JP2004057834A5 - - Google Patents

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Publication number
JP2004057834A5
JP2004057834A5 JP2003281404A JP2003281404A JP2004057834A5 JP 2004057834 A5 JP2004057834 A5 JP 2004057834A5 JP 2003281404 A JP2003281404 A JP 2003281404A JP 2003281404 A JP2003281404 A JP 2003281404A JP 2004057834 A5 JP2004057834 A5 JP 2004057834A5
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JP
Japan
Prior art keywords
array
temperature
detector
detector array
thermoelectric cooling
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JP2003281404A
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English (en)
Japanese (ja)
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JP2004057834A (ja
JP4448668B2 (ja
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Priority claimed from US10/064,609 external-priority patent/US20040022351A1/en
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Publication of JP2004057834A publication Critical patent/JP2004057834A/ja
Publication of JP2004057834A5 publication Critical patent/JP2004057834A5/ja
Application granted granted Critical
Publication of JP4448668B2 publication Critical patent/JP4448668B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2003281404A 2002-07-30 2003-07-29 熱電制御されたx線検知器アレイ Expired - Fee Related JP4448668B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/064,609 US20040022351A1 (en) 2002-07-30 2002-07-30 Thermoelectrically controlled x-ray detector array

Publications (3)

Publication Number Publication Date
JP2004057834A JP2004057834A (ja) 2004-02-26
JP2004057834A5 true JP2004057834A5 (https=) 2008-12-25
JP4448668B2 JP4448668B2 (ja) 2010-04-14

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Family Applications (1)

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JP2003281404A Expired - Fee Related JP4448668B2 (ja) 2002-07-30 2003-07-29 熱電制御されたx線検知器アレイ

Country Status (5)

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US (2) US20040022351A1 (https=)
EP (1) EP1386582A1 (https=)
JP (1) JP4448668B2 (https=)
CN (1) CN100384376C (https=)
IL (1) IL156982A (https=)

