JP4660529B2 - 二重接合磁気メモリデバイスの読み出し方法および二重接合磁気メモリデバイスへの書き込み方法 - Google Patents
二重接合磁気メモリデバイスの読み出し方法および二重接合磁気メモリデバイスへの書き込み方法 Download PDFInfo
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- JP4660529B2 JP4660529B2 JP2007264988A JP2007264988A JP4660529B2 JP 4660529 B2 JP4660529 B2 JP 4660529B2 JP 2007264988 A JP2007264988 A JP 2007264988A JP 2007264988 A JP2007264988 A JP 2007264988A JP 4660529 B2 JP4660529 B2 JP 4660529B2
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- 230000005291 magnetic effect Effects 0.000 title claims description 166
- 238000000034 method Methods 0.000 title claims description 18
- 230000005415 magnetization Effects 0.000 claims description 49
- 230000005294 ferromagnetic effect Effects 0.000 claims description 20
- 230000004888 barrier function Effects 0.000 claims description 16
- 125000006850 spacer group Chemical group 0.000 claims description 11
- 238000005259 measurement Methods 0.000 claims description 3
- 230000015654 memory Effects 0.000 description 32
- 239000004020 conductor Substances 0.000 description 18
- 239000013598 vector Substances 0.000 description 16
- 238000010586 diagram Methods 0.000 description 12
- 102100039246 Elongator complex protein 1 Human genes 0.000 description 11
- 101000813117 Homo sapiens Elongator complex protein 1 Proteins 0.000 description 11
- 101100172210 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) ELP2 gene Proteins 0.000 description 10
- 230000008901 benefit Effects 0.000 description 5
- 230000001066 destructive effect Effects 0.000 description 5
- 230000005641 tunneling Effects 0.000 description 4
- 230000008878 coupling Effects 0.000 description 3
- 238000010168 coupling process Methods 0.000 description 3
- 238000005859 coupling reaction Methods 0.000 description 3
- 230000003071 parasitic effect Effects 0.000 description 3
- 239000002885 antiferromagnetic material Substances 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 239000002902 ferrimagnetic material Substances 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 230000007774 longterm Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000005290 antiferromagnetic effect Effects 0.000 description 1
- 230000005316 antiferromagnetic exchange Effects 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 238000013500 data storage Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 239000012811 non-conductive material Substances 0.000 description 1
- 230000001151 other effect Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 229910052702 rhenium Inorganic materials 0.000 description 1
- 229910052703 rhodium Inorganic materials 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 229910052707 ruthenium Inorganic materials 0.000 description 1
- 230000006403 short-term memory Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1673—Reading or sensing circuits or methods
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/161—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect details concerning the memory cell structure, e.g. the layers of the ferromagnetic memory cell
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Mram Or Spin Memory Techniques (AREA)
- Hall/Mr Elements (AREA)
- Semiconductor Memories (AREA)
Description
RTOT1=RTJ1+RTJ2(1+TMR)=RTJ1(1+K+KTMR)、
RTOT2=RTJ1(1+TMR)+RTJ2=RTJ1(1+TMR+K)、および
(RTOT1−RTOT2)=RTJ1(1+K+KTMR−1−TMR−K)
したがって、(RTOT1−RTOT2)=RTJ1(KTMR−TMR)である。K>1である場合には、正の極性がデータ層の磁化の向きを、それゆえ図1aおよび図1bに示される論理値を示す。
RTOT1=RTJ1(1+TMR)+RTJ2=RTJ1(1+TMR+K)、
RTOT2=RTJ1+RTJ2(1+TMR)=RTJ1(1+K+KTMR)、および
(RTOT1−RTOT2)=RTJ1(1+TMR+K−1−K−KTMR)=RTJ1(TMR−KTMR)
したがって、K>1である場合には、負の極性がデータ層の磁化の向きを、それゆえ図1cおよび図1dに示される論理値を示す。
10、20 磁気トンネル接合、
12、22 データ強磁性(FM)層、
14、24 絶縁性トンネル障壁、
15 人工反強磁性体(AAF)または合成フェリ磁性体(SF)、
16、26 基準FM層。
Claims (6)
- 磁気メモリデバイス(8)を読み出す方法であって、
磁気メモリデバイス(8)は、
第1の基準強磁性層(16)を含む第1の磁気トンネル接合(10)と、
第2の基準強磁性層(26)を含む第2の磁気トンネル接合(20)と、
前記第1の基準層と前記第2の基準層との間にある導電性スペーサ層(30)とを含み、
前記第1の基準層(16)および前記第2の基準層(26)が、反強磁性結合され、
前記第2の磁気トンネル接合(20)の公称抵抗が、前記第1の磁気トンネル接合(10)の公称抵抗のK倍であり、ただしKが1以外の比例定数であり、
結合された基準層の磁化を第1の安定した向きに向けて、前記磁気メモリデバイスの第1の抵抗を測定するステップ(310、312)と、
結合された基準層の磁化を第2の安定した向きに向けて、前記磁気メモリデバイスの第2の抵抗を測定するステップ(314、316)と、
測定された前記第1の抵抗および前記第2の抵抗を用いて、前記磁気メモリデバイスに格納された論理値を判定するステップ(318、320)と、を含み、
前記論理値が、前記抵抗の測定値間の差の極性を検査することにより判定される(320)、方法。 - 前記第1の磁気トンネル接合(10)が第1の絶縁性トンネル障壁(14)を含み、前記第2の磁気トンネル接合(20)が第2の絶縁性トンネル障壁(24)を含み、前記第1の絶縁性トンネル障壁(14)および前記第2の絶縁性トンネル障壁(24)が、異なる厚みを有する、請求項1に記載の方法。
- 前記第1の磁気トンネル接合(10)および前記第2の磁気トンネル接合(20)の公称抵抗は、前記第1の磁気トンネル接合(10)および前記第2の磁気トンネル接合(20)の抵抗が区別できるようにするために、前記絶縁性トンネル障壁の厚みのばらつきに起因して生じる接合抵抗の固有のばらつきだけ少なくとも異なる、請求項2に記載の方法。
- 前記第1の磁気トンネル接合(10)が第1のデータ層(12)をさらに含み、前記第2の磁気トンネル接合(20)が第2のデータ層(22)をさらに含み、前記基準層(16、26)および前記スペーサ層(30)が、AAF(15)を形成し、そのAAF(15)の合成磁気モーメントが、前記データ層(12または22)のいずれかの磁気モーメントよりも小さい、請求項1に記載の方法。
- 前記AAF(15)がピン留めされていない、請求項4に記載の方法。
- 請求項1に記載の磁気メモリデバイスに論理値を書き込む方法であって、
両方の磁気トンネル接合に切替え磁界を同時に加えることを含み、
前記切替え磁界によって、前記第1の磁気トンネル接合および前記第2の磁気トンネル接合のデータ層の磁化が、同じ安定した方向に向けられることにより、前記第1の磁気トンネル接合および前記第2の磁気トンネル接合の基準FM層の磁化が反対の方向に向けられることを有する、方法。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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US10/426,381 US6667901B1 (en) | 2003-04-29 | 2003-04-29 | Dual-junction magnetic memory device and read method |
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JP2004131047A Division JP4133918B2 (ja) | 2003-04-29 | 2004-04-27 | 二重接合磁気メモリデバイスおよび読出し方法 |
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JP2008097811A JP2008097811A (ja) | 2008-04-24 |
JP4660529B2 true JP4660529B2 (ja) | 2011-03-30 |
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JP2004131047A Expired - Fee Related JP4133918B2 (ja) | 2003-04-29 | 2004-04-27 | 二重接合磁気メモリデバイスおよび読出し方法 |
JP2007264988A Expired - Lifetime JP4660529B2 (ja) | 2003-04-29 | 2007-10-10 | 二重接合磁気メモリデバイスの読み出し方法および二重接合磁気メモリデバイスへの書き込み方法 |
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JP2004131047A Expired - Fee Related JP4133918B2 (ja) | 2003-04-29 | 2004-04-27 | 二重接合磁気メモリデバイスおよび読出し方法 |
Country Status (3)
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US (1) | US6667901B1 (ja) |
EP (1) | EP1473735A1 (ja) |
JP (2) | JP4133918B2 (ja) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6611405B1 (en) * | 1999-09-16 | 2003-08-26 | Kabushiki Kaisha Toshiba | Magnetoresistive element and magnetic memory device |
US7522446B2 (en) * | 2003-10-31 | 2009-04-21 | Samsung Electronics Co., Ltd. | Heating MRAM cells to ease state switching |
US7502248B2 (en) * | 2004-05-21 | 2009-03-10 | Samsung Electronics Co., Ltd. | Multi-bit magnetic random access memory device |
US7009903B2 (en) * | 2004-05-27 | 2006-03-07 | Hewlett-Packard Development Company, L.P. | Sense amplifying magnetic tunnel device |
US6870711B1 (en) | 2004-06-08 | 2005-03-22 | Headway Technologies, Inc. | Double layer spacer for antiparallel pinned layer in CIP/CPP GMR and MTJ devices |
JP2006196687A (ja) * | 2005-01-13 | 2006-07-27 | Tdk Corp | 磁気メモリ |
US7230265B2 (en) * | 2005-05-16 | 2007-06-12 | International Business Machines Corporation | Spin-polarization devices using rare earth-transition metal alloys |
US7539047B2 (en) * | 2007-05-08 | 2009-05-26 | Honeywell International, Inc. | MRAM cell with multiple storage elements |
US8625336B2 (en) | 2011-02-08 | 2014-01-07 | Crocus Technology Inc. | Memory devices with series-interconnected magnetic random access memory cells |
