DE60202242D1 - Elektrisches System zur Überprüfung der Kanäle eines Kommunikationssystems - Google Patents

Elektrisches System zur Überprüfung der Kanäle eines Kommunikationssystems

Info

Publication number
DE60202242D1
DE60202242D1 DE60202242T DE60202242T DE60202242D1 DE 60202242 D1 DE60202242 D1 DE 60202242D1 DE 60202242 T DE60202242 T DE 60202242T DE 60202242 T DE60202242 T DE 60202242T DE 60202242 D1 DE60202242 D1 DE 60202242D1
Authority
DE
Germany
Prior art keywords
checking
channels
communication system
electrical system
electrical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE60202242T
Other languages
English (en)
Other versions
DE60202242T2 (de
Inventor
Heinz Nuessle
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of DE60202242D1 publication Critical patent/DE60202242D1/de
Application granted granted Critical
Publication of DE60202242T2 publication Critical patent/DE60202242T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Analogue/Digital Conversion (AREA)
DE60202242T 2002-04-06 2002-04-06 Elektrisches System zur Überprüfung der Kanäle eines Kommunikationssystems Expired - Fee Related DE60202242T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP02007781A EP1271168B1 (de) 2002-04-06 2002-04-06 Elektrisches System zur Überprüfung der Kanäle eines Kommunikationssystems

Publications (2)

Publication Number Publication Date
DE60202242D1 true DE60202242D1 (de) 2005-01-20
DE60202242T2 DE60202242T2 (de) 2006-07-06

Family

ID=8185448

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60202242T Expired - Fee Related DE60202242T2 (de) 2002-04-06 2002-04-06 Elektrisches System zur Überprüfung der Kanäle eines Kommunikationssystems

Country Status (4)

Country Link
US (1) US6844746B2 (de)
EP (1) EP1271168B1 (de)
JP (1) JP2003315398A (de)
DE (1) DE60202242T2 (de)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20140124065A (ko) * 2013-04-15 2014-10-24 삼성전자주식회사 검사 장치 및 검사 방법

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0212045A3 (de) * 1985-07-11 1988-01-27 Raimund Wilhelm Anpassung eines Anzeige- oder Auswertgerätes an einen Sensor
GB2251105A (en) * 1990-12-11 1992-06-24 Race Electronics Limited An identification component
JPH05251519A (ja) * 1992-01-09 1993-09-28 Nec Corp 半導体デバイス測定用テスター
FR2752312B1 (fr) * 1996-08-07 1998-10-30 Motorola Semiconducteurs Procede et circuit permettant d'ajuster dynamiquement la tension d'alimentation et, ou bien, la frequence du signal d'horloge dans un circuit numerique
US5939875A (en) * 1997-03-17 1999-08-17 Hewlett-Packard Company Universal probe interface
JPH11155233A (ja) * 1997-11-25 1999-06-08 Advantest Corp 直流電源装置
JP4756412B2 (ja) * 2000-06-30 2011-08-24 ネッツエスアイ東洋株式会社 パッケージ判定方式
US6580623B1 (en) * 2001-05-30 2003-06-17 Cypress Semiconductor Corp. Flexible converter routing apparatus, system and method

Also Published As

Publication number Publication date
JP2003315398A (ja) 2003-11-06
US20030189841A1 (en) 2003-10-09
EP1271168A1 (de) 2003-01-02
US6844746B2 (en) 2005-01-18
EP1271168B1 (de) 2004-12-15
DE60202242T2 (de) 2006-07-06

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D. STAATES, US

8339 Ceased/non-payment of the annual fee