JP2003142662A - オフセットされた導体を含むmramデバイス - Google Patents
オフセットされた導体を含むmramデバイスInfo
- Publication number
- JP2003142662A JP2003142662A JP2002224583A JP2002224583A JP2003142662A JP 2003142662 A JP2003142662 A JP 2003142662A JP 2002224583 A JP2002224583 A JP 2002224583A JP 2002224583 A JP2002224583 A JP 2002224583A JP 2003142662 A JP2003142662 A JP 2003142662A
- Authority
- JP
- Japan
- Prior art keywords
- memory cell
- conductor
- word line
- memory
- mram
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004020 conductor Substances 0.000 title claims abstract description 40
- 230000015654 memory Effects 0.000 claims abstract description 82
- 238000013500 data storage Methods 0.000 claims description 17
- 230000005415 magnetization Effects 0.000 description 12
- 238000010586 diagram Methods 0.000 description 9
- 238000000034 method Methods 0.000 description 6
- 230000003071 parasitic effect Effects 0.000 description 3
- 238000003491 array Methods 0.000 description 2
- 230000004888 barrier function Effects 0.000 description 2
- 230000007774 longterm Effects 0.000 description 2
- 102100036738 Guanine nucleotide-binding protein subunit alpha-11 Human genes 0.000 description 1
- 101100283445 Homo sapiens GNA11 gene Proteins 0.000 description 1
- 240000007594 Oryza sativa Species 0.000 description 1
- 235000007164 Oryza sativa Nutrition 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 230000005012 migration Effects 0.000 description 1
- 238000013508 migration Methods 0.000 description 1
- 235000009566 rice Nutrition 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 230000006403 short-term memory Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/14—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements
- G11C11/15—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements using multiple magnetic layers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1675—Writing or programming circuits or methods
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Mram Or Spin Memory Techniques (AREA)
- Semiconductor Memories (AREA)
- Hall/Mr Elements (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/920225 | 2001-08-01 | ||
| US09/920,225 US6385083B1 (en) | 2001-08-01 | 2001-08-01 | MRAM device including offset conductors |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2003142662A true JP2003142662A (ja) | 2003-05-16 |
| JP2003142662A5 JP2003142662A5 (cg-RX-API-DMAC7.html) | 2005-10-27 |
Family
ID=25443380
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2002224583A Pending JP2003142662A (ja) | 2001-08-01 | 2002-08-01 | オフセットされた導体を含むmramデバイス |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US6385083B1 (cg-RX-API-DMAC7.html) |
| EP (1) | EP1282132A3 (cg-RX-API-DMAC7.html) |
| JP (1) | JP2003142662A (cg-RX-API-DMAC7.html) |
| KR (1) | KR100898040B1 (cg-RX-API-DMAC7.html) |
| CN (1) | CN1308959C (cg-RX-API-DMAC7.html) |
| TW (1) | TW563127B (cg-RX-API-DMAC7.html) |
Families Citing this family (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6735111B2 (en) * | 2002-01-16 | 2004-05-11 | Micron Technology, Inc. | Magnetoresistive memory devices and assemblies |
| JP2003346474A (ja) * | 2002-03-19 | 2003-12-05 | Mitsubishi Electric Corp | 薄膜磁性体記憶装置 |
| US6507513B1 (en) * | 2002-06-20 | 2003-01-14 | Hewlett-Packard Company | Using delayed electrical pulses with magneto-resistive devices |
| KR20050085158A (ko) * | 2002-11-28 | 2005-08-29 | 코닌클리즈케 필립스 일렉트로닉스 엔.브이. | 자기 저항 메모리 셀 어레이, 그의 기록 방법과 제조 방법및 비휘발성 메모리 |
| ES2406304T3 (es) * | 2002-11-28 | 2013-06-06 | Crocus Technology, Inc. | Procedimiento y dispositivo para la generación mejorada de campos magnéticos durante una operación de escritura de un dispositivo de memoria magnetorresistente |
| US6836429B2 (en) * | 2002-12-07 | 2004-12-28 | Hewlett-Packard Development Company, L.P. | MRAM having two write conductors |
