JP2002506975A - １次測定値と取得パラメータの同時表示 - Google Patents

１次測定値と取得パラメータの同時表示

Info

Publication number
JP2002506975A
JP2002506975A JP2000535938A JP2000535938A JP2002506975A JP 2002506975 A JP2002506975 A JP 2002506975A JP 2000535938 A JP2000535938 A JP 2000535938A JP 2000535938 A JP2000535938 A JP 2000535938A JP 2002506975 A JP2002506975 A JP 2002506975A
Authority
JP
Japan
Prior art keywords
digital oscilloscope
parameters
cycle
obtaining
presenting information
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000535938A
Other languages
English (en)
Japanese (ja)
Other versions
JP2002506975A5 (enExample
Inventor
ミラー・マーティン・ティー
Original Assignee
レクロイ・エス・アー
レクロイ コーポレイション
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=21892738&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=JP2002506975(A) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by レクロイ・エス・アー, レクロイ コーポレイション filed Critical レクロイ・エス・アー
Publication of JP2002506975A publication Critical patent/JP2002506975A/ja
Publication of JP2002506975A5 publication Critical patent/JP2002506975A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor
    • G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
    • G01R13/345—Circuits for representing a single waveform by sampling, e.g. for very high frequencies for displaying sampled signals by using digital processors by intermediate A.D. and D.A. convertors (control circuits for CRT indicators)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G01R19/2506—Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values ; Details concerning sampling, digitizing or waveform capturing

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Mathematical Physics (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Recording Measured Values (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Measuring Frequencies, Analyzing Spectra (AREA)
  • Measuring Phase Differences (AREA)
  • Measuring Pulse, Heart Rate, Blood Pressure Or Blood Flow (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
JP2000535938A 1998-03-09 1999-03-05 １次測定値と取得パラメータの同時表示 Pending JP2002506975A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/037,155 1998-03-09
US09/037,155 US6195617B1 (en) 1998-03-09 1998-03-09 Digital storage oscilloscope with simultaneous primary measurement and derived parameter display on common time axis and method therefor
PCT/US1999/004800 WO1999046608A1 (en) 1998-03-09 1999-03-05 Simultaneous display of primary measurement values and derived parameters

Publications (2)

Publication Number Publication Date
JP2002506975A true JP2002506975A (ja) 2002-03-05
JP2002506975A5 JP2002506975A5 (enExample) 2006-04-20

Family

ID=21892738

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000535938A Pending JP2002506975A (ja) 1998-03-09 1999-03-05 １次測定値と取得パラメータの同時表示

Country Status (10)

Country Link
US (2) US6195617B1 (enExample)
EP (1) EP1062521B1 (enExample)
JP (1) JP2002506975A (enExample)
CN (1) CN1230683C (enExample)
AT (1) ATE273519T1 (enExample)
AU (1) AU758784B2 (enExample)
CA (1) CA2323085A1 (enExample)
DE (1) DE69919337T2 (enExample)
NZ (1) NZ506934A (enExample)
WO (1) WO1999046608A1 (enExample)

Cited By (6)

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JP2009516176A (ja) * 2005-11-10 2009-04-16 テラダイン、 インコーポレイテッド ローカルに順序付けられたストロービング
KR100949939B1 (ko) 2008-03-28 2010-03-30 주식회사 한영넉스 페이퍼 기록계
JP2010127626A (ja) * 2008-11-25 2010-06-10 Yokogawa Electric Corp 波形測定装置
JP2010266444A (ja) * 2009-05-15 2010-11-25 Tektronix Inc 測定方法及び装置
JP2011106827A (ja) * 2009-11-12 2011-06-02 Yokogawa Electric Corp ディジタルオシロスコープ
JP2012042468A (ja) * 2010-08-13 2012-03-01 Tektronix Inc 試験測定装置及びイベント検索方法

