JP2005108578A5 - - Google Patents

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Publication number
JP2005108578A5
JP2005108578A5 JP2003339157A JP2003339157A JP2005108578A5 JP 2005108578 A5 JP2005108578 A5 JP 2005108578A5 JP 2003339157 A JP2003339157 A JP 2003339157A JP 2003339157 A JP2003339157 A JP 2003339157A JP 2005108578 A5 JP2005108578 A5 JP 2005108578A5
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JP
Japan
Prior art keywords
ions
precursor ions
mass spectrometer
mass
sample
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2003339157A
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English (en)
Japanese (ja)
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JP2005108578A (ja
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Publication date
Application filed filed Critical
Priority to JP2003339157A priority Critical patent/JP2005108578A/ja
Priority claimed from JP2003339157A external-priority patent/JP2005108578A/ja
Priority to EP04014529A priority patent/EP1521290A1/en
Priority to US10/873,107 priority patent/US7078685B2/en
Publication of JP2005108578A publication Critical patent/JP2005108578A/ja
Publication of JP2005108578A5 publication Critical patent/JP2005108578A5/ja
Pending legal-status Critical Current

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JP2003339157A 2003-09-30 2003-09-30 質量分析装置 Pending JP2005108578A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2003339157A JP2005108578A (ja) 2003-09-30 2003-09-30 質量分析装置
EP04014529A EP1521290A1 (en) 2003-09-30 2004-06-21 Mass spectrometer
US10/873,107 US7078685B2 (en) 2003-09-30 2004-06-23 Mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003339157A JP2005108578A (ja) 2003-09-30 2003-09-30 質量分析装置

Publications (2)

Publication Number Publication Date
JP2005108578A JP2005108578A (ja) 2005-04-21
JP2005108578A5 true JP2005108578A5 (https=) 2006-06-29

Family

ID=34309007

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003339157A Pending JP2005108578A (ja) 2003-09-30 2003-09-30 質量分析装置

Country Status (3)

Country Link
US (1) US7078685B2 (https=)
EP (1) EP1521290A1 (https=)
JP (1) JP2005108578A (https=)

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US7378648B2 (en) * 2005-09-30 2008-05-27 Varian, Inc. High-resolution ion isolation utilizing broadband waveform signals
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WO2013112677A2 (en) * 2012-01-24 2013-08-01 Thermo Finnigan Llc Multinotch isolation for ms3 mass analysis
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JP6549130B2 (ja) * 2013-12-31 2019-07-24 ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド 微分移動度分光計のための噴射注入器入口
CN107533032A (zh) 2015-03-06 2018-01-02 英国质谱公司 用于从块状组织直接映射的原位电离质谱测定成像平台
GB2554206B (en) 2015-03-06 2021-03-24 Micromass Ltd Spectrometric analysis of microbes
JP6800875B2 (ja) 2015-03-06 2020-12-16 マイクロマス ユーケー リミテッド 急速蒸発イオン化質量分析（「ｒｅｉｍｓ」）装置に連結されたイオンアナライザのための流入器具
EP3264989B1 (en) 2015-03-06 2023-12-20 Micromass UK Limited Spectrometric analysis
GB2556436B (en) 2015-03-06 2022-01-26 Micromass Ltd Cell population analysis
GB2584972B (en) * 2015-03-06 2021-04-21 Micromass Ltd Liquid trap or separator for electrosurgical applications
EP3265822B1 (en) 2015-03-06 2021-04-28 Micromass UK Limited Tissue analysis by mass spectrometry or ion mobility spectrometry
GB2551294B (en) 2015-03-06 2021-03-17 Micromass Ltd Liquid trap or separator for electrosurgical applications
US11139156B2 (en) 2015-03-06 2021-10-05 Micromass Uk Limited In vivo endoscopic tissue identification tool
US11037774B2 (en) 2015-03-06 2021-06-15 Micromass Uk Limited Physically guided rapid evaporative ionisation mass spectrometry (“REIMS”)
WO2016142691A1 (en) 2015-03-06 2016-09-15 Micromass Uk Limited Rapid evaporative ionisation mass spectrometry ("reims") and desorption electrospray ionisation mass spectrometry ("desi-ms") analysis of swabs and biopsy samples
CA2978165A1 (en) 2015-03-06 2016-09-15 Micromass Uk Limited Improved ionisation of gaseous samples
US10978284B2 (en) 2015-03-06 2021-04-13 Micromass Uk Limited Imaging guided ambient ionisation mass spectrometry
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CA2977900A1 (en) 2015-03-06 2016-09-15 Micromass Uk Limited Collision surface for improved ionisation
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JP2005108578A (ja) * 2003-09-30 2005-04-21 Hitachi Ltd 質量分析装置
JP4284167B2 (ja) * 2003-12-24 2009-06-24 株式会社日立ハイテクノロジーズ イオントラップ／飛行時間型質量分析計による精密質量測定方法

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