DE69625020T2 - Verfahren zum reinigen von nadelkartenprüfspitzen - Google Patents

Verfahren zum reinigen von nadelkartenprüfspitzen

Info

Publication number
DE69625020T2
DE69625020T2 DE69625020T DE69625020T DE69625020T2 DE 69625020 T2 DE69625020 T2 DE 69625020T2 DE 69625020 T DE69625020 T DE 69625020T DE 69625020 T DE69625020 T DE 69625020T DE 69625020 T2 DE69625020 T2 DE 69625020T2
Authority
DE
Germany
Prior art keywords
cleaning needle
needle card
card tips
tips
cleaning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69625020T
Other languages
English (en)
Other versions
DE69625020D1 (de
Inventor
Egon Hollaender
August Riedo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Electronics NV filed Critical Koninklijke Philips Electronics NV
Publication of DE69625020D1 publication Critical patent/DE69625020D1/de
Application granted granted Critical
Publication of DE69625020T2 publication Critical patent/DE69625020T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • H05K3/22—Secondary treatment of printed circuits
    • H05K3/26—Cleaning or polishing of the conductive pattern
DE69625020T 1995-04-19 1996-03-18 Verfahren zum reinigen von nadelkartenprüfspitzen Expired - Fee Related DE69625020T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP95200989 1995-04-19
PCT/IB1996/000239 WO1996033419A2 (en) 1995-04-19 1996-03-18 Method of cleaning probe tips of probe cards and apparatus for implementing the method

Publications (2)

Publication Number Publication Date
DE69625020D1 DE69625020D1 (de) 2003-01-09
DE69625020T2 true DE69625020T2 (de) 2003-07-24

Family

ID=8220202

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69625020T Expired - Fee Related DE69625020T2 (de) 1995-04-19 1996-03-18 Verfahren zum reinigen von nadelkartenprüfspitzen

Country Status (7)

Country Link
US (1) US5814158A (de)
EP (1) EP0766829B1 (de)
JP (1) JPH10501928A (de)
CN (1) CN1111742C (de)
DE (1) DE69625020T2 (de)
TW (1) TW301017B (de)
WO (1) WO1996033419A2 (de)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69832010T2 (de) * 1997-07-24 2006-07-13 Mitsubishi Denki K.K. Prüfspitze für Halbleiterschaltungen und Verfahren zu ihrer Herstellung
US5990694A (en) * 1997-11-06 1999-11-23 Micron Technology, Inc. Integrated circuit probing method
JP3429995B2 (ja) * 1997-11-10 2003-07-28 東京エレクトロン株式会社 クリーニング方法
US6121058A (en) * 1998-01-02 2000-09-19 Intel Corporation Method for removing accumulated solder from probe card probing features
US6170494B1 (en) * 1999-11-12 2001-01-09 Advanced Micro Devices, Inc. Method for automatically cleaning resist nozzle
US7053646B2 (en) * 2000-09-15 2006-05-30 Orsillo James F Apparatus and method for use in testing a semiconductor wafer
US20040020514A1 (en) * 2002-07-18 2004-02-05 Orsillo James E. Probe device cleaner and method
US6908364B2 (en) * 2001-08-02 2005-06-21 Kulicke & Soffa Industries, Inc. Method and apparatus for probe tip cleaning and shaping pad
US7182672B2 (en) * 2001-08-02 2007-02-27 Sv Probe Pte. Ltd. Method of probe tip shaping and cleaning
US9833818B2 (en) 2004-09-28 2017-12-05 International Test Solutions, Inc. Working surface cleaning system and method
US7905471B2 (en) 2004-11-22 2011-03-15 Electro Scientific Industries, Inc. Vacuum ring designs for electrical contacting improvement
FR2924815B1 (fr) * 2007-12-06 2010-02-12 Ceprim Technologies Dispositif et procede de nettoyage a ultrasons des pointes de contact des cartes de test de circuits integres ou des cartes de circuits imprimes
CN101971037A (zh) * 2008-03-14 2011-02-09 富士胶片株式会社 探针卡
US8371316B2 (en) 2009-12-03 2013-02-12 International Test Solutions, Inc. Apparatuses, device, and methods for cleaning tester interface contact elements and support hardware
CN103316865B (zh) * 2013-06-07 2015-05-20 深圳市矽电半导体设备有限公司 一种半导体测试探针清洗装置及方法
CN104384123B (zh) * 2014-09-24 2016-08-17 上海华力微电子有限公司 一种探针卡清针装置
CN108321098A (zh) * 2017-01-18 2018-07-24 中芯长电半导体（江阴）有限公司 一种用于晶圆测试的探针针尖的清洁液、清洁装置及方法
US9825000B1 (en) 2017-04-24 2017-11-21 International Test Solutions, Inc. Semiconductor wire bonding machine cleaning device and method
US11434095B2 (en) 2018-02-23 2022-09-06 International Test Solutions, Llc Material and hardware to automatically clean flexible electronic web rolls
US10792713B1 (en) 2019-07-02 2020-10-06 International Test Solutions, Inc. Pick and place machine cleaning system and method
US11756811B2 (en) 2019-07-02 2023-09-12 International Test Solutions, Llc Pick and place machine cleaning system and method
US11211242B2 (en) 2019-11-14 2021-12-28 International Test Solutions, Llc System and method for cleaning contact elements and support hardware using functionalized surface microfeatures
US11318550B2 (en) 2019-11-14 2022-05-03 International Test Solutions, Llc System and method for cleaning wire bonding machines using functionalized surface microfeatures
US11035898B1 (en) 2020-05-11 2021-06-15 International Test Solutions, Inc. Device and method for thermal stabilization of probe elements using a heat conducting wafer

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4314855A (en) * 1979-12-17 1982-02-09 Bell Telephone Laboratories, Incorporated Method of cleaning test probes
US4319923A (en) * 1979-12-26 1982-03-16 Western Electric Co., Inc. Recovery of gold and/or palladium from an iodide-iodine etching solution
US4590422A (en) * 1981-07-30 1986-05-20 Pacific Western Systems, Inc. Automatic wafer prober having a probe scrub routine
US5275184A (en) * 1990-10-19 1994-01-04 Dainippon Screen Mfg. Co., Ltd. Apparatus and system for treating surface of a wafer by dipping the same in a treatment solution and a gate device for chemical agent used in the apparatus and the system
JPH0760844B2 (ja) * 1991-05-15 1995-06-28 株式会社駒ヶ根電化 使用済みプローブカードの再生方法
JPH04364746A (ja) * 1991-06-12 1992-12-17 Tokyo Electron Yamanashi Kk プローブ装置
US5166605A (en) * 1991-08-02 1992-11-24 General Electric Company Controlled impedance test fixture for planar electronic device

Also Published As

Publication number Publication date
DE69625020D1 (de) 2003-01-09
CN1150843A (zh) 1997-05-28
EP0766829A2 (de) 1997-04-09
EP0766829B1 (de) 2002-11-27
CN1111742C (zh) 2003-06-18
JPH10501928A (ja) 1998-02-17
WO1996033419A2 (en) 1996-10-24
TW301017B (de) 1997-03-21
US5814158A (en) 1998-09-29
WO1996033419A3 (en) 1996-11-28

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee