JP2002198499A - 半導体記憶装置 - Google Patents
半導体記憶装置Info
- Publication number
- JP2002198499A JP2002198499A JP2000395933A JP2000395933A JP2002198499A JP 2002198499 A JP2002198499 A JP 2002198499A JP 2000395933 A JP2000395933 A JP 2000395933A JP 2000395933 A JP2000395933 A JP 2000395933A JP 2002198499 A JP2002198499 A JP 2002198499A
- Authority
- JP
- Japan
- Prior art keywords
- bit line
- memory cell
- transistor
- write
- line
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Semiconductor Memories (AREA)
- Dram (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000395933A JP2002198499A (ja) | 2000-12-26 | 2000-12-26 | 半導体記憶装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000395933A JP2002198499A (ja) | 2000-12-26 | 2000-12-26 | 半導体記憶装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2002198499A true JP2002198499A (ja) | 2002-07-12 |
| JP2002198499A5 JP2002198499A5 (enExample) | 2005-07-14 |
Family
ID=18861309
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000395933A Pending JP2002198499A (ja) | 2000-12-26 | 2000-12-26 | 半導体記憶装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2002198499A (enExample) |
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007042172A (ja) * | 2005-08-01 | 2007-02-15 | Sony Corp | 半導体メモリ装置 |
| JP2012212499A (ja) * | 2011-03-18 | 2012-11-01 | Semiconductor Energy Lab Co Ltd | 記憶装置及び電子機器 |
| JP2012256818A (ja) * | 2010-08-16 | 2012-12-27 | Semiconductor Energy Lab Co Ltd | 半導体装置 |
| WO2013146039A1 (ja) * | 2012-03-30 | 2013-10-03 | シャープ株式会社 | 半導体記憶装置 |
| CN103367369A (zh) * | 2012-03-28 | 2013-10-23 | 三星电子株式会社 | 半导体存储器件 |
| US8941173B2 (en) | 2012-03-22 | 2015-01-27 | Samsung Electronics Co., Ltd. | Capacitorless memory device |
| JP2017126763A (ja) * | 2012-03-05 | 2017-07-20 | 株式会社半導体エネルギー研究所 | 半導体記憶装置 |
| CN115440265A (zh) * | 2021-06-01 | 2022-12-06 | 长鑫存储技术有限公司 | 存储器 |
| JP2022184976A (ja) * | 2010-08-06 | 2022-12-13 | 株式会社半導体エネルギー研究所 | 半導体装置 |
| JP2023156397A (ja) * | 2012-02-29 | 2023-10-24 | 株式会社半導体エネルギー研究所 | 半導体装置 |
| WO2024194726A1 (ja) * | 2023-03-17 | 2024-09-26 | 株式会社半導体エネルギー研究所 | 半導体装置、及び、半導体装置の作製方法 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07321228A (ja) * | 1994-05-26 | 1995-12-08 | Mitsubishi Electric Corp | 半導体装置およびその製造方法 |
| JPH11126491A (ja) * | 1997-08-20 | 1999-05-11 | Fujitsu Ltd | 半導体記憶装置 |
| JP2000269358A (ja) * | 1999-03-17 | 2000-09-29 | Hitachi Ltd | 半導体装置およびその製造方法 |
-
2000
- 2000-12-26 JP JP2000395933A patent/JP2002198499A/ja active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07321228A (ja) * | 1994-05-26 | 1995-12-08 | Mitsubishi Electric Corp | 半導体装置およびその製造方法 |
| JPH11126491A (ja) * | 1997-08-20 | 1999-05-11 | Fujitsu Ltd | 半導体記憶装置 |
| JP2000269358A (ja) * | 1999-03-17 | 2000-09-29 | Hitachi Ltd | 半導体装置およびその製造方法 |
Cited By (26)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007042172A (ja) * | 2005-08-01 | 2007-02-15 | Sony Corp | 半導体メモリ装置 |
| JP7470754B2 (ja) | 2010-08-06 | 2024-04-18 | 株式会社半導体エネルギー研究所 | 半導体装置 |
| JP2022184976A (ja) * | 2010-08-06 | 2022-12-13 | 株式会社半導体エネルギー研究所 | 半導体装置 |
| JP2012256818A (ja) * | 2010-08-16 | 2012-12-27 | Semiconductor Energy Lab Co Ltd | 半導体装置 |
| US9343480B2 (en) | 2010-08-16 | 2016-05-17 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| US9627386B2 (en) | 2011-03-18 | 2017-04-18 | Semiconductor Energy Laboratory Co., Ltd. | Memory device and electronic device |
| US9385128B2 (en) | 2011-03-18 | 2016-07-05 | Semiconductor Energy Laboratory Co., Ltd. | Memory device and electronic device |
