JP2004325451A - 小型コンタクタピン - Google Patents
小型コンタクタピン Download PDFInfo
- Publication number
- JP2004325451A JP2004325451A JP2004128522A JP2004128522A JP2004325451A JP 2004325451 A JP2004325451 A JP 2004325451A JP 2004128522 A JP2004128522 A JP 2004128522A JP 2004128522 A JP2004128522 A JP 2004128522A JP 2004325451 A JP2004325451 A JP 2004325451A
- Authority
- JP
- Japan
- Prior art keywords
- contact
- lead
- dut
- housing
- elastomer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 229920001971 elastomer Polymers 0.000 claims abstract description 34
- 239000000806 elastomer Substances 0.000 claims abstract description 34
- 238000012360 testing method Methods 0.000 claims abstract description 18
- 238000013459 approach Methods 0.000 abstract 2
- 239000000463 material Substances 0.000 description 2
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R33/00—Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
- H01R33/74—Devices having four or more poles, e.g. holders for compact fluorescent lamps
- H01R33/76—Holders with sockets, clips, or analogous contacts adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
- H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
- H01R13/2414—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means conductive elastomers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/70—Coupling devices
- H01R12/71—Coupling devices for rigid printing circuits or like structures
- H01R12/712—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit
- H01R12/714—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit with contacts abutting directly the printed circuit; Button contacts therefore provided on the printed circuit
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
- H01R13/2435—Contacts for co-operating by abutting resilient; resiliently-mounted with opposite contact points, e.g. C beam
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R31/00—Coupling parts supported only by co-operation with counterpart
- H01R31/06—Intermediate parts for linking two coupling parts, e.g. adapter
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R2201/00—Connectors or connections adapted for particular applications
- H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
- Connecting Device With Holders (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Air Bags (AREA)
- Cable Accessories (AREA)
- Electron Sources, Ion Sources (AREA)
- Seal Device For Vehicle (AREA)
- Surgical Instruments (AREA)
- Paper (AREA)
Abstract
【解決手段】接触テストは、複数の対向面と、ハウジングにて同対向面間に延びる1つ以上のスロットとを備える。同セットの使用中、第1の面はDUTに近接し、第2の面はテストサイトにおけるロードボードに近接する。1つのスロットには1つのコンタクトが収容され、各コンタクトはDUTのリードに係合可能な第1の端部を有する。各コンタクトの第2の端部は対応する端子と係合される。各コンタクトは、DUTの対応するリードに係合されない第1の配向位置と、DUTがDUTの対応するリードに係合されスロット内に向けて付勢される第2の配向位置との間を移動可能である。エラストマは第1の配向位置に向けてコンタクトを付勢する。
【選択図】図1
Description
使用時には、集積回路のリードは、曲面をもってコンタクトの始端に係合される。この動作により、前部エラストマは圧縮される。コンタクトは、終端を貫通する軸線により画定される曲面の周りを回転する。曲面に隣接する終端の直線状接触面は、ロードボードの端子パッドに平行に延びると共に同パッドに係合している。このコンタクト構造は、ロードボードの端子パッドに対するコンタクトの摺動を、実質的に消失させる傾向にある。コンタクトにおける端子パッドとの係合部は、コンタクトの回動によって前方に移動し、同時に終端と端子パッドとの間の摺動を阻止する。
図1に示されるように、コンタクタアセンブリ5は、ハウジング10に収容される。ハウジング10は、対を成す複数の対向縁部に対して基本的に直交すると共に、互いに平行に延びると共に対向する略平面状側面22を有する。ハウジング10は、集積回路デバイス(DUT)14のロードボード12への電気的な接続を実現すべく構成される。デバイス14は複数のリード17を備え、ロードボード12は、ハウジング10に収容された複数のコンタクト18に電気的に接続される複数の端子又はパッド16を備える。
Claims (4)