Families Citing this family (47)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102004055752B4 (de) * 2004-11-18 2007-12-13 Siemens Ag Computertomograph
US7338208B2 (en) * 2004-11-24 2008-03-04 General Electric Company Methods and apparatus for CT system thermal control architecture
JP2006343172A (ja) * 2005-06-08 2006-12-21 Hitachi Ltd コンピュータ断層撮影装置
US7514692B2 (en) * 2005-06-22 2009-04-07 Ge Medical Systems Israel, Ltd. Method and apparatus for reducing polarization within an imaging device
CN100394891C (zh) * 2006-01-18 2008-06-18 杭州灿维信息技术服务有限公司 Ct球管油路温度无线监控系统
DE102006024972B4 (de) 2006-05-29 2008-08-21 Siemens Ag Vorrichtung zur Kühlung eines Röntgenstrahlungsdetektors und Kühlsystem für eine Strahlungsdetektoranordnung
US8492762B2 (en) * 2006-06-27 2013-07-23 General Electric Company Electrical interface for a sensor array
US7488943B2 (en) * 2006-07-17 2009-02-10 General Electric Company PET detector methods and apparatus
US7512209B2 (en) * 2006-09-14 2009-03-31 General Electric Company Thermal stabilization methods and apparatus
US7586096B2 (en) * 2006-11-17 2009-09-08 General Electric Company Interface assembly for thermally coupling a data acquisition system to a sensor array
US7449696B2 (en) * 2006-11-21 2008-11-11 General Electric Company System and apparatus for heat management
DE102007044873A1 (de) * 2007-09-20 2009-04-16 Siemens Ag Verfahren zur Stabilisierung der Verstärkung eines PET-Detektionssystems
CN101470086B (zh) * 2007-12-29 2012-11-28 清华大学 探测器装置及具有该探测器装置的ct检查系统
US20090257548A1 (en) * 2008-04-14 2009-10-15 Ashutosh Joshi Computed tomography system
US7576330B1 (en) * 2008-04-30 2009-08-18 General Electric Company Computed tomography detector apparatus
US8532250B2 (en) * 2010-02-24 2013-09-10 Kabushiki Kaisha Toshiba X-ray CT apparatus and control method for X-ray CT apparatus
KR101891940B1 (ko) * 2010-03-19 2018-08-27 브루커 나노, 인코퍼레이션. 원자력 현미경을 작동시키는 방법
US8039812B1 (en) 2010-04-13 2011-10-18 Surescan Corporation Test equipment for verification of crystal linearity at high-flux levels
JP5595804B2 (ja) * 2010-06-21 2014-09-24 株式会社東芝 X線ct装置
JP2012034848A (ja) * 2010-08-06 2012-02-23 Toshiba Corp X線検出器およびx線ct装置
US8516832B2 (en) * 2010-08-30 2013-08-27 B/E Aerospace, Inc. Control system for a food and beverage compartment thermoelectric cooling system
JPWO2012033029A1 (ja) * 2010-09-08 2014-01-20 株式会社日立メディコ X線画像診断装置
CN103260701B (zh) * 2010-12-16 2017-10-31 皇家飞利浦电子股份有限公司 采用大腔膛的核及磁共振成像或者大腔膛的ct及磁共振成像的辐射治疗规划和跟踪系统
US20130037251A1 (en) * 2011-08-11 2013-02-14 General Electric Company Liquid cooled thermal control system and method for cooling an imaging detector
EP2748641B1 (en) * 2011-10-06 2019-04-03 Koninklijke Philips N.V. Data-driven optimization of event acceptance/rejection logic
JP2013170922A (ja) * 2012-02-21 2013-09-02 Ge Medical Systems Global Technology Co Llc 放射線検出装置および放射線撮影装置
CN103330571A (zh) * 2013-04-27 2013-10-02 中国人民解放军北京军区总医院 数据采集系统及其控制方法、移动ct扫描仪
EP2848924B1 (de) * 2013-09-11 2016-08-24 Anton Paar GmbH Temperierkammer für kompaktes Röntgengerät
CN103549972B (zh) * 2013-11-18 2016-01-20 赛诺威盛科技(北京)有限公司 Ct探测器模块的支撑结构
JP6071981B2 (ja) 2013-11-29 2017-02-01 ゼネラル・エレクトリック・カンパニイ 放射線検出装置及び放射線断層撮影装置
CN103713669B (zh) * 2013-12-27 2015-09-16 赛诺威盛科技(北京)有限公司 闭环实施的精确控制ct探测器温度的装置及方法
CN104812207B (zh) * 2014-01-28 2019-03-08 Ge医疗系统环球技术有限公司 换热装置、x射线检测装置和x射线成像设备
CN104939854B (zh) * 2014-03-26 2020-08-18 Ge医疗系统环球技术有限公司 热管理系统、x射线检测装置和计算机化断层扫描设备
JP6050561B1 (ja) * 2014-09-26 2016-12-21 コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. 加熱装置を有する放射線検出器、それを動作させる方法及びそれを有するイメージング装置
CN104780699A (zh) * 2015-04-24 2015-07-15 赛诺威盛科技(北京)有限公司 一种用于ct机多排探测器的散热装置
CN104825184A (zh) * 2015-04-28 2015-08-12 杭州灿维影像科技有限公司 冷风机及其冷却系统以及ct扫描机温度调节及均衡方法
WO2017000108A1 (en) * 2015-06-29 2017-01-05 General Electric Company Interchangeable module for thermal control in detector systems
CN111050651B (zh) * 2017-09-06 2023-08-25 上海联影医疗科技股份有限公司 Ct探测器模块及散热结构
CN107510469A (zh) * 2017-10-20 2017-12-26 上海联影医疗科技有限公司 Ct设备、探测装置及其探测组件
CN108378864B (zh) * 2018-03-19 2024-06-28 东软医疗系统股份有限公司 医疗设备的检测器温控方法和医疗设备
JP7141264B2 (ja) * 2018-07-02 2022-09-22 キヤノンメディカルシステムズ株式会社 X線検出器及びx線コンピュータ断層撮影装置
JP7094808B2 (ja) * 2018-07-09 2022-07-04 キヤノンメディカルシステムズ株式会社 X線検出器及びx線ct装置
US12262463B2 (en) 2018-08-24 2025-03-25 Radialis Medical, Inc. Liquid cooling system for precise temperature control of radiation detector for positron emission mammography
US11020072B2 (en) * 2019-06-11 2021-06-01 GE Precision Healthcare LLC System and method for regulating temperature of imaging detector sensors
CN110327070B (zh) * 2019-07-12 2024-07-12 山东大骋医疗科技有限公司 具有储能系统的ct设备
JP2022100547A (ja) 2020-12-24 2022-07-06 株式会社Kelk 電極接続構造及び検出装置
EP4628020A1 (en) * 2024-04-04 2025-10-08 Koninklijke Philips N.V. Thermal buffer and medical device with thermal buffer

