JP2002501177A5 - - Google Patents

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Publication number
JP2002501177A5
JP2002501177A5 JP2000527836A JP2000527836A JP2002501177A5 JP 2002501177 A5 JP2002501177 A5 JP 2002501177A5 JP 2000527836 A JP2000527836 A JP 2000527836A JP 2000527836 A JP2000527836 A JP 2000527836A JP 2002501177 A5 JP2002501177 A5 JP 2002501177A5
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JP
Japan
Prior art keywords
probe mechanism
probe
mixture
lead
deposits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000527836A
Other languages
English (en)
Japanese (ja)
Other versions
JP2002501177A (ja
Filing date
Publication date
Priority claimed from US09/002,479 external-priority patent/US6121058A/en
Application filed filed Critical
Publication of JP2002501177A publication Critical patent/JP2002501177A/ja
Publication of JP2002501177A5 publication Critical patent/JP2002501177A5/ja
Pending legal-status Critical Current

Links

JP2000527836A 1998-01-02 1998-12-21 プローブカードのプローブ機構から堆積ハンダを取り除くための方法 Pending JP2002501177A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/002,479 1998-01-02
US09/002,479 US6121058A (en) 1998-01-02 1998-01-02 Method for removing accumulated solder from probe card probing features
PCT/US1998/027393 WO1999035505A2 (en) 1998-01-02 1998-12-21 Method for removing accumulated solder from probe card probing features

Publications (2)

Publication Number Publication Date
JP2002501177A JP2002501177A (ja) 2002-01-15
JP2002501177A5 true JP2002501177A5 (https=) 2006-02-16

Family

ID=21700971

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000527836A Pending JP2002501177A (ja) 1998-01-02 1998-12-21 プローブカードのプローブ機構から堆積ハンダを取り除くための方法

Country Status (5)

Country Link
US (1) US6121058A (https=)
JP (1) JP2002501177A (https=)
KR (1) KR100367112B1 (https=)
AU (1) AU2092099A (https=)
WO (1) WO1999035505A2 (https=)

