JP2005286026A5 - - Google Patents

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JP2005286026A5
JP2005286026A5 JP2004096429A JP2004096429A JP2005286026A5 JP 2005286026 A5 JP2005286026 A5 JP 2005286026A5 JP 2004096429 A JP2004096429 A JP 2004096429A JP 2004096429 A JP2004096429 A JP 2004096429A JP 2005286026 A5 JP2005286026 A5 JP 2005286026A5
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lens
exposed
exposure apparatus
convex
plano
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JP2004096429A
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JP2005286026A (ja
JP4510494B2 (ja
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Priority to JP2004096429A priority Critical patent/JP4510494B2/ja
Priority claimed from JP2004096429A external-priority patent/JP4510494B2/ja
Priority to US11/093,097 priority patent/US7215410B2/en
Publication of JP2005286026A publication Critical patent/JP2005286026A/ja
Priority to US11/687,386 priority patent/US7408620B2/en
Publication of JP2005286026A5 publication Critical patent/JP2005286026A5/ja
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Publication of JP4510494B2 publication Critical patent/JP4510494B2/ja
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Expired - Fee Related legal-status Critical Current

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Claims (12)

  1. 光源からの光でレチクルを照明する照明光学系と、
    最も被露光体側に配置されるレンズおよび前記レンズを保持する鏡筒を有し、前記レチクルのパターンを前記被露光体に投影する投影光学系とを備え、
    前記レンズと前記被露光体の間の空間に満たされた液体を介して前記被露光体を露光する露光装置において、
    前記レンズは、前記レチクル側に形成された凸面、前記被露光体側の中央に形成され前記液体と接触する第1の面、および、前記被露光体側の端部に形成され、前記鏡筒の保持部に保持される、前記第1の面と平行な第2の面を有し、
    前記第1の面は、前記第2の面よりも前記被露光体に近く、前記凸面における有効領域よりも小さいことを特徴とする露光装置。
  2. 前記第1の面は、前記有効領域の1/4以下の面積を持つことを特徴とする請求項1記載の露光装置。
  3. 前記第1の面の外径は、前記凸面における有効径よりも小さいことを特徴とする請求項1記載の露光装置。
  4. 前記第1の面の外径は、前記凸面における有効径の1/2以下であることを特徴とする請求項3記載の露光装置。
  5. 前記レンズは、前記レンズと前記液体間の接触を防止する保護層を有することを特徴とする請求項1乃至4のうちいずれか一項に記載の露光装置。
  6. 前記第1の面は円形形状を有することを特徴とする請求項1乃至4のうちいずれか一項に記載の露光装置。
  7. 前記第1の面は長方形形状を有することを特徴とする請求項1乃至4のうちいずれか一項に記載の露光装置。
  8. 光源からの光でレチクルを照明する照明光学系と、平凸レンズ及び前記平凸レンズを保持する鏡筒を有し、前記レチクルのパターンを被露光体に投影する投影光学系と、を備え、前記平凸レンズの平面と前記被露光体の間の空間に満たされた液体を介して前記被露光体を露光する露光装置において、
    前記平凸レンズの前記平面は、前記平凸レンズの凸面における有効領域よりも小さく、
    前記平凸レンズの前記平面の外形形状は長方形であり、前記平凸レンズの前記凸面の外形形状は円形であり、
    前記鏡筒は、前記平凸レンズを保持する保持部と、前記液体を供給口を介して供給する供給流路と、を含み、
    前記鏡筒の前記保持部は、前記供給流路の上部に形成されていることを特徴とする露光装置。
  9. 前記平凸レンズは、前記鏡筒に保持されるための被保持部を有し、前記平凸レンズの前記被保持部は円形状であることを特徴とする請求項8に記載の露光装置。
  10. 前記供給口と前記投影光学系の光軸との距離は、前記平凸レンズの前記凸面の外径の1/2未満であることを特徴とする請求項8又は9に記載の露光装置。
  11. 前記供給流路は、前記平凸レンズの前記凸面と前記被露光体の間に突出していることを特徴としている請求項8乃至10のうちいずれか一項に記載の露光装置。
  12. 請求項1乃至11のうちいずれか一項に記載の露光装置を用いて被露光体を露光するステップと、
    当該露光された被露光体を現像するステップとを有することを特徴とするデバイス製造方法。
JP2004096429A 2004-03-29 2004-03-29 露光装置 Expired - Fee Related JP4510494B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2004096429A JP4510494B2 (ja) 2004-03-29 2004-03-29 露光装置
US11/093,097 US7215410B2 (en) 2004-03-29 2005-03-28 Exposure apparatus
US11/687,386 US7408620B2 (en) 2004-03-29 2007-03-16 Exposure apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004096429A JP4510494B2 (ja) 2004-03-29 2004-03-29 露光装置