| US7126200B2 (en) * | 2003-02-18 | 2006-10-24 | Micron Technology, Inc. | Integrated circuits with contemporaneously formed array electrodes and logic interconnects |
| JP4315703B2 (ja) * | 2003-02-27 | 2009-08-19 | 株式会社ルネサステクノロジ | 薄膜磁性体記憶装置 |
| US6952364B2 (en) * | 2003-03-03 | 2005-10-04 | Samsung Electronics Co., Ltd. | Magnetic tunnel junction structures and methods of fabrication |
| KR100615600B1 (ko) * | 2004-08-09 | 2006-08-25 | 삼성전자주식회사 | 고집적 자기램 소자 및 그 제조방법 |
| KR100615089B1 (ko) * | 2004-07-14 | 2006-08-23 | 삼성전자주식회사 | 낮은 구동 전류를 갖는 자기 램 |
| US7372722B2 (en) * | 2003-09-29 | 2008-05-13 | Samsung Electronics Co., Ltd. | Methods of operating magnetic random access memory devices including heat-generating structures |
| KR100568512B1 (ko) * | 2003-09-29 | 2006-04-07 | 삼성전자주식회사 | 열발생층을 갖는 자기열 램셀들 및 이를 구동시키는 방법들 |
| US7369428B2 (en) * | 2003-09-29 | 2008-05-06 | Samsung Electronics Co., Ltd. | Methods of operating a magnetic random access memory device and related devices and structures |
| KR100835275B1 (ko) * | 2004-08-12 | 2008-06-05 | 삼성전자주식회사 | 스핀 주입 메카니즘을 사용하여 자기램 소자를 구동시키는방법들 |
| US6987692B2 (en) * | 2003-10-03 | 2006-01-17 | Hewlett-Packard Development Company, L.P. | Magnetic memory having angled third conductor |
| US7327591B2 (en) * | 2004-06-17 | 2008-02-05 | Texas Instruments Incorporated | Staggered memory cell array |
| KR100660539B1 (ko) * | 2004-07-29 | 2006-12-22 | 삼성전자주식회사 | 자기 기억 소자 및 그 형성 방법 |
| KR100612878B1 (ko) * | 2004-12-03 | 2006-08-14 | 삼성전자주식회사 | 자기 메모리 소자와 그 제조 및 동작방법 |
| EP1667160B1 (en) * | 2004-12-03 | 2011-11-23 | Samsung Electronics Co., Ltd. | Magnetic memory device and method |
| CN100509006C (zh) * | 2005-03-25 | 2009-07-08 | 北京欧纳尔生物工程技术有限公司 | 治疗抑郁症的药物组合物及其制法 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6069815A (en) * | 1997-12-18 | 2000-05-30 | Siemens Aktiengesellschaft | Semiconductor memory having hierarchical bit line and/or word line architecture |
| JP2000076843A (ja) * | 1998-05-18 | 2000-03-14 | Canon Inc | 磁性薄膜メモリ素子およびその記録再生方法、画像録画再生装置 |
| EP0959475A3 (en) * | 1998-05-18 | 2000-11-08 | Canon Kabushiki Kaisha | Magnetic thin film memory and recording and reproducing method and apparatus using such a memory |
| US6034887A (en) * | 1998-08-05 | 2000-03-07 | International Business Machines Corporation | Non-volatile magnetic memory cell and devices |
| US6873546B2 (en) * | 2000-03-09 | 2005-03-29 | Richard M. Lienau | Method and apparatus for reading data from a ferromagnetic memory cell |
| US6236590B1 (en) * | 2000-07-21 | 2001-05-22 | Hewlett-Packard Company | Optimal write conductors layout for improved performance in MRAM |
| JP3854793B2 (ja) * | 2000-10-03 | 2006-12-06 | キヤノン株式会社 | 磁気抵抗効果素子を用いたメモリ |
-
2001
- 2001-08-01 US US09/920,225 patent/US6385083B1/en not_active Expired - Lifetime
-
2002
- 2002-07-04 TW TW091114865A patent/TW563127B/zh not_active IP Right Cessation
- 2002-07-05 EP EP02254730A patent/EP1282132A3/en not_active Withdrawn
- 2002-07-31 KR KR1020020045172A patent/KR100898040B1/ko not_active Expired - Fee Related
- 2002-08-01 JP JP2002224583A patent/JP2003142662A/ja active Pending
- 2002-08-01 CN CNB021275750A patent/CN1308959C/zh not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| KR100898040B1 (ko) | 2009-05-19 |
| US6385083B1 (en) | 2002-05-07 |
| EP1282132A2 (en) | 2003-02-05 |
| EP1282132A3 (en) | 2003-12-10 |
| CN1400607A (zh) | 2003-03-05 |
| KR20030014582A (ko) | 2003-02-19 |
| TW563127B (en) | 2003-11-21 |
| CN1308959C (zh) | 2007-04-04 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20050727 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20050727 |
|
| A711 | Notification of change in applicant |
Free format text: JAPANESE INTERMEDIATE CODE: A711 Effective date: 20070706 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20080623 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20090512 |
|
| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20091020 |