JP2005051220A - レジスト膜付基板の製造方法 - Google Patents
レジスト膜付基板の製造方法 Download PDFInfo
- Publication number
- JP2005051220A JP2005051220A JP2004200516A JP2004200516A JP2005051220A JP 2005051220 A JP2005051220 A JP 2005051220A JP 2004200516 A JP2004200516 A JP 2004200516A JP 2004200516 A JP2004200516 A JP 2004200516A JP 2005051220 A JP2005051220 A JP 2005051220A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- coating
- nozzle
- resist
- resist agent
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000758 substrate Substances 0.000 title claims description 151
- 238000004519 manufacturing process Methods 0.000 title claims description 31
- 238000000034 method Methods 0.000 title claims description 20
- 239000007788 liquid Substances 0.000 claims abstract description 91
- 238000000926 separation method Methods 0.000 claims abstract description 33
- 239000011248 coating agent Substances 0.000 claims description 209
- 238000000576 coating method Methods 0.000 claims description 208
- 239000003795 chemical substances by application Substances 0.000 claims description 90
- 238000009826 distribution Methods 0.000 abstract description 20
- 238000003825 pressing Methods 0.000 description 11
- 230000002093 peripheral effect Effects 0.000 description 6
- 239000004973 liquid crystal related substance Substances 0.000 description 4
- 238000001179 sorption measurement Methods 0.000 description 4
- 238000005259 measurement Methods 0.000 description 3
- 230000000630 rising effect Effects 0.000 description 3
- 238000013459 approach Methods 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 2
- 230000003028 elevating effect Effects 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000007664 blowing Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/16—Coating processes; Apparatus therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02282—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process liquid deposition, e.g. spin-coating, sol-gel techniques, spray coating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/6715—Apparatus for applying a liquid, a resin, an ink or the like
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Nonlinear Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Optics & Photonics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Coating Apparatus (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004200516A JP2005051220A (ja) | 2003-07-17 | 2004-07-07 | レジスト膜付基板の製造方法 |
| TW093121119A TWI276474B (en) | 2003-07-17 | 2004-07-15 | Manufacturing method for substrates with resist films |
| KR1020040055669A KR20050009241A (ko) | 2003-07-17 | 2004-07-16 | 레지스트막 부착 기판의 제조방법 |
| CNA2004100709264A CN1577741A (zh) | 2003-07-17 | 2004-07-16 | 带有抗蚀膜的基片的制造方法 |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003276256 | 2003-07-17 | ||
| JP2004200516A JP2005051220A (ja) | 2003-07-17 | 2004-07-07 | レジスト膜付基板の製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2005051220A true JP2005051220A (ja) | 2005-02-24 |
| JP2005051220A5 JP2005051220A5 (enExample) | 2007-06-28 |
Family
ID=34277588
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004200516A Pending JP2005051220A (ja) | 2003-07-17 | 2004-07-07 | レジスト膜付基板の製造方法 |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP2005051220A (enExample) |
| KR (1) | KR20050009241A (enExample) |
| CN (1) | CN1577741A (enExample) |
| TW (1) | TWI276474B (enExample) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007271775A (ja) * | 2006-03-30 | 2007-10-18 | Hoya Corp | マスクブランク及びフォトマスク |