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JP2000210800A (ja) * 1999-01-27 2000-08-02 Komatsu Ltd 産業機械のモニタ方法およびその装置
US6327544B1 (en) * 1999-03-01 2001-12-04 Agilent Technologies, Inc. Automatic storage of a trigger definition in a signal measurement system
US6463392B1 (en) * 1999-08-16 2002-10-08 Agilent Technologies, Inc. System and method for adjusting a sampling time in a logic analyzer
US6525525B1 (en) * 2000-05-02 2003-02-25 Tektronix, Inc. Oscilloscope with simplified setup procedure, and procedure for setting up oscilloscope
US6885953B2 (en) * 2000-11-17 2005-04-26 Lecroy Corporation Oscilloscope panel capture and implementation
US20030076337A1 (en) * 2001-10-19 2003-04-24 Chenjing Fernando Scaling method and apparatus for displaying signals
US20060256137A1 (en) * 2001-10-19 2006-11-16 Chenjing Fernando Scaling method and apparatus for displaying signals
US6917889B2 (en) * 2002-02-26 2005-07-12 Tektronix, Inc. Method and apparatus for visually time-correlating waveform measurements to a source waveform
US6807496B2 (en) 2002-05-02 2004-10-19 Tektronix, Inc. Acquisition system for a long record length digital storage oscilloscope
US6748335B2 (en) 2002-05-06 2004-06-08 Tektronix, Inc. Acquisition system for a multi-channel relatively long record length digital storage oscilloscope
US6892150B2 (en) 2002-05-24 2005-05-10 Tektronix, Inc. Combined analog and DSP trigger system for a digital storage oscilloscope
US7434113B2 (en) * 2002-09-30 2008-10-07 Lecroy Corporation Method of analyzing serial data streams
US7519874B2 (en) * 2002-09-30 2009-04-14 Lecroy Corporation Method and apparatus for bit error rate analysis
US7437624B2 (en) * 2002-09-30 2008-10-14 Lecroy Corporation Method and apparatus for analyzing serial data streams
JP4490642B2 (ja) * 2003-04-01 2010-06-30 株式会社根本杏林堂 薬液注入装置
USD504341S1 (en) * 2003-10-09 2005-04-26 Lecroy Corporation Measurement instrument
USD500693S1 (en) * 2003-10-09 2005-01-11 Lecroy Corporation Measurement instrument
USD501414S1 (en) * 2003-10-09 2005-02-01 Lecroy Corporation Measurement instrument
USD504078S1 (en) * 2003-10-09 2005-04-19 Lecroy Corporation Measurement instrument
US7403560B2 (en) * 2004-02-09 2008-07-22 Lecroy Corporation Simultaneous physical and protocol layer analysis
US6972554B1 (en) * 2004-07-26 2005-12-06 Honeywell International, Inc. Universal aircraft generator electrical bench test apparatus
US7305312B2 (en) * 2005-01-10 2007-12-04 Wavecrest Corporation Method and apparatus for recording a real time signal
US7839792B2 (en) * 2005-08-30 2010-11-23 Tektronix, Inc. Time-correlated, simultaneous measurement and analysis of network signals from multiple communication networks
US7652465B2 (en) * 2006-03-24 2010-01-26 Tektronix, Inc. No dead time data acquisition
CN101424711B (zh) * 2007-10-31 2011-02-02 鸿富锦精密工业（深圳）有限公司 铃音自动检测系统及方法
US20090121762A1 (en) * 2007-11-09 2009-05-14 Tektronix, Inc. Timebase variation compensation in a measurement instrument
US8521457B2 (en) * 2008-10-20 2013-08-27 Olympus Ndt User designated measurement display system and method for NDT/NDI with high rate input data
CN102004177B (zh) * 2009-08-28 2014-12-10 苏文俊 示波器及利用该示波器识别串行总线信号时序的方法
CN102012444B (zh) * 2009-09-07 2014-04-23 鸿富锦精密工业（深圳）有限公司 示波器及利用该示波器测试串行总线信号的方法
US8463953B2 (en) 2010-08-18 2013-06-11 Snap-On Incorporated System and method for integrating devices for servicing a device-under-service
US9330507B2 (en) 2010-08-18 2016-05-03 Snap-On Incorporated System and method for selecting individual parameters to transition from text-to-graph or graph-to-text
US9633492B2 (en) 2010-08-18 2017-04-25 Snap-On Incorporated System and method for a vehicle scanner to automatically execute a test suite from a storage card
US8560168B2 (en) 2010-08-18 2013-10-15 Snap-On Incorporated System and method for extending communication range and reducing power consumption of vehicle diagnostic equipment
US8754779B2 (en) 2010-08-18 2014-06-17 Snap-On Incorporated System and method for displaying input data on a remote display device
US8983785B2 (en) * 2010-08-18 2015-03-17 Snap-On Incorporated System and method for simultaneous display of waveforms generated from input signals received at a data acquisition device
US9117321B2 (en) 2010-08-18 2015-08-25 Snap-On Incorporated Method and apparatus to use remote and local control modes to acquire and visually present data
CN102466745B (zh) * 2010-11-03 2015-08-19 北京普源精电科技有限公司 一种用波形显示测量结果的数字万用表
JP5477357B2 (ja) * 2010-11-09 2014-04-23 株式会社デンソー 音場可視化システム
CN102798765A (zh) * 2011-05-27 2012-11-28 特克特朗尼克公司 触发器品质因数指示器
CN102932287B (zh) * 2011-08-11 2017-04-19 特克特朗尼克公司 测试和测量仪器中的时域搜索
CN102539863B (zh) * 2012-01-12 2014-05-14 黑龙江大学 45度线观测系统状态的示波器显示电路
US9496993B1 (en) 2012-01-13 2016-11-15 Teledyne Lecroy, Inc. Noise analysis to reveal jitter and crosstalk's effect on signal integrity
US10095659B2 (en) 2012-08-03 2018-10-09 Fluke Corporation Handheld devices, systems, and methods for measuring parameters
CN102890258B (zh) * 2012-10-22 2014-06-25 电子科技大学 一种并行结构数字存储示波器捕获率的测试方法
US9329967B2 (en) * 2012-11-13 2016-05-03 Tektronix, Inc. Methods and systems for aiding the analysis of a signal
US9128721B2 (en) * 2012-12-11 2015-09-08 Apple Inc. Closed loop CPU performance control
CN105432064B (zh) * 2013-03-15 2019-05-10 弗兰克公司 使用单独无线移动设备的红外图像的可见视听注释
CN104730306A (zh) * 2013-12-24 2015-06-24 苏州普源精电科技有限公司 解码自动门限设定方法及具有解码自动门限设定功能的示波器
US9766270B2 (en) 2013-12-30 2017-09-19 Fluke Corporation Wireless test measurement
CN106104228B (zh) * 2014-03-20 2024-06-18 株式会社石田 计量装置
CN105807114B (zh) * 2014-12-31 2018-06-26 深圳高宜电子科技有限公司 数字示波器采集数据的存取方法、装置及数字示波器
CN104977556B (zh) 2015-06-30 2017-09-12 电子科技大学 基于死区时间测量的平均波形捕获率测试方法
US10712367B2 (en) 2016-11-08 2020-07-14 Rohde & Schwarz Gmbh & Co. Kg Method for analyzing a signal as well as measurement and analyzing device
CN111948433B (zh) * 2020-08-10 2022-08-12 优利德科技(中国)股份有限公司 一种基于数字示波器的波形展示方法及装置
USD987459S1 (en) 2021-04-26 2023-05-30 Yokogawa Electric Corporation Spectrum analyzer