Publications (3)

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JP2005286026A JP2005286026A (ja) 2005-10-13
JP2005286026A5 true JP2005286026A5 (ja) 2008-08-21
JP4510494B2 JP4510494B2 (ja) 2010-07-21

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JP (1) JP4510494B2 (ja)

Families Citing this family (95)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3977324B2 (ja) 2002-11-12 2007-09-19 エーエスエムエル ネザーランズ ビー.ブイ. リソグラフィ装置
US7372541B2 (en) * 2002-11-12 2008-05-13 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
JP4179283B2 (ja) * 2002-12-10 2008-11-12 株式会社ニコン 光学素子及びその光学素子を用いた投影露光装置
US7684008B2 (en) 2003-06-11 2010-03-23 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7697111B2 (en) 2003-08-26 2010-04-13 Nikon Corporation Optical element and exposure apparatus
US8149381B2 (en) 2003-08-26 2012-04-03 Nikon Corporation Optical element and exposure apparatus
EP2261740B1 (en) 2003-08-29 2014-07-09 ASML Netherlands BV Lithographic apparatus
US6954256B2 (en) 2003-08-29 2005-10-11 Asml Netherlands B.V. Gradient immersion lithography
US7528929B2 (en) 2003-11-14 2009-05-05 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7460206B2 (en) * 2003-12-19 2008-12-02 Carl Zeiss Smt Ag Projection objective for immersion lithography
KR101441777B1 (ko) * 2004-03-25 2014-09-22 가부시키가이샤 니콘 노광 장치 및 디바이스 제조 방법
US7034917B2 (en) * 2004-04-01 2006-04-25 Asml Netherlands B.V. Lithographic apparatus, device manufacturing method and device manufactured thereby
US7486381B2 (en) * 2004-05-21 2009-02-03 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US20070103661A1 (en) * 2004-06-04 2007-05-10 Nikon Corporation Exposure apparatus, exposure method, and method for producing device
US20070216889A1 (en) * 2004-06-04 2007-09-20 Yasufumi Nishii Exposure Apparatus, Exposure Method, and Method for Producing Device
SG10201607447RA (en) * 2004-06-10 2016-10-28 Nikon Corp Exposure equipment, exposure method and device manufacturing method
US20070222959A1 (en) * 2004-06-10 2007-09-27 Nikon Corporation Exposure apparatus, exposure method, and method for producing device
KR101505756B1 (ko) * 2004-06-10 2015-03-26 가부시키가이샤 니콘 노광 장치, 노광 방법, 및 디바이스 제조 방법
US7304715B2 (en) 2004-08-13 2007-12-04 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7701550B2 (en) 2004-08-19 2010-04-20 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7411657B2 (en) * 2004-11-17 2008-08-12 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7256121B2 (en) * 2004-12-02 2007-08-14 Texas Instruments Incorporated Contact resistance reduction by new barrier stack process
US7446850B2 (en) * 2004-12-03 2008-11-04 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7397533B2 (en) * 2004-12-07 2008-07-08 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7196770B2 (en) * 2004-12-07 2007-03-27 Asml Netherlands B.V. Prewetting of substrate before immersion exposure
US7365827B2 (en) 2004-12-08 2008-04-29 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7352440B2 (en) * 2004-12-10 2008-04-01 Asml Netherlands B.V. Substrate placement in immersion lithography
US7403261B2 (en) 2004-12-15 2008-07-22 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7528931B2 (en) * 2004-12-20 2009-05-05 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7880860B2 (en) 2004-12-20 2011-02-01 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7491661B2 (en) * 2004-12-28 2009-02-17 Asml Netherlands B.V. Device manufacturing method, top coat material and substrate
US7405805B2 (en) 2004-12-28 2008-07-29 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US20060147821A1 (en) 2004-12-30 2006-07-06 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
EP1681597B1 (en) * 2005-01-14 2010-03-10 ASML Netherlands B.V. Lithographic apparatus and device manufacturing method
SG124351A1 (en) * 2005-01-14 2006-08-30 Asml Netherlands Bv Lithographic apparatus and device manufacturing method
KR20160135859A (ko) 2005-01-31 2016-11-28 가부시키가이샤 니콘 노광 장치 및 디바이스 제조 방법
US8692973B2 (en) 2005-01-31 2014-04-08 Nikon Corporation Exposure apparatus and method for producing device
EP1849040A2 (en) 2005-02-10 2007-10-31 ASML Netherlands B.V. Immersion liquid, exposure apparatus, and exposure process
US7378025B2 (en) * 2005-02-22 2008-05-27 Asml Netherlands B.V. Fluid filtration method, fluid filtered thereby, lithographic apparatus and device manufacturing method
US7224431B2 (en) * 2005-02-22 2007-05-29 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US8018573B2 (en) 2005-02-22 2011-09-13 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7428038B2 (en) 2005-02-28 2008-09-23 Asml Netherlands B.V. Lithographic apparatus, device manufacturing method and apparatus for de-gassing a liquid
US7324185B2 (en) 2005-03-04 2008-01-29 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7684010B2 (en) * 2005-03-09 2010-03-23 Asml Netherlands B.V. Lithographic apparatus, device manufacturing method, seal structure, method of removing an object and a method of sealing
US7944628B2 (en) * 2005-03-09 2011-05-17 Carl Zeiss Smt Gmbh Optical element unit
US7330238B2 (en) * 2005-03-28 2008-02-12 Asml Netherlands, B.V. Lithographic apparatus, immersion projection apparatus and device manufacturing method