- 複数の対向面を備えるハウジングと、第1の面はテスト対象となる集積回路により近接可能であり、第2の面はロードボードに近接することと、1つのスロットが、対向面のうちの第1の面から同対向する面のうちの第2の面までハウジングを通って延びることと、
リードに係合可能な第1の端部と、端子と係合される第2の端部とを備えるとともに前記スロットに収容可能なコンタクトと、同コンタクトは、集積回路のリードに係合されない第1の配向位置と、コンタクトの第1の端部が集積回路のリードに係合され、かつ、スロット内に向けて付勢される第2の配向位置との間で移動可能であることと、
コンタクトを第1の配向位置に付勢するための手段とを備え、
テスト対象となる集積回路のリードをテストサイトのロードボードの対応する端子に電気的に接続するための装置であって、
コンタクトが第1の配向位置と第2の配向位置との間で移動される際に、同コンタクトの第2の端部の前記端子に対する摺動を阻止する装置。 - 前記コンタクトは略S字形状を有する請求項1に記載の装置。
- 前記付勢手段は前記コンタクトの第1の端部とインターフェースする第1のエラストマと、同コンタクトの第2の端部とインターフェースする第2のエラストマとを備える請求項2に記載の装置。
- 前記コンタクトの第2の端部は突出部を備え、前記ハウジングは、同コンタクトの第2の端部が端子にて摺動することを阻止すべく、同突出部によって係合される1つの壁面を形成する請求項3に記載の装置。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US46502203P | 2003-04-23 | 2003-04-23 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2004325451A true JP2004325451A (ja) | 2004-11-18 |
JP2004325451A5 JP2004325451A5 (ja) | 2007-05-17 |
JP4677200B2 JP4677200B2 (ja) | 2011-04-27 |
Family
ID=33131944
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2004128522A Expired - Lifetime JP4677200B2 (ja) | 2003-04-23 | 2004-04-23 | 集積回路をテストサイトのロードボードに電気的に接続するための装置 |
Country Status (11)
Country | Link |
---|---|
US (2) | US7059866B2 (ja) |
EP (1) | EP1482595B1 (ja) |
JP (1) | JP4677200B2 (ja) |
KR (1) | KR101123718B1 (ja) |
CN (2) | CN1591986A (ja) |
AT (1) | ATE459995T1 (ja) |
DE (1) | DE602004025765D1 (ja) |
HK (1) | HK1199106A1 (ja) |
MY (3) | MY139036A (ja) |
SG (1) | SG137682A1 (ja) |
TW (1) | TWI291271B (ja) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007248460A (ja) * | 2006-02-24 | 2007-09-27 | Johnstech Internatl Corp | 電子装置のテストセット及びそれに用いられる端子 |
WO2008044467A1 (fr) * | 2006-10-05 | 2008-04-17 | Kabushiki Kaisha Nihon Micronics | Appareil de connexion electrique |
WO2008044509A1 (en) * | 2006-10-12 | 2008-04-17 | Kabushiki Kaisha Nihon Micronics | Electrical connection device |
US7914295B2 (en) | 2008-11-12 | 2011-03-29 | Yamaichi Electronics Co., Ltd. | Electrical connecting device |
WO2017122680A1 (ja) * | 2016-01-12 | 2017-07-20 | オーキンス エレクトロニクス カンパニー,リミテッド | コンタクトピンおよび異方導電性部材 |
JP2019035660A (ja) * | 2017-08-15 | 2019-03-07 | 株式会社日本マイクロニクス | 電気的接続装置 |
Families Citing this family (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7625219B2 (en) * | 2005-04-21 | 2009-12-01 | Kabushiki Kaisha Nihon Micronics | Electrical connecting apparatus |
US7445465B2 (en) * | 2005-07-08 | 2008-11-04 | Johnstech International Corporation | Test socket |
JP2009043591A (ja) | 2007-08-09 | 2009-02-26 | Yamaichi Electronics Co Ltd | Icソケット |
US8278955B2 (en) | 2008-03-24 | 2012-10-02 | Interconnect Devices, Inc. | Test interconnect |
US20090289647A1 (en) | 2008-05-01 | 2009-11-26 | Interconnect Devices, Inc. | Interconnect system |
TW201027849A (en) * | 2009-01-13 | 2010-07-16 | Yi-Zhi Yang | Connector |
USD668625S1 (en) | 2010-07-22 | 2012-10-09 | Titan Semiconductor Tool, LLC | Integrated circuit socket connector |
US7918669B1 (en) * | 2010-07-22 | 2011-04-05 | Titan Semiconductor Tool, LLC | Integrated circuit socket with a two-piece connector with a rocker arm |
SG193040A1 (en) * | 2012-02-21 | 2013-09-30 | Test Max Mfg Pte Ltd | Test socket with hook-like pin contact edge |
US9274141B1 (en) | 2013-01-22 | 2016-03-01 | Johnstech International Corporation | Low resistance low wear test pin for test contactor |
TWI500222B (zh) * | 2013-07-12 | 2015-09-11 | Ccp Contact Probes Co Ltd | 連接器組合 |
