JP2002310605A - バリ検査用センサ装置 - Google Patents

バリ検査用センサ装置

Info

Publication number
JP2002310605A
JP2002310605A JP2002010527A JP2002010527A JP2002310605A JP 2002310605 A JP2002310605 A JP 2002310605A JP 2002010527 A JP2002010527 A JP 2002010527A JP 2002010527 A JP2002010527 A JP 2002010527A JP 2002310605 A JP2002310605 A JP 2002310605A
Authority
JP
Japan
Prior art keywords
workpiece
distance
sensor
sensor device
detection head
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2002010527A
Other languages
English (en)
Japanese (ja)
Other versions
JP2002310605A5 (https=
Inventor
Manfred Jagiella
マンフレッド・ヤギーラ
Sorin Fericean
ゾリン・フェリシャン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Balluff GmbH
Original Assignee
Balluff GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Balluff GmbH filed Critical Balluff GmbH
Publication of JP2002310605A publication Critical patent/JP2002310605A/ja
Publication of JP2002310605A5 publication Critical patent/JP2002310605A5/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Processing And Handling Of Plastics And Other Materials For Molding In General (AREA)
JP2002010527A 2001-01-22 2002-01-18 バリ検査用センサ装置 Pending JP2002310605A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10103177.7 2001-01-22
DE10103177A DE10103177A1 (de) 2001-01-22 2001-01-22 Gratprüfungs-Sensorvorrichtung

Publications (2)

Publication Number Publication Date
JP2002310605A true JP2002310605A (ja) 2002-10-23
JP2002310605A5 JP2002310605A5 (https=) 2005-06-30

Family

ID=7671625

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002010527A Pending JP2002310605A (ja) 2001-01-22 2002-01-18 バリ検査用センサ装置

Country Status (4)

Country Link
US (1) US7023564B2 (https=)
EP (1) EP1225443A3 (https=)
JP (1) JP2002310605A (https=)
DE (1) DE10103177A1 (https=)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007003245A (ja) * 2005-06-21 2007-01-11 Aoi Kiko Kk バリ検知方法および装置
JP2008087091A (ja) * 2006-09-29 2008-04-17 Tokyo Seimitsu Co Ltd 平面インダクタ搭載静電結合型センサ及びそれを用いた終点検出方法及び終点検出装置
JP2008256683A (ja) * 2007-03-30 2008-10-23 Honda Motor Co Ltd 冷却剤通路検査装置及び車両用シリンダヘッド冷却剤通路の詰まり検知方法
JP2013528798A (ja) * 2010-05-11 2013-07-11 アンスティテュ.ナショナル.ポリテクニーク.デ.トゥールーズ 物理的パラメータの光学測定デバイス
KR101737932B1 (ko) * 2015-05-21 2017-05-19 한밭대학교 산학협력단 반도체 소자 내부의 메탈층을 이용한 내부형상측정모듈이 장착된 밀링장치
JP2021173757A (ja) * 2020-04-17 2021-11-01 タダノ デマグ ゲーエムベーハーTadano Demag GmbH 車両クレーンの伸縮ジブの固定・ロックユニットの誘導センサアセンブリ

