CN1230683C - 初级测量值与导出参数的同时显示 - Google Patents
初级测量值与导出参数的同时显示 Download PDFInfo
- Publication number
- CN1230683C CN1230683C CN99803804.0A CN99803804A CN1230683C CN 1230683 C CN1230683 C CN 1230683C CN 99803804 A CN99803804 A CN 99803804A CN 1230683 C CN1230683 C CN 1230683C
- Authority
- CN
- China
- Prior art keywords
- parameter
- data
- elementary measurement
- signal
- time
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000005259 measurement Methods 0.000 title claims abstract description 114
- 238000000034 method Methods 0.000 claims abstract description 68
- 230000004087 circulation Effects 0.000 claims description 46
- 230000006870 function Effects 0.000 claims description 27
- 238000005070 sampling Methods 0.000 claims description 11
- 238000012545 processing Methods 0.000 claims description 10
- 230000005540 biological transmission Effects 0.000 claims description 4
- 238000003491 array Methods 0.000 claims description 3
- 238000001514 detection method Methods 0.000 claims description 3
- 238000009795 derivation Methods 0.000 claims 8
- 230000007423 decrease Effects 0.000 claims 1
- 230000000630 rising effect Effects 0.000 claims 1
- 238000004364 calculation method Methods 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 15
- 230000036962 time dependent Effects 0.000 description 10
- 238000001228 spectrum Methods 0.000 description 9
- 238000004458 analytical method Methods 0.000 description 7
- 230000000052 comparative effect Effects 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 4
- 239000000523 sample Substances 0.000 description 4
- 238000013507 mapping Methods 0.000 description 3
- 230000008447 perception Effects 0.000 description 3
- 230000002547 anomalous effect Effects 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 230000000295 complement effect Effects 0.000 description 2
- 238000001914 filtration Methods 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 230000001360 synchronised effect Effects 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 101100434411 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) ADH1 gene Proteins 0.000 description 1
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- 101150102866 adc1 gene Proteins 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 238000010009 beating Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 125000004122 cyclic group Chemical group 0.000 description 1
- 230000001351 cycling effect Effects 0.000 description 1
- 238000013144 data compression Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 230000036039 immunity Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 230000010363 phase shift Effects 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
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- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/16—Spectrum analysis; Fourier analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/20—Cathode-ray oscilloscopes
- G01R13/22—Circuits therefor
- G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
- G01R13/345—Circuits for representing a single waveform by sampling, e.g. for very high frequencies for displaying sampled signals by using digital processors by intermediate A.D. and D.A. convertors (control circuits for CRT indicators)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
- G01R19/2506—Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values ; Details concerning sampling, digitizing or waveform capturing
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Mathematical Physics (AREA)
- Measurement Of Current Or Voltage (AREA)
- Tests Of Electronic Circuits (AREA)
- Recording Measured Values (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