US9425529B2 (en) * | 2014-06-20 | 2016-08-23 | Xcerra Corporation | Integrated circuit chip tester with an anti-rotation link |
US10114039B1 (en) * | 2015-04-24 | 2018-10-30 | Johnstech International Corporation | Selectively geometric shaped contact pin for electronic component testing and method of fabrication |
US9343830B1 (en) * | 2015-06-08 | 2016-05-17 | Xcerra Corporation | Integrated circuit chip tester with embedded micro link |
US9958499B1 (en) * | 2015-07-07 | 2018-05-01 | Johnstech International Corporation | Constant stress pin tip for testing integrated circuit chips |
US10436819B1 (en) * | 2015-07-07 | 2019-10-08 | Johnstech International Corporation | Constant pressure pin tip for testing integrated circuit chips |
US10761112B1 (en) | 2017-09-11 | 2020-09-01 | Johnstech International Corporation | Self flattening test socket with anti-bowing and elastomer retention |
MX2020007325A (es) * | 2017-09-25 | 2021-01-29 | Johnstech Int Corporation | Contactor de alto grado de aislamiento con clavija de prueba y carcasa para probar circuitos integrados. |
MY189415A (en) * | 2018-02-27 | 2022-02-10 | Jf Microtechnology Sdn Bhd | Horizontal clamp electrical contact assembly |
CN110320390B (zh) * | 2019-08-08 | 2021-12-10 | 深圳市研测科技有限公司 | 一种引脚保护型二极管测试用夹持工装 |
CN111129825A (zh) * | 2019-11-20 | 2020-05-08 | 苏州韬盛电子科技有限公司 | 一种用于测试集成电路的连接装置 |
CN111060802A (zh) * | 2019-11-28 | 2020-04-24 | 苏州韬盛电子科技有限公司 | 用于大电流测试以及高频测试的金属接触器 |
US11906576B1 (en) | 2021-05-04 | 2024-02-20 | Johnstech International Corporation | Contact assembly array and testing system having contact assembly array |
US11867752B1 (en) | 2021-05-13 | 2024-01-09 | Johnstech International Corporation | Contact assembly and kelvin testing system having contact assembly |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05174880A (ja) * | 1991-01-09 | 1993-07-13 | David A Johnson | 電気的相互接続コンタクト装置 |
US5594355A (en) * | 1994-07-19 | 1997-01-14 | Delta Design, Inc. | Electrical contactor apparatus for testing integrated circuit devices |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5388996A (en) * | 1991-01-09 | 1995-02-14 | Johnson; David A. | Electrical interconnect contact system |
US5749738A (en) * | 1991-01-09 | 1998-05-12 | Johnstech International Corporation | Electrical interconnect contact system |
US5634801A (en) * | 1991-01-09 | 1997-06-03 | Johnstech International Corporation | Electrical interconnect contact system |
US5069629A (en) * | 1991-01-09 | 1991-12-03 | Johnson David A | Electrical interconnect contact system |
FR2703839B1 (fr) * | 1993-04-09 | 1995-07-07 | Framatome Connectors France | Connecteur intermédiaire entre carte de circuit imprimé et substrat à circuits électroniques. |
EP0701925B1 (en) * | 1994-09-14 | 1999-03-03 | Sumitomo Wiring Systems, Ltd. | A branch connection device for an automotive vehicle |
US6019612A (en) * | 1997-02-10 | 2000-02-01 | Kabushiki Kaisha Nihon Micronics | Electrical connecting apparatus for electrically connecting a device to be tested |
US5938451A (en) * | 1997-05-06 | 1999-08-17 | Gryphics, Inc. | Electrical connector with multiple modes of compliance |
MY128129A (en) * | 1997-09-16 | 2007-01-31 | Tan Yin Leong | Electrical contactor for testing integrated circuit devices |
JP2001319749A (ja) | 2000-05-02 | 2001-11-16 | Sony Corp | Icソケット |
JP2002043004A (ja) | 2000-07-19 | 2002-02-08 | Nec Yamagata Ltd | Icソケット |