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US9833818B2 (en) 2004-09-28 2017-12-05 International Test Solutions, Inc. Working surface cleaning system and method
US20060065290A1 (en) * 2004-09-28 2006-03-30 Jerry Broz Working surface cleaning system and method
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US20090131348A1 (en) 2006-09-19 2009-05-21 Emmanuel Labourier Micrornas differentially expressed in pancreatic diseases and uses thereof
US7761966B2 (en) * 2007-07-16 2010-07-27 Touchdown Technologies, Inc. Method for repairing a microelectromechanical system
JP2010533861A (ja) * 2007-07-16 2010-10-28 タッチダウン・テクノロジーズ・インコーポレーテッド 微小電気機械システムを修復するための装置及び方法
WO2009137807A2 (en) 2008-05-08 2009-11-12 Asuragen, Inc. Compositions and methods related to mirna modulation of neovascularization or angiogenesis
US8371316B2 (en) 2009-12-03 2013-02-12 International Test Solutions, Inc. Apparatuses, device, and methods for cleaning tester interface contact elements and support hardware
EP2542678B1 (en) 2010-03-04 2017-04-12 InteRNA Technologies B.V. A MiRNA MOLECULE DEFINED BY ITS SOURCE AND ITS THERAPEUTIC USES IN CANCER ASSOCIATED WITH EMT
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BR112013012265A2 (pt) 2010-11-17 2016-08-02 Asuragen Inc mirnas como biomarcadores para distinguir neoplasmas de tireoide benignos de malignos
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EP2681566A2 (en) 2011-02-28 2014-01-08 University of Iowa Research Foundation Anti-müllerian hormone changes in pregnancy and prediction ofadverse pregnancy outcomes and gender
WO2013040251A2 (en) 2011-09-13 2013-03-21 Asurgen, Inc. Methods and compositions involving mir-135b for distinguishing pancreatic cancer from benign pancreatic disease
WO2013063519A1 (en) 2011-10-26 2013-05-02 Asuragen, Inc. Methods and compositions involving mirna expression levels for distinguishing pancreatic cysts
WO2013063544A1 (en) 2011-10-27 2013-05-02 Asuragen, Inc. Mirnas as diagnostic biomarkers to distinguish benign from malignant thyroid tumors
US9279830B2 (en) 2011-12-31 2016-03-08 Intel Corporation Test probe structures and methods including positioning test probe structures in a test head
US20150008950A1 (en) 2011-12-31 2015-01-08 Roy E. Swart Manufacturing advanced test probes
WO2014007623A1 (en) 2012-07-03 2014-01-09 Interna Technologies B.V. Diagnostic portfolio and its uses
WO2014055117A1 (en) 2012-10-04 2014-04-10 Asuragen, Inc. Diagnostic mirnas for differential diagnosis of incidental pancreatic cystic lesions
CA2907377A1 (en) 2013-03-15 2014-09-18 Baylor Research Institute Tissue and blood-based mirna biomarkers for the diagnosis, prognosis and metastasis-predictive potential in colorectal cancer
US9944992B2 (en) 2013-03-15 2018-04-17 The University Of Chicago Methods and compositions related to T-cell activity
US9758835B2 (en) 2013-03-15 2017-09-12 Baylor Research Institute Ulcerative colitis (UC)-associated colorectal neoplasia markers
US9825000B1 (en) 2017-04-24 2017-11-21 International Test Solutions, Inc. Semiconductor wire bonding machine cleaning device and method
CN111566212A (zh) 2017-11-03 2020-08-21 因特尔纳技术有限公司 miRNA分子，等同物，安塔够妙或其来源用于治疗和/或诊断与神经元缺陷相关的病症和/或疾病或用于神经元生成和/或再生
WO2019104155A2 (en) 2017-11-22 2019-05-31 The University Of Chicago Chemical probe-dependent evaluation of protein activity and uses thereof
US11155428B2 (en) 2018-02-23 2021-10-26 International Test Solutions, Llc Material and hardware to automatically clean flexible electronic web rolls
JP7292921B2 (ja) * 2019-03-29 2023-06-19 株式会社日本マイクロニクス 多ピン構造プローブ体及びプローブカード
EP3947727A4 (en) 2019-04-05 2023-01-04 Board of Regents, The University of Texas System METHODS AND APPLICATIONS OF CELL BARCODING
JP7566775B2 (ja) 2019-04-12 2024-10-15 ザ リージェンツ オブ ザ ユニバーシティ オブ カリフォルニア 筋肉量及び酸化的代謝を増加させるための組成物及び方法
US10792713B1 (en) 2019-07-02 2020-10-06 International Test Solutions, Inc. Pick and place machine cleaning system and method
US11756811B2 (en) 2019-07-02 2023-09-12 International Test Solutions, Llc Pick and place machine cleaning system and method
US11211242B2 (en) 2019-11-14 2021-12-28 International Test Solutions, Llc System and method for cleaning contact elements and support hardware using functionalized surface microfeatures
US11318550B2 (en) 2019-11-14 2022-05-03 International Test Solutions, Llc System and method for cleaning wire bonding machines using functionalized surface microfeatures
US11035898B1 (en) 2020-05-11 2021-06-15 International Test Solutions, Inc. Device and method for thermal stabilization of probe elements using a heat conducting wafer
WO2024028794A1 (en) 2022-08-02 2024-02-08 Temple Therapeutics BV Methods for treating endometrial and ovarian hyperproliferative disorders
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JP3188935B2 (ja) * 1995-01-19 2001-07-16 東京エレクトロン株式会社 検査装置
DE69625020T2 (de) * 1995-04-19 2003-07-24 Koninklijke Philips Electronics N.V., Eindhoven Verfahren zum reinigen von nadelkartenprüfspitzen
JPH11230989A (ja) * 1997-12-10 1999-08-27 Mitsubishi Electric Corp プローブカード用プローブ針のクリーニング方法およびクリーニング装置とそれに用いる洗浄液

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