US7411654B2 (en) 2005-04-05 2008-08-12 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7291850B2 (en) * 2005-04-08 2007-11-06 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
CN100555568C (zh) * 2005-04-28 2009-10-28 株式会社尼康 曝光方法及曝光装置、以及元件制造方法
US7317507B2 (en) * 2005-05-03 2008-01-08 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US8248577B2 (en) 2005-05-03 2012-08-21 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7433016B2 (en) * 2005-05-03 2008-10-07 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
EP2660854B1 (en) 2005-05-12 2017-06-21 Nikon Corporation Projection optical system, exposure apparatus and exposure method
US7435528B2 (en) * 2005-06-09 2008-10-14 E.I. Du Pont De Nemours And Company Processes and devices using polycyclic fluoroalkanes in vacuum and deep ultraviolet applications
US7751027B2 (en) 2005-06-21 2010-07-06 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7652746B2 (en) * 2005-06-21 2010-01-26 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7834974B2 (en) 2005-06-28 2010-11-16 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7474379B2 (en) 2005-06-28 2009-01-06 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7468779B2 (en) * 2005-06-28 2008-12-23 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US8054445B2 (en) * 2005-08-16 2011-11-08 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7411658B2 (en) * 2005-10-06 2008-08-12 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
JP2009009954A (ja) * 2005-10-18 2009-01-15 Nikon Corp 露光装置及び露光方法
US7656501B2 (en) * 2005-11-16 2010-02-02 Asml Netherlands B.V. Lithographic apparatus
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US7864292B2 (en) 2005-11-16 2011-01-04 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7633073B2 (en) * 2005-11-23 2009-12-15 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
JP2007152235A (ja) * 2005-12-05 2007-06-21 Nomura Micro Sci Co Ltd 液浸露光装置用超純水の製造方法及び装置
US7420194B2 (en) * 2005-12-27 2008-09-02 Asml Netherlands B.V. Lithographic apparatus and substrate edge seal
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US7969548B2 (en) * 2006-05-22 2011-06-28 Asml Netherlands B.V. Lithographic apparatus and lithographic apparatus cleaning method
EP2062098B1 (en) 2006-09-12 2014-11-19 Carl Zeiss SMT GmbH Optical arrangement for immersion lithography
DE102006050653A1 (de) * 2006-10-24 2008-04-30 Carl Zeiss Smt Ag Verfahren und Vorrichtung zum stoffschlüssigen Verbinden eines optischen Elementes mit einer Fassung
US8045135B2 (en) 2006-11-22 2011-10-25 Asml Netherlands B.V. Lithographic apparatus with a fluid combining unit and related device manufacturing method
US9632425B2 (en) 2006-12-07 2017-04-25 Asml Holding N.V. Lithographic apparatus, a dryer and a method of removing liquid from a surface
US8634053B2 (en) 2006-12-07 2014-01-21 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7791709B2 (en) * 2006-12-08 2010-09-07 Asml Netherlands B.V. Substrate support and lithographic process
US8817226B2 (en) 2007-02-15 2014-08-26 Asml Holding N.V. Systems and methods for insitu lens cleaning using ozone in immersion lithography
US8654305B2 (en) 2007-02-15 2014-02-18 Asml Holding N.V. Systems and methods for insitu lens cleaning in immersion lithography
US7969555B2 (en) * 2007-03-16 2011-06-28 Industry-Academic Cooperation Foundation, Yonsei University Lens structure, optical system having the same, and lithography method using the optical system
US7866330B2 (en) * 2007-05-04 2011-01-11 Asml Netherlands B.V. Cleaning device, a lithographic apparatus and a lithographic apparatus cleaning method
US8947629B2 (en) * 2007-05-04 2015-02-03 Asml Netherlands B.V. Cleaning device, a lithographic apparatus and a lithographic apparatus cleaning method
US7900641B2 (en) * 2007-05-04 2011-03-08 Asml Netherlands B.V. Cleaning device and a lithographic apparatus cleaning method
US8011377B2 (en) 2007-05-04 2011-09-06 Asml Netherlands B.V. Cleaning device and a lithographic apparatus cleaning method
JP2009026977A (ja) * 2007-07-20 2009-02-05 Canon Inc 投影光学系及びそれを有する露光装置
EP2131241B1 (en) 2008-05-08 2019-07-31 ASML Netherlands B.V. Fluid handling structure, lithographic apparatus and device manufacturing method
EP2249205B1 (en) * 2008-05-08 2012-03-07 ASML Netherlands BV Immersion lithographic apparatus, drying device, immersion metrology apparatus and device manufacturing method
US8421993B2 (en) * 2008-05-08 2013-04-16 Asml Netherlands B.V. Fluid handling structure, lithographic apparatus and device manufacturing method
JP4922359B2 (ja) * 2008-07-25 2012-04-25 エーエスエムエル ネザーランズ ビー.ブイ. 流体ハンドリング構造、リソグラフィ装置及びデバイス製造方法
NL2005207A (en) * 2009-09-28 2011-03-29 Asml Netherlands Bv Heat pipe, lithographic apparatus and device manufacturing method.
EP2381310B1 (en) 2010-04-22 2015-05-06 ASML Netherlands BV Fluid handling structure and lithographic apparatus
NL2009692A (en) * 2011-12-07 2013-06-10 Asml Netherlands Bv A lithographic apparatus and a device manufacturing method.
JP6399037B2 (ja) * 2016-05-18 2018-10-03 横河電機株式会社 対物レンズユニット及び液浸顕微鏡

