HK1199106A1 - Improved integrated circuit contact with test apparatus - Google Patents
Improved integrated circuit contact with test apparatusInfo
- Publication number
- HK1199106A1 HK1199106A1 HK14112611.8A HK14112611A HK1199106A1 HK 1199106 A1 HK1199106 A1 HK 1199106A1 HK 14112611 A HK14112611 A HK 14112611A HK 1199106 A1 HK1199106 A1 HK 1199106A1
- Authority
- HK
- Hong Kong
- Prior art keywords
- integrated circuit
- contact
- test apparatus
- circuit contact
- improved integrated
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R33/00—Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
- H01R33/74—Devices having four or more poles, e.g. holders for compact fluorescent lamps
- H01R33/76—Holders with sockets, clips, or analogous contacts adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
- H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
- H01R13/2414—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means conductive elastomers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/70—Coupling devices
- H01R12/71—Coupling devices for rigid printing circuits or like structures
- H01R12/712—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit
- H01R12/714—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit with contacts abutting directly the printed circuit; Button contacts therefore provided on the printed circuit
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
- H01R13/2435—Contacts for co-operating by abutting resilient; resiliently-mounted with opposite contact points, e.g. C beam
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R31/00—Coupling parts supported only by co-operation with counterpart
- H01R31/06—Intermediate parts for linking two coupling parts, e.g. adapter
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R2201/00—Connectors or connections adapted for particular applications
- H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
- Connecting Device With Holders (AREA)
- Seal Device For Vehicle (AREA)
- Surgical Instruments (AREA)
- Paper (AREA)
- Air Bags (AREA)
- Cable Accessories (AREA)
- Electron Sources, Ion Sources (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US46502203P | 2003-04-23 | 2003-04-23 | |
US10/829,577 US7059866B2 (en) | 2003-04-23 | 2004-04-22 | integrated circuit contact to test apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
HK1199106A1 true HK1199106A1 (en) | 2015-08-07 |
Family
ID=33131944
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK14112611.8A HK1199106A1 (en) | 2003-04-23 | 2014-12-16 | Improved integrated circuit contact with test apparatus |
Country Status (11)
Country | Link |
---|---|
US (2) | US7059866B2 (ja) |
EP (1) | EP1482595B1 (ja) |
JP (1) | JP4677200B2 (ja) |
KR (1) | KR101123718B1 (ja) |
CN (2) | CN103884877B (ja) |
AT (1) | ATE459995T1 (ja) |
DE (1) | DE602004025765D1 (ja) |
HK (1) | HK1199106A1 (ja) |
MY (3) | MY139036A (ja) |
SG (1) | SG137682A1 (ja) |
TW (1) | TWI291271B (ja) |
Families Citing this family (30)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4472002B2 (ja) * | 2005-04-21 | 2010-06-02 | 株式会社日本マイクロニクス | 電気的接続装置 |
US7445465B2 (en) * | 2005-07-08 | 2008-11-04 | Johnstech International Corporation | Test socket |
US7639026B2 (en) * | 2006-02-24 | 2009-12-29 | Johnstech International Corporation | Electronic device test set and contact used therein |
