JP2004111776A5 - - Google Patents
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- Publication number
- JP2004111776A5 JP2004111776A5 JP2002274554A JP2002274554A JP2004111776A5 JP 2004111776 A5 JP2004111776 A5 JP 2004111776A5 JP 2002274554 A JP2002274554 A JP 2002274554A JP 2002274554 A JP2002274554 A JP 2002274554A JP 2004111776 A5 JP2004111776 A5 JP 2004111776A5
- Authority
- JP
- Japan
- Prior art keywords
- solid
- solid substrate
- manufacturing
- plasma
- desired particles
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000007787 solid Substances 0.000 claims 17
- 239000002245 particle Substances 0.000 claims 10
- 239000000758 substrate Substances 0.000 claims 10
- 238000004519 manufacturing process Methods 0.000 claims 7
- 239000004065 semiconductor Substances 0.000 claims 7
- 239000007789 gas Substances 0.000 claims 5
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims 4
- 239000001257 hydrogen Substances 0.000 claims 4
- 229910052739 hydrogen Inorganic materials 0.000 claims 4
- 230000001678 irradiating effect Effects 0.000 claims 4
- 125000002887 hydroxy group Chemical group [H]O* 0.000 claims 3
- 239000012535 impurity Substances 0.000 claims 3
- 238000000034 method Methods 0.000 claims 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims 2
- 238000000137 annealing Methods 0.000 claims 2
- 238000000018 DNA microarray Methods 0.000 claims 1
- 229910052786 argon Inorganic materials 0.000 claims 1
- 239000003990 capacitor Substances 0.000 claims 1
- 150000002500 ions Chemical class 0.000 claims 1
- 239000004973 liquid crystal related substance Substances 0.000 claims 1
- 239000000126 substance Substances 0.000 claims 1
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2002274554A JP2004111776A (ja) | 2002-09-20 | 2002-09-20 | 不純物導入方法、装置および素子 |
| AU2003266541A AU2003266541A1 (en) | 2002-09-20 | 2003-09-19 | Method of introducing impurity, device and element |
| TW092125948A TW200415666A (en) | 2002-09-20 | 2003-09-19 | Impurity introduction method, apparatus and element |
| PCT/JP2003/012001 WO2004027847A1 (ja) | 2002-09-20 | 2003-09-19 | 不純物導入方法、装置および素子 |
| US10/526,999 US7547619B2 (en) | 2002-09-20 | 2003-09-19 | Method of introducing impurity, device and element |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2002274554A JP2004111776A (ja) | 2002-09-20 | 2002-09-20 | 不純物導入方法、装置および素子 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2004111776A JP2004111776A (ja) | 2004-04-08 |
| JP2004111776A5 true JP2004111776A5 (enExample) | 2005-09-22 |
Family
ID=32025003
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2002274554A Pending JP2004111776A (ja) | 2002-09-20 | 2002-09-20 | 不純物導入方法、装置および素子 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US7547619B2 (enExample) |
| JP (1) | JP2004111776A (enExample) |
| AU (1) | AU2003266541A1 (enExample) |
| TW (1) | TW200415666A (enExample) |
| WO (1) | WO2004027847A1 (enExample) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101008509B1 (ko) | 2006-01-17 | 2011-01-17 | 브로드콤 코포레이션 | 파워 오버 이더넷 컨트롤러 집적 회로 아키텍처 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3263058B2 (ja) | 1989-12-01 | 2002-03-04 | セイコーインスツルメンツ株式会社 | 半導体内壁に対する不純物の注入方法 |
| JP3130906B2 (ja) | 1989-12-01 | 2001-01-31 | セイコーインスツルメンツ株式会社 | 半導体内壁に対する不純物の注入方法 |
| JP3079575B2 (ja) | 1990-12-20 | 2000-08-21 | 株式会社日立製作所 | 半導体装置の製造方法 |
| JPH0794427A (ja) * | 1993-09-21 | 1995-04-07 | Nippon Telegr & Teleph Corp <Ntt> | ドーピング方法 |
| JPH0831779A (ja) * | 1994-07-13 | 1996-02-02 | Japan Energy Corp | 化合物半導体基板の研磨方法 |
| JPH08172214A (ja) | 1994-08-24 | 1996-07-02 | Seiko Instr Inc | 光電変換半導体装置の製造方法 |
| JPH097962A (ja) * | 1995-06-15 | 1997-01-10 | Hitachi Ltd | ボロン不純物層形成方法およびそれを用いて製造された半導体装置 |
| JP4086334B2 (ja) | 1995-08-10 | 2008-05-14 | 松下電器産業株式会社 | 不純物の導入方法 |
| US5851906A (en) * | 1995-08-10 | 1998-12-22 | Matsushita Electric Industrial Co., Ltd. | Impurity doping method |
| DE69631258T2 (de) * | 1995-10-13 | 2004-11-18 | Lam Research Corp., Fremont | Verfahren zum Entfernen von Verunreinigungen durch Bürsten |
| JPH09283456A (ja) | 1996-04-18 | 1997-10-31 | Nippon Telegr & Teleph Corp <Ntt> | 半導体装置の製造方法 |
| JP3479928B2 (ja) | 1996-09-06 | 2003-12-15 | 富士通株式会社 | 半導体結晶の製造方法 |
| JPH11204450A (ja) | 1998-01-07 | 1999-07-30 | Hitachi Ltd | 半導体装置およびその製造方法 |
-
2002
- 2002-09-20 JP JP2002274554A patent/JP2004111776A/ja active Pending
-
2003
- 2003-09-19 TW TW092125948A patent/TW200415666A/zh unknown
- 2003-09-19 WO PCT/JP2003/012001 patent/WO2004027847A1/ja not_active Ceased
- 2003-09-19 US US10/526,999 patent/US7547619B2/en not_active Expired - Lifetime
- 2003-09-19 AU AU2003266541A patent/AU2003266541A1/en not_active Abandoned
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