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US4149044A (en) 1978-01-10 1979-04-10 Hekimian Norris C Method and apparatus for graphically displaying amplitude and phase jitter
US4719416A (en) * 1986-11-10 1988-01-12 Hewlett Packard Company Method for determining the minimum number of acquisition sweeps to meet the risetime specifications of a digital oscilloscope
US5111191A (en) * 1988-06-23 1992-05-05 Motorola, Inc. Method and apparatus for waveform digitization
JPH03291570A (ja) 1990-04-10 1991-12-20 Yokogawa Electric Corp デジタルオシロスコープ
US5250935A (en) 1990-09-24 1993-10-05 Snap-On Tools Corporation Waveform peak capture circuit for digital engine analyzer
US5375067A (en) * 1992-12-11 1994-12-20 Nicolet Instrument Corporation Method and apparatus for adjustment of acquisition parameters in a data acquisition system such as a digital oscilloscope
US5446650A (en) 1993-10-12 1995-08-29 Tektronix, Inc. Logic signal extraction

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009516176A (ja) * 2005-11-10 2009-04-16 テラダイン、 インコーポレイテッド ローカルに順序付けられたストロービング
KR100949939B1 (ko) 2008-03-28 2010-03-30 주식회사 한영넉스 페이퍼 기록계
JP2010127626A (ja) * 2008-11-25 2010-06-10 Yokogawa Electric Corp 波形測定装置
JP2010266444A (ja) * 2009-05-15 2010-11-25 Tektronix Inc 測定方法及び装置
JP2011106827A (ja) * 2009-11-12 2011-06-02 Yokogawa Electric Corp ディジタルオシロスコープ
JP2012042468A (ja) * 2010-08-13 2012-03-01 Tektronix Inc 試験測定装置及びイベント検索方法

Also Published As

Publication number Publication date
US20010001850A1 (en) 2001-05-24
CN1230683C (zh) 2005-12-07
EP1062521A1 (en) 2000-12-27
ATE273519T1 (de) 2004-08-15
NZ506934A (en) 2002-12-20
DE69919337T2 (de) 2005-09-01
US6195617B1 (en) 2001-02-27
DE69919337D1 (de) 2004-09-16
US6311138B2 (en) 2001-10-30
EP1062521B1 (en) 2004-08-11
AU3069099A (en) 1999-09-27
AU758784B2 (en) 2003-03-27
CN1292876A (zh) 2001-04-25
CA2323085A1 (en) 1999-09-16
WO1999046608A1 (en) 1999-09-16

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