KR100367112B1 - 프로브 카드의 프로빙 피처에 축적된 땜납 제거 방법 - Google Patents

프로브 카드의 프로빙 피처에 축적된 땜납 제거 방법 Download PDF

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Publication number
KR100367112B1
KR100367112B1 KR10-2000-7007395A KR20007007395A KR100367112B1 KR 100367112 B1 KR100367112 B1 KR 100367112B1 KR 20007007395 A KR20007007395 A KR 20007007395A KR 100367112 B1 KR100367112 B1 KR 100367112B1
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KR
South Korea
Prior art keywords
probing
composition
feature
lead
probing feature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
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KR10-2000-7007395A
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English (en)
Korean (ko)
Other versions
KR20010033836A (ko
Inventor
쉘멜리사케이
요시모토리차드에스
Original Assignee
인텔 코오퍼레이션
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Application filed by 인텔 코오퍼레이션 filed Critical 인텔 코오퍼레이션
Publication of KR20010033836A publication Critical patent/KR20010033836A/ko
Application granted granted Critical
Publication of KR100367112B1 publication Critical patent/KR100367112B1/ko
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • H05K3/22—Secondary treatment of printed circuits
    • H05K3/26—Cleaning or polishing of the conductive pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Cleaning And De-Greasing Of Metallic Materials By Chemical Methods (AREA)
KR10-2000-7007395A 1998-01-02 1998-12-21 프로브 카드의 프로빙 피처에 축적된 땜납 제거 방법 Expired - Fee Related KR100367112B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/002,479 1998-01-02
US09/002,479 US6121058A (en) 1998-01-02 1998-01-02 Method for removing accumulated solder from probe card probing features

Publications (2)

Publication Number Publication Date
KR20010033836A KR20010033836A (ko) 2001-04-25
KR100367112B1 true KR100367112B1 (ko) 2003-01-09

Family

ID=21700971

Family Applications (1)

Application Number Title Priority Date Filing Date
KR10-2000-7007395A Expired - Fee Related KR100367112B1 (ko) 1998-01-02 1998-12-21 프로브 카드의 프로빙 피처에 축적된 땜납 제거 방법

Country Status (5)

Country Link
US (1) US6121058A (https=)
JP (1) JP2002501177A (https=)
KR (1) KR100367112B1 (https=)
AU (1) AU2092099A (https=)
WO (1) WO1999035505A2 (https=)

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US8258111B2 (en) 2008-05-08 2012-09-04 The Johns Hopkins University Compositions and methods related to miRNA modulation of neovascularization or angiogenesis
US8371316B2 (en) 2009-12-03 2013-02-12 International Test Solutions, Inc. Apparatuses, device, and methods for cleaning tester interface contact elements and support hardware
ES2631458T3 (es) 2010-03-04 2017-08-31 Interna Technologies B.V. Molécula de ARNmi definida por su fuente y sus usos terapéuticos en el cáncer asociado a la EMT
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JP2021514827A (ja) 2018-02-23 2021-06-17 インターナショナル テスト ソリューションズ， インコーポレイテッド フレキシブル電子回路ウェブロールを自動的に清浄化するための新規材料及びハードウエア
JP7292921B2 (ja) * 2019-03-29 2023-06-19 株式会社日本マイクロニクス 多ピン構造プローブ体及びプローブカード
CN114174532A (zh) 2019-04-05 2022-03-11 德克萨斯大学系统董事会 细胞条形码编码的方法和应用
WO2020210521A2 (en) 2019-04-12 2020-10-15 The Regents Of The University Of California Compositions and methods for increasing muscle mass and oxidative metabolism
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Also Published As

Publication number Publication date
KR20010033836A (ko) 2001-04-25
JP2002501177A (ja) 2002-01-15
US6121058A (en) 2000-09-19
AU2092099A (en) 1999-07-26
WO1999035505A3 (en) 2000-04-06
WO1999035505A2 (en) 1999-07-15

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