JP2004178709A5 - - Google Patents

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Publication number
JP2004178709A5
JP2004178709A5 JP2002344445A JP2002344445A JP2004178709A5 JP 2004178709 A5 JP2004178709 A5 JP 2004178709A5 JP 2002344445 A JP2002344445 A JP 2002344445A JP 2002344445 A JP2002344445 A JP 2002344445A JP 2004178709 A5 JP2004178709 A5 JP 2004178709A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2002344445A
Other languages
Japanese (ja)
Other versions
JP4266302B2 (ja
JP2004178709A (ja
Filing date
Publication date
Priority claimed from JP2002344445A external-priority patent/JP4266302B2/ja
Priority to JP2002344445A priority Critical patent/JP4266302B2/ja
Application filed filed Critical
Priority to US10/440,157 priority patent/US6898114B2/en
Priority to CNB031786626A priority patent/CN100380520C/zh
Publication of JP2004178709A publication Critical patent/JP2004178709A/ja
Priority to US11/045,136 priority patent/US6947320B2/en
Priority to US11/209,630 priority patent/US7154777B2/en
Publication of JP2004178709A5 publication Critical patent/JP2004178709A5/ja
Priority to US11/602,950 priority patent/US7292472B2/en
Publication of JP4266302B2 publication Critical patent/JP4266302B2/ja
Application granted granted Critical
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2002344445A 2002-11-27 2002-11-27 不揮発性記憶装置 Expired - Fee Related JP4266302B2 (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP2002344445A JP4266302B2 (ja) 2002-11-27 2002-11-27 不揮発性記憶装置
US10/440,157 US6898114B2 (en) 2002-11-27 2003-05-19 Memory device capable of stable data writing
CNB031786626A CN100380520C (zh) 2002-11-27 2003-07-18 可稳定地进行数据写入的存储装置
US11/045,136 US6947320B2 (en) 2002-11-27 2005-01-31 Memory device capable of stable data writing
US11/209,630 US7154777B2 (en) 2002-11-27 2005-08-24 Memory device capable of stable data writing
US11/602,950 US7292472B2 (en) 2002-11-27 2006-11-22 Memory device capable of stable data writing

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002344445A JP4266302B2 (ja) 2002-11-27 2002-11-27 不揮発性記憶装置

Publications (3)

Publication Number Publication Date
JP2004178709A JP2004178709A (ja) 2004-06-24
JP2004178709A5 true JP2004178709A5 (enExample) 2005-12-22
JP4266302B2 JP4266302B2 (ja) 2009-05-20

Family

ID=32322024

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002344445A Expired - Fee Related JP4266302B2 (ja) 2002-11-27 2002-11-27 不揮発性記憶装置

Country Status (3)

Country Link
US (4) US6898114B2 (enExample)
JP (1) JP4266302B2 (enExample)
CN (1) CN100380520C (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4266302B2 (ja) * 2002-11-27 2009-05-20 株式会社ルネサステクノロジ 不揮発性記憶装置
US20110141802A1 (en) * 2009-12-15 2011-06-16 Grandis, Inc. Method and system for providing a high density memory cell for spin transfer torque random access memory
JP5706635B2 (ja) * 2010-06-24 2015-04-22 ルネサスエレクトロニクス株式会社 半導体装置及びその内部回路の制御方法
JP5214002B2 (ja) * 2011-08-12 2013-06-19 ルネサスエレクトロニクス株式会社 不揮発性記憶装置
US9245926B2 (en) 2012-05-07 2016-01-26 Micron Technology, Inc. Apparatuses and methods including memory access in cross point memory
US8675423B2 (en) 2012-05-07 2014-03-18 Micron Technology, Inc. Apparatuses and methods including supply current in memory
JP2013140667A (ja) * 2013-03-11 2013-07-18 Hitachi Ltd 半導体装置
US9361990B1 (en) * 2014-12-18 2016-06-07 SanDisk Technologies, Inc. Time domain ramp rate control for erase inhibit in flash memory
CN113228179B (zh) 2018-11-30 2022-08-09 合肥睿科微电子有限公司 双精度模拟存储器单元及阵列
US11139025B2 (en) 2020-01-22 2021-10-05 International Business Machines Corporation Multi-level cell threshold voltage operation of one-selector-one-resistor structure included in a crossbar array
US11587635B2 (en) * 2020-09-04 2023-02-21 Micron Technology, Inc. Selective inhibition of memory

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5384730A (en) * 1991-05-31 1995-01-24 Thunderbird Technologies, Inc. Coincident activation of pass transistors in a random access memory
JP3705842B2 (ja) * 1994-08-04 2005-10-12 株式会社ルネサステクノロジ 半導体装置
US6462998B1 (en) * 1999-02-13 2002-10-08 Integrated Device Technology, Inc. Programmable and electrically configurable latch timing circuit
US6212109B1 (en) * 1999-02-13 2001-04-03 Integrated Device Technology, Inc. Dynamic memory array having write data applied to selected bit line sense amplifiers before sensing to write associated selected memory cells
US6462584B1 (en) * 1999-02-13 2002-10-08 Integrated Device Technology, Inc. Generating a tail current for a differential transistor pair using a capacitive device to project a current flowing through a current source device onto a node having a different voltage than the current source device
JP3913952B2 (ja) * 1999-12-28 2007-05-09 株式会社東芝 半導体記憶装置
JP4326127B2 (ja) * 2000-07-07 2009-09-02 株式会社ルネサステクノロジ 半導体記憶装置
JP4726290B2 (ja) 2000-10-17 2011-07-20 ルネサスエレクトロニクス株式会社 半導体集積回路
ATE397056T1 (de) * 2001-07-11 2008-06-15 Sfa International Inc Verfahren zur verminderung der rauch- und teilchenemissionen aus flüssige petroleumkraftstoffe brauchenden kompressionsanzündungskolbenkraftmaschinen
JP4570313B2 (ja) * 2001-10-25 2010-10-27 ルネサスエレクトロニクス株式会社 薄膜磁性体記憶装置
JP4208500B2 (ja) * 2002-06-27 2009-01-14 株式会社ルネサステクノロジ 薄膜磁性体記憶装置
US6940777B2 (en) * 2002-10-31 2005-09-06 Renesas Technology Corp. Semiconductor device and semiconductor memory device provided with internal current setting adjustment circuit
JP4365576B2 (ja) * 2002-11-22 2009-11-18 Tdk株式会社 磁気メモリデバイスおよび書込電流駆動回路、並びに書込電流駆動方法
JP4266302B2 (ja) * 2002-11-27 2009-05-20 株式会社ルネサステクノロジ 不揮発性記憶装置
JP3857640B2 (ja) * 2002-11-29 2006-12-13 株式会社東芝 半導体記憶装置
JP2004348815A (ja) * 2003-05-20 2004-12-09 Sharp Corp 半導体記憶装置のドライバ回路及び携帯電子機器

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