| JP2012212499A (ja) * | 2011-03-18 | 2012-11-01 | Semiconductor Energy Lab Co Ltd | 記憶装置及び電子機器 |
| JP7637730B2 (ja) | 2012-02-29 | 2025-02-28 | 株式会社半導体エネルギー研究所 | 半導体装置 |
| JP7657266B2 (ja) | 2012-02-29 | 2025-04-04 | 株式会社半導体エネルギー研究所 | 半導体装置 |
| US12382723B2 (en) | 2012-02-29 | 2025-08-05 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| JP2023156396A (ja) * | 2012-02-29 | 2023-10-24 | 株式会社半導体エネルギー研究所 | 半導体装置 |
| JP2023156397A (ja) * | 2012-02-29 | 2023-10-24 | 株式会社半導体エネルギー研究所 | 半導体装置 |
| US10170630B2 (en) | 2012-03-05 | 2019-01-01 | Semiconductor Energy Laboratory Co., Ltd. | Manufacturing method of semiconductor memory device |
| JP2021121027A (ja) * | 2012-03-05 | 2021-08-19 | 株式会社半導体エネルギー研究所 | 半導体装置 |
| JP7360416B2 (ja) | 2012-03-05 | 2023-10-12 | 株式会社半導体エネルギー研究所 | 半導体装置 |
| JP2018133581A (ja) * | 2012-03-05 | 2018-08-23 | 株式会社半導体エネルギー研究所 | 半導体記憶装置 |
| JP2017126763A (ja) * | 2012-03-05 | 2017-07-20 | 株式会社半導体エネルギー研究所 | 半導体記憶装置 |
| JP2024177410A (ja) * | 2012-03-05 | 2024-12-19 | 株式会社半導体エネルギー研究所 | 半導体記憶装置 |
| US8941173B2 (en) | 2012-03-22 | 2015-01-27 | Samsung Electronics Co., Ltd. | Capacitorless memory device |
| US8809930B2 (en) | 2012-03-28 | 2014-08-19 | Samsung Electronics Co., Ltd. | Semiconductor memory devices |
| CN103367369A (zh) * | 2012-03-28 | 2013-10-23 | 三星电子株式会社 | 半导体存储器件 |
| WO2013146039A1 (ja) * | 2012-03-30 | 2013-10-03 | シャープ株式会社 | 半導体記憶装置 |
| CN115440265A (zh) * | 2021-06-01 | 2022-12-06 | 长鑫存储技术有限公司 | 存储器 |
| CN115440265B (zh) * | 2021-06-01 | 2024-05-17 | 长鑫存储技术有限公司 | 存储器 |
| WO2024194726A1 (ja) * | 2023-03-17 | 2024-09-26 | 株式会社半導体エネルギー研究所 | 半導体装置、及び、半導体装置の作製方法 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP3549602B2 (ja) | 半導体記憶装置 | |
| US6636454B2 (en) | Low-power consumption semiconductor memory device | |
| US7692986B2 (en) | Semiconductor memory device for precharging bit lines except for specific reading and writing periods | |
| KR100887333B1 (ko) | 반도체기억장치 | |
| JP3781270B2 (ja) | 半導体集積回路装置 | |
| US20030193824A1 (en) | Semiconductor memory device | |
| JPWO2004042821A1 (ja) | 半導体記憶装置 | |
| US7869274B2 (en) | Semiconductor memory device | |
| TWI640002B (zh) | 低電壓互補式金氧半電路和相關記憶體 | |
| JP2001291389A (ja) | 半導体集積回路 | |
| JP2008294310A (ja) | 半導体記憶装置 | |
| JPWO2000070682A1 (ja) | 半導体集積回路装置 | |
| JP2007042172A (ja) | 半導体メモリ装置 | |
| JP4583703B2 (ja) | 半導体記憶装置 | |
| US8472272B2 (en) | Semiconductor device having hierarchical bit line structure | |
| TW200839783A (en) | A semiconductor integrated circuit and method of operating the same | |
| US7924644B2 (en) | Semiconductor memory device including floating body transistor memory cell array and method of operating the same | |
| US7864611B2 (en) | One-transistor type DRAM | |
| JP2002198499A (ja) | 半導体記憶装置 | |
| US11830569B2 (en) | Readout circuit, memory, and method of reading out data of memory | |
| JP2000277709A (ja) | 半導体装置 | |
| JP2001332706A (ja) | 半導体集積回路装置 | |
| KR101295775B1 (ko) | 커패시터리스 동적 반도체 메모리 장치 및 그 동작 방법 | |
| US9251871B2 (en) | Sense amplifier with dual gate precharge and decode transistors | |
| JP3568605B2 (ja) | 半導体集積回路装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20041117 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20041117 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20070524 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20070529 |
|
| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20071002 |