| JP2008311327A (ja) * | 2007-06-13 | 2008-12-25 | Hoya Corp | マスクブランクの製造方法及びフォトマスクの製造方法 |
| JP2009020378A (ja) * | 2007-07-13 | 2009-01-29 | Hoya Corp | マスクブランクの製造方法及びフォトマスクの製造方法 |
| JP2009258152A (ja) * | 2008-04-11 | 2009-11-05 | Hoya Corp | マスクブランクの製造方法及びフォトマスクの製造方法 |
| KR101012552B1 (ko) * | 2005-04-08 | 2011-02-07 | 호야 가부시키가이샤 | 도포 방법, 도포 장치 및 포토 마스크 블랭크의 제조 방법 |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006294820A (ja) * | 2005-04-08 | 2006-10-26 | Hoya Corp | 塗布装置及びフォトマスクブランクの製造方法 |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06343908A (ja) * | 1993-05-05 | 1994-12-20 | Hamatech Halbleiter Maschinenbau & Technol Gmbh | プレート又はディスクをラッカ塗布又は被覆する装置 |
| JPH08224528A (ja) * | 1994-12-22 | 1996-09-03 | Steag Microtech Gmbh Sternenfels | サブストレートのコーティング又は被覆のための方法と装置 |
| JP2001293417A (ja) * | 2000-04-14 | 2001-10-23 | Sharp Corp | 塗布装置 |
| JP2003112099A (ja) * | 2001-10-03 | 2003-04-15 | Hoya Corp | 塗布膜の乾燥方法、塗布膜の形成方法、及び塗布膜形成装置 |
| JP2003117474A (ja) * | 2001-10-15 | 2003-04-22 | Sumitomo Chem Co Ltd | 薄膜形成方法 |
| JP2003173015A (ja) * | 2001-09-28 | 2003-06-20 | Hoya Corp | グレートーンマスクの製造方法 |
-
2004
- 2004-07-07 JP JP2004200516A patent/JP2005051220A/ja active Pending
- 2004-07-15 TW TW093121119A patent/TWI276474B/zh not_active IP Right Cessation
- 2004-07-16 KR KR1020040055669A patent/KR20050009241A/ko not_active Ceased
- 2004-07-16 CN CNA2004100709264A patent/CN1577741A/zh active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06343908A (ja) * | 1993-05-05 | 1994-12-20 | Hamatech Halbleiter Maschinenbau & Technol Gmbh | プレート又はディスクをラッカ塗布又は被覆する装置 |
| JPH08224528A (ja) * | 1994-12-22 | 1996-09-03 | Steag Microtech Gmbh Sternenfels | サブストレートのコーティング又は被覆のための方法と装置 |
| JP2001293417A (ja) * | 2000-04-14 | 2001-10-23 | Sharp Corp | 塗布装置 |
| JP2003173015A (ja) * | 2001-09-28 | 2003-06-20 | Hoya Corp | グレートーンマスクの製造方法 |
| JP2003112099A (ja) * | 2001-10-03 | 2003-04-15 | Hoya Corp | 塗布膜の乾燥方法、塗布膜の形成方法、及び塗布膜形成装置 |
| JP2003117474A (ja) * | 2001-10-15 | 2003-04-22 | Sumitomo Chem Co Ltd | 薄膜形成方法 |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101012552B1 (ko) * | 2005-04-08 | 2011-02-07 | 호야 가부시키가이샤 | 도포 방법, 도포 장치 및 포토 마스크 블랭크의 제조 방법 |
| JP2007271775A (ja) * | 2006-03-30 | 2007-10-18 | Hoya Corp | マスクブランク及びフォトマスク |
| JP2008311327A (ja) * | 2007-06-13 | 2008-12-25 | Hoya Corp | マスクブランクの製造方法及びフォトマスクの製造方法 |
| JP2009020378A (ja) * | 2007-07-13 | 2009-01-29 | Hoya Corp | マスクブランクの製造方法及びフォトマスクの製造方法 |
| TWI402614B (zh) * | 2007-07-13 | 2013-07-21 | Hoya Corp | 空白光罩之製造方法及光罩之製造方法 |
| JP2009258152A (ja) * | 2008-04-11 | 2009-11-05 | Hoya Corp | マスクブランクの製造方法及びフォトマスクの製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI276474B (en) | 2007-03-21 |
| KR20050009241A (ko) | 2005-01-24 |
| CN1577741A (zh) | 2005-02-09 |
| TW200507950A (en) | 2005-03-01 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20070516 |
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| A621 | Written request for application examination |
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| RD04 | Notification of resignation of power of attorney |
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| RD03 | Notification of appointment of power of attorney |
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| A131 | Notification of reasons for refusal |
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| A02 | Decision of refusal |
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