JP2012502316A5 - - Google Patents

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Publication number
JP2012502316A5
JP2012502316A5 JP2011526116A JP2011526116A JP2012502316A5 JP 2012502316 A5 JP2012502316 A5 JP 2012502316A5 JP 2011526116 A JP2011526116 A JP 2011526116A JP 2011526116 A JP2011526116 A JP 2011526116A JP 2012502316 A5 JP2012502316 A5 JP 2012502316A5
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JP
Japan
Prior art keywords
image
mirror
optical axis
imaging apparatus
inspection surface
Prior art date
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Granted
Application number
JP2011526116A
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English (en)
Japanese (ja)
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JP5481484B2 (ja
JP2012502316A (ja
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Publication date
Priority claimed from US12/206,848 external-priority patent/US7880798B2/en
Application filed filed Critical
Publication of JP2012502316A publication Critical patent/JP2012502316A/ja
Publication of JP2012502316A5 publication Critical patent/JP2012502316A5/ja
Application granted granted Critical
Publication of JP5481484B2 publication Critical patent/JP5481484B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2011526116A 2008-09-09 2009-08-27 ３次元物体を２次元平面画像に光学的に変換する装置および方法 Expired - Fee Related JP5481484B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/206,848 2008-09-09
US12/206,848 US7880798B2 (en) 2008-09-09 2008-09-09 Apparatus and method for optically converting a three-dimensional object into a two-dimensional planar image
PCT/US2009/055148 WO2010030512A2 (en) 2008-09-09 2009-08-27 Apparatus and method for optically converting a three-dimensional object into a two-dimensional planar image

Publications (3)

Publication Number Publication Date
JP2012502316A JP2012502316A (ja) 2012-01-26
JP2012502316A5 true JP2012502316A5 (enExample) 2012-10-11
JP5481484B2 JP5481484B2 (ja) 2014-04-23

Family

ID=41798942

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011526116A Expired - Fee Related JP5481484B2 (ja) 2008-09-09 2009-08-27 ３次元物体を２次元平面画像に光学的に変換する装置および方法

Country Status (6)

Country Link
US (1) US7880798B2 (enExample)
JP (1) JP5481484B2 (enExample)
KR (1) KR20110069058A (enExample)
CN (1) CN102144187B (enExample)
TW (1) TWI449878B (enExample)
WO (1) WO2010030512A2 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008228118A (ja) * 2007-03-15 2008-09-25 Fujifilm Corp 固体電子撮像素子の補正装置およびその補正方法
US8248591B2 (en) * 2010-11-18 2012-08-21 Quality Vision International, Inc. Through-the-lens illuminator for optical comparator
US8610902B2 (en) * 2011-06-02 2013-12-17 Asm Technology Singapore Pte Ltd Apparatus and method for inspecting an object with increased depth of field
TWI489101B (zh) * 2013-12-02 2015-06-21 Ind Tech Res Inst 結合三維及二維形貌之量測方法及裝置
CN104597708A (zh) * 2014-11-18 2015-05-06 田晨希 全视角三维立体影像采集、显示方法及系统
TWI628428B (zh) * 2016-12-16 2018-07-01 由田新技股份有限公司 多視角影像擷取裝置、及其多視角影像檢測設備
CN109975316A (zh) * 2019-03-26 2019-07-05 新昌浙江工业大学科学技术研究院 鼓形滚子的全表面瑕疵检测方法
IT202000007837A1 (it) * 2020-04-14 2021-10-14 Tecnosens S P A Dispositivo di misura dimensionale non a contatto con risoluzione micrometrica
US20240153074A1 (en) * 2021-03-10 2024-05-09 Becton, Dickinson And Company Apparatus for inspecting blood culture bottles using imaging
CN113888539B (zh) * 2021-12-06 2022-03-15 蓝思科技股份有限公司 缺陷分类方法、装置、设备及存储介质

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2726808B2 (ja) * 1995-07-11 1998-03-11 シーケーディ株式会社 外観検査装置
KR970016827A (ko) 1995-09-13 1997-04-28 오노 시게오 노광 방법 및 노광 장치
SE519734C2 (sv) * 2000-07-07 2003-04-01 Axis Ab Bildförändringsanordning för en bildalstrande apparat samt metod och digitalkamera till densamma
WO2002019687A2 (en) 2000-08-28 2002-03-07 Cognitens, Ltd. Accurately aligning images in digital imaging systems by matching points in the images
JP2003086492A (ja) * 2001-09-12 2003-03-20 Canon Inc 露光装置及びその制御方法並びにデバイスの製造方法
US6924799B2 (en) 2002-02-28 2005-08-02 Hewlett-Packard Development Company, L.P. Method, node, and network for compositing a three-dimensional stereo image from a non-stereo application
US6870949B2 (en) 2003-02-26 2005-03-22 Electro Scientific Industries Coaxial narrow angle dark field lighting
US20070268470A1 (en) 2004-07-16 2007-11-22 Nikon Corporation Support Method and Support Structure of Optical Member, Optical Unit, Exposure Apparatus, and Device Manufacturing Method
KR20090091218A (ko) * 2006-12-13 2009-08-26 가부시키가이샤 니콘 측정장치 및 측정방법

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