- Measuring Frequencies, Analyzing Spectra (AREA)
- Measuring Phase Differences (AREA)
- Measuring Pulse, Heart Rate, Blood Pressure Or Blood Flow (AREA)
- Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/037,155 | 1998-03-09 | ||
| US09/037,155 US6195617B1 (en) | 1998-03-09 | 1998-03-09 | Digital storage oscilloscope with simultaneous primary measurement and derived parameter display on common time axis and method therefor |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1292876A CN1292876A (zh) | 2001-04-25 |
| CN1230683C true CN1230683C (zh) | 2005-12-07 |
Family
ID=21892738
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN99803804.0A Expired - Lifetime CN1230683C (zh) | 1998-03-09 | 1999-03-05 | 初级测量值与导出参数的同时显示 |
Country Status (10)
| Country | Link |
|---|---|
| US (2) | US6195617B1 (enExample) |
| EP (1) | EP1062521B1 (enExample) |
| JP (1) | JP2002506975A (enExample) |
| CN (1) | CN1230683C (enExample) |
| AT (1) | ATE273519T1 (enExample) |
| AU (1) | AU758784B2 (enExample) |
| CA (1) | CA2323085A1 (enExample) |
| DE (1) | DE69919337T2 (enExample) |
| NZ (1) | NZ506934A (enExample) |
| WO (1) | WO1999046608A1 (enExample) |
Families Citing this family (61)
| Publication number | Priority date | Publication date | Assignee | Title |
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| JP2000210800A (ja) * | 1999-01-27 | 2000-08-02 | Komatsu Ltd | 産業機械のモニタ方法およびその装置 |
| US6327544B1 (en) * | 1999-03-01 | 2001-12-04 | Agilent Technologies, Inc. | Automatic storage of a trigger definition in a signal measurement system |
| US6463392B1 (en) * | 1999-08-16 | 2002-10-08 | Agilent Technologies, Inc. | System and method for adjusting a sampling time in a logic analyzer |
| US6525525B1 (en) * | 2000-05-02 | 2003-02-25 | Tektronix, Inc. | Oscilloscope with simplified setup procedure, and procedure for setting up oscilloscope |
| US6885953B2 (en) * | 2000-11-17 | 2005-04-26 | Lecroy Corporation | Oscilloscope panel capture and implementation |
| US20030076337A1 (en) * | 2001-10-19 | 2003-04-24 | Chenjing Fernando | Scaling method and apparatus for displaying signals |
| US20060256137A1 (en) * | 2001-10-19 | 2006-11-16 | Chenjing Fernando | Scaling method and apparatus for displaying signals |
| US6917889B2 (en) * | 2002-02-26 | 2005-07-12 | Tektronix, Inc. | Method and apparatus for visually time-correlating waveform measurements to a source waveform |
| US6807496B2 (en) | 2002-05-02 | 2004-10-19 | Tektronix, Inc. | Acquisition system for a long record length digital storage oscilloscope |
| US6748335B2 (en) | 2002-05-06 | 2004-06-08 | Tektronix, Inc. | Acquisition system for a multi-channel relatively long record length digital storage oscilloscope |
| US6892150B2 (en) | 2002-05-24 | 2005-05-10 | Tektronix, Inc. | Combined analog and DSP trigger system for a digital storage oscilloscope |
| US7434113B2 (en) * | 2002-09-30 | 2008-10-07 | Lecroy Corporation | Method of analyzing serial data streams |
| US7519874B2 (en) * | 2002-09-30 | 2009-04-14 | Lecroy Corporation | Method and apparatus for bit error rate analysis |
| US7437624B2 (en) * | 2002-09-30 | 2008-10-14 | Lecroy Corporation | Method and apparatus for analyzing serial data streams |
| JP4490642B2 (ja) * | 2003-04-01 | 2010-06-30 | 株式会社根本杏林堂 | 薬液注入装置 |
| USD504341S1 (en) * | 2003-10-09 | 2005-04-26 | Lecroy Corporation | Measurement instrument |
| USD500693S1 (en) * | 2003-10-09 | 2005-01-11 | Lecroy Corporation | Measurement instrument |
| USD501414S1 (en) * | 2003-10-09 | 2005-02-01 | Lecroy Corporation | Measurement instrument |
| USD504078S1 (en) * | 2003-10-09 | 2005-04-19 | Lecroy Corporation | Measurement instrument |