EP2597692A1 (en) * | 2011-11-22 | 2013-05-29 | Crocus Technology S.A. | Self-referenced MRAM cell with optimized reliability |
KR102141464B1 (ko) | 2013-12-20 | 2020-08-05 | 에스케이하이닉스 주식회사 | 집적회로 및 메모리 장치 |
US9548095B2 (en) * | 2014-08-20 | 2017-01-17 | Everspin Technologies, Inc. | Redundant magnetic tunnel junctions in magnetoresistive memory |
EP3115994B1 (en) | 2015-07-07 | 2022-06-08 | Crocus Technology S.A. | Magnetic memory device that is protected against reading using an external magnetic field and method for operating such magnetic memory device |
Citations (5)
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JP2001077442A (ja) * | 1994-05-02 | 2001-03-23 | Matsushita Electric Ind Co Ltd | メモリー素子 |
JP2001237472A (ja) * | 1999-06-17 | 2001-08-31 | Matsushita Electric Ind Co Ltd | 磁気抵抗効果素子および磁気抵抗効果記憶素子およびデジタル信号を記憶させる方法 |
JP2001313377A (ja) * | 2000-03-09 | 2001-11-09 | Hewlett Packard Co <Hp> | メモリセル装置及びその製造方法 |
JP2001325791A (ja) * | 2000-05-15 | 2001-11-22 | Nec Corp | 磁気ランダムアクセスメモリ回路 |
JP2004104127A (ja) * | 2002-09-03 | 2004-04-02 | Hewlett-Packard Development Co Lp | マルチビット磁気メモリデバイス |
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US6259644B1 (en) * | 1997-11-20 | 2001-07-10 | Hewlett-Packard Co | Equipotential sense methods for resistive cross point memory cell arrays |
US6169686B1 (en) * | 1997-11-20 | 2001-01-02 | Hewlett-Packard Company | Solid-state memory with magnetic storage cells |
US6262625B1 (en) * | 1999-10-29 | 2001-07-17 | Hewlett-Packard Co | Operational amplifier with digital offset calibration |
US6211559B1 (en) * | 1998-02-27 | 2001-04-03 | Motorola, Inc. | Symmetric magnetic tunnel device |
US6611405B1 (en) * | 1999-09-16 | 2003-08-26 | Kabushiki Kaisha Toshiba | Magnetoresistive element and magnetic memory device |
US6169689B1 (en) * | 1999-12-08 | 2001-01-02 | Motorola, Inc. | MTJ stacked cell memory sensing method and apparatus |
JP2002246567A (ja) * | 2001-02-14 | 2002-08-30 | Toshiba Corp | 磁気ランダムアクセスメモリ |
DE10158795B4 (de) * | 2001-11-30 | 2005-12-22 | Infineon Technologies Ag | Magnetoresistive Speicherzelle mit dynamischer Referenzschicht |
US6593608B1 (en) * | 2002-03-15 | 2003-07-15 | Hewlett-Packard Development Company, L.P. | Magneto resistive storage device having double tunnel junction |
-
2003
- 2003-04-29 US US10/426,381 patent/US6667901B1/en not_active Expired - Lifetime
- 2003-11-18 EP EP03026575A patent/EP1473735A1/en not_active Withdrawn
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2004
- 2004-04-27 JP JP2004131047A patent/JP4133918B2/ja not_active Expired - Fee Related
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2007
- 2007-10-10 JP JP2007264988A patent/JP4660529B2/ja not_active Expired - Lifetime
Patent Citations (5)
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JP2001077442A (ja) * | 1994-05-02 | 2001-03-23 | Matsushita Electric Ind Co Ltd | メモリー素子 |
JP2001237472A (ja) * | 1999-06-17 | 2001-08-31 | Matsushita Electric Ind Co Ltd | 磁気抵抗効果素子および磁気抵抗効果記憶素子およびデジタル信号を記憶させる方法 |
JP2001313377A (ja) * | 2000-03-09 | 2001-11-09 | Hewlett Packard Co <Hp> | メモリセル装置及びその製造方法 |
JP2001325791A (ja) * | 2000-05-15 | 2001-11-22 | Nec Corp | 磁気ランダムアクセスメモリ回路 |
JP2004104127A (ja) * | 2002-09-03 | 2004-04-02 | Hewlett-Packard Development Co Lp | マルチビット磁気メモリデバイス |
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Publication number | Publication date |
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JP2004327996A (ja) | 2004-11-18 |
JP4133918B2 (ja) | 2008-08-13 |
US6667901B1 (en) | 2003-12-23 |
JP2008097811A (ja) | 2008-04-24 |
EP1473735A1 (en) | 2004-11-03 |
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