KR100351676B1 (ko) * | 2000-10-12 | 2002-09-05 | 주식회사 우영 | 콘택핀 및 이것을 구비한 집적회로 패키지 테스트용 소켓 |
-
2004
- 2004-04-22 US US10/829,577 patent/US7059866B2/en not_active Expired - Lifetime
- 2004-04-23 CN CNA2004100430576A patent/CN1591986A/zh active Pending
- 2004-04-23 TW TW093111453A patent/TWI291271B/zh active
- 2004-04-23 SG SG200402722-3A patent/SG137682A1/en unknown
- 2004-04-23 AT AT04009710T patent/ATE459995T1/de not_active IP Right Cessation
- 2004-04-23 MY MYPI20041488A patent/MY139036A/en unknown
- 2004-04-23 CN CN201410152922.4A patent/CN103884877B/zh not_active Expired - Lifetime
- 2004-04-23 DE DE602004025765T patent/DE602004025765D1/de not_active Expired - Lifetime
- 2004-04-23 JP JP2004128522A patent/JP4677200B2/ja not_active Expired - Lifetime
- 2004-04-23 KR KR1020040028436A patent/KR101123718B1/ko active IP Right Grant
- 2004-04-23 EP EP04009710A patent/EP1482595B1/en not_active Expired - Lifetime
-
2006
- 2006-06-09 US US11/423,348 patent/US7338293B2/en not_active Expired - Lifetime
-
2008
- 2008-05-26 MY MYPI20081761A patent/MY143457A/en unknown
- 2008-05-26 MY MYPI20081762A patent/MY157930A/en unknown
-
2014
- 2014-12-16 HK HK14112611.8A patent/HK1199106A1/xx not_active IP Right Cessation
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05174880A (ja) * | 1991-01-09 | 1993-07-13 | David A Johnson | 電気的相互接続コンタクト装置 |
US5594355A (en) * | 1994-07-19 | 1997-01-14 | Delta Design, Inc. | Electrical contactor apparatus for testing integrated circuit devices |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007248460A (ja) * | 2006-02-24 | 2007-09-27 | Johnstech Internatl Corp | 電子装置のテストセット及びそれに用いられる端子 |
WO2008044467A1 (fr) * | 2006-10-05 | 2008-04-17 | Kabushiki Kaisha Nihon Micronics | Appareil de connexion electrique |
JP2008089555A (ja) * | 2006-10-05 | 2008-04-17 | Micronics Japan Co Ltd | 電気的接続装置 |
WO2008044509A1 (en) * | 2006-10-12 | 2008-04-17 | Kabushiki Kaisha Nihon Micronics | Electrical connection device |
JP2008096270A (ja) * | 2006-10-12 | 2008-04-24 | Micronics Japan Co Ltd | 電気的接続装置 |
US7819672B2 (en) | 2006-10-12 | 2010-10-26 | Kabushiki Kaisha Nihon Micronics | Electrical connecting apparatus with inclined probe recess surfaces |
US7914295B2 (en) | 2008-11-12 | 2011-03-29 | Yamaichi Electronics Co., Ltd. | Electrical connecting device |
WO2017122680A1 (ja) * | 2016-01-12 | 2017-07-20 | オーキンス エレクトロニクス カンパニー,リミテッド | コンタクトピンおよび異方導電性部材 |
JP2019035660A (ja) * | 2017-08-15 | 2019-03-07 | 株式会社日本マイクロニクス | 電気的接続装置 |
JP7046527B2 (ja) | 2017-08-15 | 2022-04-04 | 株式会社日本マイクロニクス | 電気的接続装置 |
Also Published As
Publication number | Publication date |
---|---|
JP4677200B2 (ja) | 2011-04-27 |
US7338293B2 (en) | 2008-03-04 |
EP1482595B1 (en) | 2010-03-03 |
ATE459995T1 (de) | 2010-03-15 |
US7059866B2 (en) | 2006-06-13 |
KR20040093047A (ko) | 2004-11-04 |
CN103884877A (zh) | 2014-06-25 |
MY143457A (en) | 2011-05-13 |
CN103884877B (zh) | 2018-06-15 |
US20040248448A1 (en) | 2004-12-09 |
KR101123718B1 (ko) | 2012-03-15 |
US20060216962A1 (en) | 2006-09-28 |
DE602004025765D1 (de) | 2010-04-15 |
TW200511664A (en) | 2005-03-16 |
SG137682A1 (en) | 2007-12-28 |
EP1482595A3 (en) | 2006-07-12 |
TWI291271B (en) | 2007-12-11 |
HK1199106A1 (en) | 2015-08-07 |
EP1482595A2 (en) | 2004-12-01 |
MY139036A (en) | 2009-08-28 |
MY157930A (en) | 2016-08-15 |
CN1591986A (zh) | 2005-03-09 |
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