| US7403560B2 (en) * | 2004-02-09 | 2008-07-22 | Lecroy Corporation | Simultaneous physical and protocol layer analysis |
| US6972554B1 (en) * | 2004-07-26 | 2005-12-06 | Honeywell International, Inc. | Universal aircraft generator electrical bench test apparatus |
| US7305312B2 (en) * | 2005-01-10 | 2007-12-04 | Wavecrest Corporation | Method and apparatus for recording a real time signal |
| US7839792B2 (en) * | 2005-08-30 | 2010-11-23 | Tektronix, Inc. | Time-correlated, simultaneous measurement and analysis of network signals from multiple communication networks |
| US7668235B2 (en) * | 2005-11-10 | 2010-02-23 | Teradyne | Jitter measurement algorithm using locally in-order strobes |
| US7652465B2 (en) * | 2006-03-24 | 2010-01-26 | Tektronix, Inc. | No dead time data acquisition |
| CN101424711B (zh) * | 2007-10-31 | 2011-02-02 | 鸿富锦精密工业(深圳)有限公司 | 铃音自动检测系统及方法 |
| US20090121762A1 (en) * | 2007-11-09 | 2009-05-14 | Tektronix, Inc. | Timebase variation compensation in a measurement instrument |
| KR100949939B1 (ko) | 2008-03-28 | 2010-03-30 | 주식회사 한영넉스 | 페이퍼 기록계 |
| US8521457B2 (en) * | 2008-10-20 | 2013-08-27 | Olympus Ndt | User designated measurement display system and method for NDT/NDI with high rate input data |
| JP5413796B2 (ja) * | 2008-11-25 | 2014-02-12 | 横河電機株式会社 | 波形測定装置 |
| US8670947B2 (en) * | 2009-05-15 | 2014-03-11 | Tektronix, Inc. | Computer system for automatically determining slew rate de-rating values |
| CN102004177B (zh) * | 2009-08-28 | 2014-12-10 | 苏文俊 | 示波器及利用该示波器识别串行总线信号时序的方法 |
| CN102012444B (zh) * | 2009-09-07 | 2014-04-23 | 鸿富锦精密工业(深圳)有限公司 | 示波器及利用该示波器测试串行总线信号的方法 |
| JP5717332B2 (ja) * | 2009-11-12 | 2015-05-13 | 横河電機株式会社 | ディジタルオシロスコープ |
| US9297834B2 (en) * | 2010-08-13 | 2016-03-29 | Tektronix, Inc. | Time-domain searching in a test and measurement instrument |
| US8463953B2 (en) | 2010-08-18 | 2013-06-11 | Snap-On Incorporated | System and method for integrating devices for servicing a device-under-service |
| US9330507B2 (en) | 2010-08-18 | 2016-05-03 | Snap-On Incorporated | System and method for selecting individual parameters to transition from text-to-graph or graph-to-text |
| US9633492B2 (en) | 2010-08-18 | 2017-04-25 | Snap-On Incorporated | System and method for a vehicle scanner to automatically execute a test suite from a storage card |
| US8560168B2 (en) | 2010-08-18 | 2013-10-15 | Snap-On Incorporated | System and method for extending communication range and reducing power consumption of vehicle diagnostic equipment |
| US8754779B2 (en) | 2010-08-18 | 2014-06-17 | Snap-On Incorporated | System and method for displaying input data on a remote display device |
| US8983785B2 (en) * | 2010-08-18 | 2015-03-17 | Snap-On Incorporated | System and method for simultaneous display of waveforms generated from input signals received at a data acquisition device |
| US9117321B2 (en) | 2010-08-18 | 2015-08-25 | Snap-On Incorporated | Method and apparatus to use remote and local control modes to acquire and visually present data |
| CN102466745B (zh) * | 2010-11-03 | 2015-08-19 | 北京普源精电科技有限公司 | 一种用波形显示测量结果的数字万用表 |
| JP5477357B2 (ja) * | 2010-11-09 | 2014-04-23 | 株式会社デンソー | 音場可視化システム |
| CN102798765A (zh) * | 2011-05-27 | 2012-11-28 | 特克特朗尼克公司 | 触发器品质因数指示器 |
| CN102932287B (zh) * | 2011-08-11 | 2017-04-19 | 特克特朗尼克公司 | 测试和测量仪器中的时域搜索 |
| CN102539863B (zh) * | 2012-01-12 | 2014-05-14 | 黑龙江大学 | 45度线观测系统状态的示波器显示电路 |
| US9496993B1 (en) | 2012-01-13 | 2016-11-15 | Teledyne Lecroy, Inc. | Noise analysis to reveal jitter and crosstalk's effect on signal integrity |
| US10095659B2 (en) | 2012-08-03 | 2018-10-09 | Fluke Corporation | Handheld devices, systems, and methods for measuring parameters |
| CN102890258B (zh) * | 2012-10-22 | 2014-06-25 | 电子科技大学 | 一种并行结构数字存储示波器捕获率的测试方法 |
