JP2004079887A5 - - Google Patents

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Publication number
JP2004079887A5
JP2004079887A5 JP2002240537A JP2002240537A JP2004079887A5 JP 2004079887 A5 JP2004079887 A5 JP 2004079887A5 JP 2002240537 A JP2002240537 A JP 2002240537A JP 2002240537 A JP2002240537 A JP 2002240537A JP 2004079887 A5 JP2004079887 A5 JP 2004079887A5
Authority
JP
Japan
Prior art keywords
film
conductive
oxidation
layer
unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2002240537A
Other languages
English (en)
Japanese (ja)
Other versions
JP2004079887A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2002240537A priority Critical patent/JP2004079887A/ja
Priority claimed from JP2002240537A external-priority patent/JP2004079887A/ja
Priority to TW091132546A priority patent/TWI271854B/zh
Priority to US10/346,976 priority patent/US6825507B2/en
Priority to CNB031063454A priority patent/CN1293644C/zh
Priority to KR10-2003-0041033A priority patent/KR100538192B1/ko
Publication of JP2004079887A publication Critical patent/JP2004079887A/ja
Publication of JP2004079887A5 publication Critical patent/JP2004079887A5/ja
Pending legal-status Critical Current

Links

JP2002240537A 2002-08-21 2002-08-21 半導体装置 Pending JP2004079887A (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2002240537A JP2004079887A (ja) 2002-08-21 2002-08-21 半導体装置
TW091132546A TWI271854B (en) 2002-08-21 2002-11-05 Semiconductor device
US10/346,976 US6825507B2 (en) 2002-08-21 2003-01-21 Semiconductor device having high electron mobility comprising a SiGe/Si/SiGe substrate
CNB031063454A CN1293644C (zh) 2002-08-21 2003-02-25 半导体器件
KR10-2003-0041033A KR100538192B1 (ko) 2002-08-21 2003-06-24 반도체 장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002240537A JP2004079887A (ja) 2002-08-21 2002-08-21 半導体装置

Publications (2)

Publication Number Publication Date
JP2004079887A JP2004079887A (ja) 2004-03-11
JP2004079887A5 true JP2004079887A5 (enExample) 2005-09-15

Family

ID=31884521

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002240537A Pending JP2004079887A (ja) 2002-08-21 2002-08-21 半導体装置

Country Status (5)

Country Link
US (1) US6825507B2 (enExample)
JP (1) JP2004079887A (enExample)
KR (1) KR100538192B1 (enExample)
CN (1) CN1293644C (enExample)
TW (1) TWI271854B (enExample)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1620728A (zh) * 2002-01-21 2005-05-25 松下电器产业株式会社 半导体装置
US7132338B2 (en) * 2003-10-10 2006-11-07 Applied Materials, Inc. Methods to fabricate MOSFET devices using selective deposition process
DE10360874B4 (de) * 2003-12-23 2009-06-04 Infineon Technologies Ag Feldeffekttransistor mit Heteroschichtstruktur sowie zugehöriges Herstellungsverfahren
TWI463526B (zh) 2004-06-24 2014-12-01 Ibm 改良具應力矽之ｃｍｏｓ元件的方法及以該方法製備而成的元件
US7227205B2 (en) * 2004-06-24 2007-06-05 International Business Machines Corporation Strained-silicon CMOS device and method
US7288448B2 (en) * 2004-08-24 2007-10-30 Orlowski Marius K Method and apparatus for mobility enhancement in a semiconductor device
US7335929B2 (en) * 2004-10-18 2008-02-26 Taiwan Semiconductor Manufacturing Company, Ltd. Transistor with a strained region and method of manufacture
KR100592749B1 (ko) 2004-11-17 2006-06-26 한국전자통신연구원 실리콘과 실리콘 게르마늄 이종 구조를 가지는 고전압전계효과 트랜지스터 및 그 제조 방법
US7193279B2 (en) * 2005-01-18 2007-03-20 Intel Corporation Non-planar MOS structure with a strained channel region
US7994005B2 (en) * 2007-11-01 2011-08-09 Alpha & Omega Semiconductor, Ltd High-mobility trench MOSFETs
US9245971B2 (en) * 2013-09-27 2016-01-26 Qualcomm Incorporated Semiconductor device having high mobility channel
KR102452169B1 (ko) 2015-03-11 2022-10-11 파세토, 인크. 웹 api 통신을 위한 시스템 및 방법
MX2020005623A (es) 2017-12-01 2021-01-08 Fasetto Inc Sistemas y metodos para el cifrado de datos mejorado.

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05235334A (ja) 1992-02-24 1993-09-10 Nippon Telegr & Teleph Corp <Ntt> 電界効果トランジスタ
US5461250A (en) 1992-08-10 1995-10-24 International Business Machines Corporation SiGe thin film or SOI MOSFET and method for making the same
JPH07288323A (ja) 1994-04-19 1995-10-31 Sony Corp 絶縁ゲート型電界効果トランジスタとその製法
KR0135804B1 (ko) 1994-06-13 1998-04-24 김광호 실리콘 온 인슐레이터(soi) 트랜지스터
WO2001093338A1 (en) * 2000-05-26 2001-12-06 Amberwave Systems Corporation Buried channel strained silicon fet using an ion implanted doped layer
US6680496B1 (en) * 2002-07-08 2004-01-20 Amberwave Systems Corp. Back-biasing to populate strained layer quantum wells

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