューヨーク
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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0036—Scanning details, e.g. scanning stages
    • G02B21/0048—Scanning details, e.g. scanning stages scanning mirrors, e.g. rotating or galvanomirrors, MEMS mirrors
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP2018502075A 2015-07-17 2016-07-15 ３次元イメージングのためのシステムおよび方法 Active JP6914241B2 (ja)

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JP2021065272A JP7626439B2 (ja) 2015-07-17 2021-04-07 ３次元イメージングのためのシステムおよび方法

Applications Claiming Priority (7)

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US201562194155P 2015-07-17 2015-07-17
US62/194,155 2015-07-17
US201562195729P 2015-07-22 2015-07-22
US62/195,729 2015-07-22
US201562202126P 2015-08-06 2015-08-06
US62/202,126 2015-08-06
PCT/US2016/042398 WO2017015077A1 (en) 2015-07-17 2016-07-15 Systems and methods for three-dimensional imaging

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JP2018527607A JP2018527607A (ja) 2018-09-20
JP6914241B2 true JP6914241B2 (ja) 2021-08-04

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Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11686928B2 (en) 2016-09-16 2023-06-27 Leica Microsystems Cms Gmbh Light microscope
WO2018052905A1 (en) 2016-09-16 2018-03-22 The Trustees Of Columbia University In The City Of New York Three-dimensional imaging using swept, confocally aligned planar excitation and a customized image splitter
DE102019102330C5 (de) 2019-01-30 2023-02-23 Leica Microsystems Cms Gmbh Optisches System für ein Mikroskop, Mikroskop mit einem optischen System und Verfahren zur Abbildung eines Objekts unter Verwendung eines Mikroskops
WO2020188018A1 (en) * 2019-03-19 2020-09-24 Charité-Universitätsmedizin Berlin Microscopy system for oblique plane microscopy
CN113874790B (zh) * 2019-03-29 2024-05-28 迈康尼股份公司 长扫掠长度duv微光刻光束扫描声光偏转器和光学器件设计
DE102020204615A1 (de) * 2020-04-09 2021-10-14 Leica Microsystems Cms Gmbh Schiefeebenemikroskop mit verbesserter Sammeleffizienz
CN111679422B (zh) * 2020-06-09 2023-11-03 腾讯科技（深圳）有限公司 显微镜、图像处理系统及图像处理方法
CN113884019B (zh) * 2020-07-03 2024-04-05 睿镞科技(北京)有限责任公司 三维成像系统及方法
KR102327806B1 (ko) * 2020-07-07 2021-11-18 주식회사 나노시스템 탈착이 가능한 필터 및 조명 모듈을 구비한 형광 이미징 장치
EP4342166A4 (en) * 2021-05-16 2025-04-16 The Trustees of Columbia University in the City of New York Swept, confocally- aligned, planar excitation (scape) microscopy using a graded-index (grin) lens
US11788891B2 (en) * 2021-06-11 2023-10-17 The United States Of America, As Represented By The Secretary Of Agriculture Method and system for active line scan imaging
WO2023283742A1 (en) * 2021-07-14 2023-01-19 Westboro Photonics Inc. Imager and spot sampler with translatable stage
KR102547513B1 (ko) * 2022-01-25 2023-06-26 (주)오로스 테크놀로지 광학 검사 장치
CN115202022B (zh) * 2022-08-22 2023-03-24 浙江荷湖科技有限公司 一种各向同性分辨率的扫描光场成像系统和方法
WO2024232351A1 (ja) * 2023-05-09 2024-11-14 国立大学法人大阪大学 共焦点イメージング装置、及び共焦点イメージング方法
DE102023119977A1 (de) * 2023-07-27 2025-01-30 Abberior Instruments Gmbh Verfahren, Computerprogramm und Vorrichtung zum Schätzen einer Lage eines Emitters in einer Probe
WO2025216206A1 (ja) * 2024-04-08 2025-10-16 国立大学法人大阪大学 超解像顕微鏡および超解像顕微鏡の制御方法

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Publication number Priority date Publication date Assignee Title
JP2633718B2 (ja) * 1990-10-03 1997-07-23 株式会社東芝 形状認識装置
JPH05332733A (ja) * 1992-05-27 1993-12-14 Hitachi Ltd 検出光学系並びに立体形状検出方法
US20030021016A1 (en) * 2001-07-27 2003-01-30 Grier David G. Parallel scanned laser confocal microscope
DE102004032952A1 (de) * 2004-07-07 2006-01-26 Leica Microsystems Cms Gmbh Rastermikroskop und Verfahren zur Untersuchung von biologischen Proben mit einem Rastermikroskop
US8619237B2 (en) * 2009-12-04 2013-12-31 The Trustees Of Columbia University In The City Of New York Laser-scanning intersecting plane tomography such as for high speed volumetric optical imaging
DE102011000835C5 (de) * 2011-02-21 2019-08-22 Leica Microsystems Cms Gmbh Abtastmikroskop und Verfahren zur lichtmikroskopischen Abbildung eines Objektes
JP5838466B2 (ja) * 2011-03-11 2016-01-06 ナノフォトン株式会社 光学顕微鏡、及び分光測定方法
DE102012023024B4 (de) * 2012-11-07 2023-05-04 Carl Zeiss Microscopy Gmbh Lichtmikroskop und Mikroskopieverfahren
DE102013218795A1 (de) * 2013-09-19 2015-03-19 Carl Zeiss Microscopy Gmbh Laserscanningmikroskop und Verfahren zur Korrektur von Abbildungsfehlern insbesondere in der hochauflösenden Scanning-Mikroskopie
EP3095001B1 (en) * 2014-01-17 2023-04-26 The Trustees of Columbia University in the City of New York Systems and methods for three-dimensional imaging
EP3465318B1 (en) * 2016-05-30 2022-03-23 The Trustees of Columbia University in the City of New York Three-dimensional imaging using swept, confocally aligned planar excitation

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Publication number Publication date
EP3326018B1 (en) 2025-03-19
JP7626439B2 (ja) 2025-02-04
WO2017015077A1 (en) 2017-01-26
JP2018527607A (ja) 2018-09-20
JP2021113987A (ja) 2021-08-05
EP3326018A1 (en) 2018-05-30

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