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU2747999A (en) 1998-03-26 1999-10-18 Nikon Corporation Projection exposure method and system
DE10210899A1 (de) * 2002-03-08 2003-09-18 Zeiss Carl Smt Ag Refraktives Projektionsobjektiv für Immersions-Lithographie
DE10229818A1 (de) * 2002-06-28 2004-01-15 Carl Zeiss Smt Ag Verfahren zur Fokusdetektion und Abbildungssystem mit Fokusdetektionssystem
KR20050035890A (ko) * 2002-08-23 2005-04-19 가부시키가이샤 니콘 투영 광학계, 포토리소그래피 방법, 노광 장치 및 그 이용방법
JP2004205698A (ja) * 2002-12-24 2004-07-22 Nikon Corp 投影光学系、露光装置および露光方法
JP3862678B2 (ja) 2003-06-27 2006-12-27 キヤノン株式会社 露光装置及びデバイス製造方法
US6954256B2 (en) 2003-08-29 2005-10-11 Asml Netherlands B.V. Gradient immersion lithography
US7460206B2 (en) * 2003-12-19 2008-12-02 Carl Zeiss Smt Ag Projection objective for immersion lithography
US7088422B2 (en) * 2003-12-31 2006-08-08 International Business Machines Corporation Moving lens for immersion optical lithography

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