JP2003315398A - 通信システムのチャネルをテストするための電気テストシステム - Google Patents

通信システムのチャネルをテストするための電気テストシステム

Info

Publication number
JP2003315398A
JP2003315398A JP2003099315A JP2003099315A JP2003315398A JP 2003315398 A JP2003315398 A JP 2003315398A JP 2003099315 A JP2003099315 A JP 2003099315A JP 2003099315 A JP2003099315 A JP 2003099315A JP 2003315398 A JP2003315398 A JP 2003315398A
Authority
JP
Japan
Prior art keywords
voltage
board
voltage converter
function board
electrical system
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2003099315A
Other languages
English (en)
Japanese (ja)
Other versions
JP2003315398A5 (enExample
Inventor
Heinz Nuessle
ヘインツ・ヌエッスル
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of JP2003315398A publication Critical patent/JP2003315398A/ja
Publication of JP2003315398A5 publication Critical patent/JP2003315398A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Analogue/Digital Conversion (AREA)
JP2003099315A 2002-04-06 2003-04-02 通信システムのチャネルをテストするための電気テストシステム Pending JP2003315398A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP02007781A EP1271168B1 (en) 2002-04-06 2002-04-06 Electrical system for testing the channels of a communication system
EP02007781.4 2002-04-06

Publications (2)

Publication Number Publication Date
JP2003315398A true JP2003315398A (ja) 2003-11-06
JP2003315398A5 JP2003315398A5 (enExample) 2006-05-25

Family

ID=8185448

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003099315A Pending JP2003315398A (ja) 2002-04-06 2003-04-02 通信システムのチャネルをテストするための電気テストシステム

Country Status (4)

Country Link
US (1) US6844746B2 (enExample)
EP (1) EP1271168B1 (enExample)
JP (1) JP2003315398A (enExample)
DE (1) DE60202242T2 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20140124065A (ko) * 2013-04-15 2014-10-24 삼성전자주식회사 검사 장치 및 검사 방법

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0212045A3 (de) * 1985-07-11 1988-01-27 Raimund Wilhelm Anpassung eines Anzeige- oder Auswertgerätes an einen Sensor
GB2251105A (en) * 1990-12-11 1992-06-24 Race Electronics Limited An identification component
JPH05251519A (ja) * 1992-01-09 1993-09-28 Nec Corp 半導体デバイス測定用テスター
FR2752312B1 (fr) * 1996-08-07 1998-10-30 Motorola Semiconducteurs Procede et circuit permettant d'ajuster dynamiquement la tension d'alimentation et, ou bien, la frequence du signal d'horloge dans un circuit numerique
US5939875A (en) * 1997-03-17 1999-08-17 Hewlett-Packard Company Universal probe interface
JPH11155233A (ja) * 1997-11-25 1999-06-08 Advantest Corp 直流電源装置
JP4756412B2 (ja) * 2000-06-30 2011-08-24 ネッツエスアイ東洋株式会社 パッケージ判定方式
US6580623B1 (en) * 2001-05-30 2003-06-17 Cypress Semiconductor Corp. Flexible converter routing apparatus, system and method

Also Published As

Publication number Publication date
US6844746B2 (en) 2005-01-18
US20030189841A1 (en) 2003-10-09
EP1271168B1 (en) 2004-12-15
DE60202242T2 (de) 2006-07-06
DE60202242D1 (de) 2005-01-20
EP1271168A1 (en) 2003-01-02

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