JP2004029205A - レーザ走査型顕微鏡 - Google Patents

レーザ走査型顕微鏡 Download PDF

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Publication number
JP2004029205A
JP2004029205A JP2002182798A JP2002182798A JP2004029205A JP 2004029205 A JP2004029205 A JP 2004029205A JP 2002182798 A JP2002182798 A JP 2002182798A JP 2002182798 A JP2002182798 A JP 2002182798A JP 2004029205 A JP2004029205 A JP 2004029205A
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JP
Japan
Prior art keywords
light source
laser
light
laser scanning
scanning
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Pending
Application number
JP2002182798A
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English (en)
Japanese (ja)
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JP2004029205A5 (enExample
Inventor
Junichi Kitagawa
北川　純一
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Olympus Corp
Original Assignee
Olympus Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Corp filed Critical Olympus Corp
Priority to JP2002182798A priority Critical patent/JP2004029205A/ja
Priority to US10/602,361 priority patent/US7015485B2/en
Publication of JP2004029205A publication Critical patent/JP2004029205A/ja
Publication of JP2004029205A5 publication Critical patent/JP2004029205A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
JP2002182798A 2002-06-24 2002-06-24 レーザ走査型顕微鏡 Pending JP2004029205A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2002182798A JP2004029205A (ja) 2002-06-24 2002-06-24 レーザ走査型顕微鏡
US10/602,361 US7015485B2 (en) 2002-06-24 2003-06-23 Laser scanning microscope, semiconductor laser light source unit, scanning unit for a laser scanning microscope, and method of connecting semiconductor light source to scanning microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002182798A JP2004029205A (ja) 2002-06-24 2002-06-24 レーザ走査型顕微鏡

Publications (2)

Publication Number Publication Date
JP2004029205A true JP2004029205A (ja) 2004-01-29
JP2004029205A5 JP2004029205A5 (enExample) 2005-10-20

Family

ID=31179201

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002182798A Pending JP2004029205A (ja) 2002-06-24 2002-06-24 レーザ走査型顕微鏡

Country Status (2)

Country Link
US (1) US7015485B2 (enExample)
JP (1) JP2004029205A (enExample)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005308974A (ja) * 2004-04-20 2005-11-04 Olympus Corp 走査型レーザ顕微鏡装置
JP2006221167A (ja) * 2005-02-09 2006-08-24 Leica Microsystems (Schweiz) Ag 手術顕微鏡用蛍光／赤外線装置
JP2009192800A (ja) * 2008-02-14 2009-08-27 Yokogawa Electric Corp 共焦点スキャナ顕微鏡
CN103698307A (zh) * 2013-12-06 2014-04-02 中国科学院苏州生物医学工程技术研究所 激光扫描共聚焦显微系统
WO2015121911A1 (en) 2014-02-17 2015-08-20 Sony Corporation Scanning unit, laser scanning microscope, and temperature adjustment method
CN107886823A (zh) * 2017-11-15 2018-04-06 中国工程物理研究院电子工程研究所 一种优化集成式单光路激光电离效应模拟系统

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10332063A1 (de) * 2003-07-11 2005-01-27 Carl Zeiss Jena Gmbh Laser-Scanning-Mikroskop
JP4481082B2 (ja) * 2004-05-24 2010-06-16 オリンパス株式会社 顕微鏡観察方法および顕微鏡観察装置
DE102004034961A1 (de) * 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Lichtrastermikroskop mit linienförmiger Abtastung und Verwendung
DE102004034959A1 (de) * 2004-07-16 2006-02-16 Carl Zeiss Jena Gmbh Lichtrastermikroskop mit punktförmiger Lichtquellenverteilung und Verwendung
DE102004034987A1 (de) * 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Lichtrastermikroskop und Verwendung
KR100741110B1 (ko) * 2006-02-15 2007-07-19 삼성에스디아이 주식회사 광 파이버 및 플라즈마 디스플레이 패널의 전극 형성 방법
DE102006034909A1 (de) * 2006-07-28 2008-01-31 Carl Zeiss Microimaging Gmbh Verfahren zur Laser-Scanning-Mikroskopie und Strahlvereiniger
US7817275B2 (en) * 2007-03-07 2010-10-19 University Of Delaware Scanning optical microscope with long working distance objective
CN101828139A (zh) * 2007-09-05 2010-09-08 致茂电子股份有限公司 具有波长转换磷光体的光源
US8111455B2 (en) * 2007-11-26 2012-02-07 Olympus Corporation Light source apparatus and laser scanning microscope
US9778188B2 (en) * 2009-03-11 2017-10-03 Industrial Technology Research Institute Apparatus and method for detection and discrimination molecular object
US9482615B2 (en) * 2010-03-15 2016-11-01 Industrial Technology Research Institute Single-molecule detection system and methods
US8865078B2 (en) 2010-06-11 2014-10-21 Industrial Technology Research Institute Apparatus for single-molecule detection
US8865077B2 (en) 2010-06-11 2014-10-21 Industrial Technology Research Institute Apparatus for single-molecule detection
WO2012006558A2 (en) * 2010-07-08 2012-01-12 Fei Company Charged particle beam processing system with visual and infrared imaging
JP5926966B2 (ja) * 2012-01-30 2016-05-25 オリンパス株式会社 蛍光観察装置
JPWO2016098139A1 (ja) * 2014-12-16 2017-11-02 オリンパス株式会社 レーザ走査型観察装置
CN106568755A (zh) * 2016-11-06 2017-04-19 浙江大学 一种近红外激光扫描共聚焦显微成像系统
WO2018089839A1 (en) 2016-11-10 2018-05-17 The Trustees Of Columbia University In The City Of New York Rapid high-resolution imaging methods for large samples
US10378006B2 (en) 2017-04-19 2019-08-13 The Florida International University Board Of Trustees Near-infrared ray exposure system for biological studies