JP5134803B2 (ja) * | 2006-10-05 | 2013-01-30 | 株式会社日本マイクロニクス | 電気的接続装置 |
JP5134805B2 (ja) * | 2006-10-12 | 2013-01-30 | 株式会社日本マイクロニクス | 電気的接続装置 |
JP2009043591A (ja) | 2007-08-09 | 2009-02-26 | Yamaichi Electronics Co Ltd | Icソケット |
US8278955B2 (en) | 2008-03-24 | 2012-10-02 | Interconnect Devices, Inc. | Test interconnect |
US20090289647A1 (en) | 2008-05-01 | 2009-11-26 | Interconnect Devices, Inc. | Interconnect system |
JP5029969B2 (ja) * | 2008-11-12 | 2012-09-19 | 山一電機株式会社 | 電気接続装置 |
TW201027849A (en) * | 2009-01-13 | 2010-07-16 | Yi-Zhi Yang | Connector |
USD668625S1 (en) | 2010-07-22 | 2012-10-09 | Titan Semiconductor Tool, LLC | Integrated circuit socket connector |
US7918669B1 (en) * | 2010-07-22 | 2011-04-05 | Titan Semiconductor Tool, LLC | Integrated circuit socket with a two-piece connector with a rocker arm |
SG193040A1 (en) * | 2012-02-21 | 2013-09-30 | Test Max Mfg Pte Ltd | Test socket with hook-like pin contact edge |
US9274141B1 (en) | 2013-01-22 | 2016-03-01 | Johnstech International Corporation | Low resistance low wear test pin for test contactor |
TWI500222B (zh) * | 2013-07-12 | 2015-09-11 | Ccp Contact Probes Co Ltd | 連接器組合 |
US9425529B2 (en) | 2014-06-20 | 2016-08-23 | Xcerra Corporation | Integrated circuit chip tester with an anti-rotation link |
US10114039B1 (en) * | 2015-04-24 | 2018-10-30 | Johnstech International Corporation | Selectively geometric shaped contact pin for electronic component testing and method of fabrication |
US9343830B1 (en) * | 2015-06-08 | 2016-05-17 | Xcerra Corporation | Integrated circuit chip tester with embedded micro link |
US10436819B1 (en) * | 2015-07-07 | 2019-10-08 | Johnstech International Corporation | Constant pressure pin tip for testing integrated circuit chips |
US9958499B1 (en) * | 2015-07-07 | 2018-05-01 | Johnstech International Corporation | Constant stress pin tip for testing integrated circuit chips |
JP2017125696A (ja) * | 2016-01-12 | 2017-07-20 | オーキンス エレクトロニクス カンパニー,リミテッド | コンタクトピンおよび異方導電性部材 |
JP7046527B2 (ja) * | 2017-08-15 | 2022-04-04 | 株式会社日本マイクロニクス | 電気的接続装置 |
US10761112B1 (en) | 2017-09-11 | 2020-09-01 | Johnstech International Corporation | Self flattening test socket with anti-bowing and elastomer retention |
SG11202000790YA (en) * | 2017-09-25 | 2020-02-27 | Johnstech Int Corporation | High isolation contactor with test pin and housing for integrated circuit testing |
MY189415A (en) * | 2018-02-27 | 2022-02-10 | Jf Microtechnology Sdn Bhd | Horizontal clamp electrical contact assembly |
CN110320390B (zh) * | 2019-08-08 | 2021-12-10 | 深圳市研测科技有限公司 | 一种引脚保护型二极管测试用夹持工装 |
CN111129825A (zh) * | 2019-11-20 | 2020-05-08 | 苏州韬盛电子科技有限公司 | 一种用于测试集成电路的连接装置 |
CN111060802A (zh) * | 2019-11-28 | 2020-04-24 | 苏州韬盛电子科技有限公司 | 用于大电流测试以及高频测试的金属接触器 |
US11906576B1 (en) | 2021-05-04 | 2024-02-20 | Johnstech International Corporation | Contact assembly array and testing system having contact assembly array |
US11867752B1 (en) | 2021-05-13 | 2024-01-09 | Johnstech International Corporation | Contact assembly and kelvin testing system having contact assembly |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5388996A (en) * | 1991-01-09 | 1995-02-14 | Johnson; David A. | Electrical interconnect contact system |
US5749738A (en) | 1991-01-09 | 1998-05-12 | Johnstech International Corporation | Electrical interconnect contact system |