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DE102004006680B3 (de) * 2004-02-09 2006-01-12 Balluff Gmbh Sensorvorrichtung zur Prüfung von Oberflächen
DE102005039094B4 (de) * 2005-08-08 2009-03-19 Carl Zeiss Industrielle Messtechnik Gmbh Verfahren und Vorrichtung zum Führen eines Maschinenteils entlang einer definierten Bewegungsbahn über einer Werkstücksoberfläche
JP5624745B2 (ja) * 2009-10-23 2014-11-12 オリンパス株式会社 内視鏡システム
US9676045B2 (en) 2011-02-28 2017-06-13 Corning Optical Communications Rf Llc Electrodes, components, apparatuses, and methods for burr-free or substantially burr-free electrochemical machining
BR112013023244A2 (pt) * 2011-03-22 2016-12-20 Leica Geosystems Ag dispositivo de medição de distância eletro-óptica com disparo de medição de gesto que funciona sem contato com o dispositivo de medição
DE102014206582A1 (de) * 2014-04-04 2015-10-08 Zf Friedrichshafen Ag Auswerteanordnung zur Erkennung der Ausrichtung eines Werkstücks
JP6325509B2 (ja) * 2015-11-11 2018-05-16 ファナック株式会社 工作機械
JP6272611B2 (ja) * 2015-11-30 2018-01-31 シグマ株式会社 内面検査装置
US10613020B2 (en) * 2017-08-10 2020-04-07 The Boeing Company Burr detection systems and methods
CN108872399B (zh) * 2018-08-08 2023-12-26 武汉工程大学 一种用于超声扫描显微镜的定位系统和方法
CN109324061B (zh) * 2018-10-11 2023-09-22 广东德尔智慧工厂科技有限公司 一种锂电池极片的毛刺检测装置和方法
EP3875926A1 (de) * 2020-03-03 2021-09-08 Telsonic Holding AG Bearbeitungsvorrichtung mit messvorrichtung und verfahren zum betreiben einer bearbeitungsvorrichtung
CN115556059A (zh) * 2022-10-09 2023-01-03 明光帝科传动技术有限公司 一种谐波减速机柔轮的制造工艺
CN116086517A (zh) * 2022-12-08 2023-05-09 大连德迈仕精密科技股份有限公司 一种毛刺检测装置
CN116274604B (zh) * 2023-05-16 2023-08-22 合肥航谱时代科技有限公司 一种自动化网片冲裁结构

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US4465374A (en) * 1979-02-27 1984-08-14 Diffracto Ltd. Method and apparatus for determining dimensional information concerning an object
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JPS6358134A (ja) 1986-08-28 1988-03-12 Mitsubishi Electric Corp 管内面形状測定装置
US4777769A (en) * 1987-04-13 1988-10-18 General Electric Company System and method of automated grinding
JPS63288658A (ja) * 1987-05-21 1988-11-25 Mitsubishi Electric Corp バリ取り用ロボット装置
US4824248A (en) * 1987-12-21 1989-04-25 Environmental Research Institute Of Michigan Stabilized sensor device
FR2631697B1 (fr) * 1988-05-17 1991-07-26 Hispano Suiza Sa Appareil pour le controle optique du profil interne d'un tube ou d'un alesage
JP2645095B2 (ja) * 1988-08-12 1997-08-25 矢崎総業株式会社 バリ高さ測定法及び測定具
DE3839386A1 (de) * 1988-11-22 1990-05-23 Schaller Automation Induktiver naeherungssensor
DE3910297A1 (de) * 1989-03-30 1990-10-04 Micro Epsilon Messtechnik Beruehrungslos arbeitendes wegmesssystem
JPH03190652A (ja) * 1989-12-19 1991-08-20 Fanuc Ltd 非接触ならい制御装置
US5485082A (en) * 1990-04-11 1996-01-16 Micro-Epsilon Messtechnik Gmbh & Co. Kg Method of calibrating a thickness measuring device and device for measuring or monitoring the thickness of layers, tapes, foils, and the like
US5119030A (en) * 1990-05-18 1992-06-02 Trek, Inc Apparatus for electrically inspecting the surface of a drum
DE4040084C2 (de) * 1990-12-14 1998-09-24 Dittel Walter Luftfahrt Berührungsloses Abstandsmeßgerät
DE4102721A1 (de) * 1991-01-30 1992-08-06 Rosenthal Ag Verfahren und vorrichtung zur erzeugung einer sollkontur an einem werkstueck
EP0554895B1 (en) * 1992-02-07 1997-01-08 Nippon Steel Corporation Method and apparatus for detecting thickness of and penetrant metal in refractories lined in a vessel for molten metal
US5298963A (en) * 1992-02-26 1994-03-29 Mitsui Mining & Smelting Co., Ltd. Apparatus for inspecting the surface of materials
DE4217292C2 (de) * 1992-05-25 1996-07-04 Precitec Gmbh Düse zur Bearbeitung eines Werkstücks
DE4231989C1 (de) * 1992-08-13 1994-01-20 Datron Electronic Gmbh Abtastvorrichtung für konturierte Oberflächen
DE4232827B4 (de) 1992-09-30 2004-08-05 Siemens Ag Zirkular polarisierte Lokal-Antennenanordnung für ein Kernspintomographiegerät
DE4232837A1 (de) * 1992-09-30 1994-03-31 Siemens Ag Verfahren zur Erkennung von Oberflächenfehlern
GB9307484D0 (en) 1993-04-08 1993-06-02 Lucas Ind Plc Optical displacement sensor
DE19624233C1 (de) * 1996-06-18 1997-10-09 A B Elektronik Gmbh Vorrichtung zur linearen Wegaufnahme
US6155757A (en) * 1996-07-11 2000-12-05 Neos Robotics Ab Deburring method
AT2171U1 (de) * 1997-03-07 1998-05-25 Avl List Gmbh Sensor zur messung mechanischer grössen an rohren
US5988971A (en) * 1997-07-09 1999-11-23 Ade Optical Systems Corporation Wafer transfer robot
DE19847365C2 (de) * 1998-10-14 2002-04-11 Precitec Kg Verfahren zur Überwachung der Bearbeitung eines Werkstücks mittels eines aus einem Bearbeitungskopf austretenden Bearbeitungsstrahls
DE19853302A1 (de) * 1998-11-19 2000-05-25 Waelde Juergen Optischer Abstandsmesser
US6628408B1 (en) * 1999-04-15 2003-09-30 Kimberly-Clark Worldwide, Inc. Amplitude measurement for an ultrasonic horn
DK1392164T3 (da) * 2001-05-17 2012-10-22 Oticon As Fremgangsmåde til opnåelse af geometriske data med hensyn til øregangen i det menneskelige legeme
DE102004006680B3 (de) * 2004-02-09 2006-01-12 Balluff Gmbh Sensorvorrichtung zur Prüfung von Oberflächen