| US9329967B2 (en) * | 2012-11-13 | 2016-05-03 | Tektronix, Inc. | Methods and systems for aiding the analysis of a signal |
| US9128721B2 (en) * | 2012-12-11 | 2015-09-08 | Apple Inc. | Closed loop CPU performance control |
| CN105432064B (zh) * | 2013-03-15 | 2019-05-10 | 弗兰克公司 | 使用单独无线移动设备的红外图像的可见视听注释 |
| CN104730306A (zh) * | 2013-12-24 | 2015-06-24 | 苏州普源精电科技有限公司 | 解码自动门限设定方法及具有解码自动门限设定功能的示波器 |
| US9766270B2 (en) | 2013-12-30 | 2017-09-19 | Fluke Corporation | Wireless test measurement |
| CN106104228B (zh) * | 2014-03-20 | 2024-06-18 | 株式会社石田 | 计量装置 |
| CN105807114B (zh) * | 2014-12-31 | 2018-06-26 | 深圳高宜电子科技有限公司 | 数字示波器采集数据的存取方法、装置及数字示波器 |
| CN104977556B (zh) | 2015-06-30 | 2017-09-12 | 电子科技大学 | 基于死区时间测量的平均波形捕获率测试方法 |
| US10712367B2 (en) | 2016-11-08 | 2020-07-14 | Rohde & Schwarz Gmbh & Co. Kg | Method for analyzing a signal as well as measurement and analyzing device |
| CN111948433B (zh) * | 2020-08-10 | 2022-08-12 | 优利德科技(中国)股份有限公司 | 一种基于数字示波器的波形展示方法及装置 |
| USD987459S1 (en) | 2021-04-26 | 2023-05-30 | Yokogawa Electric Corporation | Spectrum analyzer |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4149044A (en) | 1978-01-10 | 1979-04-10 | Hekimian Norris C | Method and apparatus for graphically displaying amplitude and phase jitter |
| US4719416A (en) * | 1986-11-10 | 1988-01-12 | Hewlett Packard Company | Method for determining the minimum number of acquisition sweeps to meet the risetime specifications of a digital oscilloscope |
| US5111191A (en) * | 1988-06-23 | 1992-05-05 | Motorola, Inc. | Method and apparatus for waveform digitization |
| JPH03291570A (ja) | 1990-04-10 | 1991-12-20 | Yokogawa Electric Corp | デジタルオシロスコープ |
| US5250935A (en) | 1990-09-24 | 1993-10-05 | Snap-On Tools Corporation | Waveform peak capture circuit for digital engine analyzer |
| US5375067A (en) * | 1992-12-11 | 1994-12-20 | Nicolet Instrument Corporation | Method and apparatus for adjustment of acquisition parameters in a data acquisition system such as a digital oscilloscope |
| US5446650A (en) | 1993-10-12 | 1995-08-29 | Tektronix, Inc. | Logic signal extraction |
-
1998
- 1998-03-09 US US09/037,155 patent/US6195617B1/en not_active Expired - Lifetime
-
1999
- 1999-03-05 DE DE69919337T patent/DE69919337T2/de not_active Expired - Fee Related
- 1999-03-05 AU AU30690/99A patent/AU758784B2/en not_active Ceased
- 1999-03-05 CN CN99803804.0A patent/CN1230683C/zh not_active Expired - Lifetime
- 1999-03-05 JP JP2000535938A patent/JP2002506975A/ja active Pending
- 1999-03-05 NZ NZ506934A patent/NZ506934A/xx unknown
- 1999-03-05 EP EP99912279A patent/EP1062521B1/en not_active Expired - Lifetime
- 1999-03-05 CA CA002323085A patent/CA2323085A1/en not_active Abandoned
- 1999-03-05 WO PCT/US1999/004800 patent/WO1999046608A1/en not_active Ceased
- 1999-03-05 AT AT99912279T patent/ATE273519T1/de not_active IP Right Cessation
-
2001
- 2001-01-02 US US09/752,949 patent/US6311138B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| US20010001850A1 (en) | 2001-05-24 |
| EP1062521A1 (en) | 2000-12-27 |
| ATE273519T1 (de) | 2004-08-15 |
| NZ506934A (en) | 2002-12-20 |
| DE69919337T2 (de) | 2005-09-01 |
| US6195617B1 (en) | 2001-02-27 |
| DE69919337D1 (de) | 2004-09-16 |
| US6311138B2 (en) | 2001-10-30 |
| EP1062521B1 (en) | 2004-08-11 |
| AU3069099A (en) | 1999-09-27 |
| JP2002506975A (ja) | 2002-03-05 |
| AU758784B2 (en) | 2003-03-27 |
| CN1292876A (zh) | 2001-04-25 |
| CA2323085A1 (en) | 1999-09-16 |
| WO1999046608A1 (en) | 1999-09-16 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term |
Granted publication date: 20051207 |
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| CX01 | Expiry of patent term |