US5634801A (en) * | 1991-01-09 | 1997-06-03 | Johnstech International Corporation | Electrical interconnect contact system |
US5207584A (en) * | 1991-01-09 | 1993-05-04 | Johnson David A | Electrical interconnect contact system |
US5069629A (en) * | 1991-01-09 | 1991-12-03 | Johnson David A | Electrical interconnect contact system |
FR2703839B1 (fr) * | 1993-04-09 | 1995-07-07 | Framatome Connectors France | Connecteur intermédiaire entre carte de circuit imprimé et substrat à circuits électroniques. |
US5594355A (en) * | 1994-07-19 | 1997-01-14 | Delta Design, Inc. | Electrical contactor apparatus for testing integrated circuit devices |
DE69508015T2 (de) * | 1994-09-14 | 1999-09-23 | Sumitomo Wiring Systems, Ltd. | Zentralelektrik für Kraftfahrzeuge |
US6019612A (en) * | 1997-02-10 | 2000-02-01 | Kabushiki Kaisha Nihon Micronics | Electrical connecting apparatus for electrically connecting a device to be tested |
US5938451A (en) * | 1997-05-06 | 1999-08-17 | Gryphics, Inc. | Electrical connector with multiple modes of compliance |
MY128129A (en) * | 1997-09-16 | 2007-01-31 | Tan Yin Leong | Electrical contactor for testing integrated circuit devices |
JP2001319749A (ja) | 2000-05-02 | 2001-11-16 | Sony Corp | Icソケット |
JP2002043004A (ja) | 2000-07-19 | 2002-02-08 | Nec Yamagata Ltd | Icソケット |
KR100351676B1 (ko) * | 2000-10-12 | 2002-09-05 | 주식회사 우영 | 콘택핀 및 이것을 구비한 집적회로 패키지 테스트용 소켓 |
-
2004
- 2004-04-22 US US10/829,577 patent/US7059866B2/en not_active Expired - Lifetime
- 2004-04-23 SG SG200402722-3A patent/SG137682A1/en unknown
- 2004-04-23 CN CN201410152922.4A patent/CN103884877B/zh not_active Expired - Lifetime
- 2004-04-23 KR KR1020040028436A patent/KR101123718B1/ko active IP Right Grant
- 2004-04-23 TW TW093111453A patent/TWI291271B/zh not_active IP Right Cessation
- 2004-04-23 EP EP04009710A patent/EP1482595B1/en not_active Expired - Lifetime
- 2004-04-23 CN CNA2004100430576A patent/CN1591986A/zh active Pending
- 2004-04-23 AT AT04009710T patent/ATE459995T1/de not_active IP Right Cessation
- 2004-04-23 JP JP2004128522A patent/JP4677200B2/ja not_active Expired - Lifetime
- 2004-04-23 DE DE602004025765T patent/DE602004025765D1/de not_active Expired - Lifetime
- 2004-04-23 MY MYPI20041488A patent/MY139036A/en unknown
-
2006
- 2006-06-09 US US11/423,348 patent/US7338293B2/en not_active Expired - Lifetime
-
2008
- 2008-05-26 MY MYPI20081761A patent/MY143457A/en unknown
- 2008-05-26 MY MYPI20081762A patent/MY157930A/en unknown
-
2014
- 2014-12-16 HK HK14112611.8A patent/HK1199106A1/xx not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
MY139036A (en) | 2009-08-28 |
KR20040093047A (ko) | 2004-11-04 |
US7338293B2 (en) | 2008-03-04 |
MY143457A (en) | 2011-05-13 |
ATE459995T1 (de) | 2010-03-15 |
DE602004025765D1 (de) | 2010-04-15 |
CN103884877A (zh) | 2014-06-25 |
CN103884877B (zh) | 2018-06-15 |
SG137682A1 (en) | 2007-12-28 |
CN1591986A (zh) | 2005-03-09 |
US7059866B2 (en) | 2006-06-13 |
JP4677200B2 (ja) | 2011-04-27 |
JP2004325451A (ja) | 2004-11-18 |
EP1482595A2 (en) | 2004-12-01 |
TWI291271B (en) | 2007-12-11 |
US20040248448A1 (en) | 2004-12-09 |
EP1482595B1 (en) | 2010-03-03 |
EP1482595A3 (en) | 2006-07-12 |
KR101123718B1 (ko) | 2012-03-15 |
TW200511664A (en) | 2005-03-16 |
MY157930A (en) | 2016-08-15 |
US20060216962A1 (en) | 2006-09-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PE | Patent expired |
Effective date: 20240422 |