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007003245A (ja) * 2005-06-21 2007-01-11 Aoi Kiko Kk バリ検知方法および装置
JP2008087091A (ja) * 2006-09-29 2008-04-17 Tokyo Seimitsu Co Ltd 平面インダクタ搭載静電結合型センサ及びそれを用いた終点検出方法及び終点検出装置
JP2008256683A (ja) * 2007-03-30 2008-10-23 Honda Motor Co Ltd 冷却剤通路検査装置及び車両用シリンダヘッド冷却剤通路の詰まり検知方法
JP2013528798A (ja) * 2010-05-11 2013-07-11 アンスティテュ.ナショナル.ポリテクニーク.デ.トゥールーズ 物理的パラメータの光学測定デバイス
KR101737932B1 (ko) * 2015-05-21 2017-05-19 한밭대학교 산학협력단 반도체 소자 내부의 메탈층을 이용한 내부형상측정모듈이 장착된 밀링장치
JP2021173757A (ja) * 2020-04-17 2021-11-01 タダノ デマグ ゲーエムベーハーTadano Demag GmbH 車両クレーンの伸縮ジブの固定・ロックユニットの誘導センサアセンブリ
JP7739025B2 (ja) 2020-04-17 2025-09-16 タダノ デマグ ゲーエムベーハー 車両クレーンの伸縮ジブの固定・ロックユニットの誘導センサアセンブリ

Also Published As

Publication number Publication date
EP1225443A2 (de) 2002-07-24
EP1225443A3 (de) 2002-12-04
US20020135361A1 (en) 2002-09-26
US7023564B2 (en) 2006-04-04
DE10103177A1 (de) 2002-08-01

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