Family Cites Families (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4155226A (en) * 1973-12-06 1979-05-22 Gerald Altman Infrared cooler for restricted regions
US4263604A (en) * 1977-12-27 1981-04-21 The United States Of America As Represented By The Secretary Of The Navy Graded gap semiconductor detector
US4283817A (en) * 1978-12-20 1981-08-18 General Electric Company Method for bonding electrode plates in a multicell x-ray detector
US4639883A (en) * 1984-11-28 1987-01-27 Rca Corporation Thermoelectric cooling system and method
JPS61201182A (ja) * 1985-03-04 1986-09-05 Hitachi Medical Corp X線ct装置の多素子検出器
US5040381A (en) * 1990-04-19 1991-08-20 Prime Computer, Inc. Apparatus for cooling circuits
US5315830B1 (en) * 1993-04-14 1998-04-07 Marlow Ind Inc Modular thermoelectric assembly
US5444752A (en) * 1994-02-03 1995-08-22 Analogic Corporation Tomography detector temperature equalization
US5609032A (en) * 1994-03-23 1997-03-11 Bielinski; George Thermoelectric cooling system
US5485005A (en) * 1994-06-15 1996-01-16 Xicon, Inc. Cooled x-ray sensitive photoconductor
US5537825A (en) * 1994-12-27 1996-07-23 Ward; Justin Draft beer tower cooling system
US5849029A (en) * 1995-12-26 1998-12-15 Esc Medical Systems, Ltd. Method for controlling the thermal profile of the skin
US6005911A (en) * 1995-11-17 1999-12-21 Trex Medical Corporation Large area array, single exposure digital mammography
JP3816992B2 (ja) * 1996-08-29 2006-08-30 株式会社日立メディコ X線検出器恒温化装置
JPH10146332A (ja) * 1996-11-15 1998-06-02 Hitachi Medical Corp X線ct装置
JPH10272130A (ja) * 1997-03-31 1998-10-13 Shimadzu Corp X線ct装置
US5970113A (en) * 1997-10-10 1999-10-19 Analogic Corporation Computed tomography scanning apparatus and method with temperature compensation for dark current offsets
US6126311A (en) * 1998-11-02 2000-10-03 Claud S. Gordon Company Dew point sensor using mems
JP2001057974A (ja) * 1999-06-18 2001-03-06 Toshiba Corp 放射線検出器及びx線ct装置
US6411672B1 (en) * 1999-06-18 2002-06-25 Kabushiki Kaisha Toshiba Radiation detector and X-ray CT apparatus
US6230497B1 (en) * 1999-12-06 2001-05-15 Motorola, Inc. Semiconductor circuit temperature monitoring and controlling apparatus and method
US6249563B1 (en) * 1999-12-08 2001-06-19 General Electric Company X-ray detector array maintained in isothermal condition
JP4481410B2 (ja) * 2000-02-02 2010-06-16 株式会社東芝 X線ct用二次元検出器、x線ct用二次元検出器の製造方法及びx線ctスキャナ
JP4564141B2 (ja) * 2000-07-25 2010-10-20 株式会社東芝 X線ct装置
US6370881B1 (en) * 2001-02-12 2002-04-16 Ge Medical Systems Global Technology Company Llc X-ray imager cooling device
JP2003130961A (ja) * 2001-07-19 2003-05-08 Siemens Ag 検出器モジュール、x線コンピュータトモグラフ用の検出器およびx線コンピュータトモグラフによる断層像の作成方法
US6459757B1 (en) * 2002-03-01 2002-10-01 Ge Medical Systems Global Technology Company, Llc X-ray detector array with phase change material heat system

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