JP2002501177A5 - - Google Patents

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Publication number
JP2002501177A5
JP2002501177A5 JP2000527836A JP2000527836A JP2002501177A5 JP 2002501177 A5 JP2002501177 A5 JP 2002501177A5 JP 2000527836 A JP2000527836 A JP 2000527836A JP 2000527836 A JP2000527836 A JP 2000527836A JP 2002501177 A5 JP2002501177 A5 JP 2002501177A5
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JP
Japan
Prior art keywords
probe mechanism
probe
mixture
lead
deposits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000527836A
Other languages
English (en)
Japanese (ja)
Other versions
JP2002501177A (ja
Filing date
Publication date
Priority claimed from US09/002,479 external-priority patent/US6121058A/en
Application filed filed Critical
Publication of JP2002501177A publication Critical patent/JP2002501177A/ja
Publication of JP2002501177A5 publication Critical patent/JP2002501177A5/ja
Pending legal-status Critical Current

Links

JP2000527836A 1998-01-02 1998-12-21 プローブカードのプローブ機構から堆積ハンダを取り除くための方法 Pending JP2002501177A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/002,479 1998-01-02
US09/002,479 US6121058A (en) 1998-01-02 1998-01-02 Method for removing accumulated solder from probe card probing features
PCT/US1998/027393 WO1999035505A2 (en) 1998-01-02 1998-12-21 Method for removing accumulated solder from probe card probing features

Publications (2)

Publication Number Publication Date
JP2002501177A JP2002501177A (ja) 2002-01-15
JP2002501177A5 true JP2002501177A5 (https=) 2006-02-16

Family

ID=21700971

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000527836A Pending JP2002501177A (ja) 1998-01-02 1998-12-21 プローブカードのプローブ機構から堆積ハンダを取り除くための方法

Country Status (5)

Country Link
US (1) US6121058A (https=)
JP (1) JP2002501177A (https=)
KR (1) KR100367112B1 (https=)
AU (1) AU2092099A (https=)
WO (1) WO1999035505A2 (https=)

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US9833818B2 (en) 2004-09-28 2017-12-05 International Test Solutions, Inc. Working surface cleaning system and method
US20060065290A1 (en) * 2004-09-28 2006-03-30 Jerry Broz Working surface cleaning system and method
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KR101368139B1 (ko) * 2007-07-16 2014-03-12 어드밴티스트 아메리카, 인크. 마이크로 전기 기계 시스템을 수리하기 위한 장치 및 방법
US7761966B2 (en) * 2007-07-16 2010-07-27 Touchdown Technologies, Inc. Method for repairing a microelectromechanical system
US8258111B2 (en) 2008-05-08 2012-09-04 The Johns Hopkins University Compositions and methods related to miRNA modulation of neovascularization or angiogenesis
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NZ704322A (en) 2010-07-06 2016-07-29 Interna Technologies Bv Mirna and its diagnostic and therapeutic uses in diseases or conditions associated with melanoma, or in diseases or conditions associated with activated braf pathway
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WO2013040251A2 (en) 2011-09-13 2013-03-21 Asurgen, Inc. Methods and compositions involving mir-135b for distinguishing pancreatic cancer from benign pancreatic disease
WO2013063519A1 (en) 2011-10-26 2013-05-02 Asuragen, Inc. Methods and compositions involving mirna expression levels for distinguishing pancreatic cysts
WO2013063544A1 (en) 2011-10-27 2013-05-02 Asuragen, Inc. Mirnas as diagnostic biomarkers to distinguish benign from malignant thyroid tumors
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EP2870263A1 (en) 2012-07-03 2015-05-13 InteRNA Technologies B.V. Diagnostic portfolio and its uses
WO2014055117A1 (en) 2012-10-04 2014-04-10 Asuragen, Inc. Diagnostic mirnas for differential diagnosis of incidental pancreatic cystic lesions
EP2971149B1 (en) 2013-03-15 2018-05-09 Baylor Research Institute Ulcerative colitis (uc)-associated colorectal neoplasia markers
EP2971132B1 (en) 2013-03-15 2020-05-06 Baylor Research Institute Tissue and blood-based mirna biomarkers for the diagnosis, prognosis and metastasis-predictive potential in colorectal cancer
WO2014144666A2 (en) 2013-03-15 2014-09-18 The University Of Chicago Methods and compositions related to t-cell activity
US9825000B1 (en) 2017-04-24 2017-11-21 International Test Solutions, Inc. Semiconductor wire bonding machine cleaning device and method
US11497762B2 (en) 2017-11-03 2022-11-15 Interna Technologies B.V. MiRNA molecule, equivalent, antagomir, or source thereof for treating and/or diagnosing a condition and/or a disease associated with neuronal deficiency or for neuronal (re)generation
EP3714053B1 (en) 2017-11-22 2025-12-31 The University of Chicago CHEMICALLY DEPENDENT PROBE EVALUATION OF PROTEIN ACTIVITY AND ITS USES
JP2021514827A (ja) 2018-02-23 2021-06-17 インターナショナル テスト ソリューションズ, インコーポレイテッド フレキシブル電子回路ウェブロールを自動的に清浄化するための新規材料及びハードウエア
JP7292921B2 (ja) * 2019-03-29 2023-06-19 株式会社日本マイクロニクス 多ピン構造プローブ体及びプローブカード
CN114174532A (zh) 2019-04-05 2022-03-11 德克萨斯大学系统董事会 细胞条形码编码的方法和应用
WO2020210521A2 (en) 2019-04-12 2020-10-15 The Regents Of The University Of California Compositions and methods for increasing muscle mass and oxidative metabolism
US10792713B1 (en) 2019-07-02 2020-10-06 International Test Solutions, Inc. Pick and place machine cleaning system and method
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US11318550B2 (en) 2019-11-14 2022-05-03 International Test Solutions, Llc System and method for cleaning wire bonding machines using functionalized surface microfeatures
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JP3188935B2 (ja) * 1995-01-19 2001-07-16 東京エレクトロン株式会社 検査装置
DE69625020T2 (de) * 1995-04-19 2003-07-24 Koninklijke Philips Electronics N.V., Eindhoven Verfahren zum reinigen von nadelkartenprüfspitzen
JPH11230989A (ja) * 1997-12-10 1999-08-27 Mitsubishi Electric Corp プローブカード用プローブ針のクリーニング方法およびクリーニング装置とそれに用いる洗浄液

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