JP2004536181A5 - - Google Patents

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Publication number
JP2004536181A5
JP2004536181A5 JP2003512356A JP2003512356A JP2004536181A5 JP 2004536181 A5 JP2004536181 A5 JP 2004536181A5 JP 2003512356 A JP2003512356 A JP 2003512356A JP 2003512356 A JP2003512356 A JP 2003512356A JP 2004536181 A5 JP2004536181 A5 JP 2004536181A5
Authority
JP
Japan
Prior art keywords
cleaning composition
dimethyl
group
pyrrolidinone
sterically hindered
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2003512356A
Other languages
English (en)
Japanese (ja)
Other versions
JP2004536181A (ja
JP4177758B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/US2002/021374 external-priority patent/WO2003006597A1/en
Publication of JP2004536181A publication Critical patent/JP2004536181A/ja
Publication of JP2004536181A5 publication Critical patent/JP2004536181A5/ja
Application granted granted Critical
Publication of JP4177758B2 publication Critical patent/JP4177758B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP2003512356A 2001-07-09 2002-07-08 基板適合性が改善されたアンモニア不含アルカリ性マイクロエレクトロニクス洗浄組成物 Expired - Fee Related JP4177758B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US30431201P 2001-07-09 2001-07-09
PCT/US2002/021374 WO2003006597A1 (en) 2001-07-09 2002-07-08 Ammonia-free alkaline microelectronic cleaning compositions with improved substrate compatibility

Publications (3)

Publication Number Publication Date
JP2004536181A JP2004536181A (ja) 2004-12-02
JP2004536181A5 true JP2004536181A5 (enExample) 2006-07-13
JP4177758B2 JP4177758B2 (ja) 2008-11-05

Family

ID=23175967

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003512356A Expired - Fee Related JP4177758B2 (ja) 2001-07-09 2002-07-08 基板適合性が改善されたアンモニア不含アルカリ性マイクロエレクトロニクス洗浄組成物

Country Status (17)

Country Link
EP (1) EP1404796B1 (enExample)
JP (1) JP4177758B2 (enExample)
KR (2) KR100944444B1 (enExample)
CN (2) CN102399651A (enExample)
AT (1) ATE545695T1 (enExample)
AU (1) AU2002320305A1 (enExample)
BR (1) BR0211054A (enExample)
CA (1) CA2452884C (enExample)
IL (2) IL159761A0 (enExample)
IN (1) IN2004CH00042A (enExample)
MY (1) MY139607A (enExample)
NO (1) NO20040067L (enExample)
PL (1) PL199501B1 (enExample)
RS (1) RS904A (enExample)
TW (1) TWI292437B (enExample)
WO (1) WO2003006597A1 (enExample)
ZA (1) ZA200400064B (enExample)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040192938A1 (en) * 2003-03-24 2004-09-30 Manzer Leo Ernest Production of 5-mehyl-N-aryl-2-pyrrolidone and 5-methyl-N-alkyl-2-pyrrolidone by reductive of levulinic acid esters with aryl and alkyl amines
CN1839355B (zh) 2003-08-19 2012-07-11 安万托特性材料股份有限公司 用于微电子设备的剥离和清洁组合物
WO2006081406A1 (en) * 2005-01-27 2006-08-03 Advanced Technology Materials, Inc. Compositions for processing of semiconductor substrates
US7632796B2 (en) 2005-10-28 2009-12-15 Dynaloy, Llc Dynamic multi-purpose composition for the removal of photoresists and method for its use
US9329486B2 (en) 2005-10-28 2016-05-03 Dynaloy, Llc Dynamic multi-purpose composition for the removal of photoresists and method for its use
US8263539B2 (en) 2005-10-28 2012-09-11 Dynaloy, Llc Dynamic multi-purpose composition for the removal of photoresists and methods for its use
ES2356109T3 (es) 2007-02-14 2011-04-05 Mallinckrodt Baker, Inc. Formulaciones basadas en oxometalato activadas por peróxido para la eliminación de residuos de grabado.
WO2010042457A1 (en) * 2008-10-09 2010-04-15 Mallinckrodt Baker, Inc. Aqueous acidic formulations for copper oxide etch residue removal and prevention of copper electrodeposition
US8298751B2 (en) 2009-11-02 2012-10-30 International Business Machines Corporation Alkaline rinse agents for use in lithographic patterning
WO2012161790A1 (en) * 2011-02-24 2012-11-29 John Moore Concentrated chemical composition and method for removing photoresist during microelectric fabrication
US9158202B2 (en) * 2012-11-21 2015-10-13 Dynaloy, Llc Process and composition for removing substances from substrates
US10072237B2 (en) * 2015-08-05 2018-09-11 Versum Materials Us, Llc Photoresist cleaning composition used in photolithography and a method for treating substrate therewith
CN113439324B (zh) * 2019-02-15 2025-03-04 日产化学株式会社 清洗剂组合物以及清洗方法
CN113454759A (zh) * 2019-02-15 2021-09-28 日产化学株式会社 清洗剂组合物以及清洗方法
JP7465951B2 (ja) * 2019-08-30 2024-04-11 ダウ グローバル テクノロジーズ エルエルシー フォトレジスト剥離組成物
CN111519190B (zh) * 2020-05-27 2022-03-18 湖北兴福电子材料有限公司 一种铜制程面板中稳定蚀刻锥角的蚀刻液及稳定方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4744834A (en) * 1986-04-30 1988-05-17 Noor Haq Photoresist stripper comprising a pyrrolidinone, a diethylene glycol ether, a polyglycol and a quaternary ammonium hydroxide
EP0301044A4 (en) * 1987-02-05 1989-03-29 Macdermid Inc ETCHING COMPOSITION FOR PHOTORESERVE.
US5091103A (en) * 1990-05-01 1992-02-25 Alicia Dean Photoresist stripper
US6110881A (en) * 1990-11-05 2000-08-29 Ekc Technology, Inc. Cleaning solutions including nucleophilic amine compound having reduction and oxidation potentials
DE69333877T2 (de) * 1992-07-09 2006-06-14 Ekc Technology Inc Reinigungsmittelzusammensetzung, das einem Redox Aminverbindung enthält
JPH0959689A (ja) * 1995-08-29 1997-03-04 Mitsubishi Chem Corp 研削剤除去用洗浄剤
AU4189599A (en) 1998-05-18 1999-12-06 Mallinckrodt, Inc. Silicate-containing alkaline compositions for cleaning microelectronic substrates
JP4565741B2 (ja) * 1998-05-18 2010-10-20 マリンクロッド・ベイカー・インコーポレイテッド マイクロエレクトロニクス基板洗浄用珪酸塩含有アルカリ組成物
US6558879B1 (en) * 2000-09-25 2003-05-06 Ashland Inc. Photoresist stripper/cleaner compositions containing aromatic acid inhibitors

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