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6903347B2 (en) * 1994-07-15 2005-06-07 Stephen C. Baer Superresolution in microlithography and fluorescence microscopy
US6167173A (en) * 1997-01-27 2000-12-26 Carl Zeiss Jena Gmbh Laser scanning microscope
JPH1195120A (ja) * 1997-09-19 1999-04-09 Olympus Optical Co Ltd 顕微鏡の観察方法
JPH11231222A (ja) 1998-01-27 1999-08-27 Carl Zeiss Jena Gmbh 走査ユニット付顕微鏡、そのための配置および操作方法
CA2280398C (en) * 1998-10-26 2009-01-20 Lothar Lilge A semiconductor based excitation illuminator for fluorescence and phosphorescence microscopy
JP4680337B2 (ja) * 1999-09-20 2011-05-11 オリンパス株式会社 走査型レーザ顕微鏡
DE10004233B4 (de) * 2000-02-01 2005-02-17 Leica Microsystems Heidelberg Gmbh Mikroskop-Aufbau
US6844963B2 (en) * 2000-03-23 2005-01-18 Olympus Optical Co., Ltd. Double-resonance-absorption microscope
US6423956B1 (en) * 2000-07-28 2002-07-23 Optical Biopsy Technologies Fiber-coupled, high-speed, integrated, angled-dual-axis confocal scanning microscopes employing vertical cross-section scanning
DE10044636A1 (de) * 2000-09-08 2002-03-21 Leica Microsystems Optische Anordnung zur Beleuchtung von Objekten für konfokale Rastermikroskope
JP4812179B2 (ja) * 2001-03-13 2011-11-09 オリンパス株式会社 レーザ顕微鏡
JP3887188B2 (ja) * 2001-08-08 2007-02-28 株式会社ミツトヨ プローブのアライメント調整装置、その装置を備えた測定機およびプローブのアライメント調整方法
JP4939703B2 (ja) * 2001-08-21 2012-05-30 オリンパス株式会社 走査型レーザー顕微鏡
US6963398B2 (en) * 2001-10-03 2005-11-08 Olympus Optical Co., Ltd. Laser scanning microscope
US7196843B2 (en) * 2002-03-27 2007-03-27 Olympus Optical Co., Ltd. Confocal microscope apparatus

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005308974A (ja) * 2004-04-20 2005-11-04 Olympus Corp 走査型レーザ顕微鏡装置
JP2006221167A (ja) * 2005-02-09 2006-08-24 Leica Microsystems (Schweiz) Ag 手術顕微鏡用蛍光／赤外線装置
JP2009192800A (ja) * 2008-02-14 2009-08-27 Yokogawa Electric Corp 共焦点スキャナ顕微鏡
CN103698307A (zh) * 2013-12-06 2014-04-02 中国科学院苏州生物医学工程技术研究所 激光扫描共聚焦显微系统
WO2015121911A1 (en) 2014-02-17 2015-08-20 Sony Corporation Scanning unit, laser scanning microscope, and temperature adjustment method
CN107886823A (zh) * 2017-11-15 2018-04-06 中国工程物理研究院电子工程研究所 一种优化集成式单光路激光电离效应模拟系统
CN107886823B (zh) * 2017-11-15 2024-05-10 中国工程物理研究院电子工程研究所 一种优化集成式单光路激光电离效应模拟系统

Also Published As

Publication number Publication date
US20040061073A1 (en) 2004-04-01
US7015485B2 